AU2001290881A1 - Method of retrofitting a probe station - Google Patents

Method of retrofitting a probe station

Info

Publication number
AU2001290881A1
AU2001290881A1 AU2001290881A AU9088101A AU2001290881A1 AU 2001290881 A1 AU2001290881 A1 AU 2001290881A1 AU 2001290881 A AU2001290881 A AU 2001290881A AU 9088101 A AU9088101 A AU 9088101A AU 2001290881 A1 AU2001290881 A1 AU 2001290881A1
Authority
AU
Australia
Prior art keywords
retrofitting
probe station
probe
station
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001290881A
Inventor
James Orsillo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU2001290881A1 publication Critical patent/AU2001290881A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49716—Converting
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49718—Repairing
    • Y10T29/49721—Repairing with disassembling
    • Y10T29/49723—Repairing with disassembling including reconditioning of part
    • Y10T29/49725—Repairing with disassembling including reconditioning of part by shaping
    • Y10T29/49726—Removing material
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49718—Repairing
    • Y10T29/49732—Repairing by attaching repair preform, e.g., remaking, restoring, or patching
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49764—Method of mechanical manufacture with testing or indicating
    • Y10T29/49778—Method of mechanical manufacture with testing or indicating with aligning, guiding, or instruction
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49764—Method of mechanical manufacture with testing or indicating
    • Y10T29/49778—Method of mechanical manufacture with testing or indicating with aligning, guiding, or instruction
    • Y10T29/4978—Assisting assembly or disassembly
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49826—Assembling or joining
    • Y10T29/49947—Assembling or joining by applying separate fastener
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49998—Work holding
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/53983—Work-supported apparatus
AU2001290881A 2000-09-15 2001-09-14 Method of retrofitting a probe station Abandoned AU2001290881A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/662,735 US6408500B1 (en) 2000-09-15 2000-09-15 Method of retrofitting a probe station
US09662735 2000-09-15
PCT/US2001/028669 WO2002022303A1 (en) 2000-09-15 2001-09-14 Method of retrofitting a probe station

Publications (1)

Publication Number Publication Date
AU2001290881A1 true AU2001290881A1 (en) 2002-03-26

Family

ID=24658979

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001290881A Abandoned AU2001290881A1 (en) 2000-09-15 2001-09-14 Method of retrofitting a probe station

Country Status (8)

Country Link
US (4) US6408500B1 (en)
EP (1) EP1330333A4 (en)
JP (1) JP2004508735A (en)
CN (1) CN1457282A (en)
AU (1) AU2001290881A1 (en)
CA (1) CA2421641C (en)
TW (1) TWI232145B (en)
WO (1) WO2002022303A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7053646B2 (en) * 2000-09-15 2006-05-30 Orsillo James F Apparatus and method for use in testing a semiconductor wafer
US6408500B1 (en) * 2000-09-15 2002-06-25 James Orsillo Method of retrofitting a probe station
US6813817B2 (en) * 2000-09-15 2004-11-09 James Orsillo Method of using a replacement headplate to adapt a probe station
US20040020514A1 (en) * 2002-07-18 2004-02-05 Orsillo James E. Probe device cleaner and method
JP4548817B2 (en) * 2002-10-18 2010-09-22 東京エレクトロン株式会社 Probe device
JP2005265658A (en) * 2004-03-19 2005-09-29 Tokyo Electron Ltd Probe device adaptable to a plurality of types of testers
JP6488281B2 (en) * 2013-05-14 2019-03-20 フォームファクター， インコーポレイテッド Automatic installation and removal of replaceable probe head
CN114713533B (en) * 2022-06-02 2022-08-23 山东科技职业学院 Computer memory bank cleaning device
CN117047436B (en) * 2023-10-09 2024-01-05 武汉精毅通电子技术有限公司 Needle loading equipment and needle loading method for cantilever probe

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5149029A (en) * 1982-08-25 1992-09-22 Intest Corporation Electronic test head positioner for test systems
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4588346A (en) * 1982-08-25 1986-05-13 Intest Corporation Positioner for maintaining an object in a substantially weightless condition
JPH04364746A (en) 1991-06-12 1992-12-17 Tokyo Electron Yamanashi Kk Probe apparatus
US5241870A (en) * 1991-07-22 1993-09-07 Intest Corporation Test head manipulator
US5264787A (en) * 1991-08-30 1993-11-23 Hughes Aircraft Company Rigid-flex circuits with raised features as IC test probes
JPH05144892A (en) 1991-10-22 1993-06-11 Seiko Epson Corp Wafer prober
JP3219844B2 (en) 1992-06-01 2001-10-15 東京エレクトロン株式会社 Probe device
US5355079A (en) * 1993-01-07 1994-10-11 Wentworth Laboratories, Inc. Probe assembly for testing integrated circuit devices
US5440943A (en) * 1993-09-15 1995-08-15 Intest Corporation Electronic test head manipulator
US5974662A (en) 1993-11-16 1999-11-02 Formfactor, Inc. Method of planarizing tips of probe elements of a probe card assembly
KR100248569B1 (en) 1993-12-22 2000-03-15 히가시 데쓰로 Probe system
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
US5982182A (en) 1994-09-01 1999-11-09 Chiu; Michael A. Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
TW273635B (en) 1994-09-01 1996-04-01 Aesop
KR100213840B1 (en) * 1995-01-24 1999-08-02 오우라 히로시 Semiconductor tester
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5552701A (en) * 1995-05-15 1996-09-03 Hewlett-Packard Company Docking system for an electronic circuit tester
US5656942A (en) 1995-07-21 1997-08-12 Electroglas, Inc. Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane
US5647178A (en) * 1995-09-28 1997-07-15 Roger M. Cline Through-roof fittings
US5949244A (en) * 1996-01-03 1999-09-07 Miley; David M. Low tolerance probe card and probe ring systems
JP3302576B2 (en) * 1996-09-30 2002-07-15 アジレント・テクノロジー株式会社 Probe card with connector and DUT connection device
JP3364401B2 (en) * 1996-12-27 2003-01-08 東京エレクトロン株式会社 Probe card clamp mechanism and probe device
US6040700A (en) 1997-09-15 2000-03-21 Credence Systems Corporation Semiconductor tester system including test head supported by wafer prober frame
JPH11135218A (en) * 1997-10-31 1999-05-21 Nec Corp Electronic device inspecting apparatus
US6114869A (en) 1998-05-21 2000-09-05 Cerprobe Corporation Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards
US6166553A (en) * 1998-06-29 2000-12-26 Xandex, Inc. Prober-tester electrical interface for semiconductor test
US6252414B1 (en) * 1998-08-26 2001-06-26 International Business Machines Corporation Method and apparatus for testing circuits having different configurations with a single test fixture
US6433562B1 (en) * 1998-08-28 2002-08-13 International Business Machines Corporation Method and apparatus of interconnecting with a system board
US6271658B1 (en) 1998-10-19 2001-08-07 St Assembly Test Services Pte, Ltd. Universal Docking System
US6653853B1 (en) * 1999-07-06 2003-11-25 David Cheng Multiple test probe system and method
US6340895B1 (en) * 1999-07-14 2002-01-22 Aehr Test Systems, Inc. Wafer-level burn-in and test cartridge
US6407541B1 (en) * 1999-07-30 2002-06-18 Credence Systems Corporation Docking mechanism for semiconductor tester
JP2001056346A (en) * 1999-08-19 2001-02-27 Fujitsu Ltd Probe card and method for testing wafer on which a plurality of semiconductor device are formed
US6304092B1 (en) * 2000-01-28 2001-10-16 Credence Systems Corporation Self-aligning docking assembly for semiconductor tester
US6813817B2 (en) * 2000-09-15 2004-11-09 James Orsillo Method of using a replacement headplate to adapt a probe station
US6408500B1 (en) * 2000-09-15 2002-06-25 James Orsillo Method of retrofitting a probe station
US7053646B2 (en) * 2000-09-15 2006-05-30 Orsillo James F Apparatus and method for use in testing a semiconductor wafer
US6741072B2 (en) * 2000-09-15 2004-05-25 James E. Orsillo Docking system for connecting a tester to a probe station using an A-type docking configuration
DE10122049B4 (en) * 2001-05-07 2004-08-19 Heigl, Helmuth, Dr.-Ing. Device for locking two devices to be coupled to one another, in particular a test head and a test device
JP4084301B2 (en) * 2001-07-16 2008-04-30 インテスト コーポレイション System for docking an electronic test head with a handling device and method for docking an electronic test head with a handling device
DE10216003B4 (en) * 2002-04-11 2005-03-10 Multitest Elektronische Syst Docking device
JP4357813B2 (en) * 2002-08-23 2009-11-04 東京エレクトロン株式会社 Probe apparatus and probe method
US6876215B1 (en) * 2003-02-27 2005-04-05 Credence Systems Corporation Apparatus for testing semiconductor integrated circuit devices in wafer form
JP2005265658A (en) * 2004-03-19 2005-09-29 Tokyo Electron Ltd Probe device adaptable to a plurality of types of testers

Also Published As

Publication number Publication date
CA2421641C (en) 2007-01-09
US20050071974A1 (en) 2005-04-07
TWI232145B (en) 2005-05-11
US7389572B2 (en) 2008-06-24
US20030164717A1 (en) 2003-09-04
WO2002022303A1 (en) 2002-03-21
EP1330333A1 (en) 2003-07-30
EP1330333A4 (en) 2006-04-26
JP2004508735A (en) 2004-03-18
CN1457282A (en) 2003-11-19
US6408500B1 (en) 2002-06-25
US6839948B2 (en) 2005-01-11
US6925699B1 (en) 2005-08-09
CA2421641A1 (en) 2002-03-21

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