ATE420372T1 - Testpräparierte integrierte hf-schaltung - Google Patents
Testpräparierte integrierte hf-schaltungInfo
- Publication number
- ATE420372T1 ATE420372T1 AT06727743T AT06727743T ATE420372T1 AT E420372 T1 ATE420372 T1 AT E420372T1 AT 06727743 T AT06727743 T AT 06727743T AT 06727743 T AT06727743 T AT 06727743T AT E420372 T1 ATE420372 T1 AT E420372T1
- Authority
- AT
- Austria
- Prior art keywords
- circuit
- local oscillator
- signal
- oscillator signal
- integrated circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Polysaccharides And Polysaccharide Derivatives (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05102523 | 2005-03-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE420372T1 true ATE420372T1 (de) | 2009-01-15 |
Family
ID=36607483
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT06727743T ATE420372T1 (de) | 2005-03-30 | 2006-03-27 | Testpräparierte integrierte hf-schaltung |
Country Status (7)
Country | Link |
---|---|
US (1) | US7739069B2 (de) |
EP (1) | EP1866658B1 (de) |
JP (1) | JP2008534952A (de) |
CN (1) | CN101151545A (de) |
AT (1) | ATE420372T1 (de) |
DE (1) | DE602006004721D1 (de) |
WO (1) | WO2006103617A1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2343564A1 (de) | 2009-12-23 | 2011-07-13 | Nxp B.V. | Integierte Chip-Selbttestvorrichtung und -verfahren |
US8614584B2 (en) * | 2011-03-02 | 2013-12-24 | Sandisk Technologies Inc. | System and method for bonded configuration pad continuity check |
US8463224B2 (en) * | 2011-10-12 | 2013-06-11 | Tektronix, Inc. | Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication |
US20140167795A1 (en) * | 2012-12-14 | 2014-06-19 | Texas Instruments Incorporated | Active feedback silicon failure analysis die temperature control system |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4219770A (en) * | 1979-01-11 | 1980-08-26 | Weinschel Engineering Co., Inc. | Insertion loss and phase shift measurement system and method |
US6966021B2 (en) * | 1998-06-16 | 2005-11-15 | Janusz Rajski | Method and apparatus for at-speed testing of digital circuits |
JP4980538B2 (ja) * | 2000-03-24 | 2012-07-18 | トムソン ライセンシング | 集積回路用の制御および検査が可能な発振器装置 |
US6400188B1 (en) * | 2000-06-30 | 2002-06-04 | Cypress Semiconductor Corp. | Test mode clock multiplication |
JP4115676B2 (ja) * | 2001-03-16 | 2008-07-09 | 株式会社東芝 | 半導体記憶装置 |
US20060111072A1 (en) * | 2002-05-31 | 2006-05-25 | Silicon Laboratories Inc. | Wireless communication system and method using clock swapping during image rejection calibration |
US6898543B2 (en) * | 2002-07-23 | 2005-05-24 | Adc Dsl Systems, Inc. | In-system testing of an oscillator |
-
2006
- 2006-03-27 WO PCT/IB2006/050924 patent/WO2006103617A1/en not_active Application Discontinuation
- 2006-03-27 EP EP06727743A patent/EP1866658B1/de not_active Not-in-force
- 2006-03-27 DE DE602006004721T patent/DE602006004721D1/de not_active Expired - Fee Related
- 2006-03-27 AT AT06727743T patent/ATE420372T1/de not_active IP Right Cessation
- 2006-03-27 CN CNA2006800104964A patent/CN101151545A/zh active Pending
- 2006-03-27 JP JP2008503659A patent/JP2008534952A/ja not_active Withdrawn
- 2006-03-27 US US11/910,186 patent/US7739069B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN101151545A (zh) | 2008-03-26 |
EP1866658B1 (de) | 2009-01-07 |
US7739069B2 (en) | 2010-06-15 |
DE602006004721D1 (de) | 2009-02-26 |
JP2008534952A (ja) | 2008-08-28 |
WO2006103617A1 (en) | 2006-10-05 |
EP1866658A1 (de) | 2007-12-19 |
US20080208508A1 (en) | 2008-08-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |