AU3342500A - Automatic inspection system with stereovision - Google Patents

Automatic inspection system with stereovision

Info

Publication number
AU3342500A
AU3342500A AU33425/00A AU3342500A AU3342500A AU 3342500 A AU3342500 A AU 3342500A AU 33425/00 A AU33425/00 A AU 33425/00A AU 3342500 A AU3342500 A AU 3342500A AU 3342500 A AU3342500 A AU 3342500A
Authority
AU
Australia
Prior art keywords
stereovision
inspection system
automatic inspection
automatic
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU33425/00A
Inventor
Christopher B. Jackson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cyberoptics Corp
Original Assignee
Cyberoptics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cyberoptics Corp filed Critical Cyberoptics Corp
Publication of AU3342500A publication Critical patent/AU3342500A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/239—Image signal generators using stereoscopic image cameras using two 2D image sensors having a relative position equal to or related to the interocular distance
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G06T2207/10012—Stereo images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20076—Probabilistic image processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/246—Calibration of cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N2013/0074—Stereoscopic image analysis
    • H04N2013/0081—Depth or disparity estimation from stereoscopic image signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
AU33425/00A 1998-12-19 1999-12-17 Automatic inspection system with stereovision Abandoned AU3342500A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9828109 1998-12-19
GBGB9828109.0A GB9828109D0 (en) 1998-12-19 1998-12-19 Inspection equipment and methods of inspection
PCT/US1999/030206 WO2000038494A2 (en) 1998-12-19 1999-12-17 Automatic inspection system with stereovision

Publications (1)

Publication Number Publication Date
AU3342500A true AU3342500A (en) 2000-07-12

Family

ID=10844634

Family Applications (1)

Application Number Title Priority Date Filing Date
AU33425/00A Abandoned AU3342500A (en) 1998-12-19 1999-12-17 Automatic inspection system with stereovision

Country Status (8)

Country Link
EP (1) EP1057390A2 (en)
JP (1) JP2003522347A (en)
KR (1) KR20010040998A (en)
AU (1) AU3342500A (en)
CA (1) CA2321096A1 (en)
GB (1) GB9828109D0 (en)
IL (1) IL137778A0 (en)
WO (1) WO2000038494A2 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1220596A1 (en) * 2000-12-29 2002-07-03 Icos Vision Systems N.V. A method and an apparatus for measuring positions of contact elements of an electronic component
EP1407647B1 (en) * 2001-07-04 2010-11-24 Koninklijke Philips Electronics N.V. Choice of reference markings for enabling fast estimating of the position of an imaging device
JP4596422B2 (en) * 2005-05-20 2010-12-08 キヤノンマシナリー株式会社 Imaging device for die bonder
WO2006135040A1 (en) 2005-06-17 2006-12-21 Omron Corporation Image processing device and image processing method performing 3d measurement
WO2007053557A1 (en) * 2005-10-31 2007-05-10 Cyberoptics Corporation Electronics assembly machine with embedded solder paste inspection
WO2009094489A1 (en) * 2008-01-23 2009-07-30 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
CN101614679B (en) * 2008-06-27 2011-06-22 上海纺印印刷包装有限公司 Quality detection device for concave-convex printed product
US8670031B2 (en) 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
US8681211B2 (en) 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
US8388204B2 (en) 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
CN102656444B (en) * 2009-09-22 2016-08-03 赛博光学公司 The high speed optical with camera array and compact integrated illuminating device checks system
US8872912B2 (en) 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
US8894259B2 (en) 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
JP5465062B2 (en) * 2010-03-31 2014-04-09 名古屋電機工業株式会社 Substrate appearance inspection apparatus and substrate appearance inspection method
KR101160663B1 (en) * 2010-10-21 2012-06-28 한국원자력연구원 Three Dimensional Visualization of Stereo X-ray Images based on Volume Reconstruction
JP5893154B2 (en) * 2011-11-14 2016-03-23 エーファウ・グループ・エー・タルナー・ゲーエムベーハー Measurement of substrate shape change
US20140198185A1 (en) * 2013-01-17 2014-07-17 Cyberoptics Corporation Multi-camera sensor for three-dimensional imaging of a circuit board
US11176635B2 (en) * 2013-01-25 2021-11-16 Cyberoptics Corporation Automatic programming of solder paste inspection system
US10126252B2 (en) * 2013-04-29 2018-11-13 Cyberoptics Corporation Enhanced illumination control for three-dimensional imaging
US9743527B2 (en) 2013-08-09 2017-08-22 CyberOptics Corporaiton Stencil programming and inspection using solder paste inspection system
US9707584B2 (en) 2014-07-09 2017-07-18 Nordson Corporation Dual applicator fluid dispensing methods and systems
CN106290423B (en) * 2016-10-18 2024-04-05 同方威视技术股份有限公司 Method, device and system for scanning imaging
JP6831478B2 (en) * 2017-12-07 2021-02-24 ヤマハ発動機株式会社 Work device to be mounted
CN113692215A (en) * 2021-07-30 2021-11-23 广州佳帆计算机有限公司 System, method and device for adjusting position of patch element

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4978224A (en) * 1987-07-14 1990-12-18 Sharp Kabushiki Kaisha Method of and apparatus for inspecting mounting of chip components
EP0301255A1 (en) * 1987-07-30 1989-02-01 Siemens Aktiengesellschaft Three-dimensional position recognition of component pins for automatic insertion
JP2714277B2 (en) * 1991-07-25 1998-02-16 株式会社東芝 Lead shape measuring device

Also Published As

Publication number Publication date
JP2003522347A (en) 2003-07-22
KR20010040998A (en) 2001-05-15
EP1057390A2 (en) 2000-12-06
GB9828109D0 (en) 1999-02-17
WO2000038494A8 (en) 2000-10-26
CA2321096A1 (en) 2000-06-29
WO2000038494A2 (en) 2000-06-29
WO2000038494A3 (en) 2000-09-14
IL137778A0 (en) 2001-10-31

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase