AU2014101225A4 - wide-band atomic scanning analyzer - Google Patents
wide-band atomic scanning analyzer Download PDFInfo
- Publication number
- AU2014101225A4 AU2014101225A4 AU2014101225A AU2014101225A AU2014101225A4 AU 2014101225 A4 AU2014101225 A4 AU 2014101225A4 AU 2014101225 A AU2014101225 A AU 2014101225A AU 2014101225 A AU2014101225 A AU 2014101225A AU 2014101225 A4 AU2014101225 A4 AU 2014101225A4
- Authority
- AU
- Australia
- Prior art keywords
- signal
- band
- achieve
- light source
- wide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
A wide-band atomic scanning analyzer comprises: a first light source device(1) , a second light source device(2), a light beam reflecting device(3), a spectral separation device(4), a filtering device(5), a beam control device (6), a beam focusing device(7), a photoelectric conversion device(8), a signal stability device(9),a signal amplifying device(10), a signal display and recording apparatus(11); wherein the beam control device (6) is located between the filtering device(5) and the beam focusing device(7); the photoelectric conversion device(8) is connected with the beam focusing device(7) and the signal stability device(9); through the first light source device (1) to achieve and generate a beam of energetic ions, providing high-energy beam for atomic scanning analysis; by the means of second light source device(2) to generate far-infrared and near ultraviolet spectrum band beam, to facilitate low-energy atomic spectroscopy scanning analysis; using the light beam reflecting device (3) for adjusting the beam path of conduction; by means of spectral separation device (4) to achieve wide-band spectral range screening and separation; then, through filtering device (5) to achieve a specific spectral range of the filter selected for light beam scanning analysis; using the beam control device (6) for the adjustment and control of beam scan time and the band of atoms, to avoid interference from non-band beams; by means of the beam focusing device (7) for collect the spectral energy and the conduction path of the light beam, preventing the light beam energy dissipation due to irregularities in the beam conduction; through photoelectric conversion device (8) to achieve photoelectric conversion and transmission of detection signal; utilizing the signal stability device (9) to implement signal transduction stability control, to avoid excessive volatility signal interference errors from instrument; by adopting the signal amplifying device (10) to achieve amplified oscillation of signal transduction, preventing signal degradation caused by excessive speed line jump. Figure 1
Description
1 WIDE-BAND ATOMIC SCANNING ANALYZER FIELD OF THE INVENTION [0001] The present invention relates to the field of wide-band atoms, and more particularly to a wide-band atomic scanning analyzer. GENERALBACKGROUND [0002] Atomic scanning analysis techniques is primarily by decomposition with light of complex components into spectrum, measuring the light reflected from the surface of object. The photolysis arranged by wavelength, a visible spectrum is only a very small range; the rest are infrared, microwave, ultraviolet, X-rays, etc; with the light information by crawling to photographic film developing, automatically numerical display and analysis instruments, thus detecting atomic-related information items, which can be applied to air pollution, water pollution, food hygiene, such as the detection of metal industry. [0003] But the existing atomic scanning analytical instruments have defects of low measurement accuracy, low sensitivity, long response time, low spectral resolution; therefore, it is necessary to propose a new atomic scanning analysis technique to improve the analytical accuracy. SUMMARY [0004] In order to overcome the deficiencies of prior devices, the present invention adopts the technical solution as follows.
2 [0005] A wide-band atomic scanning analyzer comprises: a first light source device(1) , a second light source device(2), a light beam reflecting device(3), a spectral separation device(4), a filtering device(5), a beam control device (6), a beam focusing device(7), a photoelectric conversion device(8), a signal stability device(9),a signal amplifying device(10), a signal display and recording apparatus(11); wherein the beam control device (6) is located between the filtering device(5) and the beam focusing device(7); the photoelectric conversion device(8) is connected with the beam focusing device(7) and the signal stability device(9); through the first light source device (1) to achieve and generate a beam of energetic ions, providing high-energy beam for atomic scanning analysis; by the means of second light source device(2) to generate far-infrared and near ultraviolet spectrum band beam, to facilitate low-energy atomic spectroscopy scanning analysis; using the light beam reflecting device (3) for adjusting the beam path of conduction; by means of spectral separation device (4) to achieve wide-band spectral range screening and separation; then, through filtering device (5) to achieve a specific spectral range of the filter selected for light beam scanning analysis; using the beam control device (6) for the adjustment and control of beam scan time and the band of atoms, to avoid interference from non-band beams; by means of the beam focusing device (7) for collect the spectral energy and the conduction path of the light beam, preventing the light beam energy dissipation due to irregularities in the beam conduction; through photoelectric conversion device (8) to achieve photoelectric conversion and transmission of detection signal; utilizing the signal stability device (9) to implement signal transduction stability control, to avoid excessive volatility signal interference errors from instrument; by adopting the signal amplifying device (10) to achieve amplified oscillation of signal transduction, preventing signal degradation caused by excessive speed line jump; employing the signal display and recording apparatus (11) to achieve the display and recording of detection signal.
