ATE503176T1 - Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung - Google Patents

Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung

Info

Publication number
ATE503176T1
ATE503176T1 AT07109363T AT07109363T ATE503176T1 AT E503176 T1 ATE503176 T1 AT E503176T1 AT 07109363 T AT07109363 T AT 07109363T AT 07109363 T AT07109363 T AT 07109363T AT E503176 T1 ATE503176 T1 AT E503176T1
Authority
AT
Austria
Prior art keywords
full spectrum
calibration
light source
test apparatus
power supply
Prior art date
Application number
AT07109363T
Other languages
English (en)
Inventor
Kurt Scott
Christopher Waas
Anatoliy Ivanov
Original Assignee
Atlas Mat Testing Tech Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atlas Mat Testing Tech Gmbh filed Critical Atlas Mat Testing Tech Gmbh
Application granted granted Critical
Publication of ATE503176T1 publication Critical patent/ATE503176T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/002Test chambers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light
    • G01N17/004Investigating resistance of materials to the weather, to corrosion, or to light to light

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Biodiversity & Conservation Biology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Ecology (AREA)
  • Environmental Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
AT07109363T 2004-02-02 2005-01-24 Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung ATE503176T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/770,174 US7038196B2 (en) 2004-02-02 2004-02-02 Accelerated weathering test apparatus with full spectrum calibration, monitoring and control

Publications (1)

Publication Number Publication Date
ATE503176T1 true ATE503176T1 (de) 2011-04-15

Family

ID=34750439

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07109363T ATE503176T1 (de) 2004-02-02 2005-01-24 Bewitterungsgerät und -verfahren mit stromzufuhrkontrolle an hand einer vollspektrumeichung

Country Status (7)

Country Link
US (1) US7038196B2 (de)
EP (2) EP1832864B1 (de)
JP (2) JP4874554B2 (de)
CN (1) CN100520353C (de)
AT (1) ATE503176T1 (de)
CA (1) CA2496081C (de)
DE (1) DE602005027117D1 (de)

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US20100005911A1 (en) * 2008-07-11 2010-01-14 Atlas Material Testing Technology, Llc Weathering Test Apparatus With Real-Time Color Measurement
US8670938B2 (en) * 2010-03-10 2014-03-11 Atlas Materials Testing Technologies, Llc Methods and apparatus for accurate service life prediction
CN102288389B (zh) * 2011-05-11 2016-01-06 杭州远方光电信息股份有限公司 一种光源老化试验测量装置
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EP2682737B1 (de) * 2012-07-05 2024-05-01 Atlas Material Testing Technology GmbH Vorrichtung zur Simulation einer spektralen UV-Charakteristik durch UV-Lichtemissionsdioden
EP2682738B1 (de) * 2012-07-05 2020-12-23 Atlas Material Testing Technology GmbH Detektion der Emissionsstrahlung einer UV-Lichtemissionsdiode durch eine baugleiche UV-Lichtempfangsdiode
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EP2846147B1 (de) * 2013-09-06 2020-01-01 Atlas Material Testing Technology GmbH Bewitterungsprüfung unter Nutzung von Mittels RFID-Chips identifizierbaren Strahlungsquellen
EP2846146B1 (de) * 2013-09-06 2020-01-08 Atlas Material Testing Technology GmbH Bewitterungsprüfung mit mehreren unabhängig voneinander ansteuerbaren Strahlungsquellen
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CN105424587B (zh) * 2015-12-11 2023-08-29 苏州市华测检测技术有限公司 汽车材料模拟太阳光照射测试设备
US10739253B2 (en) * 2016-06-07 2020-08-11 Youv Labs, Inc. Methods, systems, and devices for calibrating light sensing devices
US10876886B2 (en) 2018-10-19 2020-12-29 Youv Labs, Inc. Methods, systems, and apparatuses for accurate measurement of health relevant UV exposure from sunlight
JP2020173119A (ja) * 2019-04-08 2020-10-22 三菱電機株式会社 試験装置および試験方法
CN110189703B (zh) * 2019-06-28 2022-02-18 武汉天马微电子有限公司 一种显示面板和显示装置
CN114088674A (zh) * 2021-11-17 2022-02-25 南京市计量监督检测院 一种pcr仪的光学检测装置中标准光源线性校准方法
KR102580674B1 (ko) * 2021-12-22 2023-09-19 한국화학연구원 가상 내후성 시험 서비스 제공 방법, 장치 및 시스템
CN115825582B (zh) * 2022-11-01 2023-11-03 深圳技术大学 一种便携式微气象电磁参数测试装置

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Also Published As

Publication number Publication date
CN1651900A (zh) 2005-08-10
DE602005027117D1 (de) 2011-05-05
EP1832864A2 (de) 2007-09-12
CA2496081C (en) 2013-10-22
EP1571439A3 (de) 2007-08-22
JP2005221502A (ja) 2005-08-18
EP1832864A3 (de) 2008-02-27
EP1571439A2 (de) 2005-09-07
EP1832864B1 (de) 2011-03-23
CA2496081A1 (en) 2005-08-02
US7038196B2 (en) 2006-05-02
US20050167580A1 (en) 2005-08-04
JP5554765B2 (ja) 2014-07-23
JP4874554B2 (ja) 2012-02-15
CN100520353C (zh) 2009-07-29
JP2012018190A (ja) 2012-01-26

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