AU2003280637A1 - Optical lighting system, test device for solid-state imaging device, repeater - Google Patents

Optical lighting system, test device for solid-state imaging device, repeater

Info

Publication number
AU2003280637A1
AU2003280637A1 AU2003280637A AU2003280637A AU2003280637A1 AU 2003280637 A1 AU2003280637 A1 AU 2003280637A1 AU 2003280637 A AU2003280637 A AU 2003280637A AU 2003280637 A AU2003280637 A AU 2003280637A AU 2003280637 A1 AU2003280637 A1 AU 2003280637A1
Authority
AU
Australia
Prior art keywords
repeater
solid
state imaging
lighting system
optical lighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003280637A
Other versions
AU2003280637A8 (en
Inventor
Shingo Tamai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inter Action KK
Original Assignee
Inter Action KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inter Action KK filed Critical Inter Action KK
Publication of AU2003280637A1 publication Critical patent/AU2003280637A1/en
Publication of AU2003280637A8 publication Critical patent/AU2003280637A8/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
AU2003280637A 2002-10-31 2003-10-30 Optical lighting system, test device for solid-state imaging device, repeater Abandoned AU2003280637A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002-317731 2002-10-31
JP2002317731 2002-10-31
PCT/JP2003/013915 WO2004040266A1 (en) 2002-10-31 2003-10-30 Optical lighting system, test device for solid-state imaging device, repeater

Publications (2)

Publication Number Publication Date
AU2003280637A1 true AU2003280637A1 (en) 2004-05-25
AU2003280637A8 AU2003280637A8 (en) 2004-05-25

Family

ID=32211733

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003280637A Abandoned AU2003280637A1 (en) 2002-10-31 2003-10-30 Optical lighting system, test device for solid-state imaging device, repeater

Country Status (3)

Country Link
AU (1) AU2003280637A1 (en)
TW (1) TW200409987A (en)
WO (1) WO2004040266A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100649011B1 (en) * 2004-12-30 2006-11-27 동부일렉트로닉스 주식회사 Image sensor using the optic fiber
TWI399528B (en) * 2007-09-21 2013-06-21 Hon Hai Prec Ind Co Ltd Holding apparatus for spectrum measurement
CN107727664B (en) * 2017-11-30 2021-04-13 四川恒匀通科技有限公司 Metal plate visual detection acquisition terminal and method
CN108871570A (en) * 2018-09-21 2018-11-23 苏州华兴源创科技股份有限公司 A kind of optic probe
CN109799235A (en) * 2019-03-12 2019-05-24 中国工程物理研究院激光聚变研究中心 Imaging device and imaging method
CN112748558A (en) * 2020-12-31 2021-05-04 中国科学院西安光学精密机械研究所 Wide-spectrum large-dynamic-range optical system and test calibration method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000292310A (en) * 1999-04-08 2000-10-20 Sony Corp Inspection device and its method
JP2002008405A (en) * 2000-06-21 2002-01-11 Moritex Corp Lighting equipment and lighting optical system
JP2002214072A (en) * 2001-01-15 2002-07-31 Nikon Corp Light irradiation device and inspection device using the same

Also Published As

Publication number Publication date
WO2004040266A8 (en) 2005-03-10
AU2003280637A8 (en) 2004-05-25
TW200409987A (en) 2004-06-16
WO2004040266A1 (en) 2004-05-13

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase