ATE430320T1 - Adaptive speicherkalibration unter verwendung von bins - Google Patents

Adaptive speicherkalibration unter verwendung von bins

Info

Publication number
ATE430320T1
ATE430320T1 AT05817276T AT05817276T ATE430320T1 AT E430320 T1 ATE430320 T1 AT E430320T1 AT 05817276 T AT05817276 T AT 05817276T AT 05817276 T AT05817276 T AT 05817276T AT E430320 T1 ATE430320 T1 AT E430320T1
Authority
AT
Austria
Prior art keywords
bins
adaptive memory
integrated circuit
external clock
electronic component
Prior art date
Application number
AT05817276T
Other languages
English (en)
Inventor
Jagrut Viliskumar Patel
Gregory Bullard
Sanat Kapoor
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of ATE430320T1 publication Critical patent/ATE430320T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/3193Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937Timing aspects, e.g. measuring propagation delay
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • G11C29/50012Marginal testing, e.g. race, voltage or current testing of timing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222Clock generating, synchronizing or distributing circuits within memory device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/2254Calibration
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Read Only Memory (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
AT05817276T 2004-11-05 2005-11-07 Adaptive speicherkalibration unter verwendung von bins ATE430320T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US62522904P 2004-11-05 2004-11-05
PCT/US2005/040363 WO2006052929A1 (en) 2004-11-05 2005-11-07 Adaptive memory calibration using bins

Publications (1)

Publication Number Publication Date
ATE430320T1 true ATE430320T1 (de) 2009-05-15

Family

ID=35985747

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05817276T ATE430320T1 (de) 2004-11-05 2005-11-07 Adaptive speicherkalibration unter verwendung von bins

Country Status (11)

Country Link
US (1) US8816742B2 (de)
EP (1) EP1812804B1 (de)
JP (1) JP4842958B2 (de)
CN (1) CN101095060B (de)
AT (1) ATE430320T1 (de)
CA (1) CA2586537A1 (de)
DE (1) DE602005014264D1 (de)
ES (1) ES2326903T3 (de)
MX (1) MX2007005484A (de)
RU (1) RU2363059C2 (de)
WO (1) WO2006052929A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8386829B2 (en) * 2009-06-17 2013-02-26 Macronix International Co., Ltd. Automatic internal trimming calibration method to compensate process variation
US9843315B2 (en) 2011-11-01 2017-12-12 Rambus Inc. Data transmission using delayed timing signals
US9825638B2 (en) 2014-03-05 2017-11-21 Sandisk Technologies Llc Virtual critical path (VCP) system and associated methods
RU2641465C1 (ru) * 2016-03-28 2018-01-17 СиЭрЭрСи ЦИНДАО СЫФАН РОЛЛИН СТОК РИСЁРЧ ИНСТИТЬЮТ КО., ЛТД. Чип и способ управления запуском цифрового сигнального процессора tigersharc
US11935613B2 (en) * 2020-08-05 2024-03-19 Texas Instruments Incorporated Method for tuning an external memory interface
CN115862707B (zh) * 2022-11-25 2024-03-12 湖南兴芯微电子科技有限公司 一种psram相位校准方法及控制器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1529220A1 (ru) 1986-07-15 1989-12-15 Предприятие П/Я А-3162 Устройство дл автоматического контрол больших интегральных схем
SU1471156A1 (ru) 1987-01-27 1989-04-07 Предприятие П/Я Р-6668 Устройство дл контрол параметров электронных блоков
US5268639A (en) * 1992-06-05 1993-12-07 Rambus, Inc. Testing timing parameters of high speed integrated circuit devices
JP3904244B2 (ja) 1993-09-17 2007-04-11 株式会社ルネサステクノロジ シングル・チップ・データ処理装置
US5920216A (en) * 1997-04-03 1999-07-06 Advanced Micro Devices, Inc. Method and system for generating digital clock signals of programmable frequency employing programmable delay lines
US6175928B1 (en) * 1997-12-31 2001-01-16 Intel Corporation Reducing timing variance of signals from an electronic device
JP2000235517A (ja) 1999-02-12 2000-08-29 Nec Corp 半導体集積回路及びクロック遅延調整方法
US6204694B1 (en) * 1999-05-21 2001-03-20 Logicvision, Inc. Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signals
JP2001154907A (ja) 1999-11-29 2001-06-08 Nec Kofu Ltd 遅延調整回路及び情報処理装置
JP4301680B2 (ja) * 2000-02-29 2009-07-22 株式会社ルネサステクノロジ 半導体集積回路装置
US6564335B1 (en) * 2000-03-31 2003-05-13 Intel Corporation Cross chip transfer mechanism for a memory repeater chip in a Dram memory system
DE10035169A1 (de) * 2000-07-19 2002-02-07 Infineon Technologies Ag Verfahren und Vorrichtung zum Testen von Setup-Zeit und Hold-Zeit von Signalen einer Schaltung mit getakteter Datenübertragung
US6850107B2 (en) * 2001-08-29 2005-02-01 Micron Technology, Inc. Variable delay circuit and method, and delay locked loop, memory device and computer system using same
US7290186B1 (en) * 2003-09-16 2007-10-30 Virage Logic Corporation Method and apparatus for a command based bist for testing memories
US7646835B1 (en) * 2003-11-17 2010-01-12 Rozas Guillermo J Method and system for automatically calibrating intra-cycle timing relationships for sampling signals for an integrated circuit device

Also Published As

Publication number Publication date
RU2363059C2 (ru) 2009-07-27
RU2007120819A (ru) 2008-12-10
MX2007005484A (es) 2007-07-16
CA2586537A1 (en) 2006-05-18
ES2326903T3 (es) 2009-10-21
JP4842958B2 (ja) 2011-12-21
EP1812804A1 (de) 2007-08-01
US20080123444A1 (en) 2008-05-29
EP1812804B1 (de) 2009-04-29
DE602005014264D1 (de) 2009-06-10
JP2008519457A (ja) 2008-06-05
CN101095060B (zh) 2011-03-30
WO2006052929A1 (en) 2006-05-18
US8816742B2 (en) 2014-08-26
CN101095060A (zh) 2007-12-26

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Legal Events

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