AU2003292462A8 - Electronic device and use thereof - Google Patents

Electronic device and use thereof

Info

Publication number
AU2003292462A8
AU2003292462A8 AU2003292462A AU2003292462A AU2003292462A8 AU 2003292462 A8 AU2003292462 A8 AU 2003292462A8 AU 2003292462 A AU2003292462 A AU 2003292462A AU 2003292462 A AU2003292462 A AU 2003292462A AU 2003292462 A8 AU2003292462 A8 AU 2003292462A8
Authority
AU
Australia
Prior art keywords
electronic device
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003292462A
Other versions
AU2003292462A1 (en
Inventor
Mihai D Rotaru
Johannus W Weekamp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Agency for Science Technology and Research Singapore
Original Assignee
Koninklijke Philips Electronics NV
Agency for Science Technology and Research Singapore
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV, Agency for Science Technology and Research Singapore filed Critical Koninklijke Philips Electronics NV
Publication of AU2003292462A1 publication Critical patent/AU2003292462A1/en
Publication of AU2003292462A8 publication Critical patent/AU2003292462A8/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64—Impedance arrangements
    • H01L23/66—High-frequency adaptations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49503—Lead-frames or other flat leads characterised by the die pad
    • H01L23/4951—Chip-on-leads or leads-on-chip techniques, i.e. inner lead fingers being used as die pad
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49541—Geometry of the lead-frame
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3025—Electromagnetic shielding
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49169—Assembling electrical component directly to terminal or elongated conductor
    • Y10T29/49171—Assembling electrical component directly to terminal or elongated conductor with encapsulating

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
AU2003292462A 2002-12-23 2003-12-22 Electronic device and use thereof Abandoned AU2003292462A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP02080670 2002-12-23
EP02080670.9 2002-12-23
PCT/IB2003/006109 WO2004057673A1 (en) 2002-12-23 2003-12-22 Electronic device and use thereof

Publications (2)

Publication Number Publication Date
AU2003292462A1 AU2003292462A1 (en) 2004-07-14
AU2003292462A8 true AU2003292462A8 (en) 2004-07-14

Family

ID=32668882

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003292462A Abandoned AU2003292462A1 (en) 2002-12-23 2003-12-22 Electronic device and use thereof

Country Status (7)

Country Link
US (1) US7348680B2 (en)
EP (1) EP1579505A1 (en)
JP (1) JP4653493B2 (en)
KR (1) KR101083099B1 (en)
CN (1) CN100468726C (en)
AU (1) AU2003292462A1 (en)
WO (1) WO2004057673A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI398022B (en) * 2010-03-17 2013-06-01 Univ Nat Chunghsing Separation method of epitaxial substrate of photovoltaic element
JP6544981B2 (en) * 2015-04-20 2019-07-17 ローム株式会社 Printed wiring board
US9985040B2 (en) * 2016-01-14 2018-05-29 Micron Technology, Inc. Integrated circuitry and 3D memory
TWI733454B (en) * 2020-05-18 2021-07-11 矽品精密工業股份有限公司 Electronic device, electronic package, and package substrate thereof
CN118116883A (en) * 2024-04-30 2024-05-31 深圳市科敏传感器有限公司 Sensor packaging structure

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4034399A (en) * 1976-02-27 1977-07-05 Rca Corporation Interconnection means for an array of majority carrier microwave devices
JPS5338974A (en) * 1976-09-22 1978-04-10 Hitachi Ltd Manufacture of semiconductor device
JPS56162858A (en) * 1980-05-20 1981-12-15 Nec Corp Semiconductor device
US4641418A (en) * 1982-08-30 1987-02-10 International Rectifier Corporation Molding process for semiconductor devices and lead frame structure therefor
US4987562A (en) * 1987-08-28 1991-01-22 Fujitsu Limited Semiconductor layer structure having an aluminum-silicon alloy layer
DE3842863A1 (en) * 1988-12-20 1990-06-21 Fraunhofer Ges Forschung FIELD EFFECT TRANSISTOR AND METHOD FOR PRODUCING A FIELD EFFECT TRANSISTOR
JPH03205853A (en) * 1990-01-06 1991-09-09 Fujitsu Ltd Semiconductor integrated circuit
JPH06291448A (en) * 1991-02-01 1994-10-18 Toshiba Corp Circuit pattern forming method by direct joining copper
JPH0684915A (en) * 1992-08-31 1994-03-25 Kawasaki Steel Corp Semiconductor integrated circuit
US5406120A (en) * 1992-10-20 1995-04-11 Jones; Robert M. Hermetically sealed semiconductor ceramic package
JPH0786460A (en) * 1993-09-17 1995-03-31 Toshiba Corp Semiconductor device
US6271579B1 (en) * 1993-10-08 2001-08-07 Stratedge Corporation High-frequency passband microelectronics package
US6232563B1 (en) * 1995-11-25 2001-05-15 Lg Electronics Inc. Bump electrode and method for fabricating the same
JPH09213838A (en) 1996-01-31 1997-08-15 Sumitomo Electric Ind Ltd Terminal of semiconductor receptacle and semiconductor airtightly sealed receptacle
JP3189691B2 (en) * 1996-07-10 2001-07-16 株式会社村田製作所 High frequency semiconductor devices
US6166436A (en) * 1997-04-16 2000-12-26 Matsushita Electric Industrial Co., Ltd. High frequency semiconductor device
US6038133A (en) * 1997-11-25 2000-03-14 Matsushita Electric Industrial Co., Ltd. Circuit component built-in module and method for producing the same
JP4606685B2 (en) * 1997-11-25 2011-01-05 パナソニック株式会社 Module with built-in circuit components
JP2001308226A (en) * 2000-04-24 2001-11-02 Nec Corp Semiconductor device
DE10031657A1 (en) 2000-06-29 2002-01-24 Siemens Ag High-frequency component
US6683380B2 (en) * 2000-07-07 2004-01-27 Texas Instruments Incorporated Integrated circuit with bonding layer over active circuitry
EP1435112A2 (en) * 2001-06-19 2004-07-07 Koninklijke Philips Electronics N.V. Method of manufacturing a semiconductor device and semiconductor device

Also Published As

Publication number Publication date
JP2006511937A (en) 2006-04-06
EP1579505A1 (en) 2005-09-28
AU2003292462A1 (en) 2004-07-14
US7348680B2 (en) 2008-03-25
KR101083099B1 (en) 2011-11-16
CN1729570A (en) 2006-02-01
CN100468726C (en) 2009-03-11
JP4653493B2 (en) 2011-03-16
WO2004057673A1 (en) 2004-07-08
KR20060031592A (en) 2006-04-12
US20060202337A1 (en) 2006-09-14

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Legal Events

Date Code Title Description
TH Corrigenda

Free format text: IN VOL 18, NO 32, PAGE(S) 8383 UNDER THE HEADING APPLICATIONS OPI - NAME INDEX UNDER THE NAME KONINKLIJKE PHILIPS ELECTRONICS N.V., APPLICATION NO. 2003292462, UNDER INID (71) CORRECT THE NAME TO READ AGENCY FOR SCIENCE, TECHNOLOGY AND REASEARCH; KONINKLIJKE PHILIPS ELECTRONICS N.V.

MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase