ATE461445T1 - Vorrichtung und messverfahren zur charakterisierung von oberflächen mittels reflektometrie - Google Patents

Vorrichtung und messverfahren zur charakterisierung von oberflächen mittels reflektometrie

Info

Publication number
ATE461445T1
ATE461445T1 AT07729581T AT07729581T ATE461445T1 AT E461445 T1 ATE461445 T1 AT E461445T1 AT 07729581 T AT07729581 T AT 07729581T AT 07729581 T AT07729581 T AT 07729581T AT E461445 T1 ATE461445 T1 AT E461445T1
Authority
AT
Austria
Prior art keywords
detector
reflectometry
spot
camera
measured
Prior art date
Application number
AT07729581T
Other languages
English (en)
Inventor
Herve Piombini
Philippe Voarino
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE461445T1 publication Critical patent/ATE461445T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
    • G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AT07729581T 2006-05-30 2007-05-29 Vorrichtung und messverfahren zur charakterisierung von oberflächen mittels reflektometrie ATE461445T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0651951A FR2901883B1 (fr) 2006-05-30 2006-05-30 Dispositif et procede de mesure de caracterisation par reflectometrie
PCT/EP2007/055158 WO2007138032A1 (fr) 2006-05-30 2007-05-29 Dispositif et procede de mesure de caracterisation par reflectometrie

Publications (1)

Publication Number Publication Date
ATE461445T1 true ATE461445T1 (de) 2010-04-15

Family

ID=37663169

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07729581T ATE461445T1 (de) 2006-05-30 2007-05-29 Vorrichtung und messverfahren zur charakterisierung von oberflächen mittels reflektometrie

Country Status (9)

Country Link
US (1) US7773208B2 (de)
EP (1) EP2021771B1 (de)
JP (1) JP5363976B2 (de)
AT (1) ATE461445T1 (de)
DE (1) DE602007005371D1 (de)
ES (1) ES2342906T3 (de)
FR (1) FR2901883B1 (de)
PL (1) PL2021771T3 (de)
WO (1) WO2007138032A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8953037B2 (en) 2011-10-14 2015-02-10 Microsoft Corporation Obtaining spatially varying bidirectional reflectance distribution function

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5747813A (en) * 1992-06-16 1998-05-05 Kla-Tencop. Corporation Broadband microspectro-reflectometer
JPH06118296A (ja) * 1992-09-30 1994-04-28 Shimadzu Corp 赤外顕微鏡
US5978074A (en) * 1997-07-03 1999-11-02 Therma-Wave, Inc. Apparatus for evaluating metalized layers on semiconductors
JP4909480B2 (ja) * 1999-09-16 2012-04-04 エムケーエス インストゥルメンツ インコーポレーテッド 層および表面特性の光学測定方法およびその装置
EP1488208A4 (de) * 2001-02-23 2008-05-28 Invitrogen Corp Verfahren zur bereitstellung eines erweiterten dynamikbereichs in analytentests
US7286242B2 (en) * 2001-09-21 2007-10-23 Kmac Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same
US6940592B2 (en) * 2001-10-09 2005-09-06 Applied Materials, Inc. Calibration as well as measurement on the same workpiece during fabrication
US7298496B2 (en) * 2004-05-21 2007-11-20 Zetetic Institute Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry

Also Published As

Publication number Publication date
FR2901883B1 (fr) 2008-09-19
EP2021771B1 (de) 2010-03-17
JP2009539087A (ja) 2009-11-12
US20090116022A1 (en) 2009-05-07
PL2021771T3 (pl) 2010-08-31
WO2007138032A1 (fr) 2007-12-06
US7773208B2 (en) 2010-08-10
EP2021771A1 (de) 2009-02-11
DE602007005371D1 (de) 2010-04-29
ES2342906T3 (es) 2010-07-16
JP5363976B2 (ja) 2013-12-11
FR2901883A1 (fr) 2007-12-07

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Legal Events

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