ATE417265T1 - Röntgenfluoreszenz-analysator - Google Patents
Röntgenfluoreszenz-analysatorInfo
- Publication number
- ATE417265T1 ATE417265T1 AT02704364T AT02704364T ATE417265T1 AT E417265 T1 ATE417265 T1 AT E417265T1 AT 02704364 T AT02704364 T AT 02704364T AT 02704364 T AT02704364 T AT 02704364T AT E417265 T1 ATE417265 T1 AT E417265T1
- Authority
- AT
- Austria
- Prior art keywords
- ray fluorescence
- fluorescence analyzer
- line
- spectrum
- energy
- Prior art date
Links
- 238000004876 x-ray fluorescence Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 abstract 3
- 238000001228 spectrum Methods 0.000 abstract 3
- 239000000463 material Substances 0.000 abstract 2
- 239000002184 metal Substances 0.000 abstract 1
- 229910001092 metal group alloy Inorganic materials 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- 239000010970 precious metal Substances 0.000 abstract 1
- 230000002285 radioactive effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US26729801P | 2001-02-08 | 2001-02-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE417265T1 true ATE417265T1 (de) | 2008-12-15 |
Family
ID=23018193
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT02704364T ATE417265T1 (de) | 2001-02-08 | 2002-02-07 | Röntgenfluoreszenz-analysator |
Country Status (6)
Country | Link |
---|---|
US (1) | US6765986B2 (de) |
EP (1) | EP1370851B1 (de) |
JP (1) | JP4015022B2 (de) |
AT (1) | ATE417265T1 (de) |
DE (1) | DE60230243D1 (de) |
WO (1) | WO2002063286A2 (de) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7200200B2 (en) * | 2001-09-04 | 2007-04-03 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
US7763820B1 (en) * | 2003-01-27 | 2010-07-27 | Spectramet, Llc | Sorting pieces of material based on photonic emissions resulting from multiple sources of stimuli |
EP1609155A4 (de) * | 2003-04-01 | 2009-09-23 | Keymaster Technologies Inc | Ausnahmequelle für eine röntgen-fluoreszenzeinrichtung |
US7375358B1 (en) * | 2003-05-22 | 2008-05-20 | Thermo Niton Analyzers Llc | Radiation shield for portable x-ray fluorescence instruments |
US7375359B1 (en) * | 2003-05-22 | 2008-05-20 | Thermo Niton Analyzers Llc | Portable X-ray fluorescence instrument with tapered absorption collar |
US20050139776A1 (en) * | 2003-12-29 | 2005-06-30 | Reiter Eric S. | Photon violation spectroscopy |
AT501020B8 (de) * | 2004-10-18 | 2007-02-15 | M A M I Modern Allround Man In | Sortiervorrichtung und sortierverfahren für stückgut |
JP2006132945A (ja) * | 2004-11-02 | 2006-05-25 | Sii Nanotechnology Inc | 蛍光x線分析装置の検出下限モニタ |
US7020238B1 (en) * | 2005-01-31 | 2006-03-28 | Oxford Instruments Analytical Oy | Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfaces |
AT7604U3 (de) * | 2005-02-24 | 2005-12-15 | M A M I Modern Allround Man In | Sortiervorrichtung und sortierverfahren für stückgut |
JP4814579B2 (ja) * | 2005-08-23 | 2011-11-16 | パナソニック株式会社 | 特定物質の含有判定方法 |
US7430273B2 (en) * | 2007-02-23 | 2008-09-30 | Thermo Fisher Scientific Inc. | Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities |
CA2698277A1 (en) * | 2007-09-06 | 2009-03-12 | Thermo Niton Analyzers Llc | Differentiation of lead in surface layers and in bulk samples by x-ray fluoresence |
US20090129541A1 (en) * | 2007-11-21 | 2009-05-21 | Microban Products Company | In situ indicator detection and quantitation to correlate with an additive |
WO2010036906A1 (en) * | 2008-09-26 | 2010-04-01 | Andrew Hession-Kunz | Handheld spectrometer |
US8155268B2 (en) * | 2009-04-23 | 2012-04-10 | Thermo Niton Analyzers Llc | Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysis |
US20110079734A1 (en) * | 2009-10-02 | 2011-04-07 | Lee Grodzins | Elemental Analysis Based on Complementary Techniques |
US20120087467A1 (en) * | 2010-10-12 | 2012-04-12 | Roxar Flow Measurement As | X-ray based densitometer for multiphase flow measurement |
CN102095744B (zh) * | 2010-11-25 | 2012-09-05 | 内蒙古立信测控技术有限公司 | 一种三能煤炭灰分在线监测装置 |
US8532256B1 (en) * | 2012-03-05 | 2013-09-10 | Bobby D. Jeter | Method and apparatus for the automated assay and valuation of precious metal objects |
US10641718B2 (en) | 2016-07-29 | 2020-05-05 | Bruker Handheld Llc | X-ray fluorescence analyzer |
EP3428629B1 (de) * | 2017-07-14 | 2022-12-07 | Malvern Panalytical B.V. | Analyse von röntgenspektren mittels kurvenanpassung |
WO2021007590A1 (en) | 2019-07-08 | 2021-01-14 | Thermo Scientific Portable Analytical Instruments Inc. | Devices and methods for detecting elements in a sample |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3843881A (en) | 1973-01-11 | 1974-10-22 | Phillips Petroleum Co | Detection of elements by irradiating material and measuring scattered radiation at two energy levels |
US3889113A (en) * | 1973-05-03 | 1975-06-10 | Columbia Scient Ind Inc | Radioisotope-excited, energy-dispersive x-ray fluorescence apparatus |
US3953127A (en) * | 1974-01-23 | 1976-04-27 | Battelle Development Corporation | Photon-counting integrating nephelometer |
US4063089A (en) * | 1976-11-24 | 1977-12-13 | The United States Of America As Represented By The United States Energy Research And Development Administration | X-ray chemical analyzer for field applications |
US4362935A (en) | 1979-02-09 | 1982-12-07 | Martin Marietta Corporation | Field portable element analysis unit |
US4283625A (en) * | 1979-07-13 | 1981-08-11 | Associated Metals & Minerals Corporation | X-Ray fluorescence analysis |
JPH07104299B2 (ja) | 1987-04-28 | 1995-11-13 | 株式会社島津製作所 | フアンダメンタル・パラメ−タ法による分析方法 |
JP2853261B2 (ja) * | 1989-05-16 | 1999-02-03 | 三菱マテリアル株式会社 | 金属分析方法および分析装置 |
US5274688A (en) | 1992-04-07 | 1993-12-28 | Lee Grodzins | Lead-paint detector |
JPH06174663A (ja) * | 1992-12-01 | 1994-06-24 | Toshiba Corp | 汚染元素分析方法 |
JP2002022846A (ja) * | 2000-07-05 | 2002-01-23 | Seiko Instruments Inc | エネルギー分散型x線分析装置 |
-
2002
- 2002-02-04 US US10/067,683 patent/US6765986B2/en not_active Expired - Lifetime
- 2002-02-07 WO PCT/US2002/003507 patent/WO2002063286A2/en active Application Filing
- 2002-02-07 AT AT02704364T patent/ATE417265T1/de not_active IP Right Cessation
- 2002-02-07 JP JP2002562982A patent/JP4015022B2/ja not_active Expired - Lifetime
- 2002-02-07 DE DE60230243T patent/DE60230243D1/de not_active Expired - Lifetime
- 2002-02-07 EP EP02704364A patent/EP1370851B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2004536284A (ja) | 2004-12-02 |
JP4015022B2 (ja) | 2007-11-28 |
US6765986B2 (en) | 2004-07-20 |
DE60230243D1 (de) | 2009-01-22 |
EP1370851B1 (de) | 2008-12-10 |
US20020154732A1 (en) | 2002-10-24 |
WO2002063286A3 (en) | 2002-09-19 |
EP1370851A2 (de) | 2003-12-17 |
WO2002063286A2 (en) | 2002-08-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |