ATE352115T1 - Laserspektroskopie mittels einer master-slave- steuerungsarchitektur - Google Patents

Laserspektroskopie mittels einer master-slave- steuerungsarchitektur

Info

Publication number
ATE352115T1
ATE352115T1 AT03011477T AT03011477T ATE352115T1 AT E352115 T1 ATE352115 T1 AT E352115T1 AT 03011477 T AT03011477 T AT 03011477T AT 03011477 T AT03011477 T AT 03011477T AT E352115 T1 ATE352115 T1 AT E352115T1
Authority
AT
Austria
Prior art keywords
radiant source
radiant
output signals
laser spectroscopy
master
Prior art date
Application number
AT03011477T
Other languages
English (en)
Inventor
Michael E Dobbs
Peter Wheel
Original Assignee
Itt Mfg Enterprises Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Itt Mfg Enterprises Inc filed Critical Itt Mfg Enterprises Inc
Application granted granted Critical
Publication of ATE352115T1 publication Critical patent/ATE352115T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G01J3/4338—Frequency modulated spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/0687—Stabilising the frequency of the laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4006—Injection locking

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Laser Surgery Devices (AREA)
  • Lasers (AREA)
AT03011477T 2002-05-28 2003-05-21 Laserspektroskopie mittels einer master-slave- steuerungsarchitektur ATE352115T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/155,172 US6865196B2 (en) 2002-05-28 2002-05-28 Laser spectroscopy using a master/slave architecture

Publications (1)

Publication Number Publication Date
ATE352115T1 true ATE352115T1 (de) 2007-02-15

Family

ID=29419599

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03011477T ATE352115T1 (de) 2002-05-28 2003-05-21 Laserspektroskopie mittels einer master-slave- steuerungsarchitektur

Country Status (4)

Country Link
US (1) US6865196B2 (de)
EP (1) EP1367680B1 (de)
AT (1) ATE352115T1 (de)
DE (1) DE60311182T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7085499B2 (en) * 2001-11-15 2006-08-01 Hrl Laboratories, Llc Agile RF-lightwave waveform synthesis and an optical multi-tone amplitude modulator
TW588518B (en) * 2001-11-15 2004-05-21 Hrl Lab Llc Agile spread waveform generator
US6963442B2 (en) 2002-04-17 2005-11-08 Hrl Laboratories, Llc Low-noise, switchable RF-lightwave synthesizer
AU2003221717A1 (en) * 2002-04-17 2003-11-03 Hrl Laboratories, Llc Method and apparatus for producing an optical output
US7499653B2 (en) * 2003-07-14 2009-03-03 Hrl Laboratories, Llc Multiple wavelength photonic oscillator
US7822082B2 (en) * 2004-01-27 2010-10-26 Hrl Laboratories, Llc Wavelength reconfigurable laser transmitter tuned via the resonance passbands of a tunable microresonator
US7324569B2 (en) * 2004-09-29 2008-01-29 Axsun Technologies, Inc. Method and system for spectral stitching of tunable semiconductor sources
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US7511809B2 (en) * 2006-07-07 2009-03-31 Itt Manufacturing Enterprises, Inc. Air sampler module for enhancing the detection capabilities of a chemical detection device or system
US7636154B1 (en) 2006-12-21 2009-12-22 Itt Manufacturing Enterprises, Inc. Modular optical detection system for point airborne and area surface substance detection
US7843977B2 (en) * 2008-06-19 2010-11-30 Agilent Technologies, Inc. Light source that utilizes small footprint reference gas cells for multiple laser frequency stabilization
US8187658B2 (en) * 2008-06-24 2012-05-29 Lifescan, Inc. Method of manufacturing analyte test strip for accepting diverse sample volumes
JP2015007612A (ja) * 2013-05-31 2015-01-15 キヤノン株式会社 光源調整手段、光学計測装置、被検体情報取得システム、および波長調整プログラム
CN107064059B (zh) * 2017-05-09 2019-01-29 中国人民解放军战略支援部队航天工程大学 基于激光吸收光谱的流场测量系统集成样机
JP6513306B1 (ja) * 2018-05-07 2019-05-15 三菱電機株式会社 レーザ装置、レーザ加工機およびレーザ装置の出力制御方法
CN111541150B (zh) * 2020-04-28 2021-03-30 东南大学 实现半导体激光器波长动态锁定的装置及方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5504719A (en) * 1974-09-19 1996-04-02 Martin Marietta Corporation Laser hydrophone and virtual array of laser hydrophones
US5018151A (en) * 1981-05-29 1991-05-21 Seaton Norman T Laser control apparatus and method for frequency offset phase locking and the minimizing of retro-reflection effects
US4856899A (en) * 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
DE3766850D1 (de) * 1986-01-28 1991-02-07 British Telecomm Ueberwachung und steuerung der stabilitaet einer strahlungsquelle.
US4817101A (en) * 1986-09-26 1989-03-28 The United States Of America As Represented By The United States Department Of Energy Heterodyne laser spectroscopy system
JPH01167607U (de) * 1988-05-16 1989-11-24
US5022757A (en) * 1989-01-23 1991-06-11 Modell Mark D Heterodyne system and method for sensing a target substance
US5272513A (en) * 1991-12-06 1993-12-21 Optical Air Data Systems, L.P. Laser doppler velocimeter
JPH07240716A (ja) * 1994-02-28 1995-09-12 Ando Electric Co Ltd 可変波長光源
JPH0993194A (ja) * 1995-09-27 1997-04-04 Nec Corp 波長安定回路
US5742399A (en) * 1996-04-18 1998-04-21 American Air Liquide, Inc. Method for stabilizing the wavelength in a laser spectrometer system
KR20010041209A (ko) * 1998-02-23 2001-05-15 게리 윌리스 공기의 굴절률 및 광로 길이 영향을 측정하기 위한 간섭계 및 방법
WO2001076026A1 (en) * 2000-03-30 2001-10-11 National Institute Of Standards And Technology ('nist') Mode-locked pulsed laser system and method

Also Published As

Publication number Publication date
US6865196B2 (en) 2005-03-08
US20030227629A1 (en) 2003-12-11
DE60311182T2 (de) 2007-11-08
DE60311182D1 (de) 2007-03-08
EP1367680B1 (de) 2007-01-17
EP1367680A1 (de) 2003-12-03

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Legal Events

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