ATE331350T1 - Adaptiver matrixsensor und elektrische schaltung hierzu - Google Patents

Adaptiver matrixsensor und elektrische schaltung hierzu

Info

Publication number
ATE331350T1
ATE331350T1 AT99810572T AT99810572T ATE331350T1 AT E331350 T1 ATE331350 T1 AT E331350T1 AT 99810572 T AT99810572 T AT 99810572T AT 99810572 T AT99810572 T AT 99810572T AT E331350 T1 ATE331350 T1 AT E331350T1
Authority
AT
Austria
Prior art keywords
output
low
electrical circuit
photosensor
amplifier
Prior art date
Application number
AT99810572T
Other languages
English (en)
Inventor
Stephane Bourquin
Peter Seitz
Original Assignee
Suisse Electronique Microtech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suisse Electronique Microtech filed Critical Suisse Electronique Microtech
Application granted granted Critical
Publication of ATE331350T1 publication Critical patent/ATE331350T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
    • H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
    • H03F3/087—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with IC amplifier blocks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/08—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements
    • H03F1/22—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements by use of cascode coupling, i.e. earthed cathode or emitter stage followed by earthed grid or base stage respectively
    • H03F1/223—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements by use of cascode coupling, i.e. earthed cathode or emitter stage followed by earthed grid or base stage respectively with MOSFET's

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Networks Using Active Elements (AREA)
AT99810572T 1999-07-02 1999-07-02 Adaptiver matrixsensor und elektrische schaltung hierzu ATE331350T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP99810572A EP1065809B1 (de) 1999-07-02 1999-07-02 Adaptiver Matrixsensor und elektrische Schaltung hierzu

Publications (1)

Publication Number Publication Date
ATE331350T1 true ATE331350T1 (de) 2006-07-15

Family

ID=8242901

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99810572T ATE331350T1 (de) 1999-07-02 1999-07-02 Adaptiver matrixsensor und elektrische schaltung hierzu

Country Status (4)

Country Link
US (1) US6469489B1 (de)
EP (1) EP1065809B1 (de)
AT (1) ATE331350T1 (de)
DE (1) DE69932043T2 (de)

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WO2002004925A1 (en) * 2000-07-05 2002-01-17 The University Of Western Australia Method and apparatus for determining one or more properties of a sample in optical coherence tomography
US6649900B2 (en) 2001-09-07 2003-11-18 Lockheed Martin Corporation Photoreceiver assembly for high-powered lasers
JP3918813B2 (ja) 2001-10-23 2007-05-23 ソニー株式会社 データ通信システム、データ送信装置、並びにデータ受信装置
GB0200819D0 (en) * 2002-01-15 2002-03-06 Cole Polytechnique Federale De Microscopy imaging apparatus and method for generating an image
US6642496B1 (en) * 2002-01-18 2003-11-04 Raytheon Company Two dimensional optical shading gain compensation for imaging sensors
FR2839387B1 (fr) 2002-05-06 2004-12-24 Mbdam Cellule de photodetection et detecteur d'impulsion laser muni d'une telle cellule, ainsi que dispositif de detection d'impulsion laser comprenant une matrice de tels detecteurs
US6919716B1 (en) * 2002-08-28 2005-07-19 Cisco Technology, Inc. Precision avalanche photodiode current monitor
DE10300958A1 (de) * 2003-01-13 2004-07-22 Epcos Ag Modul mit Verkapselung
US6844750B2 (en) * 2003-03-31 2005-01-18 Intel Corporation Current mirror based multi-channel leakage current monitor circuit and method
DE50307951D1 (de) * 2003-04-01 2007-09-27 Optosys Ag Rauscharmer Lichtempfänger
US7474408B2 (en) 2004-05-14 2009-01-06 Medeikon Corporation Low coherence interferometry utilizing phase
US20050254059A1 (en) * 2004-05-14 2005-11-17 Alphonse Gerard A Low coherence interferometric system for optical metrology
US7242480B2 (en) * 2004-05-14 2007-07-10 Medeikon Corporation Low coherence interferometry for detecting and characterizing plaques
US7327463B2 (en) 2004-05-14 2008-02-05 Medrikon Corporation Low coherence interferometry utilizing magnitude
US7184148B2 (en) 2004-05-14 2007-02-27 Medeikon Corporation Low coherence interferometry utilizing phase
US7190464B2 (en) * 2004-05-14 2007-03-13 Medeikon Corporation Low coherence interferometry for detecting and characterizing plaques
US7488930B2 (en) * 2006-06-02 2009-02-10 Medeikon Corporation Multi-channel low coherence interferometer
EP2119433B1 (de) 2007-02-16 2015-06-17 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Überprüfungsverfahren
WO2010011833A1 (en) 2008-07-23 2010-01-28 Alexander Stuck Secure tracking of tablets
JP5058105B2 (ja) * 2008-09-10 2012-10-24 アズビル株式会社 光信号送受信器
US9189728B2 (en) 2009-07-23 2015-11-17 I-Property Holding Corp. Method for the authentication of dosage forms
DE102013218231A1 (de) * 2013-09-11 2015-03-12 Sirona Dental Systems Gmbh Optisches System zur Erzeugung eines sich zeitlich ändernden Musters für ein Konfokalmikroskop
CN105044490B (zh) * 2015-06-25 2018-06-12 电子科技大学 一种基于压缩感知的空域小样本的天线阵列校正方法
CN105137224A (zh) * 2015-07-29 2015-12-09 中山大学 获取输入电磁干扰在片上电源上的二维分布的方法和片上电源
IT201800010793A1 (it) * 2018-12-04 2020-06-04 St Microelectronics Srl Circuito di rilevazione, dispositivo e procedimento corrispondenti

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Publication number Priority date Publication date Assignee Title
US4029976A (en) * 1976-04-23 1977-06-14 The United States Of America As Represented By The Secretary Of The Navy Amplifier for fiber optics application
JPS6041498B2 (ja) * 1980-05-31 1985-09-17 日本電気株式会社 入力信号断検出回路
JPS61212127A (ja) * 1985-03-15 1986-09-20 Fujitsu Ltd Ａｐｄバイアス制御回路
US5099128A (en) * 1989-03-17 1992-03-24 Roger Stettner High resolution position sensitive detector
FR2664048B1 (fr) * 1990-06-29 1993-08-20 Centre Nat Rech Scient Procede et dispositif de detection analogique multicanal.
FR2689666A1 (fr) * 1992-04-03 1993-10-08 Peugeot Dispositif de réception d'un signal optique, notamment pour véhicule automobile.
US5376813A (en) * 1993-06-02 1994-12-27 California Institute Of Technology Adaptive photoreceptor including adaptive element for long-time-constant continuous adaptation with low offset and insensitivity to light
DE4440613C1 (de) * 1994-11-14 1996-07-25 Leica Ag Vorrichtung und Verfahren zur Detektion und Demodulation eines intensitätsmodulierten Strahlungsfeldes

Also Published As

Publication number Publication date
US6469489B1 (en) 2002-10-22
DE69932043T2 (de) 2007-02-01
EP1065809B1 (de) 2006-06-21
DE69932043D1 (de) 2006-08-03
EP1065809A1 (de) 2001-01-03

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