BE759342A - Appareil et methode pour la determination automatique de la resistance d'etalement, la resistivite et la concentration d'impuretes dans des corps semi-conducteurs - Google Patents
Appareil et methode pour la determination automatique de la resistance d'etalement, la resistivite et la concentration d'impuretes dans des corps semi-conducteursInfo
- Publication number
- BE759342A BE759342A BE759342DA BE759342A BE 759342 A BE759342 A BE 759342A BE 759342D A BE759342D A BE 759342DA BE 759342 A BE759342 A BE 759342A
- Authority
- BE
- Belgium
- Prior art keywords
- resistivity
- impurities
- concentration
- automatic determination
- semiconductor bodies
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US87934269A | 1969-11-24 | 1969-11-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
BE759342A true BE759342A (fr) | 1971-05-24 |
Family
ID=25373949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE759342D BE759342A (fr) | 1969-11-24 | Appareil et methode pour la determination automatique de la resistance d'etalement, la resistivite et la concentration d'impuretes dans des corps semi-conducteurs |
Country Status (3)
Country | Link |
---|---|
US (1) | US3628137A (fr) |
JP (1) | JPS4927981B1 (fr) |
BE (1) | BE759342A (fr) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4646009A (en) * | 1982-05-18 | 1987-02-24 | Ade Corporation | Contacts for conductivity-type sensors |
DE3710365A1 (de) * | 1987-03-28 | 1988-10-13 | Messerschmitt Boelkow Blohm | Verfahren zur reproduzierbaren bildung von materialschichten und/oder behandlung von halbleiter-materialschichten |
JPH01283705A (ja) * | 1988-05-10 | 1989-11-15 | Endo Shomei:Kk | 照明器具の回転駆動ユニット |
US5023561A (en) * | 1990-05-04 | 1991-06-11 | Solid State Measurements, Inc. | Apparatus and method for non-invasive measurement of electrical properties of a dielectric layer in a semiconductor wafer |
US5036271A (en) * | 1990-05-23 | 1991-07-30 | Solid State Measurements, Inc. | Apparatus for characterization of electrical properties of a semiconductor body |
JP2729130B2 (ja) * | 1992-04-16 | 1998-03-18 | 三菱電機株式会社 | 半導体装置の製造パラメタの設定方法及びその装置 |
JP3039911B2 (ja) * | 1995-06-13 | 2000-05-08 | 高砂熱学工業株式会社 | 基板表面の有機物汚染の評価装置および方法 |
US5891744A (en) * | 1996-01-29 | 1999-04-06 | Micron Technology, Inc. | Method of monitoring a process of manufacturing a semiconductor wafer including hemispherical grain polysilicon |
US6052653A (en) * | 1997-07-11 | 2000-04-18 | Solid State Measurements, Inc. | Spreading resistance profiling system |
EP1256006B1 (fr) | 1999-10-19 | 2006-07-19 | Solid State Measurements, Inc. | Mesure electrique non invasive de plaquettes semi-conductrices |
US6851096B2 (en) * | 2001-08-22 | 2005-02-01 | Solid State Measurements, Inc. | Method and apparatus for testing semiconductor wafers |
US6940298B2 (en) * | 2002-09-30 | 2005-09-06 | Teradyne, Inc. | High fidelity electrical probe |
JP2006203151A (ja) * | 2004-12-24 | 2006-08-03 | Fuji Electric Holdings Co Ltd | 半導体素子の濃度評価方法 |
EP1949089B1 (fr) * | 2005-11-14 | 2013-06-19 | Abb Ab | Procede et appareil pour estimer une propriete mecanique |
KR100793607B1 (ko) * | 2006-06-27 | 2008-01-10 | 매그나칩 반도체 유한회사 | 에피텍셜 실리콘 웨이퍼 및 그 제조방법 |
CN101131371B (zh) * | 2007-10-08 | 2010-06-02 | 苏州阿特斯阳光电力科技有限公司 | 一种精炼冶金硅的杂质含量检测分析方法 |
FR2964459B1 (fr) * | 2010-09-02 | 2012-09-28 | Commissariat Energie Atomique | Procede de cartographie de la concentration en oxygene |
US11841296B2 (en) * | 2021-12-02 | 2023-12-12 | Globalfoundries U.S. Inc. | Semiconductor substrates for electrical resistivity measurements |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3312893A (en) * | 1963-12-12 | 1967-04-04 | Dow Corning | Automatic apparatus for measuring resistivity of semiconductors |
US3416078A (en) * | 1965-07-08 | 1968-12-10 | Motorola Inc | Method of determining resistivity of a thin layer |
US3487301A (en) * | 1968-03-04 | 1969-12-30 | Ibm | Measurement of semiconductor resistivity profiles by measuring voltages,calculating apparent resistivities and applying correction factors |
-
0
- BE BE759342D patent/BE759342A/fr unknown
-
1969
- 1969-11-24 US US879342A patent/US3628137A/en not_active Expired - Lifetime
-
1970
- 1970-11-24 JP JP45102839A patent/JPS4927981B1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS4927981B1 (fr) | 1974-07-23 |
US3628137A (en) | 1971-12-14 |
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