ATE239919T1 - Doppelspitzen-prüftstift zum prüfen von leiterplatten - Google Patents
Doppelspitzen-prüftstift zum prüfen von leiterplattenInfo
- Publication number
- ATE239919T1 ATE239919T1 AT99967766T AT99967766T ATE239919T1 AT E239919 T1 ATE239919 T1 AT E239919T1 AT 99967766 T AT99967766 T AT 99967766T AT 99967766 T AT99967766 T AT 99967766T AT E239919 T1 ATE239919 T1 AT E239919T1
- Authority
- AT
- Austria
- Prior art keywords
- pin
- probe
- circuit boards
- testing circuit
- test pin
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
- Magnetic Heads (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Mechanical Coupling Of Light Guides (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11439298P | 1998-12-30 | 1998-12-30 | |
PCT/US1999/031236 WO2000039595A1 (en) | 1998-12-30 | 1999-12-30 | Dual-pin probe for testing circuit boards |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE239919T1 true ATE239919T1 (de) | 2003-05-15 |
Family
ID=22354916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT99967766T ATE239919T1 (de) | 1998-12-30 | 1999-12-30 | Doppelspitzen-prüftstift zum prüfen von leiterplatten |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1141731B1 (de) |
AT (1) | ATE239919T1 (de) |
AU (1) | AU2398800A (de) |
CA (1) | CA2357012A1 (de) |
DE (1) | DE69907738D1 (de) |
WO (1) | WO2000039595A1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE541377T1 (de) | 2002-08-01 | 2012-01-15 | Nokia Corp | Übertragung von verschachtelten mehrfachen datenströmen |
GB0308550D0 (en) * | 2003-04-10 | 2003-05-21 | Barker Colin | Improvements to an automatic test machine |
WO2015116224A1 (en) * | 2014-01-31 | 2015-08-06 | Hewlett-Packard Development Company, L.P. | Test probe |
CN114527307B (zh) * | 2022-02-11 | 2024-03-22 | 木王芯(苏州)半导体科技有限公司 | 一种带有断簧保护特性的三头测试探针 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2605414B1 (fr) * | 1986-10-15 | 1989-05-12 | Automatisme Lumiere Commerce I | Procede de controle sequentiel automatique d'une carte portant des composants electroniques et dispositif pour la mise en oeuvre de ce procede |
EP0290182A1 (de) * | 1987-05-06 | 1988-11-09 | Hewlett-Packard Company | Passiver Tastkopf für Hochfrequenzmessungen |
US5006793A (en) * | 1989-06-08 | 1991-04-09 | Cascade Microtech, Inc. | High-frequency active probe having replaceable contact needles |
EP0468153B1 (de) * | 1990-07-25 | 1995-10-11 | atg test systems GmbH | Kontaktierungsvorrichtung für Prüfzwecke |
US5136237A (en) * | 1991-01-29 | 1992-08-04 | Tektronix, Inc. | Double insulated floating high voltage test probe |
US5264788A (en) * | 1992-06-12 | 1993-11-23 | Cascade Microtech, Inc. | Adjustable strap implemented return line for a probe station |
US5994909A (en) * | 1997-08-25 | 1999-11-30 | Lucas; Brian K. | Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
-
1999
- 1999-12-30 AU AU23988/00A patent/AU2398800A/en not_active Abandoned
- 1999-12-30 WO PCT/US1999/031236 patent/WO2000039595A1/en active IP Right Grant
- 1999-12-30 AT AT99967766T patent/ATE239919T1/de not_active IP Right Cessation
- 1999-12-30 DE DE69907738T patent/DE69907738D1/de not_active Expired - Lifetime
- 1999-12-30 EP EP99967766A patent/EP1141731B1/de not_active Expired - Lifetime
- 1999-12-30 CA CA002357012A patent/CA2357012A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
AU2398800A (en) | 2000-07-31 |
DE69907738D1 (de) | 2003-06-12 |
CA2357012A1 (en) | 2000-07-06 |
EP1141731A1 (de) | 2001-10-10 |
EP1141731B1 (de) | 2003-05-07 |
WO2000039595A1 (en) | 2000-07-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |