ATE120541T1 - Dickenmessgerät zum messen der auf einem substrat liegenden schicht. - Google Patents

Dickenmessgerät zum messen der auf einem substrat liegenden schicht.

Info

Publication number
ATE120541T1
ATE120541T1 AT91117145T AT91117145T ATE120541T1 AT E120541 T1 ATE120541 T1 AT E120541T1 AT 91117145 T AT91117145 T AT 91117145T AT 91117145 T AT91117145 T AT 91117145T AT E120541 T1 ATE120541 T1 AT E120541T1
Authority
AT
Austria
Prior art keywords
housing
thickness
coating
measuring
indicator rod
Prior art date
Application number
AT91117145T
Other languages
English (en)
Inventor
Frank J Koch
Marlin S Walmer
Original Assignee
Defelsko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Defelsko Corp filed Critical Defelsko Corp
Application granted granted Critical
Publication of ATE120541T1 publication Critical patent/ATE120541T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
AT91117145T 1990-10-17 1991-10-08 Dickenmessgerät zum messen der auf einem substrat liegenden schicht. ATE120541T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/599,101 US5094009A (en) 1990-10-17 1990-10-17 Gauge for measuring the thickness of a coating on a substrate

Publications (1)

Publication Number Publication Date
ATE120541T1 true ATE120541T1 (de) 1995-04-15

Family

ID=24398222

Family Applications (1)

Application Number Title Priority Date Filing Date
AT91117145T ATE120541T1 (de) 1990-10-17 1991-10-08 Dickenmessgerät zum messen der auf einem substrat liegenden schicht.

Country Status (4)

Country Link
US (1) US5094009A (de)
EP (1) EP0481334B1 (de)
AT (1) ATE120541T1 (de)
DE (1) DE69108504T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5343146A (en) * 1992-10-05 1994-08-30 De Felsko Corporation Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil
US5327659A (en) * 1992-12-03 1994-07-12 R. R. Donnelley & Sons Co. Wet film thickness gauge
US6575115B2 (en) * 1999-02-22 2003-06-10 Ray Keith Lake Thickness gauge pin
DE19918064C2 (de) * 1999-04-21 2003-09-18 Norbert Nix Schichtdickenmeßgerät mit automatisierter Nulleinstellung und/oder Kalibrierung
US7406773B2 (en) * 2004-12-23 2008-08-05 Irwin Industrial Tool Company Magnet assembly
US8229523B2 (en) * 2008-05-27 2012-07-24 Nokia Corporation Locking mechanism
US20100171493A1 (en) * 2009-01-07 2010-07-08 Robert Standen Method and device for measuring thickness of a substrate
US8448596B2 (en) * 2010-06-02 2013-05-28 Valentine International Ltd. Device for sensing gap variation
US9304073B2 (en) * 2013-02-05 2016-04-05 Pilkington Group Limited Bond strength testing apparatus and method for using same
US9518812B2 (en) 2015-01-16 2016-12-13 Schlage Lock Company Llc Self-adjusting door thickness indicator
CN113959390B (zh) * 2021-11-05 2024-02-09 扬州中远海运重工有限公司 一种远距离测膜标记用的一体支架

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2625585A (en) * 1949-12-01 1953-01-13 Glen N Krouse Magnetic measuring gauge
US2749505A (en) * 1952-11-22 1956-06-05 Mcnary Forrest Cline Apparatus for gaging
GB799768A (en) * 1954-10-13 1958-08-13 Jaroslav Binko Apparatus for measuring the thickness of non-magnetic layers on a magnetic base material
AT215169B (de) * 1958-12-09 1961-05-25 Vaclav Ing Bruna Gerät zur Bestimmung der Dicke nicht magnetisierbarer Schichten auf ferromagnetischen Prüflingen
GB907721A (en) * 1958-12-22 1962-10-10 Vaclav Bruna Instrument for use in measuring the thickness of a non-metallic layer on a ferro-magnetic base material
DE2107076C3 (de) * 1971-02-15 1975-01-30 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever Kg, 5000 Koeln Magnetischer Schicht-Dickenmesser
US3901741A (en) * 1973-08-23 1975-08-26 Gen Electric Permanent magnets of cobalt, samarium, gadolinium alloy
US4160208A (en) * 1976-01-27 1979-07-03 Elektro-Physik, Hans Nix & Dr. -Ing E. Steingroever Kg. Method of calibrating magnetic thickness gauges
JPS52109191A (en) * 1976-03-10 1977-09-13 Toshiba Corp Permanent magnet
DE2630099C2 (de) * 1976-07-03 1985-09-19 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever KG, 5000 Köln Magnetischer Schichtdickenmesser
SU590591A1 (ru) * 1976-11-18 1978-01-30 Белоярская атомная электростанция им.И.В.Курчатова Толщиномер
DE2855912C2 (de) * 1978-12-23 1988-08-18 Nix, Norbert, Dr., 5000 Köln Einrichtung zur Messung der Dicke von festen Überzügen auf einem Grundmaterial
US4226620A (en) * 1979-04-27 1980-10-07 The United States Of America As Represented By The Secretary Of The Army Magnetic alloys
US4392305A (en) * 1980-07-08 1983-07-12 Elektro-Physik Hans Nix & Dr. Ing. E. Steingroever, K.G. Pencil shaped magnetic coating thickness gauge
US4433290A (en) * 1981-11-12 1984-02-21 Defelsko Corporation Magnetic coating thickness comparator having parallel magnetic rods with nonmagnetic slide indicators
US4567436A (en) * 1982-01-21 1986-01-28 Linda Koch Magnetic thickness gauge with adjustable probe
US4733178A (en) * 1982-01-21 1988-03-22 Linda Koch Magnetic thickness gauge with third support
US4599562A (en) * 1983-11-07 1986-07-08 Defelsko Corporation Method and apparatus for magnetically measuring a coating with a plurality of magnets
DE3401466A1 (de) * 1984-01-18 1985-07-25 Elektro-Physik Hans Nix & Dr.-Ing. E. Steingroever KG, 5000 Köln Sonde fuer die kontinuierliche messung der dicke von schichten oder baendern
US4634974A (en) * 1985-01-31 1987-01-06 Hunter Rudolf A Device including moveable shaft and magnet for sensing magnetic metal
DE3611798A1 (de) * 1985-12-13 1987-06-19 Max Hacklinger Dickenmessgeraet
US5006799A (en) * 1988-12-01 1991-04-09 Pfanstiehl John G Low cost magnetic coating thickness gauge with holding magnet, bias spring and holding force indicator

Also Published As

Publication number Publication date
DE69108504D1 (de) 1995-05-04
EP0481334A1 (de) 1992-04-22
US5094009A (en) 1992-03-10
EP0481334B1 (de) 1995-03-29
DE69108504T2 (de) 1995-09-21

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Legal Events

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