AU2001238335A1 - Semiconductor device for low voltage protection with low capacitance - Google Patents
Semiconductor device for low voltage protection with low capacitanceInfo
- Publication number
- AU2001238335A1 AU2001238335A1 AU2001238335A AU3833501A AU2001238335A1 AU 2001238335 A1 AU2001238335 A1 AU 2001238335A1 AU 2001238335 A AU2001238335 A AU 2001238335A AU 3833501 A AU3833501 A AU 3833501A AU 2001238335 A1 AU2001238335 A1 AU 2001238335A1
- Authority
- AU
- Australia
- Prior art keywords
- low
- semiconductor device
- voltage protection
- capacitance
- low voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
- H01L29/7424—Thyristor-type devices, e.g. having four-zone regenerative action having a built-in localised breakdown/breakover region, e.g. self-protected against destructive spontaneous, e.g. voltage breakover, firing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0259—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using bipolar transistors as protective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0259—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using bipolar transistors as protective elements
- H01L27/0262—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using bipolar transistors as protective elements including a PNP transistor and a NPN transistor, wherein each of said transistors has its base coupled to the collector of the other transistor, e.g. silicon controlled rectifier [SCR] devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
- H01L29/747—Bidirectional devices, e.g. triacs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/87—Thyristor diodes, e.g. Shockley diodes, break-over diodes
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Thyristors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09504224 | 2000-02-15 | ||
US09/504,224 US6531717B1 (en) | 1999-03-01 | 2000-02-15 | Very low voltage actuated thyristor with centrally-located offset buried region |
PCT/US2001/004906 WO2001061759A1 (en) | 2000-02-15 | 2001-02-15 | Semiconductor device for low voltage protection with low capacitance |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001238335A1 true AU2001238335A1 (en) | 2001-08-27 |
Family
ID=24005366
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001238335A Abandoned AU2001238335A1 (en) | 2000-02-15 | 2001-02-15 | Semiconductor device for low voltage protection with low capacitance |
Country Status (4)
Country | Link |
---|---|
US (3) | US6531717B1 (en) |
EP (1) | EP1192668A4 (en) |
AU (1) | AU2001238335A1 (en) |
WO (1) | WO2001061759A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6956248B2 (en) * | 1999-03-01 | 2005-10-18 | Teccor Electronics, Lp | Semiconductor device for low voltage protection with low capacitance |
JP2002184952A (en) * | 2000-12-15 | 2002-06-28 | Shindengen Electric Mfg Co Ltd | Semiconductor device and its manufacturing method |
JP3779243B2 (en) | 2002-07-31 | 2006-05-24 | 富士通株式会社 | Semiconductor device and manufacturing method thereof |
US6781161B1 (en) | 2003-04-09 | 2004-08-24 | Teccor Electronics, Lp | Non-gated thyristor device |
WO2004105089A2 (en) * | 2003-05-15 | 2004-12-02 | Pan Jit Americas, Inc. | Low capacitance over-voltage protection thyristor device |
US7738568B2 (en) * | 2004-06-03 | 2010-06-15 | Silicon Laboratories Inc. | Multiplexed RF isolator |
US7561400B2 (en) * | 2006-12-05 | 2009-07-14 | Illinois Tool Works Inc. | Base station protector assembly for surge protection |
FR2960097A1 (en) * | 2010-05-11 | 2011-11-18 | St Microelectronics Tours Sas | Bidirectional protection component for use in first-conductivity type semiconductor substrate, has metallization layer covering first-conductivity type implanted zone, and isolated trench traversing epitaxy layer |
FR2987172A1 (en) | 2012-02-17 | 2013-08-23 | St Microelectronics Sa | BIDIRECTIONAL SEMICONDUCTOR DEVICE FOR PROTECTION AGAINST ELECTROSTATIC DISCHARGE, USEABLE ON SILICON ON INSULATION |
US10177081B2 (en) * | 2017-01-13 | 2019-01-08 | Littlefuse, Inc. | Thyristor and thermal switch device and assembly techniques therefor |
Family Cites Families (54)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3359657A (en) | 1966-01-15 | 1967-12-26 | Donald D Hedberg | Geometric structure and method of forming the same |
US4021837A (en) * | 1975-04-21 | 1977-05-03 | Hutson Jearld L | Symmetrical semiconductor switch having carrier lifetime degrading structure |
US3975664A (en) | 1975-07-28 | 1976-08-17 | Reliable Electric Company | Line protector for communication circuit |
US4074337A (en) | 1976-10-27 | 1978-02-14 | Northern Telecom Limited | Protector for telecommunication lines |
US4086648A (en) | 1976-11-01 | 1978-04-25 | Cook Electric Company | Protector module |
US4307430A (en) | 1979-09-26 | 1981-12-22 | Bell Telephone Laboratories, Incorporated | Protector device for telecommunications circuits |
US4594635A (en) | 1984-08-23 | 1986-06-10 | Northern Telecom Limited | Overload protector for communication systems |
JPS61150617A (en) | 1984-12-24 | 1986-07-09 | 日本電信電話株式会社 | Surge protection circuit |
US4939619A (en) | 1987-01-26 | 1990-07-03 | Northern Telecom Limited | Packaged solid-state surge protector |
US4796150A (en) | 1987-04-16 | 1989-01-03 | American Telephone And Telegraph Company, At&T Bell Laboratories | Telecommunication protector unit with pivotal surge protector |
GB8713440D0 (en) | 1987-06-09 | 1987-07-15 | Texas Instruments Ltd | Semiconductor device |
US4843452A (en) * | 1987-11-02 | 1989-06-27 | Latronics Corporation | Thyrister housing gate lead and method of manufacturing same |
GB8802434D0 (en) | 1988-02-03 | 1988-03-02 | British Telecomm | Protector device |
US4876626A (en) | 1988-06-03 | 1989-10-24 | Reliance Comm/Tec Corporation | Central office protector module with alarm indicator |
US4905119A (en) | 1988-06-27 | 1990-02-27 | Teccor Electronics, Inc. | Solid state overvoltage protection circuit |
US4967256A (en) | 1988-07-08 | 1990-10-30 | Texas Instruments Incorporated | Overvoltage protector |
JPH0287978A (en) | 1988-09-24 | 1990-03-28 | Shindengen Electric Mfg Co Ltd | Inverter |
US4876621A (en) | 1988-12-08 | 1989-10-24 | Reliance Comm/Tec Corporation | Line protector for a communications circuit |
US4907120A (en) | 1988-12-08 | 1990-03-06 | Reliance Comm/Tec Corporation | Line protector for a communications circuit |
US4901188A (en) | 1988-12-30 | 1990-02-13 | Reliance Comm/Tec Corporation | Line protector with spring |
US5031067A (en) | 1989-03-31 | 1991-07-09 | Gte Products Corporation | Five pin protector module for telephone circuits |
US4958254A (en) | 1989-03-31 | 1990-09-18 | Gte Products Corp. | Five pin protector module for telephone circuits |
US5101317A (en) | 1989-06-08 | 1992-03-31 | Northern Telecom Limited | Overload protector for telecommunications systems |
US4944003A (en) | 1989-09-28 | 1990-07-24 | Porta Systems Corp. | Solid state telephone protector module |
US5155649A (en) | 1989-10-02 | 1992-10-13 | Northern Telecom Limited | Surge protector for telecommunications equipment |
JPH0680820B2 (en) * | 1989-10-16 | 1994-10-12 | 株式会社東芝 | Semiconductor device with overvoltage protection function and method of manufacturing the same |
US4958253A (en) | 1989-10-25 | 1990-09-18 | Reliance Comm/Tec Corporation | Line protector for a communications circuit |
US5224012A (en) | 1990-05-17 | 1993-06-29 | Tii Industries Inc. | Solid state station protectors |
US5150271A (en) | 1990-08-21 | 1992-09-22 | Texas Instruments Incorporated | Telecommunication equipment protector |
US5438619A (en) | 1990-11-20 | 1995-08-01 | Siecor Puerto Rico, Inc. | Solid state primary telephone protector |
US5172296A (en) | 1991-06-14 | 1992-12-15 | Relaince Comm/Tec Corporation | Solid state overvoltage protector assembly |
US5175662A (en) | 1991-08-30 | 1992-12-29 | At&T Bell Laboratories | Device including an MTU and protector |
FR2683946B1 (en) | 1991-11-15 | 1997-05-09 | Sgs Thomson Microelectronics | SEMICONDUCTOR COMPONENT FOR PROTECTION AGAINST OVERVOLTAGES. |
US5296646A (en) | 1992-04-03 | 1994-03-22 | The Whitaker Corporation | Protector module for telephone line junction box |
US5359657A (en) | 1992-06-08 | 1994-10-25 | Oneac Corporation | Telephone line overvoltage protection apparatus |
CA2095500C (en) | 1992-06-08 | 1997-09-23 | Dimitris Jim Pelegris | Telephone line overvoltage protection method and apparatus |
GB9215017D0 (en) | 1992-07-15 | 1992-08-26 | Texas Instruments Ltd | Solid state suppressor |
US5371647A (en) | 1992-07-21 | 1994-12-06 | General Instrument Corporation | Surge protection circuit module and method for assembling same |
US5341270A (en) | 1992-10-14 | 1994-08-23 | Reliance Comm/Tec Corporation | Drop resistant cup-arrester assembly |
US5479031A (en) | 1993-09-10 | 1995-12-26 | Teccor Electronics, Inc. | Four layer overvoltage protection device having buried regions aligned with shorting dots to increase the accuracy of overshoot voltage value |
US5398152A (en) | 1993-09-30 | 1995-03-14 | Northern Telecom Limited | Overvoltage protector |
JPH07297384A (en) * | 1994-04-22 | 1995-11-10 | Fuji Electric Co Ltd | Bidirectional semiconductor switching element |
FR2719721B1 (en) | 1994-05-09 | 1996-09-20 | Sgs Thomson Microelectronics | Telephone line interface protection. |
US5490215A (en) | 1994-05-12 | 1996-02-06 | Oneac Corporation | Telecommunications T1 carrier overvoltage and fiber to curb power protector |
US5523916A (en) | 1994-06-03 | 1996-06-04 | Reliance Comm/Tec Corporation | Surge arrester with thermal overload protection |
US5500377A (en) * | 1994-09-06 | 1996-03-19 | Motorola, Inc. | Method of making surge suppressor switching device |
JP3355851B2 (en) | 1995-03-07 | 2002-12-09 | 株式会社デンソー | Insulated gate field effect transistor and method of manufacturing the same |
US5643014A (en) | 1995-05-17 | 1997-07-01 | Lucent Technologies Inc. | Mounting of protectors in connector blocks |
FR2734113B1 (en) * | 1995-05-12 | 1997-07-25 | Sgs Thomson Microelectronics | COMPLETE PROTECTION COMPONENT OF SUBSCRIBER LINE INTERFACE CIRCUIT |
FR2753006B1 (en) * | 1996-08-27 | 1998-11-27 | Sgs Thomson Microelectronics | MONOLITHIC PROTECTED RECTIFIER BRIDGE |
US6771594B1 (en) * | 1997-03-31 | 2004-08-03 | Intel Corporation | Reliable/non-reliable transmission of voice using TCP/UDP based on network quality of service |
US6076113A (en) * | 1997-04-11 | 2000-06-13 | Hewlett-Packard Company | Method and system for evaluating user-perceived network performance |
JP3602972B2 (en) * | 1998-07-28 | 2004-12-15 | 富士通株式会社 | Communication performance measuring device and its measuring method |
US6084253A (en) * | 1999-03-01 | 2000-07-04 | Teccor Electronics, Lp | Low voltage four-layer device with offset buried region |
-
2000
- 2000-02-15 US US09/504,224 patent/US6531717B1/en not_active Expired - Fee Related
-
2001
- 2001-02-15 WO PCT/US2001/004906 patent/WO2001061759A1/en active Application Filing
- 2001-02-15 US US09/958,987 patent/US20020134991A1/en not_active Abandoned
- 2001-02-15 AU AU2001238335A patent/AU2001238335A1/en not_active Abandoned
- 2001-02-15 EP EP01910762A patent/EP1192668A4/en not_active Withdrawn
-
2002
- 2002-09-05 US US10/235,444 patent/US6696709B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6531717B1 (en) | 2003-03-11 |
EP1192668A1 (en) | 2002-04-03 |
US20020134991A1 (en) | 2002-09-26 |
EP1192668A4 (en) | 2007-11-07 |
US20030010997A1 (en) | 2003-01-16 |
US6696709B2 (en) | 2004-02-24 |
WO2001061759A1 (en) | 2001-08-23 |
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