WO2018105674A1 - Release layer production method - Google Patents
Release layer production method Download PDFInfo
- Publication number
- WO2018105674A1 WO2018105674A1 PCT/JP2017/043907 JP2017043907W WO2018105674A1 WO 2018105674 A1 WO2018105674 A1 WO 2018105674A1 JP 2017043907 W JP2017043907 W JP 2017043907W WO 2018105674 A1 WO2018105674 A1 WO 2018105674A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- release layer
- substrate
- resin substrate
- heating
- polyamic acid
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 39
- 239000000758 substrate Substances 0.000 claims abstract description 135
- 239000010410 layer Substances 0.000 claims abstract description 99
- 229920005575 poly(amic acid) Polymers 0.000 claims abstract description 45
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000011254 layer-forming composition Substances 0.000 claims abstract description 16
- 239000003960 organic solvent Substances 0.000 claims abstract description 10
- 150000000000 tetracarboxylic acids Chemical class 0.000 claims abstract description 9
- 239000011347 resin Substances 0.000 claims description 63
- 229920005989 resin Polymers 0.000 claims description 63
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 claims description 51
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims description 50
- 238000000034 method Methods 0.000 claims description 42
- 239000000203 mixture Substances 0.000 claims description 25
- 125000006158 tetracarboxylic acid group Chemical group 0.000 claims description 19
- 125000003118 aryl group Chemical group 0.000 claims description 18
- 150000004985 diamines Chemical class 0.000 claims description 18
- 150000004984 aromatic diamines Chemical class 0.000 claims description 12
- 229920001721 polyimide Polymers 0.000 claims description 11
- 239000002253 acid Substances 0.000 claims description 5
- 239000009719 polyimide resin Substances 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 abstract description 11
- 238000000576 coating method Methods 0.000 abstract description 11
- 238000010304 firing Methods 0.000 abstract description 9
- 238000010438 heat treatment Methods 0.000 description 62
- 239000011521 glass Substances 0.000 description 32
- 238000006243 chemical reaction Methods 0.000 description 25
- 230000015572 biosynthetic process Effects 0.000 description 24
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 23
- 238000003786 synthesis reaction Methods 0.000 description 21
- 239000010408 film Substances 0.000 description 18
- 229920000642 polymer Polymers 0.000 description 16
- 239000000243 solution Substances 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 10
- 239000012299 nitrogen atmosphere Substances 0.000 description 10
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 9
- 239000002904 solvent Substances 0.000 description 9
- VZSRBBMJRBPUNF-UHFFFAOYSA-N 2-(2,3-dihydro-1H-inden-2-ylamino)-N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]pyrimidine-5-carboxamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C(=O)NCCC(N1CC2=C(CC1)NN=N2)=O VZSRBBMJRBPUNF-UHFFFAOYSA-N 0.000 description 8
- 238000009826 distribution Methods 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 7
- 239000004642 Polyimide Substances 0.000 description 5
- 125000000217 alkyl group Chemical group 0.000 description 5
- 125000004432 carbon atom Chemical group C* 0.000 description 5
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 5
- -1 luorobiphenyl Chemical class 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 3
- QBSMHWVGUPQNJJ-UHFFFAOYSA-N 4-[4-(4-aminophenyl)phenyl]aniline Chemical compound C1=CC(N)=CC=C1C1=CC=C(C=2C=CC(N)=CC=2)C=C1 QBSMHWVGUPQNJJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000001408 amides Chemical class 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 150000008064 anhydrides Chemical class 0.000 description 3
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 2
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- QCILMAMLEHOLRX-UHFFFAOYSA-N 2-(3-aminophenyl)-3h-benzimidazol-5-amine Chemical compound NC1=CC=CC(C=2NC3=CC(N)=CC=C3N=2)=C1 QCILMAMLEHOLRX-UHFFFAOYSA-N 0.000 description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 2
- LJGHYPLBDBRCRZ-UHFFFAOYSA-N 3-(3-aminophenyl)sulfonylaniline Chemical compound NC1=CC=CC(S(=O)(=O)C=2C=C(N)C=CC=2)=C1 LJGHYPLBDBRCRZ-UHFFFAOYSA-N 0.000 description 2
- ICNFHJVPAJKPHW-UHFFFAOYSA-N 4,4'-Thiodianiline Chemical compound C1=CC(N)=CC=C1SC1=CC=C(N)C=C1 ICNFHJVPAJKPHW-UHFFFAOYSA-N 0.000 description 2
- BOVVHULZWVFIOX-UHFFFAOYSA-N 4-[3-(4-aminophenyl)phenyl]aniline Chemical compound C1=CC(N)=CC=C1C1=CC=CC(C=2C=CC(N)=CC=2)=C1 BOVVHULZWVFIOX-UHFFFAOYSA-N 0.000 description 2
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- 125000003277 amino group Chemical group 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 239000012295 chemical reaction liquid Substances 0.000 description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 2
- 238000007865 diluting Methods 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 229920002457 flexible plastic Polymers 0.000 description 2
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- BBYQSYQIKWRMOE-UHFFFAOYSA-N naphthalene-1,2,6,7-tetracarboxylic acid Chemical compound C1=C(C(O)=O)C(C(O)=O)=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 BBYQSYQIKWRMOE-UHFFFAOYSA-N 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 150000003462 sulfoxides Chemical class 0.000 description 2
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- YFOOEYJGMMJJLS-UHFFFAOYSA-N 1,8-diaminonaphthalene Chemical compound C1=CC(N)=C2C(N)=CC=CC2=C1 YFOOEYJGMMJJLS-UHFFFAOYSA-N 0.000 description 1
- ZFPGARUNNKGOBB-UHFFFAOYSA-N 1-Ethyl-2-pyrrolidinone Chemical compound CCN1CCCC1=O ZFPGARUNNKGOBB-UHFFFAOYSA-N 0.000 description 1
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- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 1
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- WCZNKVPCIFMXEQ-UHFFFAOYSA-N 2,3,5,6-tetramethylbenzene-1,4-diamine Chemical compound CC1=C(C)C(N)=C(C)C(C)=C1N WCZNKVPCIFMXEQ-UHFFFAOYSA-N 0.000 description 1
- ZVDSMYGTJDFNHN-UHFFFAOYSA-N 2,4,6-trimethylbenzene-1,3-diamine Chemical compound CC1=CC(C)=C(N)C(C)=C1N ZVDSMYGTJDFNHN-UHFFFAOYSA-N 0.000 description 1
- 229940075142 2,5-diaminotoluene Drugs 0.000 description 1
- BWAPJIHJXDYDPW-UHFFFAOYSA-N 2,5-dimethyl-p-phenylenediamine Chemical compound CC1=CC(N)=C(C)C=C1N BWAPJIHJXDYDPW-UHFFFAOYSA-N 0.000 description 1
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- MJAVQHPPPBDYAN-UHFFFAOYSA-N 2,6-dimethylbenzene-1,4-diamine Chemical compound CC1=CC(N)=CC(C)=C1N MJAVQHPPPBDYAN-UHFFFAOYSA-N 0.000 description 1
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- UMGYJGHIMRFYSP-UHFFFAOYSA-N 2-(4-aminophenyl)-1,3-benzoxazol-5-amine Chemical compound C1=CC(N)=CC=C1C1=NC2=CC(N)=CC=C2O1 UMGYJGHIMRFYSP-UHFFFAOYSA-N 0.000 description 1
- FKMCNLLISWDXJQ-UHFFFAOYSA-N 2-(4-aminophenyl)-1-benzofuran-5-amine Chemical compound C1=CC(N)=CC=C1C1=CC2=CC(N)=CC=C2O1 FKMCNLLISWDXJQ-UHFFFAOYSA-N 0.000 description 1
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- HUWXDEQWWKGHRV-UHFFFAOYSA-N 3,3'-Dichlorobenzidine Chemical compound C1=C(Cl)C(N)=CC=C1C1=CC=C(N)C(Cl)=C1 HUWXDEQWWKGHRV-UHFFFAOYSA-N 0.000 description 1
- GWHLJVMSZRKEAQ-UHFFFAOYSA-N 3-(2,3-dicarboxyphenyl)phthalic acid Chemical compound OC(=O)C1=CC=CC(C=2C(=C(C(O)=O)C=CC=2)C(O)=O)=C1C(O)=O GWHLJVMSZRKEAQ-UHFFFAOYSA-N 0.000 description 1
- NBAUUNCGSMAPFM-UHFFFAOYSA-N 3-(3,4-dicarboxyphenyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=CC(C(O)=O)=C1C(O)=O NBAUUNCGSMAPFM-UHFFFAOYSA-N 0.000 description 1
- JFEXPVDGVLNUSC-UHFFFAOYSA-N 3-(3-aminophenyl)sulfanylaniline Chemical compound NC1=CC=CC(SC=2C=C(N)C=CC=2)=C1 JFEXPVDGVLNUSC-UHFFFAOYSA-N 0.000 description 1
- CKOFBUUFHALZGK-UHFFFAOYSA-N 3-[(3-aminophenyl)methyl]aniline Chemical compound NC1=CC=CC(CC=2C=C(N)C=CC=2)=C1 CKOFBUUFHALZGK-UHFFFAOYSA-N 0.000 description 1
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- UVUCUHVQYAPMEU-UHFFFAOYSA-N 3-[2-(3-aminophenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]aniline Chemical compound NC1=CC=CC(C(C=2C=C(N)C=CC=2)(C(F)(F)F)C(F)(F)F)=C1 UVUCUHVQYAPMEU-UHFFFAOYSA-N 0.000 description 1
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- WWNABCFITWBKEM-UHFFFAOYSA-N 3-[3-(3-aminophenyl)phenyl]aniline Chemical compound NC1=CC=CC(C=2C=C(C=CC=2)C=2C=C(N)C=CC=2)=C1 WWNABCFITWBKEM-UHFFFAOYSA-N 0.000 description 1
- POXPSTWTPRGRDO-UHFFFAOYSA-N 3-[4-(3-aminophenyl)phenyl]aniline Chemical compound NC1=CC=CC(C=2C=CC(=CC=2)C=2C=C(N)C=CC=2)=C1 POXPSTWTPRGRDO-UHFFFAOYSA-N 0.000 description 1
- CRORGGSWAKIXSA-UHFFFAOYSA-N 3-methylbutyl 2-hydroxypropanoate Chemical compound CC(C)CCOC(=O)C(C)O CRORGGSWAKIXSA-UHFFFAOYSA-N 0.000 description 1
- WECDUOXQLAIPQW-UHFFFAOYSA-N 4,4'-Methylene bis(2-methylaniline) Chemical compound C1=C(N)C(C)=CC(CC=2C=C(C)C(N)=CC=2)=C1 WECDUOXQLAIPQW-UHFFFAOYSA-N 0.000 description 1
- YBRVSVVVWCFQMG-UHFFFAOYSA-N 4,4'-diaminodiphenylmethane Chemical compound C1=CC(N)=CC=C1CC1=CC=C(N)C=C1 YBRVSVVVWCFQMG-UHFFFAOYSA-N 0.000 description 1
- DCSSXQMBIGEQGN-UHFFFAOYSA-N 4,6-dimethylbenzene-1,3-diamine Chemical compound CC1=CC(C)=C(N)C=C1N DCSSXQMBIGEQGN-UHFFFAOYSA-N 0.000 description 1
- LFBALUPVVFCEPA-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)C(C(O)=O)=C1 LFBALUPVVFCEPA-UHFFFAOYSA-N 0.000 description 1
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- HRDWUZRHCJPOFA-UHFFFAOYSA-N anthracene-1,5-diamine Chemical compound C1=CC=C2C=C3C(N)=CC=CC3=CC2=C1N HRDWUZRHCJPOFA-UHFFFAOYSA-N 0.000 description 1
- MRSWDOKCESOYBI-UHFFFAOYSA-N anthracene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C=C(C(C(=O)O)=C3)C(O)=O)C3=CC2=C1 MRSWDOKCESOYBI-UHFFFAOYSA-N 0.000 description 1
- UXOSWMZHKZFJHD-UHFFFAOYSA-N anthracene-2,6-diamine Chemical compound C1=C(N)C=CC2=CC3=CC(N)=CC=C3C=C21 UXOSWMZHKZFJHD-UHFFFAOYSA-N 0.000 description 1
- NDMVXIYCFFFPLE-UHFFFAOYSA-N anthracene-9,10-diamine Chemical compound C1=CC=C2C(N)=C(C=CC=C3)C3=C(N)C2=C1 NDMVXIYCFFFPLE-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- GCAIEATUVJFSMC-UHFFFAOYSA-N benzene-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1C(O)=O GCAIEATUVJFSMC-UHFFFAOYSA-N 0.000 description 1
- XAHAOEIIQYSRHJ-UHFFFAOYSA-N benzene-1,2-diamine Chemical compound NC1=CC=CC=C1N.NC1=CC=CC=C1N XAHAOEIIQYSRHJ-UHFFFAOYSA-N 0.000 description 1
- XUYGNGMQMDMYHW-UHFFFAOYSA-N benzene-1,3-diamine Chemical compound NC1=CC=CC(N)=C1.NC1=CC=CC(N)=C1 XUYGNGMQMDMYHW-UHFFFAOYSA-N 0.000 description 1
- WRPSKOREVDHZHP-UHFFFAOYSA-N benzene-1,4-diamine Chemical compound NC1=CC=C(N)C=C1.NC1=CC=C(N)C=C1 WRPSKOREVDHZHP-UHFFFAOYSA-N 0.000 description 1
- 150000001555 benzenes Chemical class 0.000 description 1
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical compound C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 description 1
- 239000007810 chemical reaction solvent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- UKJLNMAFNRKWGR-UHFFFAOYSA-N cyclohexatrienamine Chemical group NC1=CC=C=C[CH]1 UKJLNMAFNRKWGR-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 125000006159 dianhydride group Chemical group 0.000 description 1
- 238000007607 die coating method Methods 0.000 description 1
- UYAAVKFHBMJOJZ-UHFFFAOYSA-N diimidazo[1,3-b:1',3'-e]pyrazine-5,10-dione Chemical compound O=C1C2=CN=CN2C(=O)C2=CN=CN12 UYAAVKFHBMJOJZ-UHFFFAOYSA-N 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- SZXQTJUDPRGNJN-UHFFFAOYSA-N dipropylene glycol Chemical compound OCCCOCCCO SZXQTJUDPRGNJN-UHFFFAOYSA-N 0.000 description 1
- ODQWQRRAPPTVAG-GZTJUZNOSA-N doxepin Chemical compound C1OC2=CC=CC=C2C(=C/CCN(C)C)/C2=CC=CC=C21 ODQWQRRAPPTVAG-GZTJUZNOSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 125000001072 heteroaryl group Chemical group 0.000 description 1
- 125000000623 heterocyclic group Chemical group 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 238000006358 imidation reaction Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 238000013532 laser treatment Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229940057867 methyl lactate Drugs 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229940017144 n-butyl lactate Drugs 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- MZYHMUONCNKCHE-UHFFFAOYSA-N naphthalene-1,2,3,4-tetracarboxylic acid Chemical compound C1=CC=CC2=C(C(O)=O)C(C(=O)O)=C(C(O)=O)C(C(O)=O)=C21 MZYHMUONCNKCHE-UHFFFAOYSA-N 0.000 description 1
- OBKARQMATMRWQZ-UHFFFAOYSA-N naphthalene-1,2,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 OBKARQMATMRWQZ-UHFFFAOYSA-N 0.000 description 1
- QWPIYOGWUXWHOV-UHFFFAOYSA-N naphthalene-1,2,7,8-tetracarboxylic acid Chemical compound C1=CC(C(O)=O)=C(C(O)=O)C2=C(C(O)=O)C(C(=O)O)=CC=C21 QWPIYOGWUXWHOV-UHFFFAOYSA-N 0.000 description 1
- NTNWKDHZTDQSST-UHFFFAOYSA-N naphthalene-1,2-diamine Chemical compound C1=CC=CC2=C(N)C(N)=CC=C21 NTNWKDHZTDQSST-UHFFFAOYSA-N 0.000 description 1
- PKXSNWGPLBAAJQ-UHFFFAOYSA-N naphthalene-1,3-diamine Chemical compound C1=CC=CC2=CC(N)=CC(N)=C21 PKXSNWGPLBAAJQ-UHFFFAOYSA-N 0.000 description 1
- OKBVMLGZPNDWJK-UHFFFAOYSA-N naphthalene-1,4-diamine Chemical compound C1=CC=C2C(N)=CC=C(N)C2=C1 OKBVMLGZPNDWJK-UHFFFAOYSA-N 0.000 description 1
- KQSABULTKYLFEV-UHFFFAOYSA-N naphthalene-1,5-diamine Chemical compound C1=CC=C2C(N)=CC=CC2=C1N KQSABULTKYLFEV-UHFFFAOYSA-N 0.000 description 1
- PHPFSTHQADBACP-UHFFFAOYSA-N naphthalene-1,6-diamine naphthalene-1,7-diamine Chemical compound C1(=CC=CC2=CC=C(C=C12)N)N.C1(=CC=CC2=CC(=CC=C12)N)N PHPFSTHQADBACP-UHFFFAOYSA-N 0.000 description 1
- DOBFTMLCEYUAQC-UHFFFAOYSA-N naphthalene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 DOBFTMLCEYUAQC-UHFFFAOYSA-N 0.000 description 1
- XTBLDMQMUSHDEN-UHFFFAOYSA-N naphthalene-2,3-diamine Chemical compound C1=CC=C2C=C(N)C(N)=CC2=C1 XTBLDMQMUSHDEN-UHFFFAOYSA-N 0.000 description 1
- GOGZBMRXLADNEV-UHFFFAOYSA-N naphthalene-2,6-diamine Chemical compound C1=C(N)C=CC2=CC(N)=CC=C21 GOGZBMRXLADNEV-UHFFFAOYSA-N 0.000 description 1
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 1
- IEOHNKVNXFRYRZ-UHFFFAOYSA-N phenanthrene-1,2,3,4-tetracarboxylic acid Chemical compound C1=CC=C2C3=C(C(O)=O)C(C(O)=O)=C(C(=O)O)C(C(O)=O)=C3C=CC2=C1 IEOHNKVNXFRYRZ-UHFFFAOYSA-N 0.000 description 1
- WMPIWNDQTXFDML-UHFFFAOYSA-N phenanthrene-1,2,5,6-tetracarboxylic acid Chemical compound C=1(C(=CC=C2C3=C(C(=CC=C3C=CC=12)C(=O)O)C(=O)O)C(=O)O)C(=O)O WMPIWNDQTXFDML-UHFFFAOYSA-N 0.000 description 1
- CYPCCLLEICQOCV-UHFFFAOYSA-N phenanthrene-1,2,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C3=CC=C(C(=O)O)C(C(O)=O)=C3C=CC2=C1 CYPCCLLEICQOCV-UHFFFAOYSA-N 0.000 description 1
- UMSVUULWTOXCQY-UHFFFAOYSA-N phenanthrene-1,2,7,8-tetracarboxylic acid Chemical compound OC(=O)C1=CC=C2C3=CC=C(C(=O)O)C(C(O)=O)=C3C=CC2=C1C(O)=O UMSVUULWTOXCQY-UHFFFAOYSA-N 0.000 description 1
- RVRYJZTZEUPARA-UHFFFAOYSA-N phenanthrene-1,2,9,10-tetracarboxylic acid Chemical compound C1=CC=C2C(C(O)=O)=C(C(O)=O)C3=C(C(O)=O)C(C(=O)O)=CC=C3C2=C1 RVRYJZTZEUPARA-UHFFFAOYSA-N 0.000 description 1
- DSCGEATYFSJFFN-UHFFFAOYSA-N phenanthrene-1,8-diamine Chemical compound C1=CC2=C(N)C=CC=C2C2=C1C(N)=CC=C2 DSCGEATYFSJFFN-UHFFFAOYSA-N 0.000 description 1
- FQCQWCFEHHMXFW-UHFFFAOYSA-N phenanthrene-2,3,5,6-tetracarboxylic acid Chemical compound C1=C(C(=CC=2C3=C(C(=CC=C3C=CC1=2)C(=O)O)C(=O)O)C(=O)O)C(=O)O FQCQWCFEHHMXFW-UHFFFAOYSA-N 0.000 description 1
- QSQKZQDVHIPIHC-UHFFFAOYSA-N phenanthrene-2,3,6,7-tetracarboxylic acid Chemical compound C1=C(C(O)=O)C(C(O)=O)=CC2=C(C=C(C(C(=O)O)=C3)C(O)=O)C3=CC=C21 QSQKZQDVHIPIHC-UHFFFAOYSA-N 0.000 description 1
- WBTDNYIDKJTWHC-UHFFFAOYSA-N phenanthrene-2,3,9,10-tetracarboxylic acid Chemical compound C1=CC=CC2=C(C=C(C(C(=O)O)=C3)C(O)=O)C3=C(C(O)=O)C(C(O)=O)=C21 WBTDNYIDKJTWHC-UHFFFAOYSA-N 0.000 description 1
- QJZDTUSIYGXUJR-UHFFFAOYSA-N phenanthrene-2,7-diamine Chemical compound NC1=CC=C2C3=CC=C(N)C=C3C=CC2=C1 QJZDTUSIYGXUJR-UHFFFAOYSA-N 0.000 description 1
- YKACKJKMVKATQX-UHFFFAOYSA-N phenanthrene-3,4,5,6-tetracarboxylic acid Chemical compound C1=C(C(O)=O)C(C(O)=O)=C2C3=C(C(O)=O)C(C(=O)O)=CC=C3C=CC2=C1 YKACKJKMVKATQX-UHFFFAOYSA-N 0.000 description 1
- BRGICZDMWJNYQP-UHFFFAOYSA-N phenanthrene-3,4,9,10-tetracarboxylic acid Chemical compound C1=CC(=C(C=2C3=CC=CC=C3C(=C(C1=2)C(=O)O)C(=O)O)C(=O)O)C(=O)O BRGICZDMWJNYQP-UHFFFAOYSA-N 0.000 description 1
- LJUVBDJNJVYNNW-UHFFFAOYSA-N phenanthrene-3,6-diamine Chemical compound C1=C(N)C=C2C3=CC(N)=CC=C3C=CC2=C1 LJUVBDJNJVYNNW-UHFFFAOYSA-N 0.000 description 1
- VPRFQZSTJXHBHL-UHFFFAOYSA-N phenanthrene-9,10-diamine Chemical compound C1=CC=C2C(N)=C(N)C3=CC=CC=C3C2=C1 VPRFQZSTJXHBHL-UHFFFAOYSA-N 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 229960005335 propanol Drugs 0.000 description 1
- 125000002572 propoxy group Chemical group [*]OC([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- ILVGAIQLOCKNQA-UHFFFAOYSA-N propyl 2-hydroxypropanoate Chemical compound CCCOC(=O)C(C)O ILVGAIQLOCKNQA-UHFFFAOYSA-N 0.000 description 1
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 1
- 229940116423 propylene glycol diacetate Drugs 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- HNJBEVLQSNELDL-UHFFFAOYSA-N pyrrolidin-2-one Chemical compound O=C1CCCN1 HNJBEVLQSNELDL-UHFFFAOYSA-N 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000010454 slate Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
- B05D3/0254—After-treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/24—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials for applying particular liquids or other fluent materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
Definitions
- the present invention relates to a method for producing a release layer.
- Patent Documents 1, 2, and 3 an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then laser irradiation is performed from the glass substrate side to crystallize amorphous silicon.
- a method of peeling a plastic substrate from a glass substrate by hydrogen gas generated along with the crystallization is disclosed.
- Patent Document 4 a layer to be peeled (described as “transfer target layer” in Patent Document 4) is attached to a plastic film by using the techniques disclosed in Patent Documents 1 to 3, and a liquid crystal display device is formed. A method of completion is disclosed.
- JP 10-125929 A Japanese Patent Laid-Open No. 10-125931 International Publication No. 2005/050754 JP-A-10-125930
- This invention is made
- the present inventor has obtained a composition comprising a polyamic acid in which one or both of the tetracarboxylic acid ends are sealed with 2-aminophenol, and an organic solvent.
- the firing temperature at the time of forming the release layer being equal to or higher than the predetermined maximum temperature, excellent adhesion to the substrate and appropriate adhesion to the resin substrate used in the flexible electronic device and appropriate release properties are achieved.
- the present invention has been completed by finding that a release layer can be formed.
- a release layer-forming composition comprising a polyamic acid having both ends derived from tetracarboxylic acid and one or both of both ends sealed with 2-aminophenol and an organic solvent is formed on a substrate.
- a method for producing a release layer comprising a step of applying and baking at a maximum temperature of 400 ° C. or higher, 2.
- a method for producing a flexible electronic device comprising a resin substrate, characterized by using a release layer formed by using any one of production methods 1 to 4; 6).
- a flexible electronic device comprising a step of applying a composition for forming a resin substrate on a release layer formed by using any one of production methods 1 to 4 and then firing the resin substrate at a maximum temperature of 450 ° C. to form a resin substrate Manufacturing method, 7).
- the method for producing a release layer of the present invention it is possible to obtain a release layer having excellent adhesion to a substrate, moderate adhesion to a resin substrate, and moderate release with good reproducibility. Therefore, by implementing the manufacturing method of the present invention, in the manufacturing process of the flexible electronic device, the circuit or the like without damaging the resin substrate formed on the substrate or the circuit provided on the substrate. At the same time, the resin substrate can be separated from the substrate. Therefore, the manufacturing method of this invention can contribute to the simplification of the manufacturing process of a flexible electronic device provided with a resin substrate, the yield improvement, etc.
- the method for producing a release layer according to the present invention comprises a polyamic acid having both ends derived from tetracarboxylic acid, one or both of which are sealed with 2-aminophenol, and an organic solvent.
- the method further comprises a step of applying the release layer-forming composition to the substrate and baking at a maximum temperature of 400 ° C. or higher.
- the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose.
- a flexible electronic made of a substrate and a resin such as polyimide is used.
- the resin substrate can be easily peeled from the substrate.
- a release layer may be used.
- the polyamic acid used in the present invention is obtained by reacting and sealing one or both of the polymer chain ends of polyamic acid having both ends derived from tetracarboxylic acid with the amino group of 2-aminophenol. Can do. That is, in the polyamic acid obtained here, one or both of the molecular chain ends are sealed with a hydroxy group-containing phenyl group.
- the skeleton can be different from the flexible substrate used for the upper layer, so that the function of the resulting film as a release layer can be improved.
- a hydroxy group derived from 2-aminophenol may be present at either one of the polymer chain ends of the polyamic acid, but a hydroxy group derived from 2-aminophenol is present at both of the polymer chain ends. Preferably it is present.
- a diamine component and an acid dianhydride component used when producing a polyamic acid from the viewpoint of improving the function as a release layer of the obtained film, a diamine component containing an aromatic diamine and an aromatic tetracarboxylic acid dicarboxylic acid are used.
- a polyamic acid obtained by reacting an acid dianhydride component containing an anhydride is preferred.
- the aromatic diamine is not particularly limited as long as it has two amino groups in the molecule and has an aromatic ring, but an aromatic diamine containing 1 to 5 benzene nuclei is preferable. Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine), 2,4-diamino.
- Group diamines are preferred. Specifically, p-phenylenediamine, m-phenylenediamine, 2- (3-aminophenyl) -5-aminobenzimidazole, 2- (4-aminophenyl) -5-aminobenzooxol, 4,4 ′ '-Diamino-p-terphenyl and the like are preferred.
- aromatic tetracarboxylic dianhydride is not particularly limited as long as it has two dicarboxylic anhydride sites in the molecule and has an aromatic ring, but an aromatic tetracarboxylic dianhydride contains 1 to 5 benzene nuclei.
- aromatic tetracarboxylic dianhydrides are preferred.
- pyromellitic dianhydride benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1 , 2,5,6-tetracarboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene- 2,3,5,6-tetracarboxylic dianhydride, naphthalene-2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl -2,2 ', 3,3'-tetracarboxylic dianhydride, biphenyl-2,3,3', 4'-tetracarboxylic dianhydride,
- aromatic carboxylic dianhydrides having one or two benzene nuclei are preferred from the viewpoint of improving the function of the resulting film as a release layer.
- an aromatic tetracarboxylic dianhydride represented by any one of formulas (C1) to (C12) is preferred, and any one of formulas (C1) to (C7) and (C9) to (C11)
- the aromatic tetracarboxylic dianhydride shown is more preferred.
- the diamine component used in the present invention may contain a diamine other than an aromatic diamine, and the tetracarboxylic dianhydride component used in the present invention is Further, tetracarboxylic dianhydrides other than aromatic tetracarboxylic dianhydrides may be included.
- the amount of aromatic diamine in the diamine component is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, still more preferably 95 mol% or more, and most preferably 100 mol%.
- the amount of aromatic tetracarboxylic dianhydride in the tetracarboxylic acid component is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol%. Above, most preferably 100 mol%.
- the resulting polyamic acid and 2-aminophenol are reacted to be included in the composition for forming a release layer of the present invention.
- a polyamic acid in which the polymer chain ends are sealed with 2-aminophenol can be obtained.
- the charging ratio of the diamine component and the tetracarboxylic dianhydride component is appropriately determined in consideration of the target molecular weight and molecular weight distribution, the type of diamine and the type of tetracarboxylic dianhydride, etc.
- the molar ratio of the tetracarboxylic dianhydride component is preferably 1.02 to 3.0 mol, more preferably 1.07 to 2.5 mol, with respect to 1 mol of the diamine component. 2.0 mol is even more preferable.
- the organic solvent used for synthesizing the polyamic acid and sealing the molecular chain end of the synthesized polyamic acid is not particularly limited as long as it does not adversely affect the reaction.
- Specific examples thereof include m-cresol, 2-pyrrolidone, N— Methyl-2-pyrrolidone, N-ethyl-2-pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3- Ethoxy-N, N-dimethylpropylamide, 3-propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec -Butoxy-N, N-dimethylpropylamide, 3-tert-butoxy-N, N-dimethyl Propyl amide, .gam
- amides represented by formula (S1), amides represented by formula (S2) and formula ( At least one selected from amides represented by S3) is preferred.
- R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms.
- R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms.
- h represents a natural number, preferably 1 to 3, more preferably 1 or 2.
- alkyl group having 1 to 10 carbon atoms examples include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n- Examples include hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like. Of these, alkyl groups having 1 to 3 carbon atoms are preferable, and alkyl groups having 1 or 2 carbon atoms are more preferable.
- the reaction temperature during the synthesis of the polyamic acid may be appropriately set in the range from the melting point to the boiling point of the solvent to be used, and is usually about 0 to 100 ° C. However, it prevents imidization of the resulting polyamic acid in the solution. From the viewpoint of maintaining a high content of polyamic acid units, the temperature can be preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and still more preferably about 0 to 50 ° C.
- the reaction time depends on the reaction temperature and the reactivity of the raw material, it cannot be defined unconditionally, but is usually about 1 to 100 hours.
- the reaction temperature at the time of sealing the molecular chain end of the polyamic acid may be appropriately set in the range from the melting point to the boiling point of the solvent used, as in the synthesis of the polyamic acid, and is usually about 0 to 100 ° C. From the viewpoint of securely sealing the molecular chain terminal of the synthesized polyamic acid, the temperature can be preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and still more preferably about 0 to 50 ° C.
- the reaction time depends on the reaction temperature and the reactivity of the raw material, it cannot be defined unconditionally, but is usually about 1 to 100 hours.
- the weight average molecular weight of the polyamic acid obtained in this manner and having either or both of the molecular chain ends sealed with 2-aminophenol is usually about 5,000 to 500,000. From the viewpoint of improving the function of the film as a release layer, it is preferably about 6,000 to 200,000, more preferably about 7,000 to 150,000.
- a weight average molecular weight is a polystyrene conversion value by a gel permeation chromatography (GPC) measurement.
- the reaction solution after end-capping can be used as it is, or a solution obtained by diluting or concentrating can be used as the release layer forming composition of the present invention.
- the solvent in this case include organic solvents used in the above-described reaction.
- the solvent used for dilution is not particularly limited, and specific examples thereof include those similar to the specific examples of the reaction solvent for the reaction.
- the solvent used for dilution may be used singly or in combination of two or more.
- N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl-2 are used because they dissolve polyamic acid well.
- -Pyrrolidone and ⁇ -butyrolactone are preferred, and N-methyl-2-pyrrolidone is more preferred.
- ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, 1-phenoxy -2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, dipropylene glycol, 2- (2-ethoxy A solvent having a low surface tension such as propoxy) propanol, methyl lactate, ethyl lactate, n-propyl lactate, n
- the concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably It is about 1 to 20% by mass. By setting such a concentration, a release layer having a thickness of about 0.05 to 5 ⁇ m can be obtained with good reproducibility.
- the concentration of polyamic acid is adjusted to adjust the amount of diamine and tetracarboxylic dianhydride used as raw materials for polyamic acid, and after filtering the reaction solution, the filtrate is diluted or concentrated, and the isolated polyamic acid is used as a solvent. The amount can be adjusted by, for example, adjusting the amount when dissolved in the aqueous solution.
- the viscosity of the release layer-forming composition of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, etc., and in particular, a film having a thickness of about 0.05 to 5 ⁇ m can be obtained with good reproducibility. Is usually about 10 to 10,000 mPa ⁇ s, preferably about 20 to 5,000 mPa ⁇ s at 25 ° C.
- the viscosity can be measured using a commercially available liquid viscosity measurement viscometer, for example, with reference to the procedure described in JIS K7117-2 at a temperature of the composition of 25 ° C. .
- a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and preferably the composition temperature is 25 ° C. using 1 ° 34 ′ ⁇ R24 as a standard cone rotor. It can be measured under the condition of ° C.
- An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
- composition for forming a release layer of the present invention may contain a crosslinking agent or the like in order to improve the film strength, for example, in addition to the polyamic acid and the organic solvent.
- the adhesiveness to the substrate is excellent by thermally imidizing polyamic acid by a baking method including a step of baking at a maximum temperature of 400 ° C. or higher.
- a baking method including a step of baking at a maximum temperature of 400 ° C. or higher.
- the maximum temperature at the time of firing is not particularly limited as long as it is in the range of 400 ° C. or higher and not higher than the heat resistant temperature of polyimide.
- 450 ° C. or higher is preferable, and 500 ° C. or higher is more preferable.
- the upper limit is usually about 550 ° C., preferably about 510 ° C.
- the heating time varies depending on the heating temperature and cannot be defined generally, but is usually 1 minute to 5 hours.
- the imidization rate may be in the range of 50 to 100%.
- the temperature at the time of the said baking may include the process baked at the temperature below it.
- the heating mode in the present invention there is a method of heating at 50 to 150 ° C., then raising the heating temperature stepwise as it is, and finally heating at 400 ° C. or higher.
- a method of heating at 50 to 100 ° C., heating at a temperature higher than 100 ° C. to less than 400 ° C., and heating at 400 ° C. or higher can be mentioned.
- heating mode after heating at 50 to 150 ° C., heating at 150 to 350 ° C., then heating at 350 to 450 ° C., and finally 450 to 510 ° C.
- a method of heating at 0 ° C. can be mentioned.
- the heating mode in consideration of the firing time, after heating at 50 to 150 ° C. for 1 minute to 2 hours, the heating temperature is increased stepwise and finally at 400 ° C. or higher for 30 minutes.
- a method of heating for up to 4 hours can be mentioned.
- heating is performed at 50 to 100 ° C. for 1 minute to 2 hours, heating is performed above 100 ° C. to less than 400 ° C. for 5 minutes to 2 hours, and heating is performed at 400 ° C. or higher for 30 minutes to 4 hours.
- the technique to do is mentioned.
- after heating at 50 to 150 ° C. for 1 minute to 2 hours after exceeding 150 ° C. to 350 ° C. for 5 minutes to 2 hours, then, exceeding 350 ° C. to 450 ° C. for 30 minutes
- a method of heating at 450 ° C. to 510 ° C. for 30 minutes to 4 hours is mentioned.
- the peeling layer of this invention when forming the peeling layer of this invention on a base
- a release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate.
- substrate means what is used for manufacture of a flexible electronic device etc. by which the composition for peeling layer formation of this invention is applied to the surface.
- the substrate examples include glass, metal (silicon wafer, etc.), slate, and the like.
- glass is preferable because the release layer of the present invention has sufficient adhesion to it.
- substrate surface may be comprised with the single material and may be comprised with two or more materials.
- the substrate surface is composed of two or more materials, a certain range of the substrate surface is composed of a certain material, and the other surface is composed of other materials.
- a dot pattern is formed on the entire surface of the substrate. There is a mode in which a material in a pattern such as a line and space pattern is present in other materials.
- the method for applying the release layer-forming composition of the present invention to the substrate is not particularly limited, and examples thereof include cast coating, spin coating, blade coating, dip coating, roll coating, and bar coating.
- Method, die coating method, ink jet method, printing method eg, relief printing, intaglio printing, planographic printing, screen printing, etc.
- Examples of the appliance used for heating include a hot plate and an oven.
- the heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
- the thickness of the release layer is usually about 0.01 to 50 ⁇ m, and preferably about 0.05 to 20 ⁇ m from the viewpoint of productivity.
- desired thickness is implement
- the release layer described above has excellent adhesion to a substrate, particularly a glass substrate, moderate adhesion to a resin substrate, and moderate release. Therefore, the release layer of the present invention peels the resin substrate from the substrate together with the circuit formed on the resin substrate without damaging the resin substrate of the device in the manufacturing process of the flexible electronic device. Therefore, it can be suitably used.
- a release layer is formed on a glass substrate by the method described above.
- a resin substrate forming solution for forming a resin substrate is applied, and this coating film is baked, so that the resin substrate fixed to the glass substrate via the release layer of the present invention is obtained.
- the firing temperature of the coating film is appropriately set according to the type of resin and the like. In the present invention, the maximum temperature during firing is preferably 450 ° C. or higher, and preferably 480 ° C. or higher. Is more preferably 490 ° C. or higher, and further preferably 500 ° C. or higher.
- the adhesiveness between the release layer and the substrate as the base, and the appropriate adhesiveness and peelability between the release layer and the resin substrate are further improved be able to.
- a step of baking at a temperature lower than that may be included.
- the heating mode at the time of preparing the resin substrate there is a method of heating at 50 to 150 ° C., then increasing the heating temperature step by step, and finally heating at 450 ° C. or higher.
- a method of heating at 50 to 100 ° C., heating at a temperature exceeding 100 ° C. to less than 400 ° C., and heating at 450 ° C. or higher can be mentioned.
- after heating at 50 to 100 ° C. heating is performed at over 100 ° C. to 200 ° C., then over 200 ° C. to less than 300 ° C., and heating is performed at 300 ° C. to less than 400 ° C.
- heating at 400 to 450 ° C., and finally heating at 450 to 510 ° C. can be mentioned.
- the heating mode in consideration of the firing time, after heating at 50 to 150 ° C. for 1 minute to 2 hours, the heating temperature is increased stepwise and finally at 450 ° C. or higher for 30 minutes.
- a method of heating for up to 4 hours can be mentioned.
- heating is performed at 50 to 100 ° C. for 1 minute to 2 hours, heating is performed above 100 ° C. to less than 400 ° C. for 5 minutes to 2 hours, and heating is performed at 450 ° C. or higher for 30 minutes to 4 hours.
- the technique to do is mentioned.
- the resin substrate covers the entire release layer, and the substrate is formed with an area larger than the area of the release layer.
- the resin substrate include a resin substrate made of polyimide, which is a typical resin substrate for flexible electronic devices, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution.
- the method for forming the resin substrate may follow a conventional method.
- a desired circuit is formed on the resin substrate fixed to the base via the release layer of the present invention, and then the resin substrate is cut along the release layer, for example. It peels from a peeling layer, and a resin substrate and a base
- the LLO method is characterized in that light having a specific wavelength, for example, light having a wavelength of 308 nm, is irradiated from the surface opposite to the surface on which a circuit or the like is formed from the glass substrate side.
- the irradiated light passes through the glass substrate, and only the polymer (polyimide) in the vicinity of the glass substrate absorbs this light and evaporates (sublimates).
- the polymer polyimide
- the release layer of the present invention has a feature of sufficiently absorbing light having a specific wavelength (for example, 308 nm) that enables application of the above LLO method, and therefore can be used as a sacrificial layer of the LLO method. Therefore, when a desired circuit is formed on a resin substrate fixed to a glass substrate through a release layer formed by using the composition according to the present invention, and then an LLO method is performed to irradiate a light beam of 308 nm. Only the release layer absorbs this light and evaporates (sublimates). Thereby, the release layer is sacrificed (acts as a sacrifice layer), and the resin substrate can be selectively peeled from the glass substrate.
- a specific wavelength for example, 308 nm
- NMP N-methylpyrrolidone
- BCS butyl cellosolve
- p-PDA p-phenylenediamine
- 2AP 2-aminophenol
- BPDA 3,3-4,4-biphenyltetracarboxylic dianhydride
- PMDA pyromerit Acid dianhydride
- Mw polymer weight average molecular weight
- Mw polymer weight average molecular weight
- Mw molecular weight distribution
- a GPC apparatus Shidex (registered trademark) columns KF803L and KF805L
- dimethylformamide was measured under the conditions of a flow rate of 1 ml / min and a column temperature of 50 ° C.
- Mw was made into the polystyrene conversion value.
- composition for forming release layer [Example 1-1] BCS and NMP were added to the reaction solution obtained in Synthesis Example L1, and diluted such that the polymer concentration was 5 wt% and BCS was 20 mass%, to obtain a release layer forming composition.
- Examples 1-2 to 1-3 A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L3 were used in place of the reaction solution obtained in Synthesis Example L1, respectively. It was.
- Example 1-1 A composition for forming a release layer was obtained in the same manner as in Example 1-1, except that the reaction solution obtained in Comparative Synthesis Example HL1 was used instead of the reaction solution obtained in Synthesis Example L1. .
- Example 2-1 Production of release layer and resin substrate [Example 2-1] Using a spin coater (conditions: about 3,000 rpm for about 30 seconds), the release layer forming composition L1 obtained in Example 1-1 was used as a glass substrate of 100 mm ⁇ 100 mm glass substrate (hereinafter the same). It was applied on top. The obtained coating film was heated at 100 ° C. for 2 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated to 400 ° C. for 30 minutes, further heated to 500 ° C. (10 ° C./min), and heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate. A glass substrate with a release layer was obtained. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
- the resin substrate forming composition S2 was applied on the release layer (resin thin film) on the glass substrate obtained above. Then, the obtained coating film was heated at 80 ° C. for 30 minutes using a hot plate, and then the atmosphere was changed to a nitrogen atmosphere using an oven, followed by heating at 140 ° C. for 30 minutes, and the heating temperature was raised to 210 ° C. Temperature (2 ° C./min, the same applies hereinafter), 210 ° C. for 30 minutes, heating temperature to 300 ° C., 300 ° C. for 30 minutes, heating temperature to 400 ° C., 400 ° C. for 30 minutes, The heating temperature was raised to 500 ° C. and heated at 500 ° C.
- Examples 2-2 to 2-3 Except that the release layer-forming composition L2 and L3 obtained in Examples 1-2 to 1-3 were used in place of the release layer-forming composition L1 obtained in Example 1-1, respectively.
- a release layer and a polyimide resin substrate were formed to obtain a glass substrate with a release layer and a resin substrate / glass substrate with a release layer.
- Example 2-1 The same procedure as in Example 2-1 except that the release layer forming composition HL1 obtained in Comparative Example 1-1 was used instead of the release layer forming composition L1 obtained in Example 1-1.
- a release layer and a polyimide resin substrate were formed, and a glass substrate with a release layer and a glass substrate with a resin substrate / release layer were obtained.
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Abstract
Description
特に、新世代ディスプレイでは、軽量なフレキシブルプラスチック基板(以下、樹脂基板と表記する)を用いたアクティブマトリクス型フルカラーTFTディスプレイパネルの開発が求められている。この新世代ディスプレイに関する技術は、フレキシブルディスプレイや、フレキシブルスマートフォン、ミラーディスプレイ等の様々な分野への転用が期待されている。 In recent years, electronic devices have been required to have a function of being able to bend in addition to the characteristics of thinning and lightening. For this reason, it is required to use a lightweight flexible plastic substrate in place of the conventional glass substrate that is fragile and cannot be bent.
In particular, in the new generation display, development of an active matrix type full color TFT display panel using a lightweight flexible plastic substrate (hereinafter referred to as a resin substrate) is required. This new generation display technology is expected to be diverted to various fields such as flexible displays, flexible smartphones, and mirror displays.
しかも、被剥離層が大面積である場合には、レーザー処理に長時間を要するため、デバイス作製の生産性を上げることが難しい。 However, in the methods disclosed in Patent Documents 1 to 4, particularly the method disclosed in Patent Document 4, it is essential to use a highly light-transmitting substrate in order to transmit laser light, and the substrate passes through the substrate. In addition, it is necessary to irradiate laser light with a relatively large energy sufficient to release hydrogen contained in amorphous silicon, and the layer to be peeled may be damaged by the laser light irradiation. There is a problem.
In addition, when the layer to be peeled has a large area, it takes a long time for the laser treatment, and it is difficult to increase the productivity of device fabrication.
1. テトラカルボン酸由来の両末端を有し、この両末端のいずれか一方又は両方が2-アミノフェノールで封止されているポリアミック酸と、有機溶媒とを含む剥離層形成用組成物を基体上に塗布し、最高温度400℃以上で焼成する工程を含むことを特徴とする剥離層の製造方法、
2. 上記ポリアミック酸が、芳香族ジアミンを含むジアミン成分と芳香族テトラカルボン酸二無水物を含む酸二無水物成分とを反応させて得られたポリアミック酸である1の剥離層の製造方法、
3. 上記芳香族ジアミンが、ベンゼン核を1~5つ含む芳香族ジアミンである2の剥離層の製造方法、
4. 上記芳香族テトラカルボン酸二無水物が、ベンゼン核を1~5つ含む芳香族テトラカルボン酸二無水物である2又は3の剥離層の製造方法、
5. 1~4のいずれかの製造方法を用いて形成される剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法、
6. 1~4のいずれかの製造方法を用いて形成した剥離層上に、樹脂基板形成用組成物を塗布した後、最高温度450℃以上で焼成して樹脂基板を形成する工程を含むフレキシブル電子デバイスの製造方法、
7. 上記樹脂基板が、ポリイミド樹脂基板である5又は6のフレキシブル電子デバイスの製造方法
を提供する。 That is, the present invention
1. A release layer-forming composition comprising a polyamic acid having both ends derived from tetracarboxylic acid and one or both of both ends sealed with 2-aminophenol and an organic solvent is formed on a substrate. A method for producing a release layer, comprising a step of applying and baking at a maximum temperature of 400 ° C. or higher,
2. The method for producing a release layer according to claim 1, wherein the polyamic acid is a polyamic acid obtained by reacting a diamine component containing an aromatic diamine with an acid dianhydride component containing an aromatic tetracarboxylic dianhydride,
3. A method for producing a release layer of 2, wherein the aromatic diamine is an aromatic diamine containing 1 to 5 benzene nuclei,
4). A method for producing a release layer of 2 or 3, wherein the aromatic tetracarboxylic dianhydride is an aromatic tetracarboxylic dianhydride containing 1 to 5 benzene nuclei,
5). A method for producing a flexible electronic device comprising a resin substrate, characterized by using a release layer formed by using any one of production methods 1 to 4;
6). A flexible electronic device comprising a step of applying a composition for forming a resin substrate on a release layer formed by using any one of production methods 1 to 4 and then firing the resin substrate at a maximum temperature of 450 ° C. to form a resin substrate Manufacturing method,
7). The method for producing a flexible electronic device according to 5 or 6, wherein the resin substrate is a polyimide resin substrate.
本発明に係る剥離層の製造方法は、テトラカルボン酸由来の両末端を有し、この両末端のいずれか一方又は両方が2-アミノフェノールで封止されているポリアミック酸と、有機溶媒とを含む剥離層形成用組成物を基体上に塗布し、最高温度400℃以上で焼成する工程を含むことを特徴とする。
ここで、本発明における剥離層とは、所定の目的でガラス基体直上に設けられる層であって、その典型例としては、フレキシブル電子デバイスの製造プロセスにおいて、基体と、ポリイミドといった樹脂からなるフレキシブル電子デバイスの樹脂基板との間に当該樹脂基板を所定のプロセス中において固定するために設けられ、且つ、当該樹脂基板上に電子回路等の形成した後において当該樹脂基板が当該基体から容易に剥離できるようにするために設けられる剥離層が挙げられる。 Hereinafter, the present invention will be described in more detail.
The method for producing a release layer according to the present invention comprises a polyamic acid having both ends derived from tetracarboxylic acid, one or both of which are sealed with 2-aminophenol, and an organic solvent. The method further comprises a step of applying the release layer-forming composition to the substrate and baking at a maximum temperature of 400 ° C. or higher.
Here, the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose. As a typical example, in a manufacturing process of a flexible electronic device, a flexible electronic made of a substrate and a resin such as polyimide is used. Provided between the device resin substrate and the resin substrate in a predetermined process, and after the electronic circuit or the like is formed on the resin substrate, the resin substrate can be easily peeled from the substrate. For example, a release layer may be used.
その具体例としては、1,4-ジアミノベンゼン(p-フェニレンジアミン)、1,3-ジアミノベンゼン(m-フェニレンジアミン)、1,2-ジアミノベンゼン(o-フェニレンジアミン)、2,4-ジアミノトルエン、2,5-ジアミノトルエン、2,6-ジアミノトルエン、4,6-ジメチル-m-フェニレンジアミン、2,5-ジメチル-p-フェニレンジアミン、2,6-ジメチル-p-フェニレンジアミン、2,4,6-トリメチル-1,3-フェニレンジアミン、2,3,5,6-テトラメチル-p-フェニレンジアミン、m-キシリレンジアミン、p-キシリレンジアミン、5-トリフルオロメチルベンゼン-1,3-ジアミン、5-トリフルオロメチルベンゼン-1,2-ジアミン、3,5-ビス(トリフルオロメチル)ベンゼン-1,2-ジアミン等のベンゼン核が1つのジアミン;1,2-ナフタレンジアミン、1,3-ナフタレンジアミン、1,4-ナフタレンジアミン、1,5-ナフタレンジアミン、1,6-ナフタレンジアミン、1,7-ナフタレンジアミン、1,8-ナフタレンジアミン、2,3-ナフタレンジアミン、2,6-ナフタレンジアミン、4,4’-ビフェニルジアミン、2,2’-ビス(トリフルオロメチル)-4,4’-ジアミノビフェニル、3,3’-ジメチル-4,4’-ジアミノジフェニルメタン、3,3’-ジカルボキシ-4,4’-ジアミノジフェニルメタン、3,3’,5,5’-テトラメチル-4,4’-ジアミノジフェニルメタン、4,4’-ジアミノベンズアニリド、3,3’-ジクロロベンジジン、3,3’-ジメチルベンジジン、2,2’-ジメチルベンジジン、3,3’-ジアミノジフェニルメタン、3,4’-ジアミノジフェニルメタン、4,4’-ジアミノジフェニルメタン、2,2-ビス(3-アミノフェニル)プロパン、2,2-ビス(4-アミノフェニル)プロパン、2,2-ビス(3-アミノフェニル)-1,1,1,3,3,3-ヘキサフルオロプロパン、2,2-ビス(4-アミノフェニル)-1,1,1,3,3,3-ヘキサフルオロプロパン、3,3’-ジアミノジフェニルスルホキシド、3,4’-ジアミノジフェニルスルホキシド、4,4’-ジアミノジフェニルスルホキシド、3,3’-ビス(トリフルオロメチル)ビフェニル-4,4’-ジアミン、3,3’,5,5’-テトラフルオロビフェニル-4,4’-ジアミン、4,4’-ジアミノオクタフルオロビフェニル、2-(3-アミノフェニル)-5-アミノベンズイミダゾール、2-(4-アミノフェニル)-5-アミノベンゾオキゾール等のベンゼン核が2つのジアミン;1,5-ジアミノアントラセン、2,6-ジアミノアントラセン、9,10-ジアミノアントラセン、1,8-ジアミノフェナントレン、2,7-ジアミノフェナントレン、3,6-ジアミノフェナントレン、9,10-ジアミノフェナントレン、1,3-ビス(3-アミノフェニル)ベンゼン、1,3-ビス(4-アミノフェニル)ベンゼン、1,4-ビス(3-アミノフェニル)ベンゼン、1,4-ビス(4-アミノフェニル)ベンゼン、1,3-ビス(3-アミノフェニルスルフィド)ベンゼン、1,3-ビス(4-アミノフェニルスルフィド)ベンゼン、1,4-ビス(4-アミノフェニルスルフィド)ベンゼン、1,3-ビス(3-アミノフェニルスルホン)ベンゼン、1,3-ビス(4-アミノフェニルスルホン)ベンゼン、1,4-ビス(4-アミノフェニルスルホン)ベンゼン、1,3-ビス〔2-(4-アミノフェニル)イソプロピル〕ベンゼン、1,4-ビス〔2-(3-アミノフェニル)イソプロピル〕ベンゼン、1,4-ビス〔2-(4-アミノフェニル)イソプロピル〕ベンゼン、4,4’’-ジアミノ-p-ターフェニル、4,4’’-ジアミノ-m-ターフェニル等のベンゼン核が3つのジアミン等を挙げることができるが、これらに限定されない。これらは単独でも、2種以上を組み合わせて用いることもできる。なお、本発明において、上記芳香族ジアミンはエーテル結合及びエステル結合を含まないものを使用することが好ましい。 The aromatic diamine is not particularly limited as long as it has two amino groups in the molecule and has an aromatic ring, but an aromatic diamine containing 1 to 5 benzene nuclei is preferable.
Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine), 2,4-diamino. Toluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylenediamine, 2,6-dimethyl-p-phenylenediamine, 2 , 4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylenediamine, m-xylylenediamine, p-xylylenediamine, 5-trifluoromethylbenzene-1 , 3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5-bis (trifluoromethyl A diamine having one benzene nucleus such as benzene-1,2-diamine; 1,2-naphthalenediamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine 1,7-naphthalenediamine, 1,8-naphthalenediamine, 2,3-naphthalenediamine, 2,6-naphthalenediamine, 4,4′-biphenyldiamine, 2,2′-bis (trifluoromethyl) -4 , 4'-diaminobiphenyl, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dicarboxy-4,4'-diaminodiphenylmethane, 3,3 ', 5,5'-tetramethyl -4,4'-diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3'-dichlorobenzidine, 3,3'-dimethylbenz 2,2'-dimethylbenzidine, 3,3'-diaminodiphenylmethane, 3,4'-diaminodiphenylmethane, 4,4'-diaminodiphenylmethane, 2,2-bis (3-aminophenyl) propane, 2,2 -Bis (4-aminophenyl) propane, 2,2-bis (3-aminophenyl) -1,1,1,3,3,3-hexafluoropropane, 2,2-bis (4-aminophenyl)- 1,1,1,3,3,3-hexafluoropropane, 3,3′-diaminodiphenyl sulfoxide, 3,4′-diaminodiphenyl sulfoxide, 4,4′-diaminodiphenyl sulfoxide, 3,3′-bis ( Trifluoromethyl) biphenyl-4,4′-diamine, 3,3 ′, 5,5′-tetrafluorobiphenyl-4,4′-diamine, 4,4′-diaminoocta Benzene nuclei having two diamines such as luorobiphenyl, 2- (3-aminophenyl) -5-aminobenzimidazole, 2- (4-aminophenyl) -5-aminobenzoxazole; 1,5-diaminoanthracene, 2,6-diaminoanthracene, 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-diaminophenanthrene, 3,6-diaminophenanthrene, 9,10-diaminophenanthrene, 1,3-bis (3- Aminophenyl) benzene, 1,3-bis (4-aminophenyl) benzene, 1,4-bis (3-aminophenyl) benzene, 1,4-bis (4-aminophenyl) benzene, 1,3-bis ( 3-aminophenylsulfide) benzene, 1,3-bis (4-aminophenylsulfide) benze 1,4-bis (4-aminophenylsulfide) benzene, 1,3-bis (3-aminophenylsulfone) benzene, 1,3-bis (4-aminophenylsulfone) benzene, 1,4-bis (4 -Aminophenylsulfone) benzene, 1,3-bis [2- (4-aminophenyl) isopropyl] benzene, 1,4-bis [2- (3-aminophenyl) isopropyl] benzene, 1,4-bis [2 -(4-Aminophenyl) isopropyl] benzene, 4,4 ″ -diamino-p-terphenyl, 4,4 ″ -diamino-m-terphenyl and the like, and benzene nuclei having three diamines can be mentioned. However, it is not limited to these. These can be used alone or in combination of two or more. In the present invention, the aromatic diamine preferably does not contain an ether bond or an ester bond.
本発明において、上記焼成時の最高温度は400℃以上、かつ、ポリイミドの耐熱温度以下の範囲であれば特に限定されるものではないが、上述した基体との密着性や、樹脂基板との適度な密着性及び剥離性を向上させることを考慮すると、450℃以上が好ましく、500℃以上がより好ましい。また、その上限は通常550℃程度であるが、510℃程度が好ましい。加熱温度を上記範囲とすることで、得られる膜の脆弱化を防ぎつつ、イミド化反応を十分に進行させることも可能となる。
加熱時間は、加熱温度によって異なるため一概に規定できないが、通常1分~5時間である。また、イミド化率は、50~100%の範囲であればよい。 After the composition for forming a release layer described above is applied on a substrate, the adhesiveness to the substrate is excellent by thermally imidizing polyamic acid by a baking method including a step of baking at a maximum temperature of 400 ° C. or higher. In addition, it is possible to obtain a release layer made of a polyimide film having appropriate adhesion to the resin substrate and appropriate peelability.
In the present invention, the maximum temperature at the time of firing is not particularly limited as long as it is in the range of 400 ° C. or higher and not higher than the heat resistant temperature of polyimide. In view of improving the excellent adhesion and peelability, 450 ° C. or higher is preferable, and 500 ° C. or higher is more preferable. The upper limit is usually about 550 ° C., preferably about 510 ° C. By making heating temperature into the said range, it becomes possible to fully advance an imidation reaction, preventing weakening of the film | membrane obtained.
The heating time varies depending on the heating temperature and cannot be defined generally, but is usually 1 minute to 5 hours. The imidization rate may be in the range of 50 to 100%.
本発明における加熱態様の好ましい一例としては、50~150℃で加熱した後に、そのまま段階的に加熱温度を上昇させて最終的に400℃以上で加熱する手法が挙げられる。特に、加熱態様のより好ましい一例としては、50~100℃で加熱し、100℃超~400℃未満で加熱し、400℃以上で加熱する手法が挙げられる。更に、加熱態様のより好ましい他の一例としては、50~150℃で加熱した後に、150℃超~350℃で加熱し、次いで350℃超~450℃で加熱し、最後に450℃超~510℃で加熱する手法が挙げられる。 Moreover, as long as the maximum temperature becomes the said range, the temperature at the time of the said baking may include the process baked at the temperature below it.
As a preferred example of the heating mode in the present invention, there is a method of heating at 50 to 150 ° C., then raising the heating temperature stepwise as it is, and finally heating at 400 ° C. or higher. In particular, as a more preferable example of the heating mode, a method of heating at 50 to 100 ° C., heating at a temperature higher than 100 ° C. to less than 400 ° C., and heating at 400 ° C. or higher can be mentioned. Furthermore, as another more preferable example of the heating mode, after heating at 50 to 150 ° C., heating at 150 to 350 ° C., then heating at 350 to 450 ° C., and finally 450 to 510 ° C. A method of heating at 0 ° C. can be mentioned.
本発明の剥離層形成用組成物を用いて、上述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂基板形成用溶液を塗布し、この塗膜を焼成することで、本発明の剥離層を介して、ガラス基体に固定された樹脂基板を形成する。
上記塗膜の焼成温度は、樹脂の種類等に応じて適宜設定されるものであるが、本発明では、この焼成時の最高温度を450℃以上とすることが好ましく、480℃以上とすることがより好ましく、490℃以上とすることがより一層好ましく、500℃以上とすることがさらに好ましい。樹脂基板作製の際の焼成時の最高温度をこの範囲とすることで、下地である剥離層と基体との密着性や、剥離層と樹脂基板との適度な密着性及び剥離性をより向上させることができる。
この場合も、最高温度が上記範囲となる限り、それ以下の温度で焼成する工程を含んでいてもよい。 Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.
Using the composition for forming a release layer of the present invention, a release layer is formed on a glass substrate by the method described above. On this release layer, a resin substrate forming solution for forming a resin substrate is applied, and this coating film is baked, so that the resin substrate fixed to the glass substrate via the release layer of the present invention is obtained. Form.
The firing temperature of the coating film is appropriately set according to the type of resin and the like. In the present invention, the maximum temperature during firing is preferably 450 ° C. or higher, and preferably 480 ° C. or higher. Is more preferably 490 ° C. or higher, and further preferably 500 ° C. or higher. By setting the maximum temperature during firing at the time of resin substrate production within this range, the adhesiveness between the release layer and the substrate as the base, and the appropriate adhesiveness and peelability between the release layer and the resin substrate are further improved be able to.
In this case, as long as the maximum temperature falls within the above range, a step of baking at a temperature lower than that may be included.
NMP:N-メチルピロリドン
BCS:ブチルセロソルブ
p-PDA:p-フェニレンジアミン
2AP:2-アミノフェノール
BPDA:3,3-4,4-ビフェニルテトラカルボン酸二無水物
PMDA:ピロメリット酸二無水物 [1] Abbreviations of compounds NMP: N-methylpyrrolidone BCS: butyl cellosolve p-PDA: p-phenylenediamine 2AP: 2-aminophenol BPDA: 3,3-4,4-biphenyltetracarboxylic dianhydride PMDA: pyromerit Acid dianhydride
ポリマーの重量平均分子量(以下Mwと略す)と分子量分布は、日本分光(株)製GPC装置(Shodex(登録商標)カラムKF803LおよびKF805L)を用い溶出溶媒としてジメチルホルムアミドを流量1ml/分、カラム温度50℃の条件で測定した。なお、Mwはポリスチレン換算値とした。 [2] Measurement of weight average molecular weight and molecular weight distribution The polymer weight average molecular weight (hereinafter abbreviated as Mw) and molecular weight distribution were measured using a GPC apparatus (Shodex (registered trademark) columns KF803L and KF805L) manufactured by JASCO Corporation. As a measurement, dimethylformamide was measured under the conditions of a flow rate of 1 ml / min and a column temperature of 50 ° C. In addition, Mw was made into the polystyrene conversion value.
以下の方法によって、ポリアミック酸を合成した。
なお、得られたポリマー含有反応液からポリマーを単離せず、後述の通りに、反応液を希釈することで、樹脂基板形成用組成物又は剥離層形成用組成物を調製した。 [3] Synthesis of polymer Polyamic acid was synthesized by the following method.
In addition, the polymer was not isolated from the obtained polymer containing reaction liquid, but the resin substrate formation composition or the peeling layer formation composition was prepared by diluting a reaction liquid as mentioned later.
p-PDA3.176g(0.02937モル)をNMP88.2gに溶解し、BPDA 8.624g(0.02931モル)を添加した後、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは107,300、分子量分布4.6であった。 <Synthesis Example S1 Polyamic Acid (Synthesis of S1)>
3.176 g (0.02937 mol) of p-PDA was dissolved in 88.2 g of NMP, and 8.624 g (0.02931 mol) of BPDA was added, followed by reaction at 23 ° C. for 24 hours in a nitrogen atmosphere. Mw of the obtained polymer was 107,300, and the molecular weight distribution was 4.6.
p-PDA1.507g(0.0139モル)をNMP43.2gに溶解し、PMDA3.166g(0.01452モル)を添加した後、窒素雰囲気下、23℃で2時間反応させた。その後、更に2AP0.127g(0.0012モル)を添加し、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは48,500、分子量分布2.05であった。 <Synthesis Example L1 Synthesis of polyamic acid (L1)>
p-PDA (1.507 g, 0.0139 mol) was dissolved in NMP (43.2 g), PMDA (3.166 g, 0.01452 mol) was added, and the mixture was reacted at 23 ° C. for 2 hours in a nitrogen atmosphere. Thereafter, 0.127 g (0.0012 mol) of 2AP was further added and reacted at 23 ° C. for 24 hours in a nitrogen atmosphere. Mw of the obtained polymer was 48,500 and molecular weight distribution was 2.05.
p-PDA1.119g(0.01103モル)をNMP35.2gに溶解し、PMDA3.006g(0.01378モル)を添加した後、窒素雰囲気下、23℃で2時間反応させた。その後、更に2AP0.602g(0.00551モル)を添加し、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは11,700、分子量分布1.76であった。 <Synthesis Example L2 Synthesis of polyamic acid (L2)>
1.119 g (0.01103 mol) of p-PDA was dissolved in 35.2 g of NMP, and 3.006 g (0.01378 mol) of PMDA was added, followed by reaction at 23 ° C. for 2 hours in a nitrogen atmosphere. Thereafter, 0.602 g (0.00551 mol) of 2AP was further added and reacted at 23 ° C. for 24 hours in a nitrogen atmosphere. Mw of the obtained polymer was 11,700 and molecular weight distribution was 1.76.
p-PDA0.681g(0.00629モル)をNMP35.2gに溶解し、PMDA2.746g(0.01259モル)を添加した後、窒素雰囲気下、23℃で2時間反応させた。その後、更に2AP1.373g(0.012588モル)を添加し、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは8,000、分子量分布1.57であった。 <Synthesis Example L3 Synthesis of polyamic acid (L3)>
0.681 g (0.00629 mol) of p-PDA was dissolved in 35.2 g of NMP, and 2.746 g (0.01259 mol) of PMDA was added, followed by reaction at 23 ° C. for 2 hours in a nitrogen atmosphere. Thereafter, 1.373 g (0.012588 mol) of 2AP was further added, and the mixture was reacted at 23 ° C. for 24 hours in a nitrogen atmosphere. Mw of the obtained polymer was 8,000 and molecular weight distribution was 1.57.
p-PDA1.29g(0.00107モル)をNMP43.2gに溶解し、BPDA3.509g(0.00119モル)を添加した後、窒素雰囲気下、23℃で24時間反応させた。得られたポリマーのMwは34,000、分子量分布2.03であった。 <Synthesis of Comparative Synthesis Example HL1 Polyamic Acid (HL1)>
1.29 g (0.00107 mol) of p-PDA was dissolved in 43.2 g of NMP, and 3.509 g (0.00119 mol) of BPDA was added, followed by reaction at 23 ° C. for 24 hours in a nitrogen atmosphere. Mw of the obtained polymer was 34,000 and molecular weight distribution was 2.03.
p-PDA1.325g(0.00123モル)をNMP36gに溶解し、PMDA2.674g(0.00123モル)を添加した後、窒素雰囲気下、23℃で2時間反応させた。残念ながら、ゲル化したため、使用できなかった。 <Synthesis of Comparative Synthesis Example HL2 Polyamic Acid (HL2)>
1.325 g (0.00123 mol) of p-PDA was dissolved in 36 g of NMP, and 2.674 g (0.00123 mol) of PMDA was added, followed by reaction at 23 ° C. for 2 hours in a nitrogen atmosphere. Unfortunately, it was gelled and could not be used.
合成例S1で得られた反応液を、それぞれ、そのまま樹脂基板形成用組成物として用いた。 [4] Preparation of Resin Substrate Forming Composition Each of the reaction solutions obtained in Synthesis Example S1 was directly used as a resin substrate forming composition.
[実施例1-1]
合成例L1で得られた反応液に、BCSとNMPを加え、ポリマー濃度が5wt%、BCSが20質量%となるように希釈し、剥離層形成用組成物を得た。 [5] Preparation of composition for forming release layer [Example 1-1]
BCS and NMP were added to the reaction solution obtained in Synthesis Example L1, and diluted such that the polymer concentration was 5 wt% and BCS was 20 mass%, to obtain a release layer forming composition.
合成例L1で得られた反応液の代わりに、それぞれ合成例L2~L3で得られた反応液を用いた以外は、実施例1-1と同様の方法で、剥離層形成用組成物を得た。 [Examples 1-2 to 1-3]
A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L3 were used in place of the reaction solution obtained in Synthesis Example L1, respectively. It was.
合成例L1で得られた反応液の代わりに、それぞれ比較合成例HL1で得られた反応液を用いた以外は、実施例1-1と同様の方法で、剥離層形成用組成物を得た。 [Comparative Example 1-1]
A composition for forming a release layer was obtained in the same manner as in Example 1-1, except that the reaction solution obtained in Comparative Synthesis Example HL1 was used instead of the reaction solution obtained in Synthesis Example L1. .
[実施例2-1]
スピンコーター(条件:回転数3,000rpmで約30秒)を用いて、実施例1-1で得られた剥離層形成用組成物L1を、ガラス基体としての100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて100℃で2分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、400℃で30分間加熱し、さらに、500℃まで昇温(10℃/分)し、500℃で10分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成し、剥離層付きガラス基板を得た。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 [6] Production of release layer and resin substrate [Example 2-1]
Using a spin coater (conditions: about 3,000 rpm for about 30 seconds), the release layer forming composition L1 obtained in Example 1-1 was used as a glass substrate of 100 mm × 100 mm glass substrate (hereinafter the same). It was applied on top.
The obtained coating film was heated at 100 ° C. for 2 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated to 400 ° C. for 30 minutes, further heated to 500 ° C. (10 ° C./min), and heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. A glass substrate with a release layer was obtained. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
実施例1-1で得られた剥離層形成用組成物L1の代わりに、それぞれ実施例1-2~1-3で得られた剥離層形成用組成物L2及びL3を用いた以外は、実施例2-1と同様の方法で、剥離層及びポリイミド樹脂基板を形成し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。 [Examples 2-2 to 2-3]
Except that the release layer-forming composition L2 and L3 obtained in Examples 1-2 to 1-3 were used in place of the release layer-forming composition L1 obtained in Example 1-1, respectively. In the same manner as in Example 2-1, a release layer and a polyimide resin substrate were formed to obtain a glass substrate with a release layer and a resin substrate / glass substrate with a release layer.
実施例1-1で得られた剥離層形成用組成物L1の代わりに、比較例1-1で得られた剥離層形成用組成物HL1を用いた以外は、実施例2-1と同様の方法で、剥離層及びポリイミド樹脂基板を形成し、剥離層付きガラス基板及び樹脂基板・剥離層付きガラス基板を得た。 [Comparative Example 2-1]
The same procedure as in Example 2-1 except that the release layer forming composition HL1 obtained in Comparative Example 1-1 was used instead of the release layer forming composition L1 obtained in Example 1-1. By the method, a release layer and a polyimide resin substrate were formed, and a glass substrate with a release layer and a glass substrate with a resin substrate / release layer were obtained.
上記実施例2-1~2-3及び比較例2-1で得られた剥離層付きガラス基板について、剥離層とガラス基板との剥離性を、下記手法にて確認した。なお、下記の試験は、同一のガラス基板で行った。 [7] Evaluation of peelability With respect to the glass substrate with a release layer obtained in Examples 2-1 to 2-3 and Comparative Example 2-1, the peelability between the release layer and the glass substrate was confirmed by the following method. did. In addition, the following test was done with the same glass substrate.
実施例2-1~2-3及び比較例2-1で得られた剥離層付きガラス基板上の剥離層をクロスカット(縦横1mm間隔、以下同様)し、100マスカットを行った。すなわち、このクロスカットにより、1mm四方のマス目を100個形成した。
そして、この100マスカット部分に粘着テープを貼り付けて、そのテープを剥がし、以下の基準(5B~0B,B,A,AA)に基づき、剥離性を評価した。結果を表1に示す。
<判定基準>
5B:0%剥離(剥離なし)
4B:5%未満の剥離
3B:5~15%未満の剥離
2B:15~35%未満の剥離
1B:35~65%未満の剥離
0B:65%~80%未満の剥離
B:80%~95%未満の剥離
A:95%~100%未満の剥離
AA:100%剥離(すべて剥離) <Cross-cut test peelability evaluation of resin thin film>
The release layer on the glass substrate with the release layer obtained in Examples 2-1 to 2-3 and Comparative Example 2-1 was cross-cut (1 mm in length and width, the same applies hereinafter), and 100 mass cuts were performed. That is, 100 crosses of 1 mm square were formed by this cross cut.
Then, an adhesive tape was affixed to the 100 muscat portion, the tape was peeled off, and peelability was evaluated based on the following criteria (5B to 0B, B, A, AA). The results are shown in Table 1.
<Criteria>
5B: 0% peeling (no peeling)
4B: Less than 5% peeling 3B: Less than 5-15% peeling 2B: 15-35% peeling 1B: 35-65% peeling 0B: 65% -80% peeling B: 80% -95 % Peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)
実施例2-1~2-3及び比較例2-1で得られた樹脂基板・剥離層付きガラス基板の樹脂基板を、カッターを用いて25mm幅の短冊状にカットした。そして、カットした樹脂基板の先端にセロハンテープを貼り付け、これを試験片とした。この試験片を、(株)アトニック製プッシュプルテスターを用いて剥離角度が90°となるように剥離試験を行い、下記の基準に基づいて剥離性を評価した。結果を表1に示す。
<判定基準>
5B:0%剥離(剥離なし)
4B:5%未満の剥離
3B:5~15%未満の剥離
2B:15~35%未満の剥離
1B:35~65%未満の剥離
0B:65%~80%未満の剥離
B:80%~95%未満の剥離
A:95%~100%未満の剥離
AA:100%剥離(すべて剥離) <Evaluation of peelability of resin substrate>
The resin substrate / glass substrate with release layer obtained in Examples 2-1 to 2-3 and Comparative Example 2-1 was cut into a 25 mm wide strip using a cutter. And the cellophane tape was affixed on the front-end | tip of the cut resin substrate, and this was made into the test piece. The test piece was subjected to a peel test using an Atonic Co., Ltd. push-pull tester so that the peel angle was 90 °, and peelability was evaluated based on the following criteria. The results are shown in Table 1.
<Criteria>
5B: 0% peeling (no peeling)
4B: Less than 5% peeling 3B: Less than 5-15% peeling 2B: 15-35% peeling 1B: 35-65% peeling 0B: 65% -80% peeling B: 80% -95 % Peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)
Claims (7)
- テトラカルボン酸由来の両末端を有し、この両末端のいずれか一方又は両方が2-アミノフェノールで封止されているポリアミック酸と、有機溶媒とを含む剥離層形成用組成物を基体上に塗布し、最高温度400℃以上で焼成する工程を含むことを特徴とする剥離層の製造方法。 A release layer-forming composition comprising a polyamic acid having both ends derived from tetracarboxylic acid and one or both of both ends sealed with 2-aminophenol and an organic solvent is formed on a substrate. A method for producing a release layer, comprising a step of applying and baking at a maximum temperature of 400 ° C. or higher.
- 上記ポリアミック酸が、芳香族ジアミンを含むジアミン成分と芳香族テトラカルボン酸二無水物を含む酸二無水物成分とを反応させて得られたポリアミック酸である請求項1記載の剥離層の製造方法。 The method for producing a release layer according to claim 1, wherein the polyamic acid is a polyamic acid obtained by reacting a diamine component containing an aromatic diamine and an acid dianhydride component containing an aromatic tetracarboxylic dianhydride. .
- 上記芳香族ジアミンが、ベンゼン核を1~5つ含む芳香族ジアミンである請求項2記載の剥離層の製造方法。 The method for producing a release layer according to claim 2, wherein the aromatic diamine is an aromatic diamine containing 1 to 5 benzene nuclei.
- 上記芳香族テトラカルボン酸二無水物が、ベンゼン核を1~5つ含む芳香族テトラカルボン酸二無水物である請求項2又は3記載の剥離層の製造方法。 The method for producing a release layer according to claim 2 or 3, wherein the aromatic tetracarboxylic dianhydride is an aromatic tetracarboxylic dianhydride containing 1 to 5 benzene nuclei.
- 請求項1~4のいずれか1項記載の製造方法を用いて形成される剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法。 A method for producing a flexible electronic device comprising a resin substrate, comprising using a release layer formed using the production method according to any one of claims 1 to 4.
- 請求項1~4のいずれか1項記載の製造方法を用いて形成した剥離層上に、樹脂基板形成用組成物を塗布した後、最高温度450℃以上で焼成して樹脂基板を形成する工程を含むフレキシブル電子デバイスの製造方法。 A process of forming a resin substrate by applying a resin substrate-forming composition on a release layer formed by using the manufacturing method according to any one of claims 1 to 4 and then baking it at a maximum temperature of 450 ° C or higher. A method for manufacturing a flexible electronic device.
- 上記樹脂基板が、ポリイミド樹脂基板である請求項5又は6記載のフレキシブル電子デバイスの製造方法。 The method for manufacturing a flexible electronic device according to claim 5 or 6, wherein the resin substrate is a polyimide resin substrate.
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WO2016129546A1 (en) * | 2015-02-10 | 2016-08-18 | 日産化学工業株式会社 | Composition for forming release layer |
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JP4619461B2 (en) | 1996-08-27 | 2011-01-26 | セイコーエプソン株式会社 | Thin film device transfer method and device manufacturing method |
JP4619462B2 (en) | 1996-08-27 | 2011-01-26 | セイコーエプソン株式会社 | Thin film element transfer method |
GB0327093D0 (en) | 2003-11-21 | 2003-12-24 | Koninkl Philips Electronics Nv | Active matrix displays and other electronic devices having plastic substrates |
WO2011035920A1 (en) * | 2009-09-24 | 2011-03-31 | Corus Technology Bv | A method of preparing a polyetherimide coating on a metallic substrate |
JP5834930B2 (en) * | 2011-09-09 | 2015-12-24 | 宇部興産株式会社 | Polyimide precursor aqueous solution composition and method for producing polyimide precursor aqueous solution composition |
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US20160023436A1 (en) * | 2014-07-22 | 2016-01-28 | Brewer Science Inc. | Polyimides as laser release materials for 3-d ic applications |
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