BE524089A - - Google Patents

Info

Publication number
BE524089A
BE524089A BE524089DA BE524089A BE 524089 A BE524089 A BE 524089A BE 524089D A BE524089D A BE 524089DA BE 524089 A BE524089 A BE 524089A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE524089A publication Critical patent/BE524089A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE524089D 1952-11-08 BE524089A (US07642317-20100105-C00010.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL316826X 1952-11-08

Publications (1)

Publication Number Publication Date
BE524089A true BE524089A (US07642317-20100105-C00010.png)

Family

ID=19783831

Family Applications (1)

Application Number Title Priority Date Filing Date
BE524089D BE524089A (US07642317-20100105-C00010.png) 1952-11-08

Country Status (7)

Country Link
US (1) US2783385A (US07642317-20100105-C00010.png)
BE (1) BE524089A (US07642317-20100105-C00010.png)
CH (1) CH316826A (US07642317-20100105-C00010.png)
DE (1) DE1027903B (US07642317-20100105-C00010.png)
FR (1) FR1090233A (US07642317-20100105-C00010.png)
GB (1) GB741854A (US07642317-20100105-C00010.png)
NL (2) NL85501C (US07642317-20100105-C00010.png)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835820A (en) * 1955-03-07 1958-05-20 Jr La Verne S Birks Curved crystal fluorescent x-ray spectrograph
US3031571A (en) * 1956-05-21 1962-04-24 Well Completions Inc Apparatus and method for conditioning and analyzing earth components
US2898469A (en) * 1956-09-11 1959-08-04 Gen Electric X-ray diffraction apparatus
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
US2957079A (en) * 1957-12-27 1960-10-18 Gen Electric Penetrating ray emission coding
US3012443A (en) * 1960-01-11 1961-12-12 Patent Man Inc Mechanical movement for translating rotary motion to linear motion
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
JP3531098B2 (ja) * 1998-12-28 2004-05-24 理学電機工業株式会社 蛍光x線分析装置
JP6324060B2 (ja) * 2013-12-24 2018-05-16 株式会社日立ハイテクサイエンス X線分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE495202A (US07642317-20100105-C00010.png) * 1949-04-19
US2532810A (en) * 1950-01-13 1950-12-05 Gen Electric X-ray diffraction apparatus for use with radioactive materials
US2578722A (en) * 1950-05-18 1951-12-18 United States Steel Corp Apparatus for determining coating thickness

Also Published As

Publication number Publication date
DE1027903B (de) 1958-04-10
FR1090233A (fr) 1955-03-29
GB741854A (en) 1955-12-14
NL173668B (nl)
CH316826A (de) 1956-10-31
NL85501C (US07642317-20100105-C00010.png)
US2783385A (en) 1957-02-26

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