ATE500487T1 - SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM - Google Patents

SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM

Info

Publication number
ATE500487T1
ATE500487T1 AT06124619T AT06124619T ATE500487T1 AT E500487 T1 ATE500487 T1 AT E500487T1 AT 06124619 T AT06124619 T AT 06124619T AT 06124619 T AT06124619 T AT 06124619T AT E500487 T1 ATE500487 T1 AT E500487T1
Authority
AT
Austria
Prior art keywords
field
excitation
dimension
signal processing
transfer function
Prior art date
Application number
AT06124619T
Other languages
English (en)
Inventor
Jarl Sobel
Original Assignee
Abb Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Ab filed Critical Abb Ab
Application granted granted Critical
Publication of ATE500487T1 publication Critical patent/ATE500487T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Multi-Process Working Machines And Systems (AREA)
  • General Factory Administration (AREA)
  • Measuring Magnetic Variables (AREA)
AT06124619T 2006-11-23 2006-11-23 SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM ATE500487T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06124619A EP1925905B1 (de) 2006-11-23 2006-11-23 Signalverarbeitungsverfahren und Einheit für ein Größenmesssystem

Publications (1)

Publication Number Publication Date
ATE500487T1 true ATE500487T1 (de) 2011-03-15

Family

ID=37952409

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06124619T ATE500487T1 (de) 2006-11-23 2006-11-23 SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM

Country Status (7)

Country Link
US (1) US8280690B2 (de)
EP (1) EP1925905B1 (de)
JP (1) JP5155332B2 (de)
CN (1) CN101542229B (de)
AT (1) ATE500487T1 (de)
DE (1) DE602006020462D1 (de)
WO (1) WO2008062031A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014129151A1 (ja) * 2013-02-25 2014-08-28 国立大学法人神戸大学 分布解析装置および分布解析方法
CA2951848C (en) 2015-12-15 2024-01-16 Eddyfi Ndt Inc. Pulsed eddy current testing with dual-purpose coils
KR101921462B1 (ko) * 2016-11-16 2018-11-23 유진인스텍코어 주식회사 금속박 두께 측정장치

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE451886B (sv) * 1986-10-10 1987-11-02 Sten Linder Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material
JPH0648286B2 (ja) * 1986-10-28 1994-06-22 日本たばこ産業株式会社 伝達関数測定装置
JPH02110310A (ja) * 1988-10-19 1990-04-23 Nippon Electric Ind Co Ltd 膜厚測定装置
JPH06505586A (ja) * 1991-08-26 1994-06-23 ザ　フォックスボロ　カンパニー 多変数適応フィードフォワード制御器
JPH0579934A (ja) * 1991-09-24 1993-03-30 Japan Electron Control Syst Co Ltd 駆動輪の接地面トルク検出方法及び装置
US5453689A (en) * 1991-12-06 1995-09-26 Massachusetts Institute Of Technology Magnetometer having periodic winding structure and material property estimator
DE4433772A1 (de) * 1994-09-22 1996-03-28 Micro Epsilon Messtechnik Sensoranordnung und Verfahren zur Meßwerterfassung mit der Sensoranordnung
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
US5847562A (en) * 1996-05-08 1998-12-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm
US6037768A (en) * 1997-04-02 2000-03-14 Iowa State University Research Foundation, Inc. Pulsed eddy current inspections and the calibration and display of inspection results
JPH1144645A (ja) * 1997-07-28 1999-02-16 Shimadzu Corp 分析装置のデータ処理装置
DE29722715U1 (de) * 1997-12-30 1999-04-29 Klaschka GmbH & Co, 75233 Tiefenbronn Blechdicken-Meßeinrichtung
JP3767177B2 (ja) * 1998-06-29 2006-04-19 東海ゴム工業株式会社 アクティブ制御装置
WO2000037881A2 (de) * 1998-12-18 2000-06-29 Micro-Epsilon Messtechnik Gmbh & Co. Kg Verfahren zum betreiben eines wirbelstromsensors und wirbelstromsensor
KR100317598B1 (ko) * 1999-03-13 2001-12-22 박찬구 라플라스 변환 임피던스 측정방법 및 측정장치
SE517293C2 (sv) * 1999-06-30 2002-05-21 Abb Ab Förfarande och anordning för induktiv mätning av geometrisk dimension och elektrisk egenskap med motriktade magnetfält
JP4352201B2 (ja) * 2001-05-15 2009-10-28 株式会社島津製作所 サーボ式材料試験機
JP2003240504A (ja) * 2002-02-18 2003-08-27 Mitsubishi Heavy Ind Ltd 渦電流磁界検出型の膜厚測定用パターン、及び、その膜厚測定方法
US7005851B2 (en) * 2003-09-30 2006-02-28 General Electric Company Methods and apparatus for inspection utilizing pulsed eddy current
SE527125C2 (sv) 2003-12-31 2005-12-27 Abb Ab Metod och anordning för beröringsfri mätning av tjocklek eller ledningsförmåga med elektromagnetisk induktion
SE527091C2 (sv) 2003-12-31 2005-12-20 Abb Ab Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt
JP4390614B2 (ja) * 2004-01-16 2009-12-24 株式会社アルバック 膜厚測定装置
US7113876B2 (en) * 2004-09-08 2006-09-26 Sentech Biomed Corporation Technique and electronic circuitry for quantifying a transient signal using threshold-crossing counting to track signal amplitude
WO2006042540A1 (en) * 2004-10-19 2006-04-27 Widex A/S System and method for adaptive microphone matching in a hearing aid
CN101069094A (zh) * 2004-11-30 2007-11-07 皇家飞利浦电子股份有限公司 用于降低生物传感器中的磁串扰的装置和方法
JP2006278698A (ja) * 2005-03-29 2006-10-12 Kyocera Corp シリコンウエハのクラック検出方法及びその検出装置
JP2006283808A (ja) * 2005-03-31 2006-10-19 Tokkyokiki Corp 制振装置及び制振装置の設計方法

Also Published As

Publication number Publication date
JP5155332B2 (ja) 2013-03-06
CN101542229B (zh) 2011-12-21
US20090230951A1 (en) 2009-09-17
WO2008062031A1 (en) 2008-05-29
CN101542229A (zh) 2009-09-23
EP1925905A1 (de) 2008-05-28
JP2010510509A (ja) 2010-04-02
EP1925905B1 (de) 2011-03-02
US8280690B2 (en) 2012-10-02
DE602006020462D1 (de) 2011-04-14

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