TWI399528B - Holding apparatus for spectrum measurement - Google Patents
Holding apparatus for spectrum measurement Download PDFInfo
- Publication number
- TWI399528B TWI399528B TW96135466A TW96135466A TWI399528B TW I399528 B TWI399528 B TW I399528B TW 96135466 A TW96135466 A TW 96135466A TW 96135466 A TW96135466 A TW 96135466A TW I399528 B TWI399528 B TW I399528B
- Authority
- TW
- Taiwan
- Prior art keywords
- hole
- plate
- light
- light transmission
- toothed
- Prior art date
Links
Landscapes
- Spectrometry And Color Measurement (AREA)
Description
本發明涉及一種光譜量測治具。 The invention relates to a spectrometric measuring fixture.
現代光學膜片於各個領域都具有舉足輕重之應用，如紅外截止濾光片(IR-Cut Filter)等，用於手機攝像頭、數碼相機、數碼攝像機、電腦攝像頭、安防監控器(CCTV)攝像頭、可視電話、可視門鈴等CCD(Charge Coupled Device，電荷耦合裝置)數碼成像系統或者CMOS(Complementary Metal Oxide Semiconductor，互補金屬氧化物半導體)數碼成像系統，能夠有效改善紅外線對CCD/CMOS成像之影響，防止CCD/CMOS圖像感測器產生偽色和波紋，提高彩色CCD、CMOS圖像感測器有效解析度和彩色還原性，請一併參閱Tanaka,T.等人於1990年IEEE上發表之論文HDTV single-chip CCD color camera,Consumer Electronics,IEEE Transactions on Volume 36,Issue 3,Aug 1990 Page(s)：479-485。紅外截止濾光片之光學性能體現於對特定波長如紅外波長光線之穿透率上，因此，於現代工業生產和製造過程中對紅外截止濾光片等光學膜片進行諸如穿透率量測之類之光譜量測係一項必須且十分重要之程式。 Modern optical films are used in a variety of applications, such as IR-Cut Filters, for mobile phone cameras, digital cameras, digital video cameras, computer cameras, security surveillance (CCTV) cameras, and video. A CCD (Charge Coupled Device) digital imaging system such as a telephone or a video doorbell or a CMOS (Complementary Metal Oxide Semiconductor) digital imaging system can effectively improve the influence of infrared rays on CCD/CMOS imaging and prevent CCD / CMOS image sensors generate false colors and ripples to improve the resolution and color reproduction of color CCD, CMOS image sensors, please refer to the paper HDTV published by Tanaka, T. et al. in 1990. Single-chip CCD color camera, Consumer Electronics, IEEE Transactions on Volume 36, Issue 3, Aug 1990 Page(s): 479-485. The optical performance of the infrared cut filter is reflected in the transmittance of light of a specific wavelength such as infrared wavelength. Therefore, optical transmittance such as infrared cut filter is measured in modern industrial production and manufacturing processes such as transmittance measurement. Spectral measurement is a necessary and important program.
先前技術一般以光譜量測儀對光學膜片進行光譜量測，例如對紅外截止濾光片之設定波長範圍光之穿透率之量測。一般將未切割玻璃母片固定於治具上，對玻璃母片進行選點量測，最後將量測後之玻璃母片進行切割、滾圓得到產品。使用該治具進行先量測後切割滾圓得到產品之做法，無法對產品之品質和性能進行準確有效之控制，量測之準確率較低，因此，為了提高對產品品質量測之準確率，有必要直接對產品進行量測，但係不同批次之產品尺寸規格有差別，而一般治具具有固定之收容孔，當對小尺寸產品進行量測時，尺寸不合會造成準確率降低，而且容易於光學膜片邊緣部分發生漏光之現象，造成量測上之誤差。鑒於此，有必要提供一種光譜量測之治具，可解決以上該所有缺點，適用於不同尺寸產品之量測，並且消除量測時邊緣漏光現象，從而提高量測準確率。 In the prior art, the optical film was generally spectrally measured by a spectrometer, for example, the measurement of the transmittance of the light in the set wavelength range of the infrared cut filter. Generally, the uncut glass master is fixed on the jig, and the glass master is subjected to spot measurement. Finally, the measured glass master is cut and spheronized to obtain a product. The use of the jig for the first measurement and the cutting and rounding to obtain the product can not accurately and effectively control the quality and performance of the product, and the accuracy of the measurement is low. Therefore, in order to improve the accuracy of the product quality measurement, It is necessary to directly measure the product, but there are differences in the product size specifications of different batches, and the general fixture has a fixed receiving hole. When measuring small-sized products, the size difference may cause the accuracy to decrease, and It is easy to leak light at the edge of the optical film, causing errors in measurement. In view of this, it is necessary to provide a spectrometer for measuring the spectrum, which can solve all the above disadvantages, is suitable for measurement of products of different sizes, and eliminates edge leakage phenomenon during measurement, thereby improving measurement accuracy.
本發明提供一種光譜量測治具，用於將光學膜片置於該光譜量測治具中進行光譜量測，其包括：一固定板、一置放板和一光通量遮板。該固定板中心具有一第一透光孔。該置放板圓周具有複數個圓形且直徑各不相同之收容孔，該收容孔具有一收容部和一第二透光孔，該收容部與該第二透光孔相互連通且共軸設置，且該第二透光孔孔徑略小於該收容部之直徑。該光通量遮板，其具有複數個與該收容孔相同數量之圓形第三透光孔，該複數個第三透光孔與該複數個收容孔一一對應，且該每個該複數個第三透光孔孔徑分別略小於其相對 應之該收容孔之收容部之直徑。該固定板分別與該置放板和光通量遮板連接，該光通量遮板設置於該固定板與置放板之間，且該置放板收容孔之收容部與該光通量遮板相鄰。 The invention provides a spectrometric measuring tool for placing an optical film in the spectrometric measuring tool for spectral measurement, comprising: a fixing plate, a placing plate and a luminous flux shielding plate. The center of the fixing plate has a first light transmission hole. The receiving plate has a plurality of receiving holes having a circular shape and different diameters. The receiving hole has a receiving portion and a second light transmitting hole. The receiving portion and the second light transmitting hole communicate with each other and are coaxially arranged. And the aperture of the second light transmission hole is slightly smaller than the diameter of the receiving portion. The light flux shielding plate has a plurality of circular third light transmission holes of the same number as the receiving holes, and the plurality of third light transmission holes are in one-to-one correspondence with the plurality of receiving holes, and each of the plurality of first holes The three transparent apertures are slightly smaller than their relative apertures The diameter of the receiving portion of the receiving hole. The fixing plate is respectively connected to the placing plate and the luminous flux shielding plate. The luminous flux shielding plate is disposed between the fixing plate and the placing plate, and the receiving portion of the receiving plate receiving hole is adjacent to the luminous flux shielding plate.
旋轉該置放板，使得該第一透光孔能夠選擇性地與任意一該複數個收容孔及第二透光孔對準。旋轉該光通量遮板，使得該第一透光孔能夠選擇性地與任意一該第三透光孔對準。 The placement plate is rotated such that the first light transmission hole can be selectively aligned with any one of the plurality of receiving holes and the second light transmission hole. The light flux shielding plate is rotated such that the first light transmission hole can be selectively aligned with any one of the third light transmission holes.
該光譜量測治具，於實際使用過程中，要根據該光學膜片尺寸規格，來設計該收容孔之直徑，使得該光學膜片，恰好能夠放置於其中一該收容孔內，且能夠完全蓋住該其中一該第二透光孔。調整該置放板和光通量置板，使得該第一透光孔、該其中一該複數個收容孔及其第二透光孔，以及與該其中一收容孔相對應之第三透光孔，四者孔心對準，使得該光學膜片能夠完全蓋住該與該其中一收容孔相對應之第三透光孔。 In the actual measurement process, the diameter of the receiving hole is designed according to the optical film size specification, so that the optical film can be placed in one of the receiving holes, and can be completely Covering one of the second light transmission holes. Adjusting the placement plate and the light flux plate, the first light transmission hole, the one of the plurality of receiving holes and the second light transmission hole thereof, and the third light transmission hole corresponding to the one of the receiving holes, The four holes are aligned so that the optical film can completely cover the third light-transmissive hole corresponding to one of the receiving holes.
以及，一種採用上述之光譜量測治具進行光譜量測之方法，其包括以下步驟：(1)提供一該光譜量測治具，將一片待進行光譜量測之光學膜片放置於該置放板之一合適收容孔內，且能夠完全蓋住該合適收容孔之第二透光孔；(2)調整該置放板和光通量置板，使得該第一透光孔、該合適收容孔及其第二透光孔，以及與該合適收容孔相對應之第三透光孔，四者孔心對準，使得該光學膜片能夠完全蓋住該 合適收容孔相對應之第三透光孔；(3)將該光譜量測治具放入量測環境中，量測光線從該固定板之與該置放板和該光通量遮板相對之一側入射，且依次穿過第一透光孔、第三透光孔，到達該合適收容孔，再經光學膜片作用，作用後之光線繼續穿過該第二透光孔，達到量測端。 And a method for performing spectral measurement using the above-mentioned spectral measuring fixture, comprising the following steps: (1) providing a spectral measuring fixture, and placing an optical film to be subjected to spectral measurement in the set One of the release plates is adapted to receive the hole, and can completely cover the second light-transmission hole of the suitable receiving hole; (2) adjusting the placement plate and the light flux plate, so that the first light-transmission hole and the suitable receiving hole And a second light transmission hole thereof, and a third light transmission hole corresponding to the suitable receiving hole, wherein the four holes are aligned, so that the optical film can completely cover the hole a third light-transmissive hole corresponding to the receiving hole; (3) placing the spectral measuring jig into a measuring environment, and measuring light from the fixing plate opposite to the placing plate and the light flux shielding plate Side incident, and sequentially passing through the first light-transmissive hole and the third light-transmitting hole, reaching the appropriate receiving hole, and then passing through the optical film, the applied light continues to pass through the second light-transmitting hole to reach the measuring end .
相對於先前技術，該光譜量測治具及其使用該光譜量測治具進行光譜量測之方法，係對產品進行光譜量測，提高量測之準確率，且，針對不同尺寸規格之產品，尤其係光學膜片，可調整治具選擇合適之收容孔，消除因產品尺寸與治具尺寸相差太大造成之測量不準確或者係漏光現象，而且，本發明還提供一該光通量遮板，進一步消除測量中容易發生之漏光現象，進一步提高測量準確度。 Compared with the prior art, the spectrometer and the method for performing spectrometry using the spectrometer are performing spectral measurement on the product, improving the accuracy of the measurement, and the products for different sizes and specifications. In particular, the optical film can be adjusted, and the appropriate receiving hole can be selected to eliminate the inaccurate measurement or light leakage caused by the difference between the product size and the size of the jig. Moreover, the present invention also provides a luminous flux shielding plate. Further eliminate the light leakage phenomenon that is easy to occur in the measurement, and further improve the measurement accuracy.
10，40‧‧‧光譜量測治具 10,40‧‧‧Spectrum measuring fixture
121‧‧‧收容部 121‧‧‧ Housing Department
11‧‧‧固定板 11‧‧‧ fixed plate
122‧‧‧第二透光孔 122‧‧‧second light transmission hole
12‧‧‧置放板 12‧‧‧Place board
123‧‧‧第一齒狀孔 123‧‧‧First toothed hole
13‧‧‧光通量遮板 13‧‧‧Light flux shutter
131‧‧‧第三透光孔 131‧‧‧The third light transmission hole
14‧‧‧第一旋鈕 14‧‧‧First knob
132‧‧‧第二齒狀孔 132‧‧‧Second toothed hole
15‧‧‧第二旋鈕 15‧‧‧second knob
120‧‧‧收容孔 120‧‧‧ receiving holes
20‧‧‧光學膜片 20‧‧‧Optical diaphragm
111‧‧‧第一透光孔 111‧‧‧First light transmission hole
114‧‧‧第一固定孔 114‧‧‧First fixing hole
115‧‧‧第二固定孔 115‧‧‧Second fixing hole
圖1係本發明第一實施例提供之一種光譜量測治具之部件分離圖。 1 is a component separation diagram of a spectral measuring fixture according to a first embodiment of the present invention.
圖2係本發明第二實施例提供之一種光譜量測治具之部件分離圖。 2 is a component separation diagram of a spectrometric measuring tool according to a second embodiment of the present invention.
圖3係圖2所示光譜量測治具之立體圖。 Figure 3 is a perspective view of the spectral measuring fixture shown in Figure 2.
圖4係圖3所示光譜量測治具之側視圖。 Figure 4 is a side elevational view of the spectral measurement fixture of Figure 3.
圖5係圖3所示治具進行光譜量測之示意圖。 Fig. 5 is a schematic view showing the spectrometry of the jig shown in Fig. 3.
下面將結合圖式對本發明作進一步之詳細說明。 The invention will now be further described in detail in conjunction with the drawings.
請一併參閱圖1，本發明所提供第一實施例之光譜量測治具40，其包括一固定板11和一圓形之置放板12。該固定板11中心具有一第一透光孔111，該圓形之置放板12圓周具有複數個圓形且直徑各不相同之收容孔120，每個該收容孔120一收容部121和一第二透光孔122，該收容部121與該第二透光孔122相互連通且共軸設置，具有呈階梯狀設置之收容部121及第二透光孔122，且該第二透光孔122孔徑略小於該收容部121之直徑，該複數個收容孔120到該圓形置放板12之圓心距離相同。 Referring to FIG. 1 together, the spectral measuring fixture 40 of the first embodiment of the present invention comprises a fixing plate 11 and a circular placing plate 12. The center of the fixing plate 11 has a first light-transmissive hole 111. The circular receiving plate 12 has a plurality of receiving holes 120 having circular shapes and different diameters. Each of the receiving holes 120 has a receiving portion 121 and a receiving portion. The second light transmission hole 122, the accommodating portion 121 and the second light transmission hole 122 communicate with each other and are coaxially disposed, and have a receiving portion 121 and a second light transmission hole 122 which are arranged in a stepped manner, and the second light transmission hole The aperture of the receiving portion 121 is slightly smaller than the diameter of the receiving portion 121. The distance between the plurality of receiving holes 120 and the center of the circular placing plate 12 is the same.
該光譜量測治具40進一步包括一長條狀之第一旋鈕14，其具有一齒狀端部，該圓形置放板12圓心具有一第一齒狀孔123，該固定板11具有一第一固定孔114，具體地，該第一固定孔114到該固定板中心之第一透光孔111之距離與該複數個收容孔120到該圓形置放板12之圓心距離相等，該第一旋鈕14穿過該第一固定孔114，該第一旋鈕之齒狀端部與該第一齒狀孔123機械嚙合。 The spectral measuring fixture 40 further includes a long first knob 14 having a toothed end, the circular placing plate 12 having a first toothed hole 123 at the center of the circular plate, the fixing plate 11 having a The first fixing hole 114, specifically, the distance from the first fixing hole 114 to the first light transmitting hole 111 at the center of the fixing plate is equal to the distance from the center of the plurality of receiving holes 120 to the circular placing plate 12, The first knob 14 passes through the first fixing hole 114, and the toothed end of the first knob is mechanically engaged with the first toothed hole 123.
旋轉第一旋鈕14，可調整該固定板11和置放板12之位置關係，具體地，可調整使得，該固定板11上之第一透光孔111之孔心選擇性地與該置放板12上之任意一該複數個收容孔120之孔心對準。該光譜量測治具40，於實際使用中，將該置放板12上放置有一光學膜片之收容部121之圓心與該第一透光孔111之孔心對準。 The first knob 14 is rotated to adjust the positional relationship between the fixing plate 11 and the placing plate 12, and specifically, the hole of the first light transmission hole 111 on the fixing plate 11 is selectively disposed. The holes of any one of the plurality of receiving holes 120 on the plate 12 are aligned. In the actual use, the center of the accommodating portion 121 on which the optical film is placed is aligned with the center of the first light-transmissive hole 111.
請一併參閱圖2，本發明所提供第二實施例之光譜量測治具10，其與第一實施例提供之光譜量測治具40之不同於於，其進一步包括一圓形之光通量遮板13和一第二旋鈕15，且其固定板11進一步具有一第二固定孔115。該圓形之光通量遮板13設置於該固定板11與圓形置放板12之間，且該置放板12之複數個收容孔120之收容部121與該光通量遮板13相鄰。 Referring to FIG. 2 together, the spectral measuring fixture 10 of the second embodiment of the present invention is different from the spectral measuring fixture 40 provided by the first embodiment, and further includes a circular luminous flux. The shutter 13 and a second knob 15 and the fixing plate 11 further have a second fixing hole 115. The circular light flux shielding plate 13 is disposed between the fixing plate 11 and the circular placing plate 12, and the receiving portion 121 of the plurality of receiving holes 120 of the placing plate 12 is adjacent to the light flux shielding plate 13.
該光通量遮板13，其具有複數個與該收容孔120相同數量之圓形之第三透光孔131，該複數個第三透光孔131與該複數個圓形收容部121一一對應，且該每個該複數個第三透光孔131孔徑分別略小於與其相對應之該收容部121之直徑，該複數個第三透光孔131孔心到該圓形之光通量遮板13之圓心距離相同。 The light flux shielding plate 13 has a plurality of circular transparent holes 131 of the same number as the receiving holes 120, and the plurality of third light transmitting holes 131 are in one-to-one correspondence with the plurality of circular receiving portions 121. The apertures of the plurality of third transparent holes 131 are slightly smaller than the diameters of the corresponding receiving portions 121, and the plurality of third transparent holes 131 are centered on the center of the circular light flux shielding plate 13 The distance is the same.
請一併參閱圖3和圖4，該複數個第三透光孔孔徑131都小於該第一透光孔111之孔徑。 Referring to FIG. 3 and FIG. 4 together, the plurality of third light transmission apertures 131 are smaller than the aperture of the first light transmission hole 111.
請繼續參閱圖4，該光通量遮板13與該固定板11連接。具體地，該第二固定孔115到該固定板中心之第一透光孔111之距離與該複數個第三透光孔131到該圓形光通量遮板13圓心距離相等，該第二旋鈕15穿過該第二固定孔115，其一齒狀端部與該第二齒狀孔132機械嚙合。 Referring to FIG. 4, the luminous flux shutter 13 is connected to the fixing plate 11. Specifically, the distance between the second fixing hole 115 and the first light transmission hole 111 at the center of the fixing plate is equal to the center distance of the plurality of third light transmission holes 131 to the circular light flux shielding plate 13. The second knob 15 is Through the second fixing hole 115, a toothed end portion thereof mechanically meshes with the second toothed hole 132.
旋轉第一旋鈕14、第二旋鈕15，可調整該固定板11、置放板12和光通量遮板13之位置關係，具體地，可調整使得，該固定板11上之第一透光孔111之孔心選擇性地與該置放板12上 之任意一該複數個收容孔120之孔心及其對應之一該光通量遮板13上之複數個第三透光孔131之孔心對準。該光譜量測治具10，於實際使用中，將該置放板12上放置有一光學膜片之收容部121之圓心及其對應之第三透光孔131之孔心，與該第一透光孔111之孔心對準。 The positional relationship between the fixing plate 11, the placing plate 12 and the light flux shielding plate 13 can be adjusted by rotating the first knob 14 and the second knob 15. Specifically, the first light transmission hole 111 on the fixing plate 11 can be adjusted. a hole core selectively associated with the placement plate 12 Any one of the plurality of receiving holes 120 and the corresponding one of the plurality of third light transmitting holes 131 on the luminous flux shielding plate 13 are aligned. In the actual use, the center of the receiving portion 121 of the optical film and the corresponding hole of the third light transmitting hole 131 are placed on the placing plate 12, and the first through hole is The holes of the light holes 111 are aligned.
下面詳細說明使用該光譜量測治具10進行光譜量測之方法。 A method of performing spectral measurement using the spectrometer 10 will be described in detail below.
