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*
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1967-07-07 |
1972-01-11 |
Shipley Co |
Light-sensitive naphthoquinone diazide composition containing a polyvinyl ether
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US3523223A
(en)
*
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1967-11-01 |
1970-08-04 |
Texas Instruments Inc |
Metal-semiconductor diodes having high breakdown voltage and low leakage and method of manufacturing
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US3637384A
(en)
*
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1969-02-17 |
1972-01-25 |
Gaf Corp |
Positive-working diazo-oxide terpolymer photoresists
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US4530896A
(en)
*
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1970-03-03 |
1985-07-23 |
Shipley Company Inc. |
Photosensitive laminate
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US4544619A
(en)
*
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1970-03-03 |
1985-10-01 |
Shipley Company Inc. |
Photosensitive laminate
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US3661582A
(en)
*
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1970-03-23 |
1972-05-09 |
Western Electric Co |
Additives to positive photoresists which increase the sensitivity thereof
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US3772016A
(en)
*
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1973-01-30 |
1973-11-13 |
Ibm |
Method of producing multicolor planographic printing surface
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US3950173A
(en)
*
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1973-02-12 |
1976-04-13 |
Rca Corporation |
Electron beam recording article with o-quinone diazide compound
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US3852771A
(en)
*
|
1973-02-12 |
1974-12-03 |
Rca Corp |
Electron beam recording process
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US4036644A
(en)
*
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1973-03-16 |
1977-07-19 |
International Business Machines Corporation |
Photoresist process and photosensitive O-quinone diazide article with aliphatic carboxylic acid as adhesion promotor
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US4196003A
(en)
*
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1974-02-01 |
1980-04-01 |
Fuji Photo Film Co., Ltd. |
Light-sensitive o-quinone diazide copying composition
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US4174222A
(en)
*
|
1975-05-24 |
1979-11-13 |
Tokyo Ohka Kogyo Kabushiki Kaisha |
Positive-type O-quinone diazide containing photoresist compositions
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GB1571682A
(en)
*
|
1976-01-26 |
1980-07-16 |
Vickers Ltd |
Printing plates
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US4148654A
(en)
*
|
1976-07-22 |
1979-04-10 |
Oddi Michael J |
Positive acting photoresist comprising diazide ester, novolak resin and rosin
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US4102686A
(en)
*
|
1977-02-25 |
1978-07-25 |
Polychrome Corporation |
Lithographic photosensitive compositions comprising acrylonitrile-butadiene-styrene terpolymer and novolak resin
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CA1120763A
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*
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1977-11-23 |
1982-03-30 |
James A. Carothers |
Enhancement of resist development
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US4268602A
(en)
*
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1978-12-05 |
1981-05-19 |
Toray Industries, Ltd. |
Photosensitive O-quinone diazide containing composition
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US4376815A
(en)
*
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1979-10-22 |
1983-03-15 |
Oddi Michael J |
Method of applying photoresist by screening in the formation of printed circuits
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DE3040156A1
(de)
*
|
1980-10-24 |
1982-06-03 |
Hoechst Ag, 6000 Frankfurt |
Lichtempfindliches gemisch und damit hergestelltes lichtempfindliches kopiermaterial
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NL8101200A
(nl)
*
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1981-03-12 |
1982-10-01 |
Philips Nv |
Werkwijze voor het aanbrengen van een resistmateriaal op een drager en resist-materiaal.
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US4499171A
(en)
*
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1982-04-20 |
1985-02-12 |
Japan Synthetic Rubber Co., Ltd. |
Positive type photosensitive resin composition with at least two o-quinone diazides
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JPS58205147A
(ja)
*
|
1982-05-25 |
1983-11-30 |
Sumitomo Chem Co Ltd |
ポジ型フオトレジスト組成物
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DE3220816A1
(de)
*
|
1982-06-03 |
1983-12-08 |
Merck Patent Gmbh, 6100 Darmstadt |
Lichtempfindliche komponenten fuer positiv arbeitende fotoresistmaterialien
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US5084372A
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*
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1982-12-09 |
1992-01-28 |
Hoechst Celanese Corporation |
Process for preparing photographic elements utilizing light-sensitive layer containing cyclical acid amide thermo-crosslinking compound
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DE3246037A1
(de)
*
|
1982-12-09 |
1984-06-14 |
Hoechst Ag, 6230 Frankfurt |
Lichtempfindliches gemisch, daraus hergestelltes lichtempfindliches kopiermaterial und verfahren zur herstellung einer druckform aus dem kopiermaterial
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DE3325022A1
(de)
*
|
1983-07-11 |
1985-01-24 |
Hoechst Ag, 6230 Frankfurt |
Verfahren zur herstellung negativer kopien mittels eines materials auf basis von 1,2-chinondiaziden
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EP0136110A3
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*
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1983-08-30 |
1986-05-28 |
Mitsubishi Kasei Corporation |
Positive photosensitive compositions useful as photoresists
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(en)
*
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1983-11-01 |
1989-08-15 |
Hoechst Celanese Corporation |
Positive photoresist thermally stable compositions and elements having deep UV response with maleimide copolymer
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US5059513A
(en)
*
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1983-11-01 |
1991-10-22 |
Hoechst Celanese Corporation |
Photochemical image process of positive photoresist element with maleimide copolymer
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JPS60220931A
(ja)
*
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1984-03-06 |
1985-11-05 |
Tokyo Ohka Kogyo Co Ltd |
感光性樹脂用下地材料
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US4902770A
(en)
*
|
1984-03-06 |
1990-02-20 |
Tokyo Ohka Kogyo Co., Ltd. |
Undercoating material for photosensitive resins
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NO173574C
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*
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1984-06-01 |
1993-12-29 |
Rohm & Haas |
Fremgangsmaate til fremstilling av et termisk stabilt, positivt eller negativt bilde paa en underlagsflate
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US4596763A
(en)
*
|
1984-10-01 |
1986-06-24 |
American Hoechst Corporation |
Positive photoresist processing with mid U-V range exposure
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JPS61141441A
(ja)
*
|
1984-12-14 |
1986-06-28 |
Tokyo Ohka Kogyo Co Ltd |
ポジ型ホトレジスト組成物
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JPS62102241A
(ja)
*
|
1985-10-30 |
1987-05-12 |
Tokyo Ohka Kogyo Co Ltd |
感光性組成物
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US4720445A
(en)
*
|
1986-02-18 |
1988-01-19 |
Allied Corporation |
Copolymers from maleimide and aliphatic vinyl ethers and esters used in positive photoresist
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US4737437A
(en)
*
|
1986-03-27 |
1988-04-12 |
East Shore Chemical Co. |
Light sensitive diazo compound, composition and method of making the composition
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DE3634371A1
(de)
*
|
1986-10-09 |
1988-04-21 |
Hoechst Ag |
Lichtempfindliches gemisch und hieraus hergestelltes lichtempfindliches kopiermaterial
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DE3711264A1
(de)
*
|
1987-04-03 |
1988-10-13 |
Hoechst Ag |
Lichtempfindliches gemisch und hieraus hergestelltes lichtempfindliches kopiermaterial
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DE3711263A1
(de)
*
|
1987-04-03 |
1988-10-13 |
Hoechst Ag |
Lichtempfindliches gemisch, daraus hergestelltes lichtempfindliches kopiermaterial und verfahren zur herstellung von druckformen
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DE3725949A1
(de)
*
|
1987-08-05 |
1989-02-16 |
Hoechst Ag |
Lichtempfindliches gemisch, daraus hergestelltes lichtempfindliches kopiermaterial und verfahren zur herstellung von negativen reliefkopien
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US5075194A
(en)
*
|
1990-01-09 |
1991-12-24 |
Industrial Technology Research Institute |
Positive photoresist composition containing 4,4-diester, 4,5-diester, or 5,5-diester of spiroglycol and 1-oxo-2-diazonaphthalene-5-sulfonic acid chloride
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US5458921A
(en)
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1994-10-11 |
1995-10-17 |
Morton International, Inc. |
Solvent system for forming films of photoimageable compositions
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US5645970A
(en)
*
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1995-10-25 |
1997-07-08 |
Industrial Technology Research Institute |
Weak base developable positive photoresist composition containing quinonediazide compound
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US7285422B1
(en)
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1997-01-23 |
2007-10-23 |
Sequenom, Inc. |
Systems and methods for preparing and analyzing low volume analyte array elements
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EP1332000B1
(en)
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2000-10-30 |
2012-06-20 |
Sequenom, Inc. |
Method for delivery of submicroliter volumes onto a substrate
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US20090180931A1
(en)
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2007-09-17 |
2009-07-16 |
Sequenom, Inc. |
Integrated robotic sample transfer device
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2014-07-30 |
2017-07-04 |
Taiwan Semiconductor Manufacturing Co., Ltd |
Photoresist composition to reduce photoresist pattern collapse
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