ATE245817T1 - Phasenrauschendetektor - Google Patents

Phasenrauschendetektor

Info

Publication number
ATE245817T1
ATE245817T1 AT95919278T AT95919278T ATE245817T1 AT E245817 T1 ATE245817 T1 AT E245817T1 AT 95919278 T AT95919278 T AT 95919278T AT 95919278 T AT95919278 T AT 95919278T AT E245817 T1 ATE245817 T1 AT E245817T1
Authority
AT
Austria
Prior art keywords
carrier
signal
phase noise
noise detector
carrier frequency
Prior art date
Application number
AT95919278T
Other languages
English (en)
Inventor
Richard Alec Woode
Michael Edmund Tobar
Eugene Nikolay Ivanov
Original Assignee
Poseidon Scient Instr Pty Ltd
Univ Western Australia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Poseidon Scient Instr Pty Ltd, Univ Western Australia filed Critical Poseidon Scient Instr Pty Ltd
Application granted granted Critical
Publication of ATE245817T1 publication Critical patent/ATE245817T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/18—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising distributed inductance and capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2202/00—Aspects of oscillators relating to reduction of undesired oscillations
    • H03B2202/02—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator
    • H03B2202/025—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator the noise being coloured noise, i.e. frequency dependent noise
    • H03B2202/027—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator the noise being coloured noise, i.e. frequency dependent noise the noise being essentially proportional to the inverse of the frequency, i.e. the so-called 1/f noise
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2202/00—Aspects of oscillators relating to reduction of undesired oscillations
    • H03B2202/07—Reduction of undesired oscillations through a cancelling of the undesired oscillation
    • H03B2202/076—Reduction of undesired oscillations through a cancelling of the undesired oscillation by using a feedback loop external to the oscillator, e.g. the so-called noise degeneration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Soundproofing, Sound Blocking, And Sound Damping (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Amplifiers (AREA)
  • Noise Elimination (AREA)
  • Stereo-Broadcasting Methods (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Burglar Alarm Systems (AREA)
AT95919278T 1994-05-25 1995-05-25 Phasenrauschendetektor ATE245817T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPM5870A AUPM587094A0 (en) 1994-05-25 1994-05-25 Microwave loop oscillators
PCT/AU1995/000306 WO1995032435A1 (en) 1994-05-25 1995-05-25 Phase noise detector

Publications (1)

Publication Number Publication Date
ATE245817T1 true ATE245817T1 (de) 2003-08-15

Family

ID=3780444

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95919278T ATE245817T1 (de) 1994-05-25 1995-05-25 Phasenrauschendetektor

Country Status (9)

Country Link
US (1) US5841322A (de)
EP (1) EP0760954B1 (de)
JP (1) JPH10501061A (de)
AT (1) ATE245817T1 (de)
AU (1) AUPM587094A0 (de)
CA (1) CA2191232A1 (de)
DE (1) DE69531348T2 (de)
DK (1) DK0760954T3 (de)
WO (1) WO1995032435A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
US6753690B2 (en) * 1998-11-30 2004-06-22 Poseidon Scientific Instruments Pty Ltd Interferometric signal processing apparatus
DE19901750B4 (de) * 1999-01-18 2006-04-13 Rohde & Schwarz Gmbh & Co. Kg Anordnung zum Messen des Phasenrauschens des Ausgangssignals eines Meßobjektes
US7415077B2 (en) * 2002-07-29 2008-08-19 Infineon Technologies Ag Transmission arrangement, particularly for mobile radio
US7075378B2 (en) * 2003-07-11 2006-07-11 The United States of America as represented by the Secretary of Commerce, the National Institute of Standards and Technology High spectral purity microwave oscillator using air-dielectric cavity
US7505141B2 (en) 2006-01-20 2009-03-17 Eugene Nikolay Ivanov Interferometric apparatus for producing an output signal characteristic of phase and/or amplitude noise of a device
US7674836B2 (en) * 2006-07-28 2010-03-09 3M Innovative Properties Company Method of making macroporous cation exchange resins
CN101904115B (zh) * 2007-11-13 2014-10-22 光电波股份有限公司 基于光子技术及具有低相位噪声的互相关零差检测
US9350293B1 (en) 2015-01-16 2016-05-24 Raytheon Company Amplitude-noise reduction system and method for ultra-low phase-noise oscillators
CN110089026B (zh) * 2016-12-22 2023-06-09 楼氏卡泽诺维亚公司 微波腔体谐振器稳定振荡器和及其实现方法
US11817871B2 (en) 2021-01-28 2023-11-14 Anritsu Company Frequency synthesizers having low phase noise

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4555678A (en) * 1983-11-21 1985-11-26 Raytheon Company Microwave oscillator
US4639939A (en) * 1984-02-20 1987-01-27 Nec Corporation Apparatus for cancelling periodic carrier phase jitters
DE3533330A1 (de) * 1984-09-18 1986-03-27 Nec Corp., Tokio/Tokyo Schaltung zum detektieren des rauschpegels in einem fm-signal fuer einen am/fm-empfaenger
GB2179458B (en) * 1985-08-23 1988-11-09 Ferranti Plc Microwave noise measuring apparatus
EP0238906B1 (de) * 1986-03-05 1994-06-08 Nec Corporation Rauschsignaldetektion durch Abtastung des digitalen Grundfrequenzsignals an einer Augenöffnung
US4692714A (en) * 1986-10-20 1987-09-08 Raytheon Company Single resonator push-push oscillator
US5032800A (en) * 1990-06-15 1991-07-16 Raytheon Company Tunable oscillator with noise degeneration
US5036299A (en) * 1990-06-22 1991-07-30 California Institute Of Technology Method and apparatus for reducing microwave oscillator output noise

Also Published As

Publication number Publication date
WO1995032435A1 (en) 1995-11-30
US5841322A (en) 1998-11-24
DE69531348T2 (de) 2004-04-15
EP0760954A4 (de) 1999-11-10
AUPM587094A0 (en) 1994-06-16
EP0760954B1 (de) 2003-07-23
DK0760954T3 (da) 2003-11-10
DE69531348D1 (de) 2003-08-28
CA2191232A1 (en) 1995-11-30
JPH10501061A (ja) 1998-01-27
EP0760954A1 (de) 1997-03-12

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties