ATE190424T1 - Informationsaufzeichnungs-/wiedergabegerät zur informationsaufzeichnung und /-wiedergabe mittels einer sondenelektrode - Google Patents

Informationsaufzeichnungs-/wiedergabegerät zur informationsaufzeichnung und /-wiedergabe mittels einer sondenelektrode

Info

Publication number
ATE190424T1
ATE190424T1 AT93120440T AT93120440T ATE190424T1 AT E190424 T1 ATE190424 T1 AT E190424T1 AT 93120440 T AT93120440 T AT 93120440T AT 93120440 T AT93120440 T AT 93120440T AT E190424 T1 ATE190424 T1 AT E190424T1
Authority
AT
Austria
Prior art keywords
information recording
recording medium
probe electrode
probe
replay
Prior art date
Application number
AT93120440T
Other languages
English (en)
Inventor
Miyazaki Toshihiko
Nakayama Masaru
Kuroda Ryo
Kawase Toshimitsu
Tagawa Masahiro
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE190424T1 publication Critical patent/ATE190424T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1409—Heads
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/943—Information storage or retrieval using nanostructure
    • Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Micromachines (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Indexing, Searching, Synchronizing, And The Amount Of Synchronization Travel Of Record Carriers (AREA)
AT93120440T 1992-12-21 1993-12-17 Informationsaufzeichnungs-/wiedergabegerät zur informationsaufzeichnung und /-wiedergabe mittels einer sondenelektrode ATE190424T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4340754A JP3025120B2 (ja) 1992-12-21 1992-12-21 記録再生装置

Publications (1)

Publication Number Publication Date
ATE190424T1 true ATE190424T1 (de) 2000-03-15

Family

ID=18339990

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93120440T ATE190424T1 (de) 1992-12-21 1993-12-17 Informationsaufzeichnungs-/wiedergabegerät zur informationsaufzeichnung und /-wiedergabe mittels einer sondenelektrode

Country Status (6)

Country Link
US (1) US5426631A (de)
EP (1) EP0603770B1 (de)
JP (1) JP3025120B2 (de)
AT (1) ATE190424T1 (de)
CA (1) CA2111770C (de)
DE (1) DE69328012T2 (de)

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US6339217B1 (en) 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
US5751683A (en) * 1995-07-24 1998-05-12 General Nanotechnology, L.L.C. Nanometer scale data storage device and associated positioning system
US6353219B1 (en) 1994-07-28 2002-03-05 Victor B. Kley Object inspection and/or modification system and method
JPH09293283A (ja) * 1996-04-25 1997-11-11 Hewlett Packard Co <Hp> プローブ装置およびその製造方法、ならびにメディア移動型メモリ装置
JPH10321631A (ja) * 1997-05-19 1998-12-04 Oki Electric Ind Co Ltd 半導体装置およびその製造方法
US6459088B1 (en) * 1998-01-16 2002-10-01 Canon Kabushiki Kaisha Drive stage and scanning probe microscope and information recording/reproducing apparatus using the same
US6787768B1 (en) 2001-03-08 2004-09-07 General Nanotechnology Llc Method and apparatus for tool and tip design for nanomachining and measurement
US6923044B1 (en) 2001-03-08 2005-08-02 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US6802646B1 (en) * 2001-04-30 2004-10-12 General Nanotechnology Llc Low-friction moving interfaces in micromachines and nanomachines
US6752008B1 (en) 2001-03-08 2004-06-22 General Nanotechnology Llc Method and apparatus for scanning in scanning probe microscopy and presenting results
US7196328B1 (en) 2001-03-08 2007-03-27 General Nanotechnology Llc Nanomachining method and apparatus
WO2001003157A1 (en) * 1999-07-01 2001-01-11 General Nanotechnology, Llc Object inspection and/or modification system and method
RU2198435C2 (ru) * 2000-04-11 2003-02-10 Государственный научно-исследовательский институт физических проблем им. Ф.В.Лукина Запоминающее устройство с электрическим зондовым считыванием
US6931710B2 (en) 2001-01-30 2005-08-23 General Nanotechnology Llc Manufacturing of micro-objects such as miniature diamond tool tips
US7253407B1 (en) 2001-03-08 2007-08-07 General Nanotechnology Llc Active cantilever for nanomachining and metrology
US20020154871A1 (en) * 2001-04-19 2002-10-24 Autonetworks Technologies, Ltd. Optical connector, shield casing, optical connector device
JP4695325B2 (ja) * 2001-09-17 2011-06-08 キヤノン電子株式会社 磁気検出素子とその製造方法及び該素子を用いた携帯機器
US7053369B1 (en) 2001-10-19 2006-05-30 Rave Llc Scan data collection for better overall data accuracy
US6813937B2 (en) 2001-11-28 2004-11-09 General Nanotechnology Llc Method and apparatus for micromachines, microstructures, nanomachines and nanostructures
US6998689B2 (en) * 2002-09-09 2006-02-14 General Nanotechnology Llc Fluid delivery for scanning probe microscopy
US20050128927A1 (en) * 2003-12-15 2005-06-16 Hewlett-Packard Development Co., L.P. Electrostatic actuator for contact probe storage device
US7423954B2 (en) * 2003-12-17 2008-09-09 Hewlett-Packard Development Company, L.P. Contact probe storage sensor pod
US7436753B2 (en) 2003-12-17 2008-10-14 Mejia Robert G Contact probe storage FET sensor
US7212487B2 (en) * 2004-01-07 2007-05-01 Hewlett-Packard Development Company, L.P. Data readout arrangement
US7787350B2 (en) * 2005-01-13 2010-08-31 International Business Machines Corporation Data storage device
US7212488B2 (en) 2005-03-21 2007-05-01 Hewlett-Packard Development Company, L.P. Method and device enabling capacitive probe-based data storage readout
JP2007141414A (ja) * 2005-11-22 2007-06-07 Lg Electronics Inc カンチレバー構造を利用したナノ情報保存／再生装置及びその製造方法
US8302456B2 (en) 2006-02-23 2012-11-06 Asylum Research Corporation Active damping of high speed scanning probe microscope components
US7514942B2 (en) * 2006-09-27 2009-04-07 Intel Corporation Probe based patterning of microelectronic and micromechanical devices
US7948337B2 (en) * 2007-05-31 2011-05-24 Seagate Technology Llc Simultaneous rotational control using offset linear actuators
JP2009123421A (ja) * 2007-11-13 2009-06-04 Canon Inc 気密容器の製造方法
JP2011210431A (ja) * 2010-03-29 2011-10-20 Canon Inc 気密容器の製造方法
JP2011210430A (ja) * 2010-03-29 2011-10-20 Canon Inc 気密容器の製造方法
JP5590935B2 (ja) * 2010-03-29 2014-09-17 キヤノン株式会社 気密容器の製造方法
JP2012059401A (ja) 2010-09-06 2012-03-22 Canon Inc 気密容器の製造方法
JP5627370B2 (ja) 2010-09-27 2014-11-19 キヤノン株式会社 減圧気密容器及び画像表示装置の製造方法
US9383388B2 (en) 2014-04-21 2016-07-05 Oxford Instruments Asylum Research, Inc Automated atomic force microscope and the operation thereof
CN114397482A (zh) * 2021-12-20 2022-04-26 百及纳米科技(上海)有限公司 探针装置与探针控制设备

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US4575822A (en) * 1983-02-15 1986-03-11 The Board Of Trustees Of The Leland Stanford Junior University Method and means for data storage using tunnel current data readout
FR2559297B1 (fr) * 1984-02-03 1990-01-12 Commissariat Energie Atomique Nouveau patin de vol pour tetes magnetiques d'enregistrement
EP0247219B1 (de) * 1986-05-27 1991-05-15 International Business Machines Corporation Speichereinheit mit direktem Zugriff
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JPH01290598A (ja) * 1988-05-17 1989-11-22 Res Dev Corp Of Japan 微細マルチプローブの製造方法
JP2896794B2 (ja) * 1988-09-30 1999-05-31 キヤノン株式会社 走査型トンネル電流検出装置，走査型トンネル顕微鏡，及び記録再生装置
US5015850A (en) * 1989-06-20 1991-05-14 The Board Of Trustees Of The Leland Stanford Junior University Microfabricated microscope assembly
ATE155579T1 (de) * 1990-08-14 1997-08-15 Canon Kk Biegebalkenmessfühler und mit dem messfühler ausgestattete informationsverarbeitungsvorrichtung
JP3030574B2 (ja) * 1990-08-16 2000-04-10 キヤノン株式会社 微小変位型情報検知探針素子及びこれを用いた走査型トンネル顕微鏡、原子間力顕微鏡、情報処理装置
JP2741629B2 (ja) * 1990-10-09 1998-04-22 キヤノン株式会社 カンチレバー型プローブ、それを用いた走査型トンネル顕微鏡及び情報処理装置
JP2802828B2 (ja) * 1990-10-19 1998-09-24 キヤノン株式会社 情報記録担体及びこれを使用する情報処理装置
US5216631A (en) * 1990-11-02 1993-06-01 Sliwa Jr John W Microvibratory memory device
JPH0575047A (ja) * 1991-03-08 1993-03-26 Hitachi Ltd 記憶装置
JP2930447B2 (ja) * 1991-05-15 1999-08-03 キヤノン株式会社 情報処理装置
US5329122A (en) * 1991-08-29 1994-07-12 Canon Kabushiki Kaisha Information processing apparatus and scanning tunnel microscope

Also Published As

Publication number Publication date
US5426631A (en) 1995-06-20
CA2111770C (en) 1998-10-13
EP0603770A3 (de) 1995-12-13
JP3025120B2 (ja) 2000-03-27
EP0603770A2 (de) 1994-06-29
DE69328012D1 (de) 2000-04-13
JPH06195773A (ja) 1994-07-15
DE69328012T2 (de) 2000-08-03
CA2111770A1 (en) 1994-06-22
EP0603770B1 (de) 2000-03-08

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