ATE441832T1 - Verfahren und apparat zur formabweichungsmessung von bearbeiteten oberflächen - Google Patents
Verfahren und apparat zur formabweichungsmessung von bearbeiteten oberflächenInfo
- Publication number
- ATE441832T1 ATE441832T1 AT99203215T AT99203215T ATE441832T1 AT E441832 T1 ATE441832 T1 AT E441832T1 AT 99203215 T AT99203215 T AT 99203215T AT 99203215 T AT99203215 T AT 99203215T AT E441832 T1 ATE441832 T1 AT E441832T1
- Authority
- AT
- Austria
- Prior art keywords
- field
- machined surfaces
- scattered
- reflected
- form deviation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Coating With Molten Metal (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT1998MI002145A IT1302609B1 (it) | 1998-10-06 | 1998-10-06 | Procedimento e relativa apparecchiatura per la misurazione delledeviazioni di forma di superfici lavorate. |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE441832T1 true ATE441832T1 (de) | 2009-09-15 |
Family
ID=11380814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT99203215T ATE441832T1 (de) | 1998-10-06 | 1999-10-01 | Verfahren und apparat zur formabweichungsmessung von bearbeiteten oberflächen |
Country Status (5)
Country | Link |
---|---|
US (1) | US6222628B1 (de) |
EP (1) | EP0992763B1 (de) |
AT (1) | ATE441832T1 (de) |
DE (1) | DE69941350D1 (de) |
IT (1) | IT1302609B1 (de) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1303170B1 (it) * | 1998-07-10 | 2000-10-30 | Fidia Spa | Procedimento e sistema per la realizzazione della compensazione deglierrori statici su macchine utensili a controllo numerico |
US6678062B2 (en) * | 2000-12-08 | 2004-01-13 | Cyberoptics Corporation | Automated system with improved height sensing |
DE10296834B4 (de) * | 2001-05-16 | 2011-05-26 | X-Rite, Inc., Grandville | Überstrahlungsgerichtete Bildgebung |
US20040064929A1 (en) * | 2002-10-08 | 2004-04-08 | Yokabitus Robert P. | Shelf formation system and method |
US7854097B2 (en) * | 2004-01-16 | 2010-12-21 | Jeld-Wen, Inc. | Simulated divided light products and processes and systems for making such products |
US8929688B2 (en) | 2004-10-01 | 2015-01-06 | University Of Washington | Remapping methods to reduce distortions in images |
US7298938B2 (en) * | 2004-10-01 | 2007-11-20 | University Of Washington | Configuration memory for a scanning beam device |
US7784697B2 (en) | 2004-12-23 | 2010-08-31 | University Of Washington | Methods of driving a scanning beam device to achieve high frame rates |
US7159782B2 (en) * | 2004-12-23 | 2007-01-09 | University Of Washington | Methods of driving a scanning beam device to achieve high frame rates |
US7189961B2 (en) | 2005-02-23 | 2007-03-13 | University Of Washington | Scanning beam device with detector assembly |
US20060226231A1 (en) * | 2005-03-29 | 2006-10-12 | University Of Washington | Methods and systems for creating sequential color images |
US7640073B2 (en) | 2005-04-14 | 2009-12-29 | Jeld-Wen, Inc. | Systems and methods of identifying and manipulating objects |
US7395967B2 (en) * | 2005-07-21 | 2008-07-08 | University Of Washington | Methods and systems for counterbalancing a scanning beam device |
US7312879B2 (en) * | 2005-08-23 | 2007-12-25 | University Of Washington | Distance determination in a scanned beam image capture device |
US7684053B2 (en) * | 2006-12-12 | 2010-03-23 | Hong Kong Applied Science And Technology Research Institute Co., Ltd. | Optical displacement sensor and distance measuring apparatus |
US8311777B2 (en) * | 2007-02-22 | 2012-11-13 | Nippon Steel Corporation | Coke oven wall surface evaluation apparatus, coke oven wall surface repair supporting apparatus, coke oven wall surface evaluation method, coke oven wall surface repair supporting method and computer program |
EP1972930B1 (de) * | 2007-03-19 | 2019-11-13 | Concast Ag | Verfahren zur Erkennung von Oberflächenmerkmalen metallurgischer Erzeugnisse, insbesondere Strangguss- und Walzerzeugnisse, sowie eine Einrichtung zur Durchführung des Verfahrens |
US20130081246A1 (en) * | 2011-10-03 | 2013-04-04 | Schmitt Industries, Inc. | Systems and methods for in-process non-contact optical surface roughness measurement |
JP6161262B2 (ja) | 2012-11-19 | 2017-07-12 | 株式会社ミツトヨ | 画像測定機のled照明方法及び装置 |
JP2014163690A (ja) * | 2013-02-21 | 2014-09-08 | Mitsutoyo Corp | 形状測定装置 |
CN104121872B (zh) | 2013-04-26 | 2018-04-13 | 通用电气公司 | 表面粗糙度测量装置 |
CN103471532B (zh) * | 2013-09-10 | 2017-01-04 | 中国商用飞机有限责任公司 | 测量飞行器表面波纹度的系统以及相应方法 |
US10201120B2 (en) * | 2013-10-17 | 2019-02-05 | Yamaha Hatsudoki Kabushiki Kaisha | Component mounting apparatus |
US11266054B2 (en) | 2017-01-24 | 2022-03-08 | Cnh Industrial America Llc | System and method for automatically estimating and adjusting crop residue parameters as a tillage operation is being performed |
US10123475B2 (en) | 2017-02-03 | 2018-11-13 | Cnh Industrial America Llc | System and method for automatically monitoring soil surface roughness |
US10262206B2 (en) | 2017-05-16 | 2019-04-16 | Cnh Industrial America Llc | Vision-based system for acquiring crop residue data and related calibration methods |
CN108662993A (zh) * | 2018-04-13 | 2018-10-16 | 黄智强 | 一种基于光学散射原理的表面粗糙度检测系统 |
EP3729934A1 (de) | 2019-04-25 | 2020-10-28 | CNH Industrial Sweden AB | Pflug |
US11558993B2 (en) | 2020-03-26 | 2023-01-24 | Cnh Industrial America Llc | Soil monitoring system for an agricultural tillage implement |
US11638393B2 (en) | 2020-03-26 | 2023-05-02 | Cnh Industrial America Llc | Ground engaging tool monitoring system |
US11730076B2 (en) | 2020-03-26 | 2023-08-22 | Cnh Industrial America Llc | Control system for an agricultural implement |
US11602092B2 (en) | 2020-03-26 | 2023-03-14 | Cnh Industrial America Llc | Frame control system for an agricultural implement |
US12022756B2 (en) | 2020-03-26 | 2024-07-02 | Cnh Industrial America Llc | Orientation control system for an agricultural implement |
US11617294B2 (en) | 2020-03-26 | 2023-04-04 | Cnh Industrial America Llc | Orientation control system for an agricultural implement |
CN113465555B (zh) * | 2021-08-23 | 2023-09-19 | 中车青岛四方机车车辆股份有限公司 | 一种表面状态检测装置及其使用方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3771880A (en) | 1971-09-29 | 1973-11-13 | Us Navy | Roughness analyzer |
IT1108254B (it) * | 1978-10-24 | 1985-12-02 | Fiat Spa | Procedimento e dispositivo per il ilevamento di difetti superficiali di un pezzo che ha subito una lavorazione meccanica |
US4334780A (en) | 1979-06-29 | 1982-06-15 | Grumman Aerospace Corporation | Optical surface roughness detection method and apparatus |
US4364663A (en) | 1980-11-17 | 1982-12-21 | Caterpillar Tractor Co. | Surface roughness gauge and method |
DE3621567A1 (de) * | 1985-06-28 | 1987-01-02 | Ando Electric | Mit reflektiertem licht arbeitender oberflaechenrauheitsanalysator |
LU86194A1 (fr) | 1985-12-05 | 1987-07-24 | Centre Rech Metallurgique | Procede de mesure en continu de la rugosite de la surface d'un produit lamine a froid |
US4770536A (en) * | 1986-12-04 | 1988-09-13 | Moshe Golberstein | Reflective photometry instrument |
JPH0615970B2 (ja) | 1987-09-01 | 1994-03-02 | 三菱重工業株式会社 | ロールプロフィール計測方法 |
FR2620823B1 (fr) * | 1987-09-17 | 1990-08-17 | Centre Tech Ind Papier | Dispositif pour determiner en continu un indice d'etat de surface d'un materiau en feuille en mouvement |
DE3805785A1 (de) | 1988-02-24 | 1989-09-07 | Sick Optik Elektronik Erwin | Verfahren und vorrichtung zur optischen erfassung des rauheitsprofils einer materialoberflaeche |
DE3831907C1 (de) | 1988-09-20 | 1989-08-31 | Deutsche Forschungs- Und Versuchsanstalt Fuer Luft- Und Raumfahrt Ev, 5000 Koeln, De | |
US4989984A (en) * | 1989-11-08 | 1991-02-05 | Environmental Research Institute Of Michigan | System for measuring optical characteristics of curved surfaces |
US5410410A (en) | 1992-12-29 | 1995-04-25 | Mitutoyo Corporation | Non-contact type measuring device for measuring three-dimensional shape using optical probe |
DE4420293A1 (de) * | 1994-06-10 | 1995-12-14 | Dresden Messelektronik Gmbh | Vorrichtung zur berührungslosen Bestimmung des Oberflächenprofils eines Werkstücks |
US5608527A (en) | 1995-03-08 | 1997-03-04 | Optical Dimensions, Llc | Apparatus and method for dynamic measurement of surface roughness |
DE19508861A1 (de) | 1995-03-11 | 1996-09-12 | Zeiss Carl Fa | Koordinatenmeßgerät mit einer Einrichtung für die Rauheitsmessung |
US5617645A (en) | 1995-05-02 | 1997-04-08 | William R. W. Wick | Non-contact precision measurement system |
US5625451A (en) | 1995-11-27 | 1997-04-29 | Schmitt Measurement Systems, Inc. | Methods and apparatus for characterizing a surface |
US5757496A (en) | 1997-03-07 | 1998-05-26 | Mitutoyo Corporation | Method of surface roughness measurement using a fiber-optic probe |
US5831940A (en) * | 1997-08-27 | 1998-11-03 | Gillette; Warren | Solo electronic starter and timer system |
US5877858A (en) * | 1997-09-19 | 1999-03-02 | International Business Machines Corporation | Textured surface monitoring and control apparatus |
-
1998
- 1998-10-06 IT IT1998MI002145A patent/IT1302609B1/it active IP Right Grant
-
1999
- 1999-04-21 US US09/295,304 patent/US6222628B1/en not_active Expired - Fee Related
- 1999-10-01 DE DE69941350T patent/DE69941350D1/de not_active Expired - Fee Related
- 1999-10-01 EP EP99203215A patent/EP0992763B1/de not_active Expired - Lifetime
- 1999-10-01 AT AT99203215T patent/ATE441832T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US6222628B1 (en) | 2001-04-24 |
EP0992763B1 (de) | 2009-09-02 |
IT1302609B1 (it) | 2000-09-29 |
EP0992763A2 (de) | 2000-04-12 |
EP0992763A3 (de) | 2001-02-07 |
ITMI982145A1 (it) | 2000-04-06 |
DE69941350D1 (de) | 2009-10-15 |
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Legal Events
Date | Code | Title | Description |
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |