ATE500487T1 - SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM - Google Patents
SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEMInfo
- Publication number
- ATE500487T1 ATE500487T1 AT06124619T AT06124619T ATE500487T1 AT E500487 T1 ATE500487 T1 AT E500487T1 AT 06124619 T AT06124619 T AT 06124619T AT 06124619 T AT06124619 T AT 06124619T AT E500487 T1 ATE500487 T1 AT E500487T1
- Authority
- AT
- Austria
- Prior art keywords
- field
- excitation
- dimension
- signal processing
- transfer function
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Magnetic Variables (AREA)
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
- Multi-Process Working Machines And Systems (AREA)
- General Factory Administration (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06124619A EP1925905B1 (de) | 2006-11-23 | 2006-11-23 | Signalverarbeitungsverfahren und Einheit für ein Größenmesssystem |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE500487T1 true ATE500487T1 (de) | 2011-03-15 |
Family
ID=37952409
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT06124619T ATE500487T1 (de) | 2006-11-23 | 2006-11-23 | SIGNALVERARBEITUNGSVERFAHREN UND EINHEIT FÜR EIN GRÖßENMESSSYSTEM |
Country Status (7)
Country | Link |
---|---|
US (1) | US8280690B2 (de) |
EP (1) | EP1925905B1 (de) |
JP (1) | JP5155332B2 (de) |
CN (1) | CN101542229B (de) |
AT (1) | ATE500487T1 (de) |
DE (1) | DE602006020462D1 (de) |
WO (1) | WO2008062031A1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105122076B (zh) * | 2013-02-25 | 2017-10-13 | 国立大学法人神户大学 | 分布解析装置及分布解析方法 |
US9880130B2 (en) | 2015-12-15 | 2018-01-30 | Eddyfi Ndt Inc. | Pulsed eddy current testing with dual-purpose coils |
KR101921462B1 (ko) * | 2016-11-16 | 2018-11-23 | 유진인스텍코어 주식회사 | 금속박 두께 측정장치 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE451886B (sv) | 1986-10-10 | 1987-11-02 | Sten Linder | Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material |
JPH0648286B2 (ja) * | 1986-10-28 | 1994-06-22 | 日本たばこ産業株式会社 | 伝達関数測定装置 |
JPH02110310A (ja) * | 1988-10-19 | 1990-04-23 | Nippon Electric Ind Co Ltd | 膜厚測定装置 |
CA2094707C (en) * | 1991-08-26 | 2003-01-21 | Edgar H. Bristol | Multivariable adaptive feedforward controller |
JPH0579934A (ja) * | 1991-09-24 | 1993-03-30 | Japan Electron Control Syst Co Ltd | 駆動輪の接地面トルク検出方法及び装置 |
US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
DE4433772A1 (de) * | 1994-09-22 | 1996-03-28 | Micro Epsilon Messtechnik | Sensoranordnung und Verfahren zur Meßwerterfassung mit der Sensoranordnung |
US5541510A (en) * | 1995-04-06 | 1996-07-30 | Kaman Instrumentation Corporation | Multi-Parameter eddy current measuring system with parameter compensation technical field |
US5847562A (en) * | 1996-05-08 | 1998-12-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm |
US6037768A (en) * | 1997-04-02 | 2000-03-14 | Iowa State University Research Foundation, Inc. | Pulsed eddy current inspections and the calibration and display of inspection results |
JPH1144645A (ja) * | 1997-07-28 | 1999-02-16 | Shimadzu Corp | 分析装置のデータ処理装置 |
DE29722715U1 (de) * | 1997-12-30 | 1999-04-29 | Klaschka Gmbh & Co | Blechdicken-Meßeinrichtung |
JP3767177B2 (ja) * | 1998-06-29 | 2006-04-19 | 東海ゴム工業株式会社 | アクティブ制御装置 |
EP1141654B1 (de) * | 1998-12-18 | 2005-03-02 | Micro-Epsilon Messtechnik GmbH & Co. KG | Betreiben eines wirbelstromsensors |
KR100317598B1 (ko) * | 1999-03-13 | 2001-12-22 | 박찬구 | 라플라스 변환 임피던스 측정방법 및 측정장치 |
SE517293C2 (sv) * | 1999-06-30 | 2002-05-21 | Abb Ab | Förfarande och anordning för induktiv mätning av geometrisk dimension och elektrisk egenskap med motriktade magnetfält |
JP4352201B2 (ja) * | 2001-05-15 | 2009-10-28 | 株式会社島津製作所 | サーボ式材料試験機 |
JP2003240504A (ja) * | 2002-02-18 | 2003-08-27 | Mitsubishi Heavy Ind Ltd | 渦電流磁界検出型の膜厚測定用パターン、及び、その膜厚測定方法 |
US7005851B2 (en) * | 2003-09-30 | 2006-02-28 | General Electric Company | Methods and apparatus for inspection utilizing pulsed eddy current |
SE527091C2 (sv) | 2003-12-31 | 2005-12-20 | Abb Ab | Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt |
SE527125C2 (sv) | 2003-12-31 | 2005-12-27 | Abb Ab | Metod och anordning för beröringsfri mätning av tjocklek eller ledningsförmåga med elektromagnetisk induktion |
JP4390614B2 (ja) * | 2004-01-16 | 2009-12-24 | 株式会社アルバック | 膜厚測定装置 |
US7113876B2 (en) * | 2004-09-08 | 2006-09-26 | Sentech Biomed Corporation | Technique and electronic circuitry for quantifying a transient signal using threshold-crossing counting to track signal amplitude |
CA2581118C (en) * | 2004-10-19 | 2013-05-07 | Widex A/S | A system and method for adaptive microphone matching in a hearing aid |
WO2006059268A2 (en) * | 2004-11-30 | 2006-06-08 | Koninklijke Philips Electronics N.V. | A method for calibrating a transfer function of a magnetic sensor |
JP2006278698A (ja) * | 2005-03-29 | 2006-10-12 | Kyocera Corp | シリコンウエハのクラック検出方法及びその検出装置 |
JP2006283808A (ja) * | 2005-03-31 | 2006-10-19 | Tokkyokiki Corp | 制振装置及び制振装置の設計方法 |
-
2006
- 2006-11-23 EP EP06124619A patent/EP1925905B1/de active Active
- 2006-11-23 DE DE602006020462T patent/DE602006020462D1/de active Active
- 2006-11-23 AT AT06124619T patent/ATE500487T1/de active
-
2007
- 2007-11-22 CN CN2007800435321A patent/CN101542229B/zh active Active
- 2007-11-22 JP JP2009537637A patent/JP5155332B2/ja active Active
- 2007-11-22 WO PCT/EP2007/062675 patent/WO2008062031A1/en active Application Filing
-
2009
- 2009-05-20 US US12/469,287 patent/US8280690B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN101542229B (zh) | 2011-12-21 |
JP5155332B2 (ja) | 2013-03-06 |
JP2010510509A (ja) | 2010-04-02 |
EP1925905A1 (de) | 2008-05-28 |
CN101542229A (zh) | 2009-09-23 |
WO2008062031A1 (en) | 2008-05-29 |
US8280690B2 (en) | 2012-10-02 |
US20090230951A1 (en) | 2009-09-17 |
DE602006020462D1 (de) | 2011-04-14 |
EP1925905B1 (de) | 2011-03-02 |
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