ATE539338T1 - Linsenuntersuchungssystem mit phasenkontrastabbildung - Google Patents

Linsenuntersuchungssystem mit phasenkontrastabbildung

Info

Publication number
ATE539338T1
ATE539338T1 AT06819659T AT06819659T ATE539338T1 AT E539338 T1 ATE539338 T1 AT E539338T1 AT 06819659 T AT06819659 T AT 06819659T AT 06819659 T AT06819659 T AT 06819659T AT E539338 T1 ATE539338 T1 AT E539338T1
Authority
AT
Austria
Prior art keywords
phase contrast
contrast imaging
examination system
lenses
inspection
Prior art date
Application number
AT06819659T
Other languages
English (en)
Inventor
Roger Biel
Livio Fornasiero
Original Assignee
Novartis Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novartis Ag filed Critical Novartis Ag
Application granted granted Critical
Publication of ATE539338T1 publication Critical patent/ATE539338T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AT06819659T 2005-11-24 2006-11-22 Linsenuntersuchungssystem mit phasenkontrastabbildung ATE539338T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05025641 2005-11-24
PCT/EP2006/068744 WO2007060173A1 (en) 2005-11-24 2006-11-22 Lens inspection system using phase contrast imaging

Publications (1)

Publication Number Publication Date
ATE539338T1 true ATE539338T1 (de) 2012-01-15

Family

ID=36118315

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06819659T ATE539338T1 (de) 2005-11-24 2006-11-22 Linsenuntersuchungssystem mit phasenkontrastabbildung

Country Status (6)

Country Link
US (2) US7663742B2 (de)
EP (1) EP1952115B1 (de)
CN (1) CN101313205B (de)
AT (1) ATE539338T1 (de)
MY (1) MY149023A (de)
WO (1) WO2007060173A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2167910B1 (de) * 2007-06-29 2015-01-28 Johnson & Johnson Vision Care Inc. Verfahren zur erkennung der ausrichtung einer augenlinse in ihrer verpackung
US8035809B2 (en) * 2007-12-21 2011-10-11 Bausch & Lomb Incorporated Bubble removal system
SG173233A1 (en) * 2010-01-28 2011-08-29 Visionxtreme Pte Ltd Inspection of defects in a contact lens
CN101846812A (zh) * 2010-04-29 2010-09-29 中国科学技术大学 纹影准单色光源装置
US9253448B1 (en) 2011-12-28 2016-02-02 Cognex Corporation System and method for determination of contact lens orientation
US8929239B2 (en) * 2012-07-02 2015-01-06 Apple Inc. Modulation and coding scheme (MCS) recovery based on CQI offset
CN106537110A (zh) * 2014-05-15 2017-03-22 伊麦视觉私人有限公司 用于检查眼镜镜片的系统和方法
JP6542355B2 (ja) 2014-08-15 2019-07-10 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ レンズ及びレンズ金型の光学評価
SG10201509497VA (en) * 2015-11-18 2017-06-29 Emage Vision Pte Ltd Contact lens defect inspection using uv illumination
CN110709749B (zh) * 2017-06-09 2021-10-26 电子慕泽雷帕里公司 组合式明视场和相衬显微镜系统及配备其的图像处理设备
WO2019038696A1 (en) 2017-08-24 2019-02-28 Novartis Ag PRODUCTION CHAIN FOR PRODUCTION OF OPHTHALMIC LENSES
US10983251B2 (en) 2017-08-24 2021-04-20 Alcon Inc. Manufacturing module for the manufacture of ophthalmic lenses
US10751962B2 (en) 2017-08-24 2020-08-25 Alcon Inc. Modular production line for the production of ophthalmic lenses
EP3474003A1 (de) * 2017-10-20 2019-04-24 Essilor International Verfahren zur bewertung kosmetischer fehler einer optischen vorrichtung
WO2019155023A1 (en) * 2018-02-08 2019-08-15 Amo Groningen B.V. Wavefront based characterization of lens surfaces based on reflections
AU2019219296B2 (en) 2018-02-08 2024-08-29 Amo Groningen B.V. Multi-wavelength wavefront system and method for measuring diffractive lenses
SG11202100618YA (en) * 2018-08-13 2021-02-25 Alcon Inc Method and apparatus for optically inspecting a mold for manufacturing ophthalmic lenses for possible mold defects
CN110579474B (zh) * 2019-09-24 2024-10-18 中国科学院力学研究所 一种同时观测晶体形貌及测量晶体周围浓度场的装置
CN113984790B (zh) * 2021-09-28 2024-08-30 歌尔光学科技有限公司 镜片质量检测方法及装置
TW202326093A (zh) * 2021-12-16 2023-07-01 瑞士商愛爾康公司 用於在自動化鏡片製造過程中檢查眼科鏡片之方法及系統
WO2024129543A2 (en) * 2022-12-15 2024-06-20 Seurat Technologies, Inc. Powder bed measurement for additive manufacturing

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8702130D0 (en) * 1987-01-30 1987-03-04 Sira Ltd Surface inspection
FR2647912B1 (fr) * 1989-06-05 1991-09-13 Essilor Int Dispositif optique a reseau pour le controle, en transmission, par detection de phase, d'un quelconque systeme optique, en particulier d'une lentille ophtalmique
IL96483A (en) * 1990-11-27 1995-07-31 Orbotech Ltd Optical inspection method and apparatus
IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
US5751475A (en) * 1993-12-17 1998-05-12 Olympus Optical Co., Ltd. Phase contrast microscope
JP3734512B2 (ja) 1993-12-27 2006-01-11 株式会社メニコン コンタクトレンズ外観検査方法および外観検査装置
US5500732A (en) 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
US6047082A (en) 1997-11-14 2000-04-04 Wesley Jessen Corporation Automatic lens inspection system
US6201600B1 (en) 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection
EP1248092B1 (de) * 2001-03-09 2010-09-15 Novartis AG Linsenprüfung
US6914723B2 (en) * 2001-11-09 2005-07-05 Xradia, Inc. Reflective lithography mask inspection tool based on achromatic Fresnel optics
CN1358996A (zh) * 2002-01-29 2002-07-17 清华大学 用透射式微分干涉相衬显微镜测量表面形貌的方法和装置
BR0303223A (pt) 2002-02-21 2004-03-30 Johnson & Johnson Vision Care Inspeção dupla de lentes oftálmicas
WO2004057297A1 (en) 2002-12-19 2004-07-08 Lk A/S Method and apparatus for automatic optical inspection
US20070121109A1 (en) 2003-12-04 2007-05-31 Roger Biel Lens inspection
US7084970B2 (en) * 2004-05-14 2006-08-01 Photon Dynamics, Inc. Inspection of TFT LCD panels using on-demand automated optical inspection sub-system
US7355689B2 (en) * 2005-01-31 2008-04-08 Applied Materials, Inc. Automatic optical inspection using multiple objectives
CN101283260B (zh) * 2005-10-13 2011-07-27 诺瓦提斯公司 用于自由浮动眼用透镜的光学检查的透明小试管

Also Published As

Publication number Publication date
CN101313205A (zh) 2008-11-26
US20100157289A1 (en) 2010-06-24
EP1952115B1 (de) 2011-12-28
EP1952115A1 (de) 2008-08-06
MY149023A (en) 2013-06-28
CN101313205B (zh) 2011-08-31
US7663742B2 (en) 2010-02-16
US7855782B2 (en) 2010-12-21
WO2007060173A1 (en) 2007-05-31
US20070139640A1 (en) 2007-06-21

Similar Documents

Publication Publication Date Title
ATE539338T1 (de) Linsenuntersuchungssystem mit phasenkontrastabbildung
MY187200A (en) System and method for inspection of wet ophthalmic lens
WO2008115197A3 (en) Methods of identifying disease biomarkers in the lense of the eye
WO2008139735A1 (ja) 表面検査装置および表面検査方法
MY151339A (en) Multi-imaging automated inspection methods and systems for wet ophthalmic lenses
EP2090918A3 (de) Kalibriervorrichtung und Laser-Scanning-Mikroskop mit einer derartigen Kalibriervorrichtung
ATE555418T1 (de) Kamerainternes verfahren zur erkennung von blitzlichtaugen mit hoher genauigkeit
ATE481628T1 (de) Linsenprüfung
TW200604518A (en) Method and system for the inspection of a wafer
TW200735298A (en) Apparatus, unit and method for testing image sensor packages
MX2020006757A (es) Sistema y metodo para la configuracion de la inspeccion de la linea de produccion.
WO2005072265A3 (en) Illumination system for material inspection
WO2009088930A3 (en) High numerical aperture telemicroscopy apparatus
WO2012117353A3 (en) Method and apparatus for measuring the thickness of a transparent object in an automatic production line
WO2010072920A8 (fr) Procede de controle non destructif d'une piece mecanique
UA115521C2 (uk) Метод і пристосування для сортування клітин
TW200707614A (en) Testing method detecting localized failure on a semiconductor wafer
WO2009129105A3 (en) Methods and systems for determining a defect criticality index for defects on wafers
ES2528321T3 (es) Detección de a-fucosilación en anticuerpos
FI20051118A0 (fi) Menetelmä ja järjestelmä automatisoidun etsimispalvelun tarjoamiseksi kiinteistömarkkinoilla
EP2317388A3 (de) Verfahren und System zur Waferinspektion
EP1840623A3 (de) Mikroskop mit einem optischen System zur Detektion von Fokussierfehlern
EP1973782B8 (de) Verfahren und vorrichtung zur erkennung des vorhandenseins einer ophthalmischen linse in einer verpackung
JP2015227793A (ja) 光学部品の検査装置及び検査方法
WO2020127758A3 (de) Vorrichtung und verfahren zur optischen vermessung einer innenkontur einer brillenfassung