ATE32785T1 - Verfahren und einrichtung zur messung des spektrums von materialien. - Google Patents

Verfahren und einrichtung zur messung des spektrums von materialien.

Info

Publication number
ATE32785T1
ATE32785T1 AT83103538T AT83103538T ATE32785T1 AT E32785 T1 ATE32785 T1 AT E32785T1 AT 83103538 T AT83103538 T AT 83103538T AT 83103538 T AT83103538 T AT 83103538T AT E32785 T1 ATE32785 T1 AT E32785T1
Authority
AT
Austria
Prior art keywords
spectrum
measured
sample
radiation
stored
Prior art date
Application number
AT83103538T
Other languages
English (en)
Inventor
Andras Czabaffy
Lorand Dr Horvath
Karoly Dr Kaffka
Original Assignee
Koezponti Elelmiszeripari
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koezponti Elelmiszeripari filed Critical Koezponti Elelmiszeripari
Application granted granted Critical
Publication of ATE32785T1 publication Critical patent/ATE32785T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0232—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Mathematical Physics (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT83103538T 1982-04-14 1983-04-12 Verfahren und einrichtung zur messung des spektrums von materialien. ATE32785T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
HU821139A HU183889B (en) 1982-04-14 1982-04-14 Method and apparatus for measuring the spectrum of materials
EP83103538A EP0091692B1 (de) 1982-04-14 1983-04-12 Verfahren und Einrichtung zur Messung des Spektrums von Materialien

Publications (1)

Publication Number Publication Date
ATE32785T1 true ATE32785T1 (de) 1988-03-15

Family

ID=10953004

Family Applications (1)

Application Number Title Priority Date Filing Date
AT83103538T ATE32785T1 (de) 1982-04-14 1983-04-12 Verfahren und einrichtung zur messung des spektrums von materialien.

Country Status (5)

Country Link
US (1) US4632549A (de)
EP (1) EP0091692B1 (de)
AT (1) ATE32785T1 (de)
DE (1) DE3375824D1 (de)
HU (1) HU183889B (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3811446A1 (de) * 1988-04-06 1989-10-19 Bodenseewerk Perkin Elmer Co Einrichtung zur erzeugung eines magnetfeldes in einem atomabsorptions-spektrometer
US4893259A (en) * 1988-06-02 1990-01-09 The Perkin-Elmer Corporation Standardization of spectral lines
US5270797A (en) * 1989-07-20 1993-12-14 Brooklyn College Foundation Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control
US5260772A (en) * 1989-07-20 1993-11-09 Pollak Fred H Method and apparatus for determining a material's characteristics by photoreflectance
US5255071A (en) * 1989-09-13 1993-10-19 Pollak Fred H Photoreflectance method and apparatus utilizing acousto-optic modulation
WO1991009298A1 (en) * 1989-12-19 1991-06-27 Komi Nauchny Tsentr Uralskogo Otdelenia Akademii Nauk Sssr Method and device for obtaining metric characteristics of spectrochemical parameters of analysed materials
US5643796A (en) * 1994-10-14 1997-07-01 University Of Washington System for sensing droplet formation time delay in a flow cytometer
DK0796424T3 (da) * 1994-12-09 2000-04-25 Foss Electric As Fremgangsmåde til at opnå information
JP3250426B2 (ja) * 1995-09-27 2002-01-28 安藤電気株式会社 光スペクトラム測定装置
US6927859B2 (en) 2001-03-08 2005-08-09 The Hong Kong Polytechnic University Microdensitometer system with micrometer resolution for reading radiochromic films
JP2004247380A (ja) * 2003-02-12 2004-09-02 Mitsubishi Electric Corp ピエゾ電場の評価方法
CN101169340B (zh) * 2006-10-27 2010-12-08 鸿富锦精密工业（深圳）有限公司 主板发光二极管检测装置及方法
US7835004B2 (en) * 2007-07-03 2010-11-16 Mine Safety Appliances Company Gas sensors and methods of controlling light sources therefor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3131349A (en) * 1954-02-23 1964-04-28 Applied Physics Corp Spectrophotometer pulse amplitude ratio measuring means with feedback amplifier for noise and drift compensation
US3207996A (en) * 1961-11-17 1965-09-21 Beckman Instruments Inc Signal comparison circuit
US4035083A (en) * 1972-05-30 1977-07-12 Woodriff Ray A Background correction in spectro-chemical analysis
GB1401942A (en) * 1973-03-16 1975-08-06 Chrysler Corp Method and system for the infrared analysis of gases
US3935463A (en) * 1974-12-05 1976-01-27 Milton Roy Company Spectrophotometer
AT349791B (de) * 1975-10-17 1979-04-25 Gao Ges Automation Org Verfahren zur identifizierung von fluor- eszenzstoffen und spektral absorbierendes filter zur durchfuehrung des verfahrens
US4299485A (en) * 1979-03-05 1981-11-10 Pye Electronic Products Limited Spectrophotometer
US4357673A (en) * 1980-04-18 1982-11-02 Hewlett-Packard Company Apparatus for performing measurements and error analysis of the measurements
JPS585669A (ja) * 1981-06-30 1983-01-13 Shimadzu Corp ベ−スライン補正方法

Also Published As

Publication number Publication date
EP0091692A3 (en) 1984-09-05
HU183889B (en) 1984-06-28
US4632549A (en) 1986-12-30
EP0091692A2 (de) 1983-10-19
DE3375824D1 (en) 1988-04-07
EP0091692B1 (de) 1988-03-02

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee