AU6417898A - Automatic fixture building for electrical testing - Google Patents

Automatic fixture building for electrical testing

Info

Publication number
AU6417898A
AU6417898A AU64178/98A AU6417898A AU6417898A AU 6417898 A AU6417898 A AU 6417898A AU 64178/98 A AU64178/98 A AU 64178/98A AU 6417898 A AU6417898 A AU 6417898A AU 6417898 A AU6417898 A AU 6417898A
Authority
AU
Australia
Prior art keywords
electrical testing
automatic fixture
fixture building
building
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU64178/98A
Inventor
Zvi Netter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIT SYSTEMS Ltd
Original Assignee
NIT SYSTEMS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIT SYSTEMS Ltd filed Critical NIT SYSTEMS Ltd
Publication of AU6417898A publication Critical patent/AU6417898A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
AU64178/98A 1998-03-24 1998-03-24 Automatic fixture building for electrical testing Abandoned AU6417898A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IL1998/000133 WO1999049325A1 (en) 1998-03-24 1998-03-24 Automatic fixture building for electrical testing

Publications (1)

Publication Number Publication Date
AU6417898A true AU6417898A (en) 1999-10-18

Family

ID=11062320

Family Applications (1)

Application Number Title Priority Date Filing Date
AU64178/98A Abandoned AU6417898A (en) 1998-03-24 1998-03-24 Automatic fixture building for electrical testing

Country Status (3)

Country Link
AU (1) AU6417898A (en)
IL (1) IL125749A0 (en)
WO (1) WO1999049325A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5822042B1 (en) * 2015-03-27 2015-11-24 日本電産リード株式会社 Inspection jig, substrate inspection apparatus, and manufacturing method of inspection jig
KR101656047B1 (en) * 2016-03-23 2016-09-09 주식회사 나노시스 Jig for Circuit Board Inspection
TWI777698B (en) * 2021-07-29 2022-09-11 中華精測科技股份有限公司 Probe card device and transmission structure
JP7182817B1 (en) * 2022-03-14 2022-12-05 ユニコン株式会社 Probe sheet and manufacturing method thereof

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH525562A (en) * 1970-12-23 1972-07-15 Contraves Ag Electrical contacting device with a large number of contact pins and method for their production
US4535536A (en) * 1983-11-03 1985-08-20 Augat Inc. Method of assembling adaptor for automatic testing equipment
DE8515436U1 (en) * 1985-05-24 1985-08-22 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten Contact pin made of electrically conductive material for use in an electrical test device for printed circuit boards
CH676898A5 (en) * 1988-09-02 1991-03-15 Microcontact Ag
US5389874A (en) * 1991-09-18 1995-02-14 Hewlett-Packard Company Method for control of ground bounce above an internal ground plane in a short-wire board test fixture
FR2688975B1 (en) * 1992-03-19 1996-10-04 Testelec INTERFACE DEVICE BETWEEN A TESTING APPARATUS AND A PRINTED CIRCUIT BOARD.
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures

Also Published As

Publication number Publication date
WO1999049325A1 (en) 1999-09-30
IL125749A0 (en) 1999-04-11

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase