ATE470842T1 - Verbesserte strahlungsenergiemesseinrichtung mit zwei positionen - Google Patents

Verbesserte strahlungsenergiemesseinrichtung mit zwei positionen

Info

Publication number
ATE470842T1
ATE470842T1 AT04816513T AT04816513T ATE470842T1 AT E470842 T1 ATE470842 T1 AT E470842T1 AT 04816513 T AT04816513 T AT 04816513T AT 04816513 T AT04816513 T AT 04816513T AT E470842 T1 ATE470842 T1 AT E470842T1
Authority
AT
Austria
Prior art keywords
improved
measurement device
radiation energy
energy measurement
radiant energy
Prior art date
Application number
AT04816513T
Other languages
English (en)
Inventor
Nicolas Massoni
Jean-Louis Ouvrier-Buffet
Andre Perez
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE470842T1 publication Critical patent/ATE470842T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Measurement Of Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
AT04816513T 2003-12-08 2004-12-06 Verbesserte strahlungsenergiemesseinrichtung mit zwei positionen ATE470842T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0351000A FR2863357B1 (fr) 2003-12-08 2003-12-08 Dispositif de mesure d'energie rayonnante ameliore a deux positions
PCT/FR2004/050659 WO2005057148A1 (fr) 2003-12-08 2004-12-06 Dispositif de mesure d'energie rayonnante ameliore a deux positions.

Publications (1)

Publication Number Publication Date
ATE470842T1 true ATE470842T1 (de) 2010-06-15

Family

ID=34586455

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04816513T ATE470842T1 (de) 2003-12-08 2004-12-06 Verbesserte strahlungsenergiemesseinrichtung mit zwei positionen

Country Status (6)

Country Link
US (1) US7541585B2 (de)
EP (1) EP1692475B1 (de)
AT (1) ATE470842T1 (de)
DE (1) DE602004027654D1 (de)
FR (1) FR2863357B1 (de)
WO (1) WO2005057148A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2072976A4 (de) * 2006-10-11 2013-08-14 Panasonic Corp Elektronische einrichtung
EP2015046A1 (de) * 2007-06-06 2009-01-14 Infineon Technologies SensoNor AS Vakuumsensor
US7851759B2 (en) 2007-06-21 2010-12-14 Alcatel-Lucent Usa Inc. Infrared imaging apparatus
KR100925214B1 (ko) * 2007-11-29 2009-11-06 한국전자통신연구원 볼로미터 및 그 제조 방법
US7842923B2 (en) * 2008-07-28 2010-11-30 Alcatel-Lucent Usa Inc. Thermal actuator for an infrared sensor
US9048065B2 (en) * 2009-09-24 2015-06-02 Protochips, Inc. Methods of using temperature control devices in electron microscopy
JP2011153871A (ja) * 2010-01-26 2011-08-11 Seiko Epson Corp 熱型光検出器、熱型光検出装置及び電子機器
WO2013011753A1 (ja) * 2011-07-21 2013-01-24 コニカミノルタホールディングス株式会社 熱センサ
CN113588231A (zh) * 2021-07-14 2021-11-02 江苏汉皇安装集团有限公司 用于机电设备安装的底座固定机构及方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017784A (en) * 1985-03-11 1991-05-21 Savin Corporation Thermal detector
US4695715A (en) * 1985-12-12 1987-09-22 Northrop Corporation Infrared imaging array employing metal tabs as connecting means
EP0566156B1 (de) * 1992-04-17 1997-08-27 Terumo Kabushiki Kaisha Infrarotsensor und Verfahren für dessen Herstellung
US5436450A (en) * 1994-01-13 1995-07-25 Texas Instruments Incorporated Infrared detector local biasing structure and method
FR2752299B1 (fr) 1996-08-08 1998-09-11 Commissariat Energie Atomique Detecteur infrarouge et procede de fabication de celui-ci
WO2001063232A1 (en) * 2000-02-24 2001-08-30 University Of Virginia Patent Foundation High sensitivity infrared sensing apparatus and related method thereof
US6690014B1 (en) * 2000-04-25 2004-02-10 Raytheon Company Microbolometer and method for forming

Also Published As

Publication number Publication date
EP1692475B1 (de) 2010-06-09
WO2005057148A1 (fr) 2005-06-23
US20070116086A1 (en) 2007-05-24
EP1692475A1 (de) 2006-08-23
US7541585B2 (en) 2009-06-02
DE602004027654D1 (de) 2010-07-22
FR2863357A1 (fr) 2005-06-10
FR2863357B1 (fr) 2006-05-05

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Legal Events

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