|
DE3347704C1
(de)
|
1983-12-31 |
1985-04-18 |
Zipperling Kessler & Co (Gmbh & Co), 2070 Ahrensburg |
Antistatika enthaltendes Konzentrat auf Basis von Polymeren,Verfahren zu dessen Herstellung sowie dessen Verwendung
|
|
DE3421993C1
(de)
|
1984-06-14 |
1985-12-12 |
Zipperling Kessler & Co (Gmbh & Co), 2070 Ahrensburg |
Verfahren zur Herstellung von Formteilen aus elektrisch leitfaehigen organischen Polymeren und/oder organischen Leitern,Vorrichtung zur Durchfuehrung des Verfahrens sowie Verwendung der Formteile
|
|
DE3422316C2
(de)
|
1984-06-15 |
1986-11-20 |
Zipperling Kessler & Co (Gmbh & Co), 2070 Ahrensburg |
Verfahren zur Herstellung von verformbaren Polymerblends aus elektrisch leitfähigen organischen Polymeren und/oder organischen Leitern, Vorrichtung zur Durchführung des Verfahrens sowie Verwendung der Polymerblends
|
|
DE3440617C1
(de)
|
1984-11-07 |
1986-06-26 |
Zipperling Kessler & Co (Gmbh & Co), 2070 Ahrensburg |
Antistatische bzw. elektrisch halbleitende thermoplastische Polymerblends,Verfahren zu deren Herstellung und deren Verwendung
|
|
US5069820A
(en)
|
1987-08-07 |
1991-12-03 |
Allied-Signal Inc. |
Thermally stable forms of electrically conductive polyaniline
|
|
DE3729566A1
(de)
|
1987-09-04 |
1989-03-16 |
Zipperling Kessler & Co |
Intrinsisch leitfaehiges polymer in form eines dispergierbaren feststoffes, dessen herstellung und dessen verwendung
|
|
US5476612A
(en)
|
1989-12-30 |
1995-12-19 |
Zipperling Kessler & Co., (Gmbh & Co.). |
Process for making antistatic or electrically conductive polymer compositions
|
|
FR2672126B1
(fr)
|
1990-11-16 |
1994-04-08 |
Alcyon Analyser Sa |
Segment reactionnel pour analyseur automatique d'echantillons et analyseur equipe d'un segment.
|
|
US5160456A
(en)
|
1991-06-07 |
1992-11-03 |
Exxon Research And Engineering Company |
Catalyst/heat-transfer medium for syngas generation
|
|
DE4317010A1
(de)
|
1993-05-17 |
1994-11-24 |
Zipperling Kessler & Co |
Dispergierbares intrinsisch leitfähiges Polymer und Verfahren zu dessen Herstellung
|
|
EP0656958B1
(de)
|
1993-06-25 |
1999-04-07 |
Zipperling Kessler & Co (GmbH & Co) |
Verfahren zur herstellung korrosionsgeschützter metallischer werkstoffe
|
|
JP3409226B2
(ja)
|
1995-03-27 |
2003-05-26 |
日東電工株式会社 |
半導電性樹脂シート及びその製造方法
|
|
ATE213026T1
(de)
|
1995-11-29 |
2002-02-15 |
Zipperling Kessler & Co |
Verfahren zur herstellung von metallisierten werkstoffen
|
|
US6130419A
(en)
*
|
1996-07-10 |
2000-10-10 |
Wavefront Sciences, Inc. |
Fixed mount wavefront sensor
|
|
US6271914B1
(en)
*
|
1996-11-25 |
2001-08-07 |
Autonomous Technologies Corporation |
Objective measurement and correction of optical systems using wavefront analysis
|
|
US5777719A
(en)
*
|
1996-12-23 |
1998-07-07 |
University Of Rochester |
Method and apparatus for improving vision and the resolution of retinal images
|
|
US6632380B1
(en)
|
1997-07-25 |
2003-10-14 |
Zipperling Kessler & Co. (Gmbh & Co.) |
Chemical compounds made of intrinsically conductive polymers and metals
|
|
US6086204A
(en)
*
|
1999-09-20 |
2000-07-11 |
Magnante; Peter C. |
Methods and devices to design and fabricate surfaces on contact lenses and on corneal tissue that correct the eye's optical aberrations
|
|
US6264328B1
(en)
*
|
1999-10-21 |
2001-07-24 |
University Of Rochester |
Wavefront sensor with off-axis illumination
|
|
US6199986B1
(en)
*
|
1999-10-21 |
2001-03-13 |
University Of Rochester |
Rapid, automatic measurement of the eye's wave aberration
|
|
US6565209B2
(en)
*
|
2000-04-25 |
2003-05-20 |
Alcon Universal Ltd. |
Range-extending system and spatial filter for enhancing Hartmann-Shack images and associated methods
|
|
US6460997B1
(en)
*
|
2000-05-08 |
2002-10-08 |
Alcon Universal Ltd. |
Apparatus and method for objective measurements of optical systems using wavefront analysis
|
|
ATE334623T1
(de)
*
|
2000-10-10 |
2006-08-15 |
Univ Rochester |
Bestimmung der okularen refraktion mittels wellenfrontaberrationsdaten
|
|
JP4649035B2
(ja)
*
|
2000-10-18 |
2011-03-09 |
株式会社トプコン |
眼特性測定装置
|
|
US6827444B2
(en)
*
|
2000-10-20 |
2004-12-07 |
University Of Rochester |
Rapid, automatic measurement of the eye's wave aberration
|
|
CA2437345A1
(en)
*
|
2001-02-09 |
2002-08-22 |
Kabushiki Kaisha Topcon |
Eye characteristics measuring apparatus
|
|
UA59488C2
(uk)
*
|
2001-10-03 |
2003-09-15 |
Василь Васильович Молебний |
Спосіб вимірювання хвильових аберацій ока та пристрій для його здійснення (варіанти)
|
|
JP4694025B2
(ja)
*
|
2001-04-18 |
2011-06-01 |
株式会社トプコン |
眼特性測定装置
|
|
US6572230B2
(en)
*
|
2001-06-05 |
2003-06-03 |
Metrologic Instruments, Inc. |
Ophthalmic instrument having an integral wavefront sensor and display device that displays a graphical representation of high order aberrations of the human eye measured by the wavefront sensor
|
|
US6709108B2
(en)
|
2001-08-31 |
2004-03-23 |
Adaptive Optics Associates, Inc. |
Ophthalmic instrument with adaptive optic subsystem that measures aberrations (including higher order aberrations) of a human eye and that provides a view of compensation of such aberrations to the human eye
|
|
US6575572B2
(en)
*
|
2001-09-21 |
2003-06-10 |
Carl Zeiss Ophthalmic Systems, Inc. |
Method and apparatus for measuring optical aberrations of an eye
|
|
WO2003053230A1
(en)
*
|
2001-12-11 |
2003-07-03 |
Kabushiki Kaisha Topcon |
Eye characteristic measuring apparatus
|
|
US7077522B2
(en)
|
2002-05-03 |
2006-07-18 |
University Of Rochester |
Sharpness metric for vision quality
|
|
US7078665B2
(en)
*
|
2002-07-09 |
2006-07-18 |
Wavefront Sciences, Inc. |
System and method of wavefront sensing for determining a location of focal spot
|
|
US20040021826A1
(en)
*
|
2002-08-01 |
2004-02-05 |
Sarver Edwin J. |
Combination advanced corneal topography/wave front aberration measurement
|
|
JP4245968B2
(ja)
*
|
2003-04-23 |
2009-04-02 |
株式会社小糸製作所 |
車両用前照灯
|
|
DE10333794A1
(de)
|
2003-07-24 |
2005-03-03 |
Technovision Gmbh |
Verfahren und Vorrichtung zur Online-Kontaktlinsenbewertung
|
|
US20060126019A1
(en)
*
|
2004-12-10 |
2006-06-15 |
Junzhong Liang |
Methods and systems for wavefront analysis
|
|
US20060126018A1
(en)
*
|
2004-12-10 |
2006-06-15 |
Junzhong Liang |
Methods and apparatus for wavefront sensing of human eyes
|
|
US8439502B2
(en)
*
|
2005-03-09 |
2013-05-14 |
Advanced Vision Engineering, Inc |
Algorithms and methods for determining aberration-induced vision symptoms in the eye from wave aberration
|