ATE244879T1 - Photobleichbare lumineszenzschichten zur kalibrierung und standardisierung in optischer mikroskopie - Google Patents

Photobleichbare lumineszenzschichten zur kalibrierung und standardisierung in optischer mikroskopie

Info

Publication number
ATE244879T1
ATE244879T1 AT98921476T AT98921476T ATE244879T1 AT E244879 T1 ATE244879 T1 AT E244879T1 AT 98921476 T AT98921476 T AT 98921476T AT 98921476 T AT98921476 T AT 98921476T AT E244879 T1 ATE244879 T1 AT E244879T1
Authority
AT
Austria
Prior art keywords
calibration
photobleachable
standardization
optical microscopy
optical
Prior art date
Application number
AT98921476T
Other languages
English (en)
Inventor
Godefriedus Jacobus Brakenhoff
Rick Iftekar Ghauharali
Johannes Willem Hofstraat
Original Assignee
Univ Amsterdam
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Amsterdam filed Critical Univ Amsterdam
Application granted granted Critical
Publication of ATE244879T1 publication Critical patent/ATE244879T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/278—Constitution of standards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/10—Composition for standardization, calibration, simulation, stabilization, preparation or preservation; processes of use in preparation for chemical testing

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Luminescent Compositions (AREA)
AT98921476T 1997-04-25 1998-04-17 Photobleichbare lumineszenzschichten zur kalibrierung und standardisierung in optischer mikroskopie ATE244879T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP97201235 1997-04-25
PCT/EP1998/002358 WO1998049537A1 (en) 1997-04-25 1998-04-17 Photobleachable luminescent layers for calibration and standardization in optical microscopy

Publications (1)

Publication Number Publication Date
ATE244879T1 true ATE244879T1 (de) 2003-07-15

Family

ID=8228254

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98921476T ATE244879T1 (de) 1997-04-25 1998-04-17 Photobleichbare lumineszenzschichten zur kalibrierung und standardisierung in optischer mikroskopie

Country Status (5)

Country Link
US (1) US6259524B1 (de)
EP (1) EP0977981B1 (de)
AT (1) ATE244879T1 (de)
DE (1) DE69816289T2 (de)
WO (1) WO1998049537A1 (de)

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US6472671B1 (en) * 2000-02-09 2002-10-29 Jean I. Montagu Quantified fluorescence microscopy
DE10048812B4 (de) * 2000-09-29 2005-07-28 Orga Systems Gmbh Datenträger mit mittels energiereichem Strahl personalisierbaren Echtheitsmerkmalen
ATE366923T1 (de) * 2001-03-28 2007-08-15 Clondiag Chip Tech Gmbh Vorrichtung zur referenzierung von fluoreszenzsignalen
US6468803B1 (en) * 2001-05-25 2002-10-22 Becton, Dickinson And Company Method for calibrating a sample analyzer
US6794424B2 (en) * 2001-12-04 2004-09-21 Agilent Technologies, Inc. Devices for calibrating optical scanners and methods of using the same
US7057721B2 (en) * 2002-01-10 2006-06-06 Chemimage Corporation Wide field method for detecting pathogenic microorganisms
US7534561B2 (en) 2003-04-02 2009-05-19 Agilent Technologies, Inc. Nucleic acid array in situ fabrication methods and arrays produced using the same
JP2005181244A (ja) * 2003-12-24 2005-07-07 Yokogawa Electric Corp 光量分布補正方法およびバイオチップ読取装置
US7480042B1 (en) * 2004-06-30 2009-01-20 Applied Biosystems Inc. Luminescence reference standards
WO2006024819A2 (en) * 2004-09-01 2006-03-09 Perkinelmer Singapore Pte Ltd. A method of analysing a sample and apparatus therefor
US20060202118A1 (en) * 2005-02-25 2006-09-14 Axel Engel Standard for referencing luminescence signals
US20070141726A1 (en) * 2005-12-19 2007-06-21 Agency For Science, Technology And Research Detection via switchable emission of nanocrystals
EP2156370B1 (de) 2007-05-14 2011-10-12 Historx, Inc. Abteilungsauftrennung durch pixelcharakterisierung unter verwendung von bilddatenclusterung
CA2690633C (en) 2007-06-15 2015-08-04 Historx, Inc. Method and system for standardizing microscope instruments
CA2604317C (en) 2007-08-06 2017-02-28 Historx, Inc. Methods and system for validating sample images for quantitative immunoassays
CA2596204C (en) 2007-08-07 2019-02-26 Historx, Inc. Method and system for determining an optimal dilution of a reagent
GB0721564D0 (en) 2007-11-02 2007-12-12 Ge Healthcare Uk Ltd Microscopy imaging phantoms
DE102008028708A1 (de) 2008-06-17 2009-12-24 Carl Zeiss Microimaging Gmbh Verfahren zum Kalibrieren eines Detektors eines Laser-Scanning-Mikroskops
EP2335221B8 (de) 2008-09-16 2016-05-25 Novartis AG Reproduzierbare quantifizierung einer biomarkerexpression
US8374818B2 (en) * 2008-12-19 2013-02-12 Affymetrix, Inc. System, method and apparatus for calibrating inspection tools
GB0900526D0 (en) * 2009-01-14 2009-02-11 Perkinelmer Ltd Fluorescence microscopy methods and apparatus
US8259170B2 (en) * 2009-08-24 2012-09-04 Cellomics, Inc. Integrated calibration sample bay for fluorescence readers
US20110089317A1 (en) * 2009-10-21 2011-04-21 University Of North Texas Health Science Center At Forth Worth Polarization Standards for Microscopy
NL2012169C2 (en) * 2014-01-30 2015-08-06 Univ Delft Tech Determining the average number of localizations per emitter and the average number of emitters associated with one site in localization microscopy.
WO2020022038A1 (ja) * 2018-07-24 2020-01-30 ソニー株式会社 情報処理装置、情報処理方法、情報処理システム、およびプログラム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4055376A (en) * 1975-10-02 1977-10-25 Rockwell International Corporation Calibration reticle for measuring microscopes
US4868126A (en) * 1985-12-11 1989-09-19 Flow Cytometry Standards Corporation Method of calibrating a fluorescent microscope using fluorescent calibration microbeads simulating stained cells

Also Published As

Publication number Publication date
DE69816289T2 (de) 2004-04-22
US6259524B1 (en) 2001-07-10
WO1998049537A1 (en) 1998-11-05
EP0977981A1 (de) 2000-02-09
EP0977981B1 (de) 2003-07-09
DE69816289D1 (de) 2003-08-14

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