ATE434822T1 - System und verfahren zum prüfen einer datenspeichereinrichtung ohne enthüllung von speicherinhalt - Google Patents

System und verfahren zum prüfen einer datenspeichereinrichtung ohne enthüllung von speicherinhalt

Info

Publication number
ATE434822T1
ATE434822T1 AT05732025T AT05732025T ATE434822T1 AT E434822 T1 ATE434822 T1 AT E434822T1 AT 05732025 T AT05732025 T AT 05732025T AT 05732025 T AT05732025 T AT 05732025T AT E434822 T1 ATE434822 T1 AT E434822T1
Authority
AT
Austria
Prior art keywords
data
testing
new
revealing
storage device
Prior art date
Application number
AT05732025T
Other languages
English (en)
Inventor
Jerrold Randell
Original Assignee
Research In Motion Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Research In Motion Ltd filed Critical Research In Motion Ltd
Application granted granted Critical
Publication of ATE434822T1 publication Critical patent/ATE434822T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
    • H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
    • H04L9/0891—Revocation or update of secret information, e.g. encryption key update or rekeying
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
    • H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
    • H04L9/0894—Escrow, recovery or storing of secret information, e.g. secret key escrow or cryptographic key storage
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L2209/00—Additional information or applications relating to cryptographic mechanisms or cryptographic arrangements for secret or secure communication H04L9/00
    • H04L2209/26—Testing cryptographic entity, e.g. testing integrity of encryption key or encryption algorithm
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L2209/00—Additional information or applications relating to cryptographic mechanisms or cryptographic arrangements for secret or secure communication H04L9/00
    • H04L2209/80—Wireless
AT05732025T 2004-06-14 2005-04-01 System und verfahren zum prüfen einer datenspeichereinrichtung ohne enthüllung von speicherinhalt ATE434822T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US57945904P 2004-06-14 2004-06-14
PCT/CA2005/000495 WO2005122179A1 (en) 2004-06-14 2005-04-01 System and method for testing a data storage device without revealing memory content

Publications (1)

Publication Number Publication Date
ATE434822T1 true ATE434822T1 (de) 2009-07-15

Family

ID=35503338

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05732025T ATE434822T1 (de) 2004-06-14 2005-04-01 System und verfahren zum prüfen einer datenspeichereinrichtung ohne enthüllung von speicherinhalt

Country Status (6)

Country Link
US (3) US7228471B2 (de)
EP (1) EP1766632B1 (de)
AT (1) ATE434822T1 (de)
CA (1) CA2570401C (de)
DE (1) DE602005015112D1 (de)
WO (1) WO2005122179A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005122179A1 (en) * 2004-06-14 2005-12-22 Research In Motion Limited System and method for testing a data storage device without revealing memory content
US8176406B2 (en) * 2008-03-19 2012-05-08 International Business Machines Corporation Hard error detection
US9672886B2 (en) * 2014-05-05 2017-06-06 The Regents Of The University Of California Fast and low-power sense amplifier and writing circuit for high-speed MRAM
CN105118530B (zh) * 2015-09-12 2018-06-01 上海华虹宏力半导体制造有限公司 晶圆级测试中闪存单元读取电压测试方法以及晶圆级测试
CN106610877A (zh) * 2016-12-19 2017-05-03 郑州云海信息技术有限公司 一种测试硬盘数据一致性的方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864615A (en) * 1988-05-27 1989-09-05 General Instrument Corporation Reproduction of secure keys by using distributed key generation data
US5926412A (en) 1992-02-09 1999-07-20 Raytheon Company Ferroelectric memory structure
US5363448A (en) * 1993-06-30 1994-11-08 United Technologies Automotive, Inc. Pseudorandom number generation and cryptographic authentication
US5541942A (en) 1994-06-14 1996-07-30 Microsoft Corporation Method and system for testing memory utilizing specific bit patterns
US5799090A (en) * 1995-09-25 1998-08-25 Angert; Joseph C. pad encryption method and software
US5925142A (en) * 1995-10-06 1999-07-20 Micron Technology, Inc. Self-test RAM using external synchronous clock
US5666368A (en) * 1996-01-30 1997-09-09 Sun Microsystems, Inc. System and method for testing the operation of registers in digital electronic systems
US6167514A (en) * 1996-07-05 2000-12-26 Seiko Epson Corporation Method, apparatus, system and information storage medium for wireless communication
GB2367912B (en) 2000-08-08 2003-01-08 Sun Microsystems Inc Apparatus for testing computer memory
US6757845B2 (en) * 2000-11-30 2004-06-29 Bitmicro Networks, Inc. Method and apparatus for testing a storage device
US20020078401A1 (en) * 2000-12-15 2002-06-20 Fry Michael Andrew Test coverage analysis system
US6701472B2 (en) * 2001-02-09 2004-03-02 Adc Telecommunications Israel, Ltd. Methods for tracing faults in memory components
US20050154953A1 (en) * 2004-01-12 2005-07-14 Norskog Allen C. Multiple function pattern generator and comparator having self-seeding test function
WO2005122179A1 (en) * 2004-06-14 2005-12-22 Research In Motion Limited System and method for testing a data storage device without revealing memory content

Also Published As

Publication number Publication date
US20090132874A1 (en) 2009-05-21
EP1766632A4 (de) 2007-07-25
CA2570401A1 (en) 2005-12-22
US7228471B2 (en) 2007-06-05
CA2570401C (en) 2012-01-10
WO2005122179A1 (en) 2005-12-22
DE602005015112D1 (de) 2009-08-06
US7634699B2 (en) 2009-12-15
US20070288811A1 (en) 2007-12-13
US7500160B2 (en) 2009-03-03
EP1766632A1 (de) 2007-03-28
US20050278591A1 (en) 2005-12-15
EP1766632B1 (de) 2009-06-24

Similar Documents

Publication Publication Date Title
CN106133537B (zh) 一种fpga功能模块仿真验证方法及其系统
DE602005010419D1 (de) Gelatchte programmierung von speicher und verfahren
WO2019126416A3 (en) Auto-referenced memory cell read techniques
KR880014468A (ko) 메모리 테스트 방법 및 장치
ATE496372T1 (de) Vorrichtung und verfahren für speicheroperationen unter verwendung adressabhängiger bedingungen
ATE434822T1 (de) System und verfahren zum prüfen einer datenspeichereinrichtung ohne enthüllung von speicherinhalt
TW200705444A (en) Methods/circuits for programming flash memory devices using overlapping bit line setup and word line enable intervals
TW200739593A (en) Test apparatus and test method
TW200723280A (en) Resistive memory devices including selected reference memory cells and methods of operating the same
WO2007116393A3 (en) Method for generating soft bits in flash memories
ATE512441T1 (de) Bereitstellung von energiereduktion bei der datenspeicherung in einem speicher
WO2007134247A3 (en) Dynamic cell bit resolution
TW200739590A (en) Testing device, program and testing method
TW200604787A (en) Method for testing and programming memory devices and system for same
RU2016107013A (ru) Обновление данных, сохраненных в перекрестной энергонезависимой памяти
NO20085065L (no) Fremgangsmate for oppfriskning av et ikke-volatilt minne
JP2008158955A5 (de)
TW200703361A (en) Nonvolatile memory performing verify processing in sequential write
JP2009289374A5 (de)
DE602007007190D1 (de) Verfahren und vorrichtung zum prüfen der datenlenklogik für den datenspeicher mit unabhängig voneinander adressierbaren untereinheiten
CN109308933A (zh) 存储器修复方案
KR870005473A (ko) 반도체 프로그램어블 메모리 장치
TWI544485B (zh) 用於相變化記憶體之交錯式寫入與驗證
DE60236000D1 (de) Verfahren zum extrahieren und laden von daten aus einem/in einem puffer
CN104461796A (zh) 用于嵌入式8051cpu的jtag调试模块及调试方法

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties