ATE157798T1 - Informationsaufzeichnungs/wiedergabegerät - Google Patents
Informationsaufzeichnungs/wiedergabegerätInfo
- Publication number
- ATE157798T1 ATE157798T1 AT92109732T AT92109732T ATE157798T1 AT E157798 T1 ATE157798 T1 AT E157798T1 AT 92109732 T AT92109732 T AT 92109732T AT 92109732 T AT92109732 T AT 92109732T AT E157798 T1 ATE157798 T1 AT E157798T1
- Authority
- AT
- Austria
- Prior art keywords
- electrodes
- recording
- circuit
- recording medium
- information
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1418—Disposition or mounting of heads or record carriers
- G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/06—Probe tip arrays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
- Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Holo Graphy (AREA)
- Optical Recording Or Reproduction (AREA)
- Semiconductor Memories (AREA)
- Recording Measured Values (AREA)
- Micromachines (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03140108A JP3109861B2 (ja) | 1991-06-12 | 1991-06-12 | 情報の記録及び/又は再生装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE157798T1 true ATE157798T1 (de) | 1997-09-15 |
Family
ID=15261118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT92109732T ATE157798T1 (de) | 1991-06-12 | 1992-06-10 | Informationsaufzeichnungs/wiedergabegerät |
Country Status (6)
Country | Link |
---|---|
US (1) | US5373494A (de) |
EP (1) | EP0518283B1 (de) |
JP (1) | JP3109861B2 (de) |
AT (1) | ATE157798T1 (de) |
CA (1) | CA2070947C (de) |
DE (1) | DE69221944T2 (de) |
Families Citing this family (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5354695A (en) | 1992-04-08 | 1994-10-11 | Leedy Glenn J | Membrane dielectric isolation IC fabrication |
JPH06195772A (ja) * | 1992-12-21 | 1994-07-15 | Canon Inc | 画像信号処理機構およびその適用機器 |
JP3384009B2 (ja) * | 1992-12-25 | 2003-03-10 | キヤノン株式会社 | デジタルテレビジョン受像機 |
US5751683A (en) | 1995-07-24 | 1998-05-12 | General Nanotechnology, L.L.C. | Nanometer scale data storage device and associated positioning system |
US6339217B1 (en) | 1995-07-28 | 2002-01-15 | General Nanotechnology Llc | Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
US6337479B1 (en) | 1994-07-28 | 2002-01-08 | Victor B. Kley | Object inspection and/or modification system and method |
JPH08129875A (ja) | 1994-10-28 | 1996-05-21 | Hewlett Packard Co <Hp> | 導電性針の位置ずれを低減したプローブ装置 |
JP3652728B2 (ja) * | 1994-12-31 | 2005-05-25 | ヒューレット・パッカード・カンパニー | 走査型メモリ装置および誤り訂正方法 |
JP3935976B2 (ja) * | 1995-02-08 | 2007-06-27 | ヒューレット・パッカード・カンパニー | 半導体層構造および大容量メモリ装置の記録媒体 |
US5717631A (en) * | 1995-07-21 | 1998-02-10 | Carnegie Mellon University | Microelectromechanical structure and process of making same |
US6507553B2 (en) | 1995-07-24 | 2003-01-14 | General Nanotechnology Llc | Nanometer scale data storage device and associated positioning system |
US6000047A (en) * | 1995-12-08 | 1999-12-07 | Hewlett-Packard Company | Scanning memory device and error correction method |
JPH09293283A (ja) * | 1996-04-25 | 1997-11-11 | Hewlett Packard Co <Hp> | プローブ装置およびその製造方法、ならびにメディア移動型メモリ装置 |
US6551857B2 (en) | 1997-04-04 | 2003-04-22 | Elm Technology Corporation | Three dimensional structure integrated circuits |
US6923044B1 (en) | 2001-03-08 | 2005-08-02 | General Nanotechnology Llc | Active cantilever for nanomachining and metrology |
US6752008B1 (en) | 2001-03-08 | 2004-06-22 | General Nanotechnology Llc | Method and apparatus for scanning in scanning probe microscopy and presenting results |
US7196328B1 (en) | 2001-03-08 | 2007-03-27 | General Nanotechnology Llc | Nanomachining method and apparatus |
US6802646B1 (en) | 2001-04-30 | 2004-10-12 | General Nanotechnology Llc | Low-friction moving interfaces in micromachines and nanomachines |
US6787768B1 (en) | 2001-03-08 | 2004-09-07 | General Nanotechnology Llc | Method and apparatus for tool and tip design for nanomachining and measurement |
US6477132B1 (en) * | 1998-08-19 | 2002-11-05 | Canon Kabushiki Kaisha | Probe and information recording/reproduction apparatus using the same |
US7260051B1 (en) | 1998-12-18 | 2007-08-21 | Nanochip, Inc. | Molecular memory medium and molecular memory integrated circuit |
WO2001003157A1 (en) | 1999-07-01 | 2001-01-11 | General Nanotechnology, Llc | Object inspection and/or modification system and method |
KR100331451B1 (ko) * | 2000-05-10 | 2002-04-09 | 윤종용 | 탄소 함유 물질을 이용한 재기록 가능한 데이타 스토리지및 그 기록/재생 방법 |
WO2002040944A1 (en) * | 2000-11-16 | 2002-05-23 | International Business Machines Corporation | Method and apparatus for reading an array of thermal resistance sensors |
US6931710B2 (en) | 2001-01-30 | 2005-08-23 | General Nanotechnology Llc | Manufacturing of micro-objects such as miniature diamond tool tips |
US7253407B1 (en) | 2001-03-08 | 2007-08-07 | General Nanotechnology Llc | Active cantilever for nanomachining and metrology |
US6593666B1 (en) | 2001-06-20 | 2003-07-15 | Ambient Systems, Inc. | Energy conversion systems using nanometer scale assemblies and methods for using same |
US7053369B1 (en) | 2001-10-19 | 2006-05-30 | Rave Llc | Scan data collection for better overall data accuracy |
US6813937B2 (en) | 2001-11-28 | 2004-11-09 | General Nanotechnology Llc | Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
US6998689B2 (en) | 2002-09-09 | 2006-02-14 | General Nanotechnology Llc | Fluid delivery for scanning probe microscopy |
KR100519752B1 (ko) * | 2002-05-10 | 2005-10-07 | 삼성전자주식회사 | 시분할 다중 방식을 채용한 고속 고밀도 정보저장 장치 및이를 이용한 정보기록방법 및 정보재생방법 |
AU2003255254A1 (en) | 2002-08-08 | 2004-02-25 | Glenn J. Leedy | Vertical system integration |
US7233517B2 (en) | 2002-10-15 | 2007-06-19 | Nanochip, Inc. | Atomic probes and media for high density data storage |
US7095645B2 (en) | 2003-06-02 | 2006-08-22 | Ambient Systems, Inc. | Nanoelectromechanical memory cells and data storage devices |
US7148579B2 (en) | 2003-06-02 | 2006-12-12 | Ambient Systems, Inc. | Energy conversion systems utilizing parallel array of automatic switches and generators |
US7199498B2 (en) | 2003-06-02 | 2007-04-03 | Ambient Systems, Inc. | Electrical assemblies using molecular-scale electrically conductive and mechanically flexible beams and methods for application of same |
US20040238907A1 (en) | 2003-06-02 | 2004-12-02 | Pinkerton Joseph F. | Nanoelectromechanical transistors and switch systems |
US20050128927A1 (en) * | 2003-12-15 | 2005-06-16 | Hewlett-Packard Development Co., L.P. | Electrostatic actuator for contact probe storage device |
US7436753B2 (en) | 2003-12-17 | 2008-10-14 | Mejia Robert G | Contact probe storage FET sensor |
EP1548748A1 (de) * | 2003-12-17 | 2005-06-29 | Interuniversitaire Microelectronica Centrum vzw ( IMEC) | Verfahren zur Herstellung von Sonden für Atomkraftmikroskopie |
US7423954B2 (en) * | 2003-12-17 | 2008-09-09 | Hewlett-Packard Development Company, L.P. | Contact probe storage sensor pod |
US7212487B2 (en) * | 2004-01-07 | 2007-05-01 | Hewlett-Packard Development Company, L.P. | Data readout arrangement |
US7212488B2 (en) | 2005-03-21 | 2007-05-01 | Hewlett-Packard Development Company, L.P. | Method and device enabling capacitive probe-based data storage readout |
US7463573B2 (en) | 2005-06-24 | 2008-12-09 | Nanochip, Inc. | Patterned media for a high density data storage device |
US7367119B2 (en) | 2005-06-24 | 2008-05-06 | Nanochip, Inc. | Method for forming a reinforced tip for a probe storage device |
US7309630B2 (en) | 2005-07-08 | 2007-12-18 | Nanochip, Inc. | Method for forming patterned media for a high density data storage device |
US7514942B2 (en) * | 2006-09-27 | 2009-04-07 | Intel Corporation | Probe based patterning of microelectronic and micromechanical devices |
US8385113B2 (en) | 2007-04-03 | 2013-02-26 | Cjp Ip Holdings, Ltd. | Nanoelectromechanical systems and methods for making the same |
JP4792095B2 (ja) * | 2009-03-18 | 2011-10-12 | 株式会社東芝 | 不揮発性記憶装置 |
JP4811506B2 (ja) * | 2009-08-03 | 2011-11-09 | 横浜ゴム株式会社 | スチール線材被覆用ゴム組成物 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3710352A (en) * | 1970-03-13 | 1973-01-09 | Micro Bit Corp | High speed-large storage capability electron beam accessed memory method and apparatus |
US3872445A (en) * | 1973-05-11 | 1975-03-18 | Xynetics Inc | Automated data library system including a flat plane memory |
EP0247219B1 (de) * | 1986-05-27 | 1991-05-15 | International Business Machines Corporation | Speichereinheit mit direktem Zugriff |
US4906840A (en) * | 1988-01-27 | 1990-03-06 | The Board Of Trustees Of Leland Stanford Jr., University | Integrated scanning tunneling microscope |
DE3823010A1 (de) * | 1988-07-07 | 1989-09-21 | Leitz Wild Gmbh | Anordnung zum auslesen von daten |
JPH0298896A (ja) * | 1988-10-05 | 1990-04-11 | Olympus Optical Co Ltd | 記憶装置 |
JPH02206043A (ja) * | 1989-02-03 | 1990-08-15 | Olympus Optical Co Ltd | 記憶装置 |
EP0382192B1 (de) * | 1989-02-09 | 1993-08-18 | Olympus Optical Co., Ltd. | Rastertunnelmikroskop-Speichergerät |
GB8910566D0 (en) * | 1989-05-08 | 1989-06-21 | Amersham Int Plc | Imaging apparatus and method |
US5075548A (en) * | 1989-07-17 | 1991-12-24 | Olympus Optical Co., Ltd. | Tunnel current probe moving mechanism having parallel cantilevers |
US5132533A (en) * | 1989-12-08 | 1992-07-21 | Canon Kabushiki Kaisha | Method for forming probe and apparatus therefor |
-
1991
- 1991-06-12 JP JP03140108A patent/JP3109861B2/ja not_active Expired - Fee Related
-
1992
- 1992-06-10 DE DE69221944T patent/DE69221944T2/de not_active Expired - Lifetime
- 1992-06-10 CA CA002070947A patent/CA2070947C/en not_active Expired - Lifetime
- 1992-06-10 AT AT92109732T patent/ATE157798T1/de active
- 1992-06-10 EP EP92109732A patent/EP0518283B1/de not_active Expired - Lifetime
- 1992-06-10 US US07/896,372 patent/US5373494A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0518283A2 (de) | 1992-12-16 |
CA2070947C (en) | 1998-09-29 |
EP0518283B1 (de) | 1997-09-03 |
EP0518283A3 (en) | 1993-08-18 |
DE69221944T2 (de) | 1998-01-02 |
JP3109861B2 (ja) | 2000-11-20 |
DE69221944D1 (de) | 1997-10-09 |
CA2070947A1 (en) | 1992-12-13 |
US5373494A (en) | 1994-12-13 |
JPH04364299A (ja) | 1992-12-16 |
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