AU2023421564A1 - Measuring apparatus and measuring system - Google Patents

Measuring apparatus and measuring system Download PDF

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Publication number
AU2023421564A1
AU2023421564A1 AU2023421564A AU2023421564A AU2023421564A1 AU 2023421564 A1 AU2023421564 A1 AU 2023421564A1 AU 2023421564 A AU2023421564 A AU 2023421564A AU 2023421564 A AU2023421564 A AU 2023421564A AU 2023421564 A1 AU2023421564 A1 AU 2023421564A1
Authority
AU
Australia
Prior art keywords
deformable
layer
sensors
measuring apparatus
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
AU2023421564A
Other languages
English (en)
Inventor
Satoshi Nakamaru
Koutarou TAJIMA
Junki Yamamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suntory Holdings Ltd
Original Assignee
Suntory Holdings Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suntory Holdings Ltd filed Critical Suntory Holdings Ltd
Publication of AU2023421564A1 publication Critical patent/AU2023421564A1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/14—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G01L1/146—Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors for measuring force distributions, e.g. using force arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/205—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using distributed sensing elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
AU2023421564A 2023-01-04 2023-12-27 Measuring apparatus and measuring system Pending AU2023421564A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202363478371P 2023-01-04 2023-01-04
US63/478,371 2023-01-04
PCT/JP2023/047094 WO2024147329A1 (ja) 2023-01-04 2023-12-27 測定装置及び測定システム

Publications (1)

Publication Number Publication Date
AU2023421564A1 true AU2023421564A1 (en) 2025-07-10

Family

ID=91803955

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2023421564A Pending AU2023421564A1 (en) 2023-01-04 2023-12-27 Measuring apparatus and measuring system

Country Status (6)

Country Link
EP (1) EP4647734A1 (https=)
JP (1) JPWO2024147329A1 (https=)
KR (1) KR20250129031A (https=)
CN (1) CN120457325A (https=)
AU (1) AU2023421564A1 (https=)
WO (1) WO2024147329A1 (https=)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0654269B2 (ja) * 1988-04-05 1994-07-20 株式会社エニックス 凹凸面圧力分布検出用感圧板
JP3144420B1 (ja) * 1999-10-21 2001-03-12 オムロン株式会社 人工触覚器およびこの触覚器を用いた人工皮膚ならびにロボット
JP4364146B2 (ja) * 2005-03-10 2009-11-11 株式会社東芝 触覚センサー
US7645398B2 (en) * 2005-12-07 2010-01-12 Electronics And Telecommunications Research Institute Pressure sensor for electronic skin and fabrication method of pressure sensor for electronic skin
EP2247998B1 (en) * 2008-02-28 2019-04-10 New York University Method and apparatus for providing input to a processor, and a sensor pad
JP6982953B2 (ja) * 2016-09-21 2021-12-17 エルジー ディスプレイ カンパニー リミテッド センサ装置
JP2018189513A (ja) 2017-05-08 2018-11-29 国立大学法人 東京大学 圧力センサ及び圧力センサアレイ
CN116323120A (zh) * 2020-11-17 2023-06-23 索尼集团公司 传感器装置和机器人装置

Also Published As

Publication number Publication date
EP4647734A1 (en) 2025-11-12
CN120457325A (zh) 2025-08-08
KR20250129031A (ko) 2025-08-28
JPWO2024147329A1 (https=) 2024-07-11
WO2024147329A1 (ja) 2024-07-11

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Legal Events

Date Code Title Description
DA3 Amendments made section 104

Free format text: THE NATURE OF THE AMENDMENT IS: AMEND THE INVENTION TITLE TO READ MEASURING APPARATUS AND MEASURING SYSTEM