KR20250129031A - 측정 장치 및 측정 시스템 - Google Patents

측정 장치 및 측정 시스템

Info

Publication number
KR20250129031A
KR20250129031A KR1020257024477A KR20257024477A KR20250129031A KR 20250129031 A KR20250129031 A KR 20250129031A KR 1020257024477 A KR1020257024477 A KR 1020257024477A KR 20257024477 A KR20257024477 A KR 20257024477A KR 20250129031 A KR20250129031 A KR 20250129031A
Authority
KR
South Korea
Prior art keywords
measuring device
sensors
layer
deformation layer
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020257024477A
Other languages
English (en)
Korean (ko)
Inventor
준키 야마무라
사토시 나카마루
고우타로우 다지마
Original Assignee
산토리 홀딩스 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 산토리 홀딩스 가부시키가이샤 filed Critical 산토리 홀딩스 가부시키가이샤
Publication of KR20250129031A publication Critical patent/KR20250129031A/ko
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/14Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/14Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
    • G01L1/142Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors
    • G01L1/146Measuring force or stress, in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators using capacitors for measuring force distributions, e.g. using force arrays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/205Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using distributed sensing elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
KR1020257024477A 2023-01-04 2023-12-27 측정 장치 및 측정 시스템 Pending KR20250129031A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202363478371P 2023-01-04 2023-01-04
US63/478,371 2023-01-04
PCT/JP2023/047094 WO2024147329A1 (ja) 2023-01-04 2023-12-27 測定装置及び測定システム

Publications (1)

Publication Number Publication Date
KR20250129031A true KR20250129031A (ko) 2025-08-28

Family

ID=91803955

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020257024477A Pending KR20250129031A (ko) 2023-01-04 2023-12-27 측정 장치 및 측정 시스템

Country Status (6)

Country Link
EP (1) EP4647734A1 (https=)
JP (1) JPWO2024147329A1 (https=)
KR (1) KR20250129031A (https=)
CN (1) CN120457325A (https=)
AU (1) AU2023421564A1 (https=)
WO (1) WO2024147329A1 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018189513A (ja) 2017-05-08 2018-11-29 国立大学法人 東京大学 圧力センサ及び圧力センサアレイ

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0654269B2 (ja) * 1988-04-05 1994-07-20 株式会社エニックス 凹凸面圧力分布検出用感圧板
JP3144420B1 (ja) * 1999-10-21 2001-03-12 オムロン株式会社 人工触覚器およびこの触覚器を用いた人工皮膚ならびにロボット
JP4364146B2 (ja) * 2005-03-10 2009-11-11 株式会社東芝 触覚センサー
US7645398B2 (en) * 2005-12-07 2010-01-12 Electronics And Telecommunications Research Institute Pressure sensor for electronic skin and fabrication method of pressure sensor for electronic skin
EP2247998B1 (en) * 2008-02-28 2019-04-10 New York University Method and apparatus for providing input to a processor, and a sensor pad
JP6982953B2 (ja) * 2016-09-21 2021-12-17 エルジー ディスプレイ カンパニー リミテッド センサ装置
CN116323120A (zh) * 2020-11-17 2023-06-23 索尼集团公司 传感器装置和机器人装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018189513A (ja) 2017-05-08 2018-11-29 国立大学法人 東京大学 圧力センサ及び圧力センサアレイ

Also Published As

Publication number Publication date
EP4647734A1 (en) 2025-11-12
CN120457325A (zh) 2025-08-08
JPWO2024147329A1 (https=) 2024-07-11
WO2024147329A1 (ja) 2024-07-11
AU2023421564A1 (en) 2025-07-10

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Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

Q12 Application published

Free format text: ST27 STATUS EVENT CODE: A-1-1-Q10-Q12-NAP-PG1501 (AS PROVIDED BY THE NATIONAL OFFICE)