JPS5692804U - - Google Patents
Info
- Publication number
- JPS5692804U JPS5692804U JP17462179U JP17462179U JPS5692804U JP S5692804 U JPS5692804 U JP S5692804U JP 17462179 U JP17462179 U JP 17462179U JP 17462179 U JP17462179 U JP 17462179U JP S5692804 U JPS5692804 U JP S5692804U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17462179U JPS5692804U (en) | 1979-12-17 | 1979-12-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17462179U JPS5692804U (en) | 1979-12-17 | 1979-12-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5692804U true JPS5692804U (en) | 1981-07-23 |
Family
ID=29685344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17462179U Pending JPS5692804U (en) | 1979-12-17 | 1979-12-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5692804U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004507721A (en) * | 2000-08-24 | 2004-03-11 | シエル・インターナシヨネイル・リサーチ・マーチヤツピイ・ベー・ウイ | Measuring wall thickness of conductive objects |
JP2010164431A (en) * | 2009-01-15 | 2010-07-29 | Nippon Steel Corp | Apparatus and method for measuring surface state |
WO2016111266A1 (en) * | 2015-01-06 | 2016-07-14 | 株式会社東海理化電機製作所 | Position detecting device |
-
1979
- 1979-12-17 JP JP17462179U patent/JPS5692804U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004507721A (en) * | 2000-08-24 | 2004-03-11 | シエル・インターナシヨネイル・リサーチ・マーチヤツピイ・ベー・ウイ | Measuring wall thickness of conductive objects |
JP2010164431A (en) * | 2009-01-15 | 2010-07-29 | Nippon Steel Corp | Apparatus and method for measuring surface state |
WO2016111266A1 (en) * | 2015-01-06 | 2016-07-14 | 株式会社東海理化電機製作所 | Position detecting device |