ATE78587T1 - Quench-schaltung fuer avalanche-photodioden. - Google Patents

Quench-schaltung fuer avalanche-photodioden.

Info

Publication number
ATE78587T1
ATE78587T1 AT87907973T AT87907973T ATE78587T1 AT E78587 T1 ATE78587 T1 AT E78587T1 AT 87907973 T AT87907973 T AT 87907973T AT 87907973 T AT87907973 T AT 87907973T AT E78587 T1 ATE78587 T1 AT E78587T1
Authority
AT
Austria
Prior art keywords
photodiode
comparator
pct
avalanche
reset
Prior art date
Application number
AT87907973T
Other languages
English (en)
Inventor
Robin Jones
Dennis Ridley
Original Assignee
Secr Defence Brit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB868628110A external-priority patent/GB8628110D0/en
Priority claimed from GB878703105A external-priority patent/GB8703105D0/en
Application filed by Secr Defence Brit filed Critical Secr Defence Brit
Application granted granted Critical
Publication of ATE78587T1 publication Critical patent/ATE78587T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
  • Amplifiers (AREA)
  • Electronic Switches (AREA)
AT87907973T 1986-11-25 1987-11-23 Quench-schaltung fuer avalanche-photodioden. ATE78587T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB868628110A GB8628110D0 (en) 1986-11-25 1986-11-25 Avalanche photodiode quenching circuit
GB878703105A GB8703105D0 (en) 1987-02-11 1987-02-11 Avalanche photodiode quenching circuit
PCT/GB1987/000837 WO1988004034A2 (en) 1986-11-25 1987-11-23 Avalanche photodiode quenching circuit
EP87907973A EP0333751B1 (de) 1986-11-25 1987-11-23 Quench-schaltung für avalanche-photodioden

Publications (1)

Publication Number Publication Date
ATE78587T1 true ATE78587T1 (de) 1992-08-15

Family

ID=26291580

Family Applications (1)

Application Number Title Priority Date Filing Date
AT87907973T ATE78587T1 (de) 1986-11-25 1987-11-23 Quench-schaltung fuer avalanche-photodioden.

Country Status (7)

Country Link
US (1) US4945227A (de)
EP (1) EP0333751B1 (de)
JP (1) JPH02500789A (de)
AT (1) ATE78587T1 (de)
CA (1) CA1310505C (de)
DE (1) DE3780647T2 (de)
WO (1) WO1988004034A2 (de)

Families Citing this family (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1229945B (it) * 1988-10-20 1991-09-17 Consiglio Nazionale Ricerche Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota
GB8906650D0 (en) * 1989-03-22 1989-05-04 Harley Phillip E Electronic quenching circuit
GB8915245D0 (en) * 1989-07-03 1989-08-23 Secr Defence Avalanche photodiode quenching circuit
DE4006504A1 (de) * 1990-03-02 1991-09-05 Telefunken Electronic Gmbh Schaltungsanordnung fuer opto-schmitt-trigger
JP3207240B2 (ja) * 1992-04-10 2001-09-10 キヤノン株式会社 フォトダイオードのバイアス回路
GB2269010B (en) * 1992-07-25 1996-01-17 Roke Manor Research Improvements in or relating to photon counters
JP2686036B2 (ja) * 1993-07-09 1997-12-08 浜松ホトニクス株式会社 アバランシェフォトダイオードのバイアス回路
US5532474A (en) * 1993-12-17 1996-07-02 Eg&G Limited Active quench circuit and reset circuit for avalanche photodiode
US5933042A (en) * 1997-07-01 1999-08-03 Eg&G Canada, Ltd. Active quench circuit for an avalanche current device
IT1316793B1 (it) * 2000-03-09 2003-05-12 Milano Politecnico Circuito monolitico di spegnimento attivo e ripristino attivo perfotodiodi a valanga
DE10336080A1 (de) * 2003-08-06 2005-03-03 Gnothis Holding Sa Verfahren und Vorrichtung zur Bestimmung von lumineszierenden Molekülen, insbesondere nach der Methode der Fluoreszenzkorrelationsspektroskopie
CN100363724C (zh) * 2004-02-24 2008-01-23 华东师范大学 双门控雪崩光电二极管单光子探测方法
CN100410636C (zh) * 2004-03-19 2008-08-13 华东师范大学 一种apd单光子探测的电路模块
US8188563B2 (en) * 2006-07-21 2012-05-29 The Regents Of The University Of California Shallow-trench-isolation (STI)-bounded single-photon CMOS photodetector
US7897906B2 (en) * 2007-03-23 2011-03-01 Excelitas Canada Inc. Double quench circuit for an avalanche current device
US8803075B2 (en) * 2008-04-18 2014-08-12 Saint-Gobain Ceramics & Plastics, Inc. Radiation detector device
US8637875B2 (en) 2008-07-11 2014-01-28 The Regents Of The University Of California Single photon IR detectors and their integration with silicon detectors
CN101923173B (zh) * 2009-06-10 2014-10-01 圣戈本陶瓷及塑料股份有限公司 闪烁体以及检测器组件
US8198578B2 (en) * 2009-06-23 2012-06-12 Nokia Corporation Color filters for sub-diffraction limit-sized light sensors
EP2556540B1 (de) * 2010-04-08 2020-09-16 BAE Systems Information and Electronic Systems Integration Inc. Algorithmus zur auswahl der betriebsspannung einer avalanche-photodiode
US9671284B1 (en) * 2016-01-14 2017-06-06 Kiskeya Microsystems Llc Single-photon avalanche diode circuit with variable hold-off time and dual delay regime
CN110118598B (zh) * 2018-02-07 2024-07-02 科大国盾量子技术股份有限公司 用于雪崩光电二极管的延时电路及集成单光子检测电路
WO2019221799A1 (en) * 2018-05-17 2019-11-21 Hi Llc Stacked photodetector assemblies
US10340408B1 (en) 2018-05-17 2019-07-02 Hi Llc Non-invasive wearable brain interface systems including a headgear and a plurality of self-contained photodetector units configured to removably attach to the headgear
US10420498B1 (en) 2018-06-20 2019-09-24 Hi Llc Spatial and temporal-based diffusive correlation spectroscopy systems and methods
US11213206B2 (en) 2018-07-17 2022-01-04 Hi Llc Non-invasive measurement systems with single-photon counting camera
US12352896B2 (en) 2018-12-05 2025-07-08 Sony Semiconductor Solutions Corporation Light detection apparatus and control method of light detection apparatus, and ranging apparatus
WO2020131148A1 (en) 2018-12-21 2020-06-25 Hi Llc Biofeedback for awareness and modulation of mental state using a non-invasive brain interface system and method
JP2020148537A (ja) * 2019-03-12 2020-09-17 ソニーセミコンダクタソリューションズ株式会社 制御回路および測距システム
EP3966590A1 (de) 2019-05-06 2022-03-16 Hi LLC Photodetektorarchitekturen für zeitkorrelierte einzelphotonenzählung
CN110207836B (zh) * 2019-05-17 2024-06-25 中国航空工业集团公司洛阳电光设备研究所 一种单光子探测器及其高压快速调节电路
CA3137921A1 (en) 2019-06-06 2020-12-10 Hi Llc Photodetector systems with low-power time-to-digital converter architectures
EP3999821B1 (de) * 2019-07-19 2025-01-08 Avago Technologies International Sales Pte. Limited Ladeschaltung für digitale silizium-photovervielfacher
JP7621961B2 (ja) * 2019-11-05 2025-01-27 ソニーセミコンダクタソリューションズ株式会社 センシングデバイスおよび測距装置
US11883181B2 (en) 2020-02-21 2024-01-30 Hi Llc Multimodal wearable measurement systems and methods
US11630310B2 (en) 2020-02-21 2023-04-18 Hi Llc Wearable devices and wearable assemblies with adjustable positioning for use in an optical measurement system
US12144653B2 (en) 2020-02-21 2024-11-19 Hi Llc Systems, circuits, and methods for reducing common-mode noise in biopotential recordings
US12029558B2 (en) 2020-02-21 2024-07-09 Hi Llc Time domain-based optical measurement systems and methods configured to measure absolute properties of tissue
US11096620B1 (en) 2020-02-21 2021-08-24 Hi Llc Wearable module assemblies for an optical measurement system
US11515014B2 (en) 2020-02-21 2022-11-29 Hi Llc Methods and systems for initiating and conducting a customized computer-enabled brain research study
US11950879B2 (en) 2020-02-21 2024-04-09 Hi Llc Estimation of source-detector separation in an optical measurement system
US11969259B2 (en) 2020-02-21 2024-04-30 Hi Llc Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members
WO2021167893A1 (en) 2020-02-21 2021-08-26 Hi Llc Integrated detector assemblies for a wearable module of an optical measurement system
US12336323B2 (en) 2020-03-04 2025-06-17 The University Of Chicago Avalanche photodiodes with adaptive quenching of photocurrent
WO2021188496A1 (en) 2020-03-20 2021-09-23 Hi Llc Photodetector calibration of an optical measurement system
US11877825B2 (en) 2020-03-20 2024-01-23 Hi Llc Device enumeration in an optical measurement system
US12138068B2 (en) 2020-03-20 2024-11-12 Hi Llc Techniques for characterizing a nonlinearity of a time-to-digital converter in an optical measurement system
WO2021188488A1 (en) 2020-03-20 2021-09-23 Hi Llc Bias voltage generation in an optical measurement system
US11857348B2 (en) 2020-03-20 2024-01-02 Hi Llc Techniques for determining a timing uncertainty of a component of an optical measurement system
US11245404B2 (en) 2020-03-20 2022-02-08 Hi Llc Phase lock loop circuit based signal generation in an optical measurement system
WO2021188487A1 (en) 2020-03-20 2021-09-23 Hi Llc Temporal resolution control for temporal point spread function generation in an optical measurement system
US11645483B2 (en) 2020-03-20 2023-05-09 Hi Llc Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system
US11864867B2 (en) 2020-03-20 2024-01-09 Hi Llc Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse
US11819311B2 (en) 2020-03-20 2023-11-21 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US11187575B2 (en) 2020-03-20 2021-11-30 Hi Llc High density optical measurement systems with minimal number of light sources
US12059262B2 (en) 2020-03-20 2024-08-13 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US12059270B2 (en) 2020-04-24 2024-08-13 Hi Llc Systems and methods for noise removal in an optical measurement system
CN112363148A (zh) * 2020-11-09 2021-02-12 广东博智林机器人有限公司 光电检测电路及光电探测器
CN116802514A (zh) * 2021-02-02 2023-09-22 索尼半导体解决方案公司 光检测装置及测距系统

Also Published As

Publication number Publication date
US4945227A (en) 1990-07-31
WO1988004034A2 (en) 1988-06-02
JPH02500789A (ja) 1990-03-15
DE3780647T2 (de) 1993-03-11
WO1988004034A3 (en) 1988-07-14
CA1310505C (en) 1992-11-24
DE3780647D1 (de) 1992-08-27
EP0333751B1 (de) 1992-07-22
EP0333751A1 (de) 1989-09-27

Similar Documents

Publication Publication Date Title
DE3780647D1 (de) Quench-schaltung fuer avalanche-photodioden.
EP2130011B1 (de) Doppellöschglied für ein lawinenstromgerät
EP3081963A1 (de) Lawinendiodenanordnung und verfahren zur bereitstellung eines erkennungssignals
EP0365095A3 (de) Anordnung mit durch einzelne Photonen getriggerter Halbleiter-Avalanche-Photodiode und aktiver Quench-Schaltung
GB2269010A (en) Photon counting APD with active quench and reset
US5322995A (en) Charge integration preamplifier for use in radiation detection circuitry
US4890021A (en) Noise spike elimination circuit for pulse width modulators
US5003191A (en) Emission of pulsed energy
US4639616A (en) Circuit for controlling the base of a power transistor used in high tension switching
GB1273441A (en) Pulse generator circuit
SU465710A1 (ru) Импульсный усилитель
SU964845A1 (ru) Транзисторный преобразователь с защитой
SU617820A1 (ru) Импульсный усилитель с индуктивной нагрузкой
SU1450097A1 (ru) Высоковольтный компаратор
JPH04364496A (ja) 半導体検出器用前置増幅器
ADAMOV et al. Subnanosecond optical pulse detector(Priemnik subnanosekundnykh opticheskikh impul'sov)
JPS5446352A (en) Power source regulator circuit
SU824226A1 (ru) Интегратор
SU1714787A1 (ru) Эмиттерный повторитель
JPS5564406A (en) Crystal oscillation circuit
SU570990A1 (ru) Блокинг-генератор на транзисторе
SU849484A1 (ru) Амплитудно-временной преобразователь
SU1550601A1 (ru) Генератор импульсов
SU175313A1 (ru) Динамический триггер
SU995673A1 (ru) Устройство автоматического смещени