ATE487181T1 - Fehlererkennungsvorrichtung mit niedrigleistungsmodus und entsprechendes verfahren - Google Patents

Fehlererkennungsvorrichtung mit niedrigleistungsmodus und entsprechendes verfahren

Info

Publication number
ATE487181T1
ATE487181T1 AT08744355T AT08744355T ATE487181T1 AT E487181 T1 ATE487181 T1 AT E487181T1 AT 08744355 T AT08744355 T AT 08744355T AT 08744355 T AT08744355 T AT 08744355T AT E487181 T1 ATE487181 T1 AT E487181T1
Authority
AT
Austria
Prior art keywords
keeper
low power
power mode
integrated circuit
circuit device
Prior art date
Application number
AT08744355T
Other languages
English (en)
Inventor
Michael Simmons
Original Assignee
Microchip Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Tech Inc filed Critical Microchip Tech Inc
Application granted granted Critical
Publication of ATE487181T1 publication Critical patent/ATE487181T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1666—Error detection or correction of the data by redundancy in hardware where the redundant component is memory or memory area
    • G06F11/167—Error detection by comparing the memory output
AT08744355T 2007-03-27 2008-03-26 Fehlererkennungsvorrichtung mit niedrigleistungsmodus und entsprechendes verfahren ATE487181T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US90832807P 2007-03-27 2007-03-27
US12/017,521 US7908516B2 (en) 2007-03-27 2008-01-22 Low power mode fault recovery method, system and apparatus
PCT/US2008/058196 WO2008118933A1 (en) 2007-03-27 2008-03-26 Low power mode fault recovery apparatus and method therefor

Publications (1)

Publication Number Publication Date
ATE487181T1 true ATE487181T1 (de) 2010-11-15

Family

ID=39684297

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08744355T ATE487181T1 (de) 2007-03-27 2008-03-26 Fehlererkennungsvorrichtung mit niedrigleistungsmodus und entsprechendes verfahren

Country Status (7)

Country Link
US (1) US7908516B2 (de)
EP (1) EP2130123B1 (de)
CN (1) CN101647005B (de)
AT (1) ATE487181T1 (de)
DE (1) DE602008003317D1 (de)
TW (1) TWI465895B (de)
WO (1) WO2008118933A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8060204B2 (en) * 2008-02-28 2011-11-15 Cardiac Pacemakers, Inc. Low power digital design for deep submicron technology
US8896975B2 (en) 2012-01-18 2014-11-25 Microchip Technology Incorporated Voltage regulator over-voltage detection system, method and apparatus
KR20180109215A (ko) * 2017-03-27 2018-10-08 에스케이하이닉스 주식회사 반도체장치

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2768520B2 (ja) * 1989-02-17 1998-06-25 ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング ネツトワークインターフエース
FR2732133B1 (fr) * 1995-03-21 1997-04-25 Sgs Thomson Microelectronics Detecteur de coherence d'informations contenues dans un circuit integre
JP3846939B2 (ja) * 1995-08-30 2006-11-15 フリースケール セミコンダクター インコーポレイテッド データプロセッサ
US5889981A (en) * 1996-05-07 1999-03-30 Lucent Technologies Inc. Apparatus and method for decoding instructions marked with breakpoint codes to select breakpoint action from plurality of breakpoint actions
US6356960B1 (en) * 1997-10-29 2002-03-12 Sgs-Thomson Microelectronics Limited Microprocessor having an on-chip CPU fetching a debugging routine from a memory in an external debugging device in response to a control signal received through a debugging port
US6016555A (en) * 1997-11-19 2000-01-18 Texas Instruments Incorporated Non-intrusive software breakpoints in a processor instruction execution pipeline
US6389557B1 (en) * 1998-09-16 2002-05-14 Advanced Micro Devices, Inc. Freezing mechanism for debugging
US6418070B1 (en) * 1999-09-02 2002-07-09 Micron Technology, Inc. Memory device tester and method for testing reduced power states
US6510528B1 (en) * 1999-12-14 2003-01-21 International Business Machines Corporation Method for improving personal computer reliability for systems that use certain power saving schemes
US6694451B2 (en) * 2000-12-07 2004-02-17 Hewlett-Packard Development Company, L.P. Method for redundant suspend to RAM
US6862694B1 (en) * 2001-10-05 2005-03-01 Hewlett-Packard Development Company, L.P. System and method for setting and executing breakpoints
JP3910902B2 (ja) * 2002-10-02 2007-04-25 松下電器産業株式会社 集積回路装置
EP1604281B1 (de) 2003-03-20 2006-08-09 ARM Limited Fehlererkennung und fehlerbehebung für systematische und zufällige fehler innerhalb einer verarbeitungsstufe einer integrierten schaltung
CN100378617C (zh) * 2003-09-09 2008-04-02 华宇电脑股份有限公司 网络唤醒装置与方法
US20050188186A1 (en) * 2004-02-23 2005-08-25 Wolczko Mario I. Obtaining execution path information in an instruction sampling system
US7249285B2 (en) * 2004-03-25 2007-07-24 International Business Machines Corporation Address watch breakpoints in a hardware synchronization range
US7213172B2 (en) * 2004-03-31 2007-05-01 Intel Corporation Debugging power management
US7334161B2 (en) * 2004-04-30 2008-02-19 Arm Limited Breakpoint logic unit, debug logic and breakpoint method for a data processing apparatus
TWI261441B (en) * 2004-06-28 2006-09-01 Nokia Corp Method and apparatus for packet aggregation in a wireless communication network
JP4516483B2 (ja) * 2005-06-07 2010-08-04 富士通セミコンダクター株式会社 半導体記憶装置及び情報処理システム
US20070250755A1 (en) * 2006-03-29 2007-10-25 Wayne Burleson Dormant error checker
US7596737B2 (en) * 2006-11-10 2009-09-29 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for testing state retention circuits

Also Published As

Publication number Publication date
WO2008118933A1 (en) 2008-10-02
EP2130123A1 (de) 2009-12-09
CN101647005A (zh) 2010-02-10
EP2130123B1 (de) 2010-11-03
CN101647005B (zh) 2013-09-11
US20080238472A1 (en) 2008-10-02
TW200846895A (en) 2008-12-01
TWI465895B (zh) 2014-12-21
US7908516B2 (en) 2011-03-15
DE602008003317D1 (de) 2010-12-16

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