AU8181375A - Determination of thickness of uniform films - Google Patents

Determination of thickness of uniform films

Info

Publication number
AU8181375A
AU8181375A AU81813/75A AU8181375A AU8181375A AU 8181375 A AU8181375 A AU 8181375A AU 81813/75 A AU81813/75 A AU 81813/75A AU 8181375 A AU8181375 A AU 8181375A AU 8181375 A AU8181375 A AU 8181375A
Authority
AU
Australia
Prior art keywords
determination
thickness
uniform films
films
uniform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU81813/75A
Other languages
English (en)
Inventor
Pauline Margaret Toms
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Decca Ltd
Original Assignee
Decca Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Decca Ltd filed Critical Decca Ltd
Publication of AU8181375A publication Critical patent/AU8181375A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU81813/75A 1974-06-07 1975-06-03 Determination of thickness of uniform films Expired AU8181375A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2542074 1974-06-07

Publications (1)

Publication Number Publication Date
AU8181375A true AU8181375A (en) 1976-12-09

Family

ID=10227383

Family Applications (1)

Application Number Title Priority Date Filing Date
AU81813/75A Expired AU8181375A (en) 1974-06-07 1975-06-03 Determination of thickness of uniform films

Country Status (9)

Country Link
JP (1) JPS5111464A (enrdf_load_stackoverflow)
AU (1) AU8181375A (enrdf_load_stackoverflow)
BE (1) BE829978A (enrdf_load_stackoverflow)
DE (1) DE2524982A1 (enrdf_load_stackoverflow)
DK (1) DK255675A (enrdf_load_stackoverflow)
FR (1) FR2274022A1 (enrdf_load_stackoverflow)
NL (1) NL7506740A (enrdf_load_stackoverflow)
NO (1) NO751987L (enrdf_load_stackoverflow)
SE (1) SE7506493L (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU598626B2 (en) * 1986-12-04 1990-06-28 Libbey-Owens-Ford Co. Device for monitoring film characteristics

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643685A (en) * 1979-09-19 1981-04-22 Hitachi Ltd Optical character reader
FR2716531B1 (fr) * 1994-02-18 1996-05-03 Saint Gobain Cinematique Contr Procédé de mesure d'épaisseur d'un matériau transparent.
RU2168151C2 (ru) * 1999-08-04 2001-05-27 Научно-исследовательский институт радиоэлектроники и лазерной техники Московского государственного технического университета им. Н.Э. Баумана Дистанционный способ измерения толщины пленок
JP2011191252A (ja) * 2010-03-16 2011-09-29 Nippon Steel Engineering Co Ltd 金属の表面品質評価方法および金属の表面品質評価装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU598626B2 (en) * 1986-12-04 1990-06-28 Libbey-Owens-Ford Co. Device for monitoring film characteristics

Also Published As

Publication number Publication date
DE2524982A1 (de) 1976-01-02
FR2274022A1 (fr) 1976-01-02
DK255675A (da) 1975-12-08
SE7506493L (sv) 1975-12-08
NL7506740A (nl) 1975-12-09
BE829978A (fr) 1975-10-01
FR2274022B3 (enrdf_load_stackoverflow) 1978-12-29
NO751987L (enrdf_load_stackoverflow) 1975-12-09
JPS5111464A (enrdf_load_stackoverflow) 1976-01-29

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