3 [0006] The first light source device (1) comprises an ion beam electrode, the electrode material is a palladium-rhodium oxide alloy composite materials. [0007] The second light source device (2) comprises a high voltage beam electrode, the electrode material is erbium-nobelium carbide alloy composite materials. [0008] The light beam reflecting device (3) contains enneagon prismatic reflective lens, the reflective lens surface is covered with three layers of tantalum-yttrium hexaphosphate nanocomposite reflective film, which has a thickness of 1.5um. [0009] The spectral separation device (4) contains hexagonal cylindrical lens, five-hole slit diffraction and double concave lens; the three straight along the beam propagation direction are arranged alternately; wherein hexagonal cylindrical lens is at the front, five-hole slit diffraction is located in the middle, double concave lens is at the rear. [0010] Compared with the prior art, the present invention has the advantages that: (1) Through the first light source device to provide high energy ion beam for atomic spectroscopy scans analysis ; (2) By second light source device generating far-infrared and near ultraviolet spectrum band beam to achieve low-energy atomic scanning spectroscopy analysis; (3) Using beam control device to conducted adjustment and control of atomic beam scanning time and wavelength range, avoiding interference from non-band beams.
4 BRIEF DESCRIPTION OF THE DRAWING [0011] Figure 1 is a schematic diagram of the present invention; List of reference characters: 1 first light source device , 2 second light source device, 3 light beam reflecting device, 4 spectral separation device, 5 filtering device, 6 beam control device, 7 beam focusing device, 8 photoelectric conversion device, 9 signal stability device, 10 signal amplifying device, 11 signal display and recording apparatus. DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS Embodiment 1 [0012] As shown in Fig. 1, a wide-band atomic scanning analyzer comprises: a first light source device(1) , a second light source device(2), a light beam reflecting device(3), a spectral separation device(4), a filtering device(5), a beam control device (6), a beam focusing device(7), a photoelectric conversion device(8), a signal stability device(9),a signal amplifying device(10), a signal display and recording apparatus(11); wherein the beam control device (6) is located between the filtering device(5) and the beam focusing device(7); the photoelectric conversion device(8) is connected with the beam focusing device(7) and the signal stability device(9); through the first light source device (1) to achieve and generate a beam of energetic 5 ions, providing high-energy beam for atomic scanning analysis; by the means of second light source device(2) to generate far-infrared and near ultraviolet spectrum band beam, to facilitate low-energy atomic spectroscopy scanning analysis; using the light beam reflecting device (3) for adjusting the beam path of conduction; by means of spectral separation device (4) to achieve wide-band spectral range screening and separation; then, through filtering device (5) to achieve a specific spectral range of the filter selected for light beam scanning analysis; using the beam control device (6) for the adjustment and control of beam scan time and the band of atoms, to avoid interference from non-band beams; by means of the beam focusing device (7) for collect the spectral energy and the conduction path of the light beam, preventing the light beam energy dissipation due to irregularities in the beam conduction; through photoelectric conversion device (8) to achieve photoelectric conversion and transmission of detection signal; utilizing the signal stability device (9) to implement signal transduction stability control, to avoid excessive volatility signal interference errors from instrument; by adopting the signal amplifying device (10) to achieve amplified oscillation of signal transduction, preventing signal degradation caused by excessive speed line jump; employing the signal display and recording apparatus (11) to achieve the display and recording of detection signal. [0013] In the present invention, the first light source device (1) comprises an ion beam electrode, the electrode material is a palladium-rhodium oxide alloy composite materials. [0014] In the present invention, the second light source device (2) comprises a high voltage beam electrode, the electrode material is erbium-nobelium carbide alloy composite materials.
6 Embodiment 2 [0015] A wide-band atomic scanning analyzer comprises: a first light source device(1) , a second light source device(2), a light beam reflecting device(3), a spectral separation device(4), a filtering device(5), a beam control device (6), a beam focusing device(7), a photoelectric conversion device(8), a signal stability device(9),a signal amplifying device(10), a signal display and recording apparatus(11); wherein the beam control device (6) is located between the filtering device(5) and the beam focusing device(7); the photoelectric conversion device(8) is connected with the beam focusing device(7) and the signal stability device(9); through the first light source device (1) to achieve and generate a beam of energetic ions, providing high-energy beam for atomic scanning analysis; by the means of second light source device(2) to generate far-infrared and near ultraviolet spectrum band beam, to facilitate low-energy atomic spectroscopy scanning analysis; using the light beam reflecting device (3) for adjusting the beam path of conduction; by means of spectral separation device (4) to achieve wide-band spectral range screening and separation; then, through filtering device (5) to achieve a specific spectral range of the filter selected for light beam scanning analysis; using the beam control device (6) for the adjustment and control of beam scan time and the band of atoms, to avoid interference from non-band beams; by means of the beam focusing device (7) for collect the spectral energy and the conduction path of the light beam, preventing the light beam energy dissipation due to irregularities in the beam conduction; through photoelectric conversion device (8) to achieve photoelectric conversion and transmission of detection signal; utilizing the signal stability device (9) to implement signal transduction stability control, to avoid excessive volatility signal interference errors from instrument; by adopting the signal amplifying device (10) to achieve amplified oscillation of signal transduction, preventing signal degradation caused by excessive speed line jump; employing the signal display and recording apparatus (11) to achieve the display and recording of detection signal.
7 [0016] In the present invention, the light beam reflecting device (3) contains enneagon prismatic reflective lens, the reflective lens surface is covered with three layers of tantalum-yttrium hexaphosphate nanocomposite reflective film, which has a thickness of 1.5um. [0017] In the present invention, the spectral separation device (4) contains hexagonal cylindrical lens, five-hole slit diffraction and double concave lens; the three straight along the beam propagation direction are arranged alternately; wherein hexagonal cylindrical lens is at the front, five-hole slit diffraction is located in the middle, double concave lens is at the rear.
Claims (5)
1. A wide-band atomic scanning analyzer comprises: a first light source device(1) , a second light source device(2), a light beam reflecting device(3), a spectral separation device(4), a filtering device(5), a beam control device (6), a beam focusing device(7), a photoelectric conversion device(8), a signal stability device(9),a signal amplifying device(10), a signal display and recording apparatus(11); wherein the beam control device (6) is located between the filtering device(5) and the beam focusing device(7); the photoelectric conversion device(8) is connected with the beam focusing device(7) and the signal stability device(9); through the first light source device (1) to achieve and generate a beam of energetic ions, providing high-energy beam for atomic scanning analysis; by the means of second light source device(2) to generate far-infrared and near ultraviolet spectrum band beam, to facilitate low-energy atomic spectroscopy scanning analysis; using the light beam reflecting device (3) for adjusting the beam path of conduction; by means of spectral separation device (4) to achieve wide-band spectral range screening and separation; then, through filtering device (5) to achieve a specific spectral range of the filter selected for light beam scanning analysis; using the beam control device (6) for the adjustment and control of beam scan time and the band of atoms, to avoid interference from non-band beams; by means of the beam focusing device (7) for collect the spectral energy and the conduction path of the light beam, preventing the light beam energy dissipation due to irregularities in the beam conduction; through photoelectric conversion device (8) to achieve photoelectric conversion and transmission of detection signal; utilizing the signal stability device (9) to implement signal transduction stability control, to avoid excessive volatility signal interference errors from instrument; by adopting the signal amplifying device (10) to achieve amplified oscillation of signal transduction, preventing signal degradation caused by excessive speed line jump; employing the signal display and recording apparatus (11) to achieve the display and recording of detection signal. 2
2. The wide-band atomic scanning analyzer according to claim 1, wherein the first light source device (1) comprises an ion beam electrode, the electrode material is a palladium-rhodium oxide alloy composite materials.
3. The wide-band atomic scanning analyzer according to claim 1, wherein the second light source device (2) comprises a high voltage beam electrode, the electrode material is erbium-nobelium carbide alloy composite materials.
4. The wide-band atomic scanning analyzer according to claim 1, wherein the light beam reflecting device (3) contains enneagon prismatic reflective lens, the reflective lens surface is covered with three layers of tantalum-yttrium hexaphosphate nanocomposite reflective film, which has a thickness of 1.5um.
5. The wide-band atomic scanning analyzer according to claim 1, wherein the spectral separation device (4) contains hexagonal cylindrical lens, five-hole slit diffraction and double concave lens; the three straight along the beam propagation direction are arranged alternately; wherein hexagonal cylindrical lens is at the front, five-hole slit diffraction is located in the middle, double concave lens is at the rear.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2014101225A AU2014101225A4 (en) | 2014-10-04 | 2014-10-04 | wide-band atomic scanning analyzer |
GB201423247A GB201423247D0 (en) | 2014-05-29 | 2014-12-29 | Atoms scanning device with wide spectrum |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2014101225A AU2014101225A4 (en) | 2014-10-04 | 2014-10-04 | wide-band atomic scanning analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2014101225A4 true AU2014101225A4 (en) | 2014-11-06 |
Family
ID=51844450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2014101225A Ceased AU2014101225A4 (en) | 2014-05-29 | 2014-10-04 | wide-band atomic scanning analyzer |
Country Status (1)
Country | Link |
---|---|
AU (1) | AU2014101225A4 (en) |
-
2014
- 2014-10-04 AU AU2014101225A patent/AU2014101225A4/en not_active Ceased
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101545419B1 (en) | Device for detecting foreign matter and method for detecting foreign matter | |
CN105738314B (en) | A kind of portable Terahertz spectrum detection device and detection method | |
JP2011127950A (en) | Liquid thin-film forming device | |
CN102213682B (en) | Method for measuring transmission of interference-insensitive terahertz wave | |
CN103323478A (en) | Total reflection X-ray fluorescence spectrometer | |
CN103278472A (en) | Fourier infrared spectrometer and sample gas absorption cell | |
JP2019015616A (en) | Fourier transform infrared spectrophotometer | |
Loh et al. | A tabletop femtosecond time-resolved soft x-ray transient absorption spectrometer | |
Fuchs et al. | Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources | |
Voronov et al. | Glow discharge imaging spectroscopy with a novel acousto-optical imaging spectrometer | |
AU2014101225A4 (en) | wide-band atomic scanning analyzer | |
CN104502067A (en) | Relative diffraction efficiency tester for Fourier transformation plane grating | |
JP2017211293A (en) | Image acquisition device and film thickness measurement method | |
WO2015163792A1 (en) | Device for the x-ray fluorescence analysis of materials with the formation of an excitation beam by a planar x-ray waveguide-resonator | |
JP2004138499A (en) | Gas concentration detection sensor | |
US10082456B2 (en) | Photothermal conversion spectroscopic analyzer | |
JP2011196766A (en) | Method for measuring shape of measured object having light transmittance | |
JP6782849B2 (en) | Spectroscopy device | |
RU2672036C1 (en) | Method of measuring the thickness of coating in the process of plasma-electrolytic oxidation and the device for its implementation | |
RU2671150C1 (en) | Method for forming defects in volume of dielectric sample with laser radiation | |
CN106353262B (en) | Atomic absorption measurement method and measuring device | |
CN103712692A (en) | Spectrograph and working method | |
CN111290011B (en) | Calibration method, device and equipment for ray detection and storage medium | |
CN108572186B (en) | Semiconductor transient X-ray nonlinear optical effect testing device and testing method thereof | |
JP2011164043A (en) | X-ray apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FGI | Letters patent sealed or granted (innovation patent) | ||
MK22 | Patent ceased section 143a(d), or expired - non payment of renewal fee or expiry |