ATE503176T1 - Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung - Google Patents
Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichungInfo
- Publication number
- ATE503176T1 ATE503176T1 AT07109363T AT07109363T ATE503176T1 AT E503176 T1 ATE503176 T1 AT E503176T1 AT 07109363 T AT07109363 T AT 07109363T AT 07109363 T AT07109363 T AT 07109363T AT E503176 T1 ATE503176 T1 AT E503176T1
- Authority
- AT
- Austria
- Prior art keywords
- full spectrum
- calibration
- light source
- test apparatus
- power supply
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 title abstract 4
- 238000000034 method Methods 0.000 title abstract 2
- 238000012544 monitoring process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/002—Test chambers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/004—Investigating resistance of materials to the weather, to corrosion, or to light to light
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Biodiversity & Conservation Biology (AREA)
- Environmental & Geological Engineering (AREA)
- Ecology (AREA)
- Environmental Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/770,174 US7038196B2 (en) | 2004-02-02 | 2004-02-02 | Accelerated weathering test apparatus with full spectrum calibration, monitoring and control |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE503176T1 true ATE503176T1 (de) | 2011-04-15 |
Family
ID=34750439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT07109363T ATE503176T1 (de) | 2004-02-02 | 2005-01-24 | Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7038196B2 (de) |
| EP (2) | EP1832864B1 (de) |
| JP (2) | JP4874554B2 (de) |
| CN (1) | CN100520353C (de) |
| AT (1) | ATE503176T1 (de) |
| CA (1) | CA2496081C (de) |
| DE (1) | DE602005027117D1 (de) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040233520A1 (en) * | 2001-12-19 | 2004-11-25 | 3M Innovative Properties Company | Optical filters for manipulating spectral power distribution in accelerated weathering devices |
| DE102004037603B3 (de) | 2004-08-03 | 2005-10-27 | Atlas Material Testing Technology Gmbh | Regelung der UV-Strahlungsquellen einer Bewitterungsvorrichtung auf der Basis der gemittelten Strahlungsintensität |
| DE102004037602B4 (de) * | 2004-08-03 | 2006-05-24 | Atlas Material Testing Technology Gmbh | Bewitterungsvorrichtung mit UV-Strahlungsquellen und Strahlungssensoren enthaltend einen zweifach kalibrierten UV-Sensor |
| US7124651B2 (en) * | 2004-08-09 | 2006-10-24 | 3M Innovative Properties Company | Method of accelerated testing of illuminated device components |
| US7318672B2 (en) * | 2005-03-31 | 2008-01-15 | Atlas Material Testing Technology, L.L.C. | Specimen heater and control system for accelerated weathering test apparatus |
| US7400445B2 (en) * | 2005-05-31 | 2008-07-15 | 3M Innovative Properties Company | Optical filters for accelerated weathering devices |
| US20070177144A1 (en) * | 2006-01-27 | 2007-08-02 | Eko Instruments Co., Ltd. | Weathering test apparatus with spectroradiometer and portable spectroradiometer |
| US20070295114A1 (en) * | 2006-06-21 | 2007-12-27 | Atlas Material Testing Technology Llc | Accelerated weathering device with optical slip ring |
| JP4704384B2 (ja) * | 2007-03-20 | 2011-06-15 | アンリツ株式会社 | スペクトラムアナライザ |
| US20100005911A1 (en) * | 2008-07-11 | 2010-01-14 | Atlas Material Testing Technology, Llc | Weathering Test Apparatus With Real-Time Color Measurement |
| US8670938B2 (en) * | 2010-03-10 | 2014-03-11 | Atlas Materials Testing Technologies, Llc | Methods and apparatus for accurate service life prediction |
| CN102288389B (zh) * | 2011-05-11 | 2016-01-06 | 杭州远方光电信息股份有限公司 | 一种光源老化试验测量装置 |
| KR101306793B1 (ko) | 2012-02-13 | 2013-09-10 | 한국광기술원 | 스펙트럼 혼합 제어 장치 및 방법 |
| EP2682737B1 (de) * | 2012-07-05 | 2024-05-01 | Atlas Material Testing Technology GmbH | Vorrichtung zur Simulation einer spektralen UV-Charakteristik durch UV-Lichtemissionsdioden |
| EP2682738B1 (de) * | 2012-07-05 | 2020-12-23 | Atlas Material Testing Technology GmbH | Detektion der Emissionsstrahlung einer UV-Lichtemissionsdiode durch eine baugleiche UV-Lichtempfangsdiode |
| US9012862B2 (en) | 2012-09-21 | 2015-04-21 | Industrial Technology Research Institute | Material aging test apparatus and method thereof |
| JP5495216B1 (ja) * | 2013-07-26 | 2014-05-21 | スガ試験機株式会社 | 耐候性試験機および固体発光素子システム |
| EP2846147B1 (de) * | 2013-09-06 | 2020-01-01 | Atlas Material Testing Technology GmbH | Bewitterungsprüfung unter Nutzung von Mittels RFID-Chips identifizierbaren Strahlungsquellen |
| EP2846146B1 (de) * | 2013-09-06 | 2020-01-08 | Atlas Material Testing Technology GmbH | Bewitterungsprüfung mit mehreren unabhängig voneinander ansteuerbaren Strahlungsquellen |
| FR3031181B1 (fr) * | 2014-12-26 | 2017-02-10 | Airbus Operations Sas | Dispositif pour la realisation d'essais de vieillissement accelere d'un revetement par plusieurs types de sollicitations |
| CN104808366B (zh) * | 2015-05-15 | 2018-01-09 | 合肥鑫晟光电科技有限公司 | 一种光学膜片的测试装置 |
| CN105424587B (zh) * | 2015-12-11 | 2023-08-29 | 苏州市华测检测技术有限公司 | 汽车材料模拟太阳光照射测试设备 |
| US10739253B2 (en) * | 2016-06-07 | 2020-08-11 | Youv Labs, Inc. | Methods, systems, and devices for calibrating light sensing devices |
| US10876886B2 (en) | 2018-10-19 | 2020-12-29 | Youv Labs, Inc. | Methods, systems, and apparatuses for accurate measurement of health relevant UV exposure from sunlight |
| JP2020173119A (ja) * | 2019-04-08 | 2020-10-22 | 三菱電機株式会社 | 試験装置および試験方法 |
| CN110189703B (zh) * | 2019-06-28 | 2022-02-18 | 武汉天马微电子有限公司 | 一种显示面板和显示装置 |
| CN114088674A (zh) * | 2021-11-17 | 2022-02-25 | 南京市计量监督检测院 | 一种pcr仪的光学检测装置中标准光源线性校准方法 |
| KR102580674B1 (ko) * | 2021-12-22 | 2023-09-19 | 한국화학연구원 | 가상 내후성 시험 서비스 제공 방법, 장치 및 시스템 |
| CN115825582B (zh) * | 2022-11-01 | 2023-11-03 | 深圳技术大学 | 一种便携式微气象电磁参数测试装置 |
Family Cites Families (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3870873A (en) * | 1971-04-07 | 1975-03-11 | Mbr Corp | Environmental chamber |
| DE2250751A1 (de) * | 1971-11-01 | 1973-05-17 | Atlas Electric Devices Co | Lichtregel-einheit |
| US4012663A (en) * | 1974-11-25 | 1977-03-15 | General Electric Company | Lighting control system |
| JPS5429034Y2 (de) * | 1975-05-01 | 1979-09-17 | ||
| JPS5515082Y2 (de) * | 1975-09-30 | 1980-04-07 | ||
| US4025440A (en) * | 1975-09-30 | 1977-05-24 | Shigeru Suga | Device for regulating a xenon lamp with optical and temperature compensation |
| DE2940325A1 (de) * | 1979-10-04 | 1981-04-09 | Original Hanau Heraeus Gmbh | Strahlungsmengenmesser |
| DE3310631A1 (de) * | 1983-03-24 | 1984-10-04 | W.C. Heraeus Gmbh, 6450 Hanau | Licht- und wetterechtheitspruefgeraet |
| DE8308709U1 (de) * | 1983-03-24 | 1983-08-04 | W.C. Heraeus Gmbh, 6450 Hanau | Sensor |
| JPH0812108B2 (ja) * | 1986-06-27 | 1996-02-07 | 浜松ホトニクス株式会社 | 分光測光装置 |
| JPS6438631A (en) * | 1987-08-01 | 1989-02-08 | Suga Test Instruments | Spectral irradiation apparatus |
| US4825078A (en) * | 1987-10-22 | 1989-04-25 | Atlas Electric Devices Co. | Radiation sensor |
| US5004349A (en) * | 1988-04-05 | 1991-04-02 | Minolta Camera Kabushiki Kaisha | Lighting apparatus and color measuring apparatus using the same |
| US4894683A (en) * | 1988-12-05 | 1990-01-16 | Eastman Kodak Company | Variable brightness light generators |
| US4922089A (en) * | 1988-12-05 | 1990-05-01 | Eastman Kodak Company | Constant color temperature and intensity illumination source |
| JP2862953B2 (ja) * | 1990-05-15 | 1999-03-03 | 株式会社和廣武 | 疑似太陽光照射装置およびそのスペクトル調整方法 |
| US5136886A (en) * | 1990-11-06 | 1992-08-11 | Atlas Electric Devices Co. | Accelerated weathering and lightfastness testing chamber |
| US5226318A (en) * | 1991-09-20 | 1993-07-13 | Atlas Electric Devices Co. | Weathering tester |
| US5206518A (en) * | 1991-12-02 | 1993-04-27 | Q-Panel Company | Accelerated weathering apparatus |
| US5340974A (en) * | 1991-12-09 | 1994-08-23 | Hughes Aircraft Company | Polychromatic source calibration by one or more spectrally filtered photodetector currents |
| JP2774010B2 (ja) * | 1992-02-07 | 1998-07-09 | スガ試験機株式会社 | キセノンランプの保護回路 |
| DE4325718C2 (de) | 1993-08-02 | 1999-03-11 | Xenotest Ges Fuer Die Herstell | Beleuchtungsanordnung für Licht- und Wetterechtheitsprüfgeräte mit einer Xenon-Gas-Entladungslampe |
| JPH07103825A (ja) * | 1993-10-05 | 1995-04-21 | Suga Test Instr Co Ltd | 赤外分光放射エネルギー測定装置 |
| JP2640212B2 (ja) * | 1994-02-22 | 1997-08-13 | スガ試験機株式会社 | 分光照射装置 |
| US5521392A (en) * | 1994-04-29 | 1996-05-28 | Efos Canada Inc. | Light cure system with closed loop control and work piece recording |
| JP2957917B2 (ja) * | 1995-01-20 | 1999-10-06 | スガ試験機株式会社 | 光加速分光劣化試験装置 |
| US5503032A (en) * | 1995-02-23 | 1996-04-02 | Atlas Electric Devices Co. | High accuracy weathering test machine |
| US5854433A (en) * | 1996-11-08 | 1998-12-29 | Atlas Electric Devices Co. | Variable rotation and irradiation weathering testing machine |
| JPH11352057A (ja) * | 1998-04-27 | 1999-12-24 | Perkin Elmer Corp:The | スペクトルメ―タ装置および集積スペクトルメ―タ装置 |
| EP1025429A1 (de) * | 1998-08-26 | 2000-08-09 | Q-Panel Lab Products Corporation | Prüfkammer mit einer xenonlampe |
| US6303916B1 (en) * | 1998-12-24 | 2001-10-16 | Mitutoyo Corporation | Systems and methods for generating reproducible illumination |
| US6362878B1 (en) * | 1999-10-29 | 2002-03-26 | Agilent Technologies, Inc. | Multipoint wavelength calibration technique |
| US6239554B1 (en) * | 1999-12-30 | 2001-05-29 | Mitutoyo Corporation | Open-loop light intensity calibration systems and methods |
| JP2002247296A (ja) * | 2001-02-14 | 2002-08-30 | Canon Inc | 白色ledアレーを光源に用いた画像読取装置および画像形成装置、記録媒体並びにプログラム |
| JP3465049B2 (ja) * | 2001-03-08 | 2003-11-10 | 独立行政法人産業技術総合研究所 | 疑似光発生装置 |
| US6720562B2 (en) * | 2001-04-02 | 2004-04-13 | Atlas Material Testing Technology, L.L.C. | Accelerated weathering apparatus |
| CN1259557C (zh) * | 2001-04-02 | 2006-06-14 | 阿特拉斯材料测试技术有限责任公司 | 改进的加速老化装置 |
| JP3291504B1 (ja) * | 2001-07-12 | 2002-06-10 | スガ試験機株式会社 | 耐候光性試験装置 |
| US6533452B1 (en) * | 2001-10-30 | 2003-03-18 | Atlas Material Testing Technology, L.L.C. | Accelerated weathering test apparatus with soaking cycle |
| CN2577276Y (zh) * | 2002-11-07 | 2003-10-01 | 国家建筑材料工业局标准化研究所 | 新型氙灯耐气候试验机 |
| CN2585224Y (zh) * | 2002-12-17 | 2003-11-05 | 广州电器科学研究院 | 自然大气加速曝露试验装置 |
-
2004
- 2004-02-02 US US10/770,174 patent/US7038196B2/en not_active Expired - Lifetime
-
2005
- 2005-01-24 AT AT07109363T patent/ATE503176T1/de not_active IP Right Cessation
- 2005-01-24 EP EP07109363A patent/EP1832864B1/de not_active Expired - Lifetime
- 2005-01-24 EP EP05250328A patent/EP1571439A3/de not_active Withdrawn
- 2005-01-24 DE DE602005027117T patent/DE602005027117D1/de not_active Expired - Lifetime
- 2005-02-02 JP JP2005026893A patent/JP4874554B2/ja not_active Expired - Fee Related
- 2005-02-02 CA CA2496081A patent/CA2496081C/en not_active Expired - Fee Related
- 2005-02-02 CN CNB2005100078168A patent/CN100520353C/zh not_active Expired - Fee Related
-
2011
- 2011-10-24 JP JP2011232764A patent/JP5554765B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1651900A (zh) | 2005-08-10 |
| DE602005027117D1 (de) | 2011-05-05 |
| EP1832864A2 (de) | 2007-09-12 |
| CA2496081C (en) | 2013-10-22 |
| EP1571439A3 (de) | 2007-08-22 |
| JP2005221502A (ja) | 2005-08-18 |
| EP1832864A3 (de) | 2008-02-27 |
| EP1571439A2 (de) | 2005-09-07 |
| EP1832864B1 (de) | 2011-03-23 |
| CA2496081A1 (en) | 2005-08-02 |
| US7038196B2 (en) | 2006-05-02 |
| US20050167580A1 (en) | 2005-08-04 |
| JP5554765B2 (ja) | 2014-07-23 |
| JP4874554B2 (ja) | 2012-02-15 |
| CN100520353C (zh) | 2009-07-29 |
| JP2012018190A (ja) | 2012-01-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |