ATE393478T1 - Durchbruchsdiode und verfahren zur herstellung - Google Patents

Durchbruchsdiode und verfahren zur herstellung

Info

Publication number
ATE393478T1
ATE393478T1 AT01911525T AT01911525T ATE393478T1 AT E393478 T1 ATE393478 T1 AT E393478T1 AT 01911525 T AT01911525 T AT 01911525T AT 01911525 T AT01911525 T AT 01911525T AT E393478 T1 ATE393478 T1 AT E393478T1
Authority
AT
Austria
Prior art keywords
diode
region
tvsd
substrate
punch
Prior art date
Application number
AT01911525T
Other languages
English (en)
Inventor
Godefridus Hurkx
Edwin Hijzen
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE393478T1 publication Critical patent/ATE393478T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes
    • H01L29/8618—Diodes with bulk potential barrier, e.g. Camel diodes, Planar Doped Barrier diodes, Graded bandgap diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Bipolar Transistors (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
AT01911525T 2000-02-15 2001-01-24 Durchbruchsdiode und verfahren zur herstellung ATE393478T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP00200510 2000-02-15

Publications (1)

Publication Number Publication Date
ATE393478T1 true ATE393478T1 (de) 2008-05-15

Family

ID=8171017

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01911525T ATE393478T1 (de) 2000-02-15 2001-01-24 Durchbruchsdiode und verfahren zur herstellung

Country Status (6)

Country Link
US (1) US6597052B2 (de)
EP (1) EP1200994B1 (de)
JP (1) JP2003523634A (de)
AT (1) ATE393478T1 (de)
DE (1) DE60133707T2 (de)
WO (1) WO2001061762A2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7482669B2 (en) * 2003-02-18 2009-01-27 Nxp B.V. Semiconductor device and method of manufacturing such a device
US7244970B2 (en) 2004-12-22 2007-07-17 Tyco Electronics Corporation Low capacitance two-terminal barrier controlled TVS diodes
US20060216913A1 (en) * 2005-03-25 2006-09-28 Pu-Ju Kung Asymmetric bidirectional transient voltage suppressor and method of forming same
DE102005047000A1 (de) * 2005-09-30 2007-04-12 Infineon Technologies Ag Halbleiterstruktur zur Ableitung eines Überspannungsimpulses und Verfahren zur Herstellung desselben
US8288839B2 (en) * 2009-04-30 2012-10-16 Alpha & Omega Semiconductor, Inc. Transient voltage suppressor having symmetrical breakdown voltages
US8384126B2 (en) 2010-06-22 2013-02-26 Littelfuse, Inc. Low voltage PNPN protection device
US8557654B2 (en) 2010-12-13 2013-10-15 Sandisk 3D Llc Punch-through diode
CN102097492A (zh) * 2010-12-24 2011-06-15 中山大学 异质结构场效应二极管及制造方法
US8730629B2 (en) 2011-12-22 2014-05-20 General Electric Company Variable breakdown transient voltage suppressor
JP6107430B2 (ja) * 2012-06-08 2017-04-05 豊田合成株式会社 半導体装置
WO2016159962A1 (en) * 2015-03-31 2016-10-06 Vishay General Semiconductor Llc Thin bi-directional transient voltage suppressor (tvs) or zener diode
JP6455335B2 (ja) 2015-06-23 2019-01-23 三菱電機株式会社 半導体装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5880511A (en) * 1995-06-30 1999-03-09 Semtech Corporation Low-voltage punch-through transient suppressor employing a dual-base structure
EP1090428B1 (de) * 1999-04-08 2006-08-16 Philips Electronics N.V. Durchbruchsdiode und verfahren zur herstellung

Also Published As

Publication number Publication date
EP1200994A2 (de) 2002-05-02
WO2001061762A3 (en) 2002-02-21
US20010017389A1 (en) 2001-08-30
DE60133707T2 (de) 2008-08-28
US6597052B2 (en) 2003-07-22
WO2001061762A2 (en) 2001-08-23
DE60133707D1 (de) 2008-06-05
EP1200994B1 (de) 2008-04-23
JP2003523634A (ja) 2003-08-05

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Legal Events

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