AU2001287701A1 - Measuring the wall thickness of an electrically conductive object - Google Patents

Measuring the wall thickness of an electrically conductive object

Info

Publication number
AU2001287701A1
AU2001287701A1 AU2001287701A AU8770101A AU2001287701A1 AU 2001287701 A1 AU2001287701 A1 AU 2001287701A1 AU 2001287701 A AU2001287701 A AU 2001287701A AU 8770101 A AU8770101 A AU 8770101A AU 2001287701 A1 AU2001287701 A1 AU 2001287701A1
Authority
AU
Australia
Prior art keywords
wall thickness
measuring
probe
electrically conductive
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001287701A
Inventor
Paulus Carolus Nicolaas Crouzen
Mark Theodoor Looijer
Johan Van Der Steen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shell Internationale Research Maatschappij BV
Original Assignee
Shell Internationale Research Maatschappij BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shell Internationale Research Maatschappij BV filed Critical Shell Internationale Research Maatschappij BV
Publication of AU2001287701A1 publication Critical patent/AU2001287701A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance

Abstract

Measuring the wall thickness of an electrically conductive object using a probe comprising a transmitter coil, a first receiver and a second receiver, which method comprises arranging the probe near the object; inducing transient eddy currents in the object and recording the signals of the receivers with time; measuring the wall thickness from a characteristic of one of the signals; calculating a characteristic value from a combination of the signals; and correcting the measured wall thickness for the distance between the probe and the object using a pre-determined relationship between the wall thickness and the characteristic value for different values of the distance between the probe and the object.
AU2001287701A 2000-08-24 2001-08-22 Measuring the wall thickness of an electrically conductive object Abandoned AU2001287701A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00307298 2000-08-24
EP00307298 2000-08-24
PCT/EP2001/009720 WO2002016863A1 (en) 2000-08-24 2001-08-22 Measuring the wall thickness of an electrically conductive object

Publications (1)

Publication Number Publication Date
AU2001287701A1 true AU2001287701A1 (en) 2002-03-04

Family

ID=8173218

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001287701A Abandoned AU2001287701A1 (en) 2000-08-24 2001-08-22 Measuring the wall thickness of an electrically conductive object

Country Status (11)

Country Link
US (1) US6593737B2 (en)
EP (1) EP1311800B1 (en)
JP (1) JP2004507721A (en)
CN (1) CN1447902A (en)
AT (1) ATE433092T1 (en)
AU (1) AU2001287701A1 (en)
CA (1) CA2420309A1 (en)
DE (1) DE60138891D1 (en)
NO (1) NO20030814L (en)
RU (1) RU2260172C2 (en)
WO (1) WO2002016863A1 (en)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6640151B1 (en) 1999-12-22 2003-10-28 Applied Materials, Inc. Multi-tool control system, method and medium
US6708074B1 (en) 2000-08-11 2004-03-16 Applied Materials, Inc. Generic interface builder
US6538435B2 (en) * 2000-08-24 2003-03-25 Shell Oil Company Method for detecting an anomaly in an object of electrically conductive material along first and second direction at inspection points
US6570379B2 (en) * 2000-08-24 2003-05-27 Shell Oil Company Method for inspecting an object of electrically conducting material
US7188142B2 (en) 2000-11-30 2007-03-06 Applied Materials, Inc. Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
US7160739B2 (en) 2001-06-19 2007-01-09 Applied Materials, Inc. Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US7698012B2 (en) 2001-06-19 2010-04-13 Applied Materials, Inc. Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US20030199112A1 (en) 2002-03-22 2003-10-23 Applied Materials, Inc. Copper wiring module control
US6672716B2 (en) * 2002-04-29 2004-01-06 Xerox Corporation Multiple portion solid ink stick
US7272459B2 (en) 2002-11-15 2007-09-18 Applied Materials, Inc. Method, system and medium for controlling manufacture process having multivariate input parameters
RU2323410C2 (en) * 2002-12-19 2008-04-27 Шелл Интернэшнл Рисерч Маатсхаппий Б.В. Monitoring of thickness of wall
DE112004002418T5 (en) * 2003-12-10 2006-10-19 Metso Paper, Inc. Method for controlling the running parameters in a device for treating a fiber web and apparatus for applying this method
SE527091C2 (en) * 2003-12-31 2005-12-20 Abb Ab Method and apparatus for contactless measurement of thickness and electrical conductivity of a measuring object
SE527125C2 (en) * 2003-12-31 2005-12-27 Abb Ab Method and apparatus for contactless measurement of thickness or conductivity with electromagnetic induction
JP4542973B2 (en) * 2005-09-15 2010-09-15 株式会社東芝 Moving distance measuring device and moving distance measuring method
DK2064413T3 (en) 2006-09-21 2018-02-12 Tüv Rheinland Sonovation Holding B V DEVICE AND PROCEDURE FOR DETECTING AN ANOMALY IN A COLLECTION OF A FIRST AND SECOND ITEM
GB2450112B (en) * 2007-06-12 2010-12-08 Ge Inspection Technologies Ltd Automatic lift-off compensation for pulsed eddy current inspection
CN101398298B (en) * 2008-11-10 2010-09-29 清华大学 Electromagnetical ultrasonic thickness-measuring method
US20100240900A1 (en) * 2009-03-23 2010-09-23 Headwaters Technology Innovation, Llc Dispersible carbon nanospheres and methods for making same
JP5513821B2 (en) * 2009-09-17 2014-06-04 株式会社荏原製作所 Eddy current sensor, polishing apparatus, plating apparatus, polishing method, plating method
CN101788260B (en) * 2010-03-18 2011-12-28 清华大学 Eddy current measuring method of thickness of metal film
JP4975142B2 (en) 2010-06-17 2012-07-11 トヨタ自動車株式会社 Eddy current measuring sensor and eddy current measuring method
FR2981741B1 (en) * 2011-10-20 2013-11-29 Messier Bugatti Dowty METHOD FOR MEASURING THE THICKNESS OF A COATING LAYER BY INDUCING MAGNETIC FIELDS
US9091664B2 (en) * 2012-06-07 2015-07-28 Thomas Krause Pulsed eddy current sensor for precision measurement at-large lift-offs on metallic surfaces
US9335151B2 (en) * 2012-10-26 2016-05-10 Applied Materials, Inc. Film measurement
CN104465481A (en) * 2013-09-22 2015-03-25 盛美半导体设备（上海）有限公司 Wafer chuck
CN104034250B (en) * 2014-06-30 2016-08-24 山东中科普锐检测技术有限公司 Coating thickness detector temperature-compensating measuring method
FR3025306B1 (en) * 2014-08-29 2020-07-10 Safran NON-DESTRUCTIVE METHOD FOR MEASURING THICKNESS OF THERMAL BARRIER AND / OR WALL IN HOLLOW BLADE TURBOMACHINE SUPERALLOY
US10073058B2 (en) 2015-02-11 2018-09-11 Structural Integrity Associates Dynamic pulsed eddy current probe
US10895555B2 (en) 2015-03-30 2021-01-19 Structural Integrity Associates, Inc. System for in-line inspection using a dynamic pulsed eddy current probe and method thereof
CN105509631B (en) * 2015-12-07 2018-05-18 天津因科新创科技有限公司 A kind of impulse eddy current method for testing wall thickness and device
CN106197249A (en) * 2016-09-30 2016-12-07 天津华海清科机电科技有限公司 Copper layer thickness on-line measurement system and control method thereof during CMP
CN109764800A (en) * 2019-01-15 2019-05-17 西南石油大学 A kind of corrosive pipeline wall thickness detecting system based on vortex thermal imaging array
EP4053494A1 (en) 2021-03-02 2022-09-07 ABB Schweiz AG Thickness measurement using a pulsed eddy current system

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3555887A (en) 1967-09-19 1971-01-19 American Mach & Foundry Apparatus for electroacoustically inspecting tubular members for anomalies using the magnetostrictive effect and for measuring wall thickness
US3693075A (en) * 1969-11-15 1972-09-19 Forster F M O Eddy current system for testing tubes for defects,eccentricity,and wall thickness
DE2345848C3 (en) * 1973-09-12 1986-06-19 ELEKTRO-PHYSIK Hans Nix & Dr.-Ing. E. Steingroever GmbH & Co KG, 5000 Köln Electromagnetic coating thickness meter
US4383218A (en) * 1978-12-29 1983-05-10 The Boeing Company Eddy current flow detection including compensation for system variables such as lift-off
JPS5692804U (en) * 1979-12-17 1981-07-23
US4492115A (en) * 1984-04-11 1985-01-08 Pa Incorporated Method and apparatus for measuring defects in ferromagnetic tubing
DE3413787A1 (en) 1984-04-12 1985-10-17 Nukem Gmbh, 6450 Hanau METHOD AND DEVICE FOR TESTING ELECTRICALLY CONDUCTING OBJECTS BY MEANS OF ULTRASOUND
FR2572175A1 (en) 1984-10-24 1986-04-25 Stein Heurtey METHOD AND DEVICE FOR MEASURING THE THICKNESS OF THIN METAL LAYERS DEPOSITED ON A CONDUCTIVE SUPPORT
FR2574938B1 (en) 1984-12-19 1986-12-26 Snecma METHOD OF CONTROLLING BY CONTACTLESS EDGE CURRENT AND DEVICE FOR IMPLEMENTING IT
JPS61151402A (en) * 1984-12-26 1986-07-10 Nippon Kokan Kk <Nkk> Differential mutual induction type eddy current measuring sensor
US4644271A (en) * 1985-02-25 1987-02-17 Ltv Steel Company, Inc. Method and apparatus for examining a workpiece
JPS62225947A (en) * 1986-03-26 1987-10-03 Kobe Steel Ltd Probe for measuring vortex
US4945305A (en) 1986-10-09 1990-07-31 Ascension Technology Corporation Device for quantitatively measuring the relative position and orientation of two bodies in the presence of metals utilizing direct current magnetic fields
SE451886B (en) * 1986-10-10 1987-11-02 Sten Linder SET AND DEVICE FOR SOUND-FREE SEAT OF SIZES OF OR CONNECTED TO ELECTRICALLY CONDUCTIVE MATERIAL
JPS63139202A (en) * 1986-12-02 1988-06-11 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for measuring electromagnetic induction type thickness
US4843320A (en) 1987-12-17 1989-06-27 Atlantic Richfield Company Transient electromagnetic method for detecting corrosion on conductive containers
US4929898A (en) * 1987-12-17 1990-05-29 Atlantic Richfield Transient electromagnetic method for detecting irregularities on conductive containers
US4849693A (en) * 1988-02-29 1989-07-18 Battelle Memorial Institute Automated measurement system employing eddy currents to adjust probe position and determine metal hardness
US4843317A (en) 1988-10-18 1989-06-27 Conoco Inc. Method and apparatus for measuring casing wall thickness using a flux generating coil with radial sensing coils and flux leakage sensing coils
JPH0654206B2 (en) * 1989-09-05 1994-07-20 株式会社ニレコ Eddy current distance measuring device
US5198764A (en) 1991-02-22 1993-03-30 Sentech Corp. Position detector apparatus and method utilizing a transient voltage waveform processor
US5491409A (en) * 1992-11-09 1996-02-13 The Babcock & Wilcox Company Multiple yoke eddy current technique for detection of surface defects on metal components covered with marine growth
US5569835A (en) 1994-08-10 1996-10-29 Ultrasonic Arrays, Inc. Reference wire compensation method and apparatus
US5592092A (en) 1994-10-28 1997-01-07 Gas Research Institute Pipe proximity warning device for accidental damage prevention mounted on the bucket of a backhoe
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
SE508354C2 (en) 1996-07-05 1998-09-28 Asea Atom Ab Method and apparatus for determining layer thickness
US6291992B1 (en) 1996-07-12 2001-09-18 Shell Oil Company Eddy current inspection technique
NL1005160C2 (en) * 1997-01-31 1998-08-03 Roentgen Tech Dienst Bv Device for determining properties of an electrically conductive object.
US6037768A (en) * 1997-04-02 2000-03-14 Iowa State University Research Foundation, Inc. Pulsed eddy current inspections and the calibration and display of inspection results
US6201987B1 (en) 1998-05-26 2001-03-13 General Electric Company Error compensation for device tracking systems employing electromagnetic fields
US6344741B1 (en) * 2000-06-20 2002-02-05 Her Majesty The Queen As Represented By The Minister Of National Defence In Right Of Canada Pulsed eddy current method for detection of corrosion in multilayer structures using the lift-off point of intersection

Also Published As

Publication number Publication date
ATE433092T1 (en) 2009-06-15
EP1311800A1 (en) 2003-05-21
RU2260172C2 (en) 2005-09-10
NO20030814D0 (en) 2003-02-21
CA2420309A1 (en) 2002-02-28
WO2002016863A1 (en) 2002-02-28
EP1311800B1 (en) 2009-06-03
US6593737B2 (en) 2003-07-15
US20020149359A1 (en) 2002-10-17
NO20030814L (en) 2003-04-22
DE60138891D1 (en) 2009-07-16
JP2004507721A (en) 2004-03-11
CN1447902A (en) 2003-10-08

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