請一併參閱圖5之使用本發明之光譜量測治具10對一光學膜片20進行光譜量測之示意圖。該第二透光孔122孔徑略小於該收容部121之直徑，使得每個該複數個收容孔120中具有一凸台(圖上未標示)，可容置該光學膜片20，且該第三透光孔131孔徑也略小於該收容部121之直徑，從而不會讓該光學膜片20從該第二透光孔122或者從該第三透光孔131脫落出去。量測光線30從固定板11與置放板12相對之一側發出，依次穿過第一透光孔111、第三透光孔131，到達光學膜片20，再經該光學膜片20作用，穿過該第二透光孔122到達光線量測端(圖上未標示)。 Please refer to FIG. 5 for a schematic diagram of spectral measurement of an optical film 20 using the spectral measuring fixture 10 of the present invention. The aperture of the second light-transmissive aperture 122 is slightly smaller than the diameter of the receiving portion 121, so that each of the plurality of receiving holes 120 has a boss (not shown), and the optical film 20 can be accommodated. The aperture of the three transparent holes 131 is also slightly smaller than the diameter of the receiving portion 121, so that the optical film 20 is not detached from the second light transmission hole 122 or the third light transmission hole 131. The measuring light 30 is emitted from one side of the fixing plate 11 and the placing plate 12, and sequentially passes through the first light transmitting hole 111 and the third light transmitting hole 131 to reach the optical film 20, and then acts through the optical film 20. Passing through the second light transmission hole 122 to reach the light measuring end (not shown).
具體地，於光譜量測前，將光學膜片20安裝到該收容部121之步驟為：第一步，取下該第一旋鈕14和第二旋鈕15，使得該固定板11、置放板12和光通量遮板13分離開來；第二步，根據光學膜片尺寸選擇其中一合適之收容部121，使得該光學膜片20能夠放入該合適之收容部121且能夠完全 蓋住該合適之收容孔120之第二透光孔122；第三步，按照如圖4所示位置關係安裝該固定板11、光通量遮板13和放置有光學膜片20之置放板12，該光通量遮板13位於該固定板11和置放板12之間，且保證第三透光孔131孔心與第二透光孔122孔心對準且該光學膜片30恰好能夠完全蓋住該第三透光孔131。 Specifically, before the spectral measurement, the step of mounting the optical film 20 to the receiving portion 121 is as follows: in the first step, the first knob 14 and the second knob 15 are removed, so that the fixing plate 11 and the placing plate are disposed. 12 and the light flux shutter 13 are separated; in the second step, one of the suitable receiving portions 121 is selected according to the optical film size, so that the optical film 20 can be placed in the suitable receiving portion 121 and can be completely The second light-transmissive hole 122 of the suitable receiving hole 120 is covered; in the third step, the fixing plate 11, the light flux shielding plate 13 and the placing plate 12 on which the optical film 20 is placed are mounted in a positional relationship as shown in FIG. The light flux shielding plate 13 is located between the fixing plate 11 and the placing plate 12, and ensures that the hole of the third light transmitting hole 131 is aligned with the hole of the second light transmitting hole 122 and the optical film 30 can be completely covered. The third light transmission hole 131 is housed.
下面詳細說明採用圖1至圖3提供之光譜量測治具10進行光譜量測之方法，其包括以下步驟：(1)提供一該光譜量測治具10，將一光學膜片20，放入該光譜量測治具10之一合適之收容孔120之收容部121內，該合適之收容孔120即係滿足下面條件，即該光學膜片20恰好能夠放置於該合適之收容孔120之收容部121內，且能夠完全蓋住該合適之收容孔120之第二透光孔122；(2)將該圓形光通量遮板13放置於該置放板12與該固定板11之間，且保證該合適之收容部121及其相對應之該光通量遮板上之第三透光孔131對準，同時，保證該合適之收容部121及其相對應之第三透光孔131與該第一透光孔111對準，且該光學膜片20恰好能夠完全蓋住與該合適收容部121對應之第三透光孔131；(3)將該光譜量測治具10放入量測環境中，量測光線30從該固定板11之與該置放板12和該光通量遮板13相對之一側入射，且依次穿過第一透光孔111、第三透光孔131，到達該放置 有光學膜片20之該合適之收容部121，再經光學膜片20作用，作用後之光線繼續穿過該合適之收容孔120之第二透光孔122，達到量測端。 The following is a detailed description of the method for performing spectral measurement using the spectral measuring fixture 10 provided in FIG. 1 to FIG. 3, which includes the following steps: (1) providing a spectral measuring fixture 10, placing an optical film 20 The accommodating portion 121 of the accommodating hole 120 is formed in the accommodating portion 121 of the accommodating hole 120. The accommodating hole 120 satisfies the condition that the optical film 20 can be placed in the appropriate receiving hole 120. The second light transmission hole 122 of the suitable receiving hole 120 can be completely covered in the accommodating portion 121; (2) the circular light flux shielding plate 13 is placed between the placing plate 12 and the fixing plate 11, And ensuring that the appropriate receiving portion 121 and the corresponding third light transmission hole 131 on the light flux shielding plate are aligned, and at the same time, securing the suitable receiving portion 121 and the corresponding third light transmitting hole 131 and the same The first light transmission hole 111 is aligned, and the optical film 20 can completely cover the third light transmission hole 131 corresponding to the suitable receiving portion 121; (3) the spectral measuring fixture 10 is placed in the measurement In the environment, the measuring light 30 is incident from one side of the fixing plate 11 opposite to the placing plate 12 and the luminous flux shutter 13 And passes through a first light transmitting hole 111, the third light transmission hole 131, reaches the place The accommodating portion 121 of the optical film 20 is further applied through the optical film 20, and the applied light continues to pass through the second light-transmissive hole 122 of the suitable receiving hole 120 to reach the measuring end.
相對於先前技術，該光譜量測治具及其使用該光譜量測治具進行光譜量測之方法，係對產品進行光譜量測，提高量測之準確率，且，針對不同尺寸規格之產品，尤其係光學膜片，可調整治具選擇合適之收容孔，消除因產品尺寸與治具尺寸相差太大造成之測量不準確或者係漏光現象，且，本發明還提供一該光通量遮板，其上之第三透光孔孔徑分別略小於該收容部和第一透光孔之直徑，進一步消除測量中容易發生之漏光現象，進一步提高測量準確度。 Compared with the prior art, the spectrometer and the method for performing spectrometry using the spectrometer are performing spectral measurement on the product, improving the accuracy of the measurement, and the products for different sizes and specifications. In particular, the optical film can be adjusted to select a suitable receiving hole to eliminate the inaccurate measurement or light leakage caused by the difference between the product size and the size of the jig, and the present invention also provides a luminous flux shielding plate. The diameter of the third transparent hole is slightly smaller than the diameter of the receiving portion and the first transparent hole, thereby further eliminating the light leakage phenomenon which is easy to occur in the measurement, and further improving the measurement accuracy.
本發明提供之光譜量測治具，適合用於對不同尺寸之光學膜片之光譜量測，且能夠消除光譜量測中容易產生之漏光現象。 The spectral measuring fixture provided by the invention is suitable for measuring the spectral measurement of optical films of different sizes, and can eliminate the light leakage phenomenon which is easily generated in the spectral measurement.
綜上所述，本發明確已符合發明專利之要件，遂依法提出專利申請。惟，以上所述者僅為本發明之較佳實施方式，自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化，皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
10‧‧‧光譜量測治具 10‧‧‧Spectrum measurement fixture
121‧‧‧收容部 121‧‧‧ Housing Department
11‧‧‧固定板 11‧‧‧ fixed plate
122‧‧‧第二透光孔 122‧‧‧second light transmission hole
12‧‧‧置放板 12‧‧‧Place board
123‧‧‧第一齒狀孔 123‧‧‧First toothed hole
13‧‧‧光通量遮板 13‧‧‧Light flux shutter
131‧‧‧第三透光孔 131‧‧‧The third light transmission hole
14‧‧‧第一旋鈕 14‧‧‧First knob
132‧‧‧第二齒狀孔 132‧‧‧Second toothed hole
15‧‧‧第二旋鈕 15‧‧‧second knob
120‧‧‧收容孔 120‧‧‧ receiving holes
111‧‧‧第一透光孔 111‧‧‧First light transmission hole
114‧‧‧第一固定孔 114‧‧‧First fixing hole
115‧‧‧第二固定孔 115‧‧‧Second fixing hole
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96135466A TWI399528B (en) | 2007-09-21 | 2007-09-21 | Holding apparatus for spectrum measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96135466A TWI399528B (en) | 2007-09-21 | 2007-09-21 | Holding apparatus for spectrum measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200914804A TW200914804A (en) | 2009-04-01 |
| TWI399528B true TWI399528B (en) | 2013-06-21 |
Family
ID=44725528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96135466A TWI399528B (en) | 2007-09-21 | 2007-09-21 | Holding apparatus for spectrum measurement |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI399528B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4541697A (en) * | 1981-03-03 | 1985-09-17 | Randwal Instrument Co., Inc. | Ophthalmic testing devices |
| TW200409987A (en) * | 2002-10-31 | 2004-06-16 | Inter Action Corp | Optical lighting device, test device for solid-state imaging device and repeater |
| EP0959437B1 (en) * | 1998-05-21 | 2005-01-12 | Asahi Seiko Co. Ltd. | Coin dispensing apparatus |
| TW200523581A (en) * | 2004-01-06 | 2005-07-16 | Prodisc Technology Inc | Assembly for balanced optical device |
-
2007
- 2007-09-21 TW TW96135466A patent/TWI399528B/en not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4541697A (en) * | 1981-03-03 | 1985-09-17 | Randwal Instrument Co., Inc. | Ophthalmic testing devices |
| EP0959437B1 (en) * | 1998-05-21 | 2005-01-12 | Asahi Seiko Co. Ltd. | Coin dispensing apparatus |
| TW200409987A (en) * | 2002-10-31 | 2004-06-16 | Inter Action Corp | Optical lighting device, test device for solid-state imaging device and repeater |
| TW200523581A (en) * | 2004-01-06 | 2005-07-16 | Prodisc Technology Inc | Assembly for balanced optical device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200914804A (en) | 2009-04-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10827106B2 (en) | Camera module | |
| CN101770060B (en) | Camera module and assembly method thereof | |
| US9417132B2 (en) | Multispectral imaging color measurement system and method for processing imaging signals thereof | |
| US7579577B2 (en) | Image capturing apparatus having a filter section disposed on periphery of a light passing section of a partial wavelength spectrum diaphragm section | |
| US20070211164A1 (en) | Imager module optical focus and assembly method | |
| US9316540B1 (en) | Compact spectrometer | |
| CN100545746C (en) | Optical look angle measuring systems and measuring method thereof | |
| JP2002320234A (en) | Apparatus for photoelectrically measuring two- dimensional object measured at each pixel | |
| JP2009164654A (en) | Compound eye camera module | |
| CN101387572A (en) | Spectrum measuring fixture | |
| TWI584643B (en) | Camera devices and systems based on a single imaging sensor and methods for manufacturing the same | |
| CN100370301C (en) | Digital camera lens mould set regulating method | |
| TWI399528B (en) | Holding apparatus for spectrum measurement | |
| US20180038732A1 (en) | Light detection device and electronic apparatus | |
| US20130229530A1 (en) | Spectral calibration of imaging devices | |
| WO2023185477A1 (en) | Thermal imaging module and electronic device | |
| KR20180012986A (en) | Method for producing iris for high-resolustion camera module of smart phone, iris for high-resolustion camera module of smart phone, and smart phone camera module having the same | |
| CN100580406C (en) | Apparatus for testing performance of optical low pass filter | |
| JP2005303520A (en) | Camera for calibration | |
| WO2022074047A1 (en) | Multi-spectral optical sensor and system | |
| WO2016050195A1 (en) | Light box, stereo test chart, and adjustment device and application thereof | |
| CN220380615U (en) | Imaging colorimeter | |
| CN209784211U (en) | Detection device | |
| CN212459386U (en) | Optical measuring instrument | |
| Büchtemann et al. | Advanced test station for imaging EO systems in the VIS to SWIR range |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |