ATA205492A - Interferometrische einrichtung zur messung der lage eines reflektierenden objektes - Google Patents
Interferometrische einrichtung zur messung der lage eines reflektierenden objektesInfo
- Publication number
- ATA205492A ATA205492A AT0205492A AT205492A ATA205492A AT A205492 A ATA205492 A AT A205492A AT 0205492 A AT0205492 A AT 0205492A AT 205492 A AT205492 A AT 205492A AT A205492 A ATA205492 A AT A205492A
- Authority
- AT
- Austria
- Prior art keywords
- measuring
- reflective object
- interferometric device
- interferometric
- reflective
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT0205492A AT399222B (de) | 1992-10-19 | 1992-10-19 | Interferometrische einrichtung zur messung der lage eines reflektierenden objektes |
DE4335036A DE4335036C2 (de) | 1992-10-19 | 1993-10-14 | Interferometrische Einrichtung zur Messung der Lage eines reflektierenden Objektes |
GB9321426A GB2271632B (en) | 1992-10-19 | 1993-10-18 | Interferometric device |
US08/335,596 US5539520A (en) | 1992-10-19 | 1994-11-08 | Interferometer using frequency modulation of the carrier frequency |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT0205492A AT399222B (de) | 1992-10-19 | 1992-10-19 | Interferometrische einrichtung zur messung der lage eines reflektierenden objektes |
Publications (2)
Publication Number | Publication Date |
---|---|
ATA205492A true ATA205492A (de) | 1994-08-15 |
AT399222B AT399222B (de) | 1995-04-25 |
Family
ID=3526790
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT0205492A AT399222B (de) | 1992-10-19 | 1992-10-19 | Interferometrische einrichtung zur messung der lage eines reflektierenden objektes |
Country Status (4)
Country | Link |
---|---|
US (1) | US5539520A (de) |
AT (1) | AT399222B (de) |
DE (1) | DE4335036C2 (de) |
GB (1) | GB2271632B (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5645351A (en) * | 1992-05-20 | 1997-07-08 | Hitachi, Ltd. | Temperature measuring method using thermal expansion and an apparatus for carrying out the same |
US5706084A (en) * | 1995-09-14 | 1998-01-06 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Modulated source interferometry with combined amputude & frequency modulation |
DE10247882B4 (de) * | 2002-10-14 | 2005-03-10 | Deutsch Zentr Luft & Raumfahrt | Verfahren zum Verringern von bei optischer Freiraum-Kommunikation auftretenden Fading |
JP2005051245A (ja) | 2003-07-30 | 2005-02-24 | Asml Netherlands Bv | リソグラフィ装置 |
CZ304138B6 (cs) * | 2012-05-19 | 2013-11-13 | Ústav prístrojové techniky Akademie ved CR, v.v.i. | Zpusob detekce interferencní fáze dvou interferujících laserových paprsku a zarízení pro provádení tohoto zpusobu |
CN103162631A (zh) * | 2013-03-21 | 2013-06-19 | 上海理工大学 | 光学测位移装置 |
CN103322926B (zh) * | 2013-06-09 | 2016-04-27 | 中国科学院长春光学精密机械与物理研究所 | 信号传输过程中的周期性非线性误差或干扰消除法 |
CN103322922B (zh) * | 2013-06-09 | 2016-01-13 | 中国科学院长春光学精密机械与物理研究所 | 基于fft算法消除非线性误差的光外差干涉法 |
CN103322923B (zh) * | 2013-06-09 | 2016-04-27 | 中国科学院长春光学精密机械与物理研究所 | 基于方波均值法消除非线性误差的光外差干涉法 |
CN111670335A (zh) * | 2018-01-31 | 2020-09-15 | Asml荷兰有限公司 | 波长追踪系统、校准波长追踪系统的方法、光刻设备、确定可运动对象的绝对位置的方法、以及干涉仪系统 |
CN109239384B (zh) * | 2018-10-23 | 2021-02-09 | 北京控制工程研究所 | 一种二维三维融合的非合作目标转速转轴测量方法 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DD139760B1 (de) * | 1978-11-27 | 1980-12-10 | Werner Krieg | Interferometrische einrichtung zum messen von abstaenden und abstandsaenderungen |
FR2482325A1 (fr) * | 1980-05-08 | 1981-11-13 | Thomson Csf | Systeme optique d'observation en temps reel a balayage |
US4552457A (en) * | 1983-02-01 | 1985-11-12 | Giallorenzi Thomas G | Fiber optic interferometer using two wavelengths or variable wavelength |
DE3334460A1 (de) * | 1983-09-23 | 1985-04-11 | Fa. Carl Zeiss, 7920 Heidenheim | Mehrkoordinaten-messmaschine |
JPS61202128A (ja) * | 1985-03-06 | 1986-09-06 | Hitachi Ltd | 半導体レ−ザヘテロダイン干渉計 |
US4688940A (en) * | 1985-03-12 | 1987-08-25 | Zygo Corporation | Heterodyne interferometer system |
KR900002117B1 (ko) * | 1985-03-28 | 1990-04-02 | 시부야 고오교오 가부시끼가이샤 | 레이저 광선을 이용한 거리측정방법과 장치 |
US4633715A (en) * | 1985-05-08 | 1987-01-06 | Canadian Patents And Development Limited - Societe Canadienne Des Brevets Et D'exploitation Limitee | Laser heterodyne interferometric method and system for measuring ultrasonic displacements |
CH678108A5 (de) * | 1987-04-28 | 1991-07-31 | Wild Leitz Ag | |
US4978219A (en) * | 1988-05-06 | 1990-12-18 | Brother Kogyo Kabushiki Kaisha | Surface roughness measuring apparatus utilizing deflectable laser beams |
US4886363A (en) * | 1988-09-06 | 1989-12-12 | Eastman Kodak Company | Quadratic frequency modulated absolute distance measuring interferometry |
DE3906118A1 (de) * | 1989-02-28 | 1990-08-30 | Bosch Gmbh Robert | Vorrichtung zur interferometrischen erfassung von oberflaechenstrukturen |
DE59001953D1 (en) * | 1989-06-07 | 1993-08-19 | Tabarelli Werner | Interferometeranordnung. |
JP2808136B2 (ja) * | 1989-06-07 | 1998-10-08 | キヤノン株式会社 | 測長方法及び装置 |
US5298970A (en) * | 1990-03-20 | 1994-03-29 | Kabushiki Kaisha Kobe Seiko Sho | Sample evaluating method by using thermal expansion displacement |
US5172186A (en) * | 1990-07-03 | 1992-12-15 | Konica Corporation | Laser interferometry length measuring an apparatus employing a beam slitter |
IT1246572B (it) * | 1991-02-27 | 1994-11-24 | Cise Spa | Procedimento e apparecchio per misure interferometriche assolute di grandezze fisiche. |
JP2821817B2 (ja) * | 1991-03-11 | 1998-11-05 | コニカ株式会社 | 差動型干渉プリズム |
US5155550A (en) * | 1991-05-10 | 1992-10-13 | Barger R L | Accurate correlator of rotational and translational motions and control method and apparatus |
US5412474A (en) * | 1992-05-08 | 1995-05-02 | Smithsonian Institution | System for measuring distance between two points using a variable frequency coherent source |
-
1992
- 1992-10-19 AT AT0205492A patent/AT399222B/de not_active IP Right Cessation
-
1993
- 1993-10-14 DE DE4335036A patent/DE4335036C2/de not_active Expired - Fee Related
- 1993-10-18 GB GB9321426A patent/GB2271632B/en not_active Expired - Fee Related
-
1994
- 1994-11-08 US US08/335,596 patent/US5539520A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AT399222B (de) | 1995-04-25 |
DE4335036A1 (de) | 1994-04-21 |
GB2271632A (en) | 1994-04-20 |
DE4335036C2 (de) | 1998-01-15 |
US5539520A (en) | 1996-07-23 |
GB9321426D0 (en) | 1993-12-08 |
GB2271632B (en) | 1996-07-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EIH | Change in the person of patent owner | ||
ELJ | Ceased due to non-payment of the annual fee | ||
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |