ATE148263T1 - Sekundärionenmassenspektrometer zur analyse positiv und negativ geladener ionen - Google Patents
Sekundärionenmassenspektrometer zur analyse positiv und negativ geladener ionenInfo
- Publication number
- ATE148263T1 ATE148263T1 AT93103506T AT93103506T ATE148263T1 AT E148263 T1 ATE148263 T1 AT E148263T1 AT 93103506 T AT93103506 T AT 93103506T AT 93103506 T AT93103506 T AT 93103506T AT E148263 T1 ATE148263 T1 AT E148263T1
- Authority
- AT
- Austria
- Prior art keywords
- secondary ions
- mass spectrometer
- sample
- analyzing
- separated
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4081410A JPH05251039A (ja) | 1992-03-04 | 1992-03-04 | 二次イオン質量分析計 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE148263T1 true ATE148263T1 (de) | 1997-02-15 |
Family
ID=13745570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT93103506T ATE148263T1 (de) | 1992-03-04 | 1993-03-04 | Sekundärionenmassenspektrometer zur analyse positiv und negativ geladener ionen |
Country Status (5)
Country | Link |
---|---|
US (1) | US5401965A (de) |
EP (1) | EP0559202B1 (de) |
JP (1) | JPH05251039A (de) |
AT (1) | ATE148263T1 (de) |
DE (1) | DE69307557T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9717877D0 (en) * | 1997-08-26 | 1997-10-29 | Ellis Richard J | Order charge separation and order -charge type separation |
WO2005024882A2 (en) * | 2003-09-05 | 2005-03-17 | Griffin Analytical Technologies | Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry |
CA2570806A1 (en) * | 2004-06-15 | 2006-01-05 | Griffin Analytical Technologies, Inc. | Analytical instruments, assemblies, and methods |
DE602005006967D1 (de) * | 2005-03-17 | 2008-07-03 | Integrated Circuit Testing | Analyse-System und Teilchenstrahlgerät |
CN101317246A (zh) | 2005-04-25 | 2008-12-03 | 格里芬分析技术有限责任公司 | 分析仪器、装置和方法 |
US7992424B1 (en) | 2006-09-14 | 2011-08-09 | Griffin Analytical Technologies, L.L.C. | Analytical instrumentation and sample analysis methods |
JP5196362B2 (ja) * | 2007-07-23 | 2013-05-15 | 独立行政法人物質・材料研究機構 | 磁気構造解析方法とそれに使用するスピン偏極イオン散乱分光装置 |
US7855361B2 (en) * | 2008-05-30 | 2010-12-21 | Varian, Inc. | Detection of positive and negative ions |
GB0809950D0 (en) * | 2008-05-30 | 2008-07-09 | Thermo Fisher Scient Bremen | Mass spectrometer |
CN102706914B (zh) * | 2012-06-29 | 2015-03-18 | 北京卫星环境工程研究所 | 介质材料二次电子发射系数测量系统及测量方法 |
TWI539154B (zh) * | 2012-12-19 | 2016-06-21 | 英福康公司 | 雙重偵測殘餘氣體分析器 |
EP3201939B1 (de) * | 2014-10-02 | 2021-03-03 | 908 Devices Inc. | Massenspektrometrie durch detektion von positiv und negativ geladenen teilchen |
US9564290B2 (en) | 2014-11-18 | 2017-02-07 | Hamilton Sundstrand Corporation | Micro machined two dimensional faraday collector grid |
DE102015106418B3 (de) * | 2015-04-27 | 2016-08-11 | Bruker Daltonik Gmbh | Messung des elektrischen Stromverlaufs von Partikelschwärmen in Gasen und im Vakuum |
CN105428199B (zh) * | 2015-12-28 | 2017-12-01 | 中国计量科学研究院 | 质谱分析方法及具有大气压接口的质谱分析装置 |
CN106783505B (zh) * | 2016-12-30 | 2018-11-20 | 聚光科技(杭州)股份有限公司 | 大气压离子源的真空接口 |
US10468239B1 (en) * | 2018-05-14 | 2019-11-05 | Bruker Daltonics, Inc. | Mass spectrometer having multi-dynode multiplier(s) of high dynamic range operation |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE758925A (fr) * | 1969-11-14 | 1971-04-16 | Bayer Ag | Procede pour l'analyse des surfaces de corps solides par spectrometrie de masse |
DE2445711A1 (de) * | 1973-10-03 | 1975-04-10 | Hewlett Packard Co | Ionen/elektronen-umwandler |
US4066894A (en) * | 1976-01-20 | 1978-01-03 | University Of Virginia | Positive and negative ion recording system for mass spectrometer |
US4266127A (en) * | 1978-12-01 | 1981-05-05 | Cherng Chang | Mass spectrometer for chemical ionization and electron impact ionization operation |
JPS6190161A (ja) * | 1984-10-09 | 1986-05-08 | Seiko Instr & Electronics Ltd | 集束イオンビ−ムのビ−ム形状調整方法 |
JPS6237860A (ja) * | 1985-08-09 | 1987-02-18 | Nippon Telegr & Teleph Corp <Ntt> | 二次イオン質量分析計 |
JP2641437B2 (ja) * | 1987-02-27 | 1997-08-13 | 株式会社日立製作所 | 荷電粒子線装置 |
US4988867A (en) * | 1989-11-06 | 1991-01-29 | Galileo Electro-Optics Corp. | Simultaneous positive and negative ion detector |
JP2586710B2 (ja) * | 1990-09-07 | 1997-03-05 | 日本電気株式会社 | 2次イオン質量分析方法 |
-
1992
- 1992-03-04 JP JP4081410A patent/JPH05251039A/ja active Pending
-
1993
- 1993-03-03 US US08/027,242 patent/US5401965A/en not_active Expired - Fee Related
- 1993-03-04 AT AT93103506T patent/ATE148263T1/de not_active IP Right Cessation
- 1993-03-04 EP EP93103506A patent/EP0559202B1/de not_active Expired - Lifetime
- 1993-03-04 DE DE69307557T patent/DE69307557T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69307557T2 (de) | 1997-08-14 |
US5401965A (en) | 1995-03-28 |
DE69307557D1 (de) | 1997-03-06 |
JPH05251039A (ja) | 1993-09-28 |
EP0559202A1 (de) | 1993-09-08 |
EP0559202B1 (de) | 1997-01-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |