ATE157798T1 - Informationsaufzeichnungs/wiedergabegerät - Google Patents

Informationsaufzeichnungs/wiedergabegerät

Info

Publication number
ATE157798T1
ATE157798T1 AT92109732T AT92109732T ATE157798T1 AT E157798 T1 ATE157798 T1 AT E157798T1 AT 92109732 T AT92109732 T AT 92109732T AT 92109732 T AT92109732 T AT 92109732T AT E157798 T1 ATE157798 T1 AT E157798T1
Authority
AT
Austria
Prior art keywords
electrodes
recording
circuit
recording medium
information
Prior art date
Application number
AT92109732T
Other languages
English (en)
Inventor
Hideyuki Kawagishi
Haruki Kawada
Kiyoshi Takimoto
Toshimitsu Kawase
Yuko Morikawa
Katsuhiko Shinjo
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE157798T1 publication Critical patent/ATE157798T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0009RRAM elements whose operation depends upon chemical change
    • G11C13/0014RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418Disposition or mounting of heads or record carriers
    • G11B9/1427Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06Probe tip arrays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00Applications, other than SPM, of scanning-probe techniques
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure
    • Y10S977/932Specified use of nanostructure for electronic or optoelectronic application
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure
    • Y10S977/932Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943Information storage or retrieval using nanostructure
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure
    • Y10S977/932Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943Information storage or retrieval using nanostructure
    • Y10S977/947Information storage or retrieval using nanostructure with scanning probe instrument

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Holo Graphy (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Semiconductor Memories (AREA)
  • Recording Measured Values (AREA)
  • Micromachines (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
AT92109732T 1991-06-12 1992-06-10 Informationsaufzeichnungs/wiedergabegerät ATE157798T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03140108A JP3109861B2 (ja) 1991-06-12 1991-06-12 情報の記録及び/又は再生装置

Publications (1)

Publication Number Publication Date
ATE157798T1 true ATE157798T1 (de) 1997-09-15

Family

ID=15261118

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92109732T ATE157798T1 (de) 1991-06-12 1992-06-10 Informationsaufzeichnungs/wiedergabegerät

Country Status (6)

Country Link
US (1) US5373494A (de)
EP (1) EP0518283B1 (de)
JP (1) JP3109861B2 (de)
AT (1) ATE157798T1 (de)
CA (1) CA2070947C (de)
DE (1) DE69221944T2 (de)

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US5751683A (en) 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US6339217B1 (en) 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US6337479B1 (en) 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
JPH08129875A (ja) 1994-10-28 1996-05-21 Hewlett Packard Co <Hp> 導電性針の位置ずれを低減したプローブ装置
JP3652728B2 (ja) * 1994-12-31 2005-05-25 ヒューレット・パッカード・カンパニー 走査型メモリ装置および誤り訂正方法
JP3935976B2 (ja) * 1995-02-08 2007-06-27 ヒューレット・パッカード・カンパニー 半導体層構造および大容量メモリ装置の記録媒体
US5717631A (en) * 1995-07-21 1998-02-10 Carnegie Mellon University Microelectromechanical structure and process of making same
US6507553B2 (en) 1995-07-24 2003-01-14 General Nanotechnology Llc Nanometer scale data storage device and associated positioning system
US6000047A (en) * 1995-12-08 1999-12-07 Hewlett-Packard Company Scanning memory device and error correction method
JPH09293283A (ja) * 1996-04-25 1997-11-11 Hewlett Packard Co <Hp> プローブ装置およびその製造方法、ならびにメディア移動型メモリ装置
US6551857B2 (en) 1997-04-04 2003-04-22 Elm Technology Corporation Three dimensional structure integrated circuits
US6923044B1 (en) 2001-03-08 2005-08-02 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6752008B1 (en) 2001-03-08 2004-06-22 General Nanotechnology Llc Method and apparatus for scanning in scanning probe microscopy and presenting results
US7196328B1 (en) 2001-03-08 2007-03-27 General Nanotechnology Llc Nanomachining method and apparatus
US6802646B1 (en) 2001-04-30 2004-10-12 General Nanotechnology Llc Low-friction moving interfaces in micromachines and nanomachines
US6787768B1 (en) 2001-03-08 2004-09-07 General Nanotechnology Llc Method and apparatus for tool and tip design for nanomachining and measurement
US6477132B1 (en) * 1998-08-19 2002-11-05 Canon Kabushiki Kaisha Probe and information recording/reproduction apparatus using the same
US7260051B1 (en) 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
WO2001003157A1 (en) 1999-07-01 2001-01-11 General Nanotechnology, Llc Object inspection and/or modification system and method
KR100331451B1 (ko) * 2000-05-10 2002-04-09 윤종용 탄소 함유 물질을 이용한 재기록 가능한 데이타 스토리지및 그 기록/재생 방법
WO2002040944A1 (en) * 2000-11-16 2002-05-23 International Business Machines Corporation Method and apparatus for reading an array of thermal resistance sensors
US6931710B2 (en) 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 (en) 2001-03-08 2007-08-07 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6593666B1 (en) 2001-06-20 2003-07-15 Ambient Systems, Inc. Energy conversion systems using nanometer scale assemblies and methods for using same
US7053369B1 (en) 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
US6813937B2 (en) 2001-11-28 2004-11-09 General Nanotechnology Llc Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
US6998689B2 (en) 2002-09-09 2006-02-14 General Nanotechnology Llc Fluid delivery for scanning probe microscopy
KR100519752B1 (ko) * 2002-05-10 2005-10-07 삼성전자주식회사 시분할 다중 방식을 채용한 고속 고밀도 정보저장 장치 및이를 이용한 정보기록방법 및 정보재생방법
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US7199498B2 (en) 2003-06-02 2007-04-03 Ambient Systems, Inc. Electrical assemblies using molecular-scale electrically conductive and mechanically flexible beams and methods for application of same
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US20050128927A1 (en) * 2003-12-15 2005-06-16 Hewlett-Packard Development Co., L.P. Electrostatic actuator for contact probe storage device
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EP1548748A1 (de) * 2003-12-17 2005-06-29 Interuniversitaire Microelectronica Centrum vzw ( IMEC) Verfahren zur Herstellung von Sonden für Atomkraftmikroskopie
US7423954B2 (en) * 2003-12-17 2008-09-09 Hewlett-Packard Development Company, L.P. Contact probe storage sensor pod
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US7309630B2 (en) 2005-07-08 2007-12-18 Nanochip, Inc. Method for forming patterned media for a high density data storage device
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Also Published As

Publication number Publication date
EP0518283A2 (de) 1992-12-16
CA2070947C (en) 1998-09-29
EP0518283B1 (de) 1997-09-03
EP0518283A3 (en) 1993-08-18
DE69221944T2 (de) 1998-01-02
JP3109861B2 (ja) 2000-11-20
DE69221944D1 (de) 1997-10-09
CA2070947A1 (en) 1992-12-13
US5373494A (en) 1994-12-13
JPH04364299A (ja) 1992-12-16

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