WO2016129546A1 - Composition for forming release layer - Google Patents
Composition for forming release layer Download PDFInfo
- Publication number
- WO2016129546A1 WO2016129546A1 PCT/JP2016/053624 JP2016053624W WO2016129546A1 WO 2016129546 A1 WO2016129546 A1 WO 2016129546A1 JP 2016053624 W JP2016053624 W JP 2016053624W WO 2016129546 A1 WO2016129546 A1 WO 2016129546A1
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- WIPO (PCT)
- Prior art keywords
- release layer
- polyamic acid
- tetracarboxylic dianhydride
- composition
- substrate
- Prior art date
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- UKMIDFFCQPUGNK-UHFFFAOYSA-N Nc(cc1)ccc1Oc(cc1)ccc1-c1cc(Oc(cc2)ccc2N)ccc1 Chemical compound Nc(cc1)ccc1Oc(cc1)ccc1-c1cc(Oc(cc2)ccc2N)ccc1 UKMIDFFCQPUGNK-UHFFFAOYSA-N 0.000 description 1
- SABLNSAXXRBTBO-UHFFFAOYSA-N Nc(cc1)ccc1Oc(cc1)ccc1-c1cc(Oc2cc(N)ccc2)ccc1 Chemical compound Nc(cc1)ccc1Oc(cc1)ccc1-c1cc(Oc2cc(N)ccc2)ccc1 SABLNSAXXRBTBO-UHFFFAOYSA-N 0.000 description 1
- WVIGQQBEFCXWRW-UHFFFAOYSA-N Nc(cc1)ccc1Oc1cc(-c2cc(Oc(cc3)ccc3N)ccc2)ccc1 Chemical compound Nc(cc1)ccc1Oc1cc(-c2cc(Oc(cc3)ccc3N)ccc2)ccc1 WVIGQQBEFCXWRW-UHFFFAOYSA-N 0.000 description 1
- QZTQWIGFUOTJDP-UHFFFAOYSA-N Nc(cc1)ccc1Oc1cccc(-c2cc(Oc3cc(N)ccc3)ccc2)c1 Chemical compound Nc(cc1)ccc1Oc1cccc(-c2cc(Oc3cc(N)ccc3)ccc2)c1 QZTQWIGFUOTJDP-UHFFFAOYSA-N 0.000 description 1
- OSYIROQVSVAEAH-UHFFFAOYSA-N Nc1cccc(Oc(cc2)ccc2-c2cc(Oc3cc(N)ccc3)ccc2)c1 Chemical compound Nc1cccc(Oc(cc2)ccc2-c2cc(Oc3cc(N)ccc3)ccc2)c1 OSYIROQVSVAEAH-UHFFFAOYSA-N 0.000 description 1
- MFIONUVRAOILLH-UHFFFAOYSA-N Nc1cccc(Oc2cccc(-c3cc(Oc4cc(N)ccc4)ccc3)c2)c1 Chemical compound Nc1cccc(Oc2cccc(-c3cc(Oc4cc(N)ccc4)ccc3)c2)c1 MFIONUVRAOILLH-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1067—Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
- C08G73/1071—Wholly aromatic polyimides containing oxygen in the form of ether bonds in the main chain
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1003—Preparatory processes
- C08G73/1007—Preparatory processes from tetracarboxylic acids or derivatives and diamines
- C08G73/1028—Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous
- C08G73/1032—Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous characterised by the solvent(s) used
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1039—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors comprising halogen-containing substituents
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1042—Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1067—Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/1085—Polyimides with diamino moieties or tetracarboxylic segments containing heterocyclic moieties
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/133305—Flexible substrates, e.g. plastics, organic film
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/13338—Input devices, e.g. touch panels
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
- G09F9/301—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements flexible foldable or roll-able electronic displays, e.g. thin LCD, OLED
Definitions
- the present invention relates to a release layer forming composition, and more particularly, to a release layer forming composition for forming a release layer provided on a substrate.
- Patent Documents 1, 2, and 3 an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then a laser is irradiated from the glass surface side to accompany crystallization of amorphous silicon.
- a method of peeling a plastic substrate from a glass substrate with generated hydrogen gas is disclosed.
- Patent Document 4 uses a technique disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device by attaching a layer to be peeled (described as “transfer target layer” in Patent Document 4) to a plastic film. A method is disclosed.
- JP 10-125929 A Japanese Patent Laid-Open No. 10-125931 International Publication No. 2005/050754 JP-A-10-125930
- This invention is made
- the inventors of the present invention include a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and a composition containing an organic solvent.
- the aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond
- / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond.
- a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond.
- a composition for forming a release layer, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42); 3.
- composition for forming a release layer according to 1 or 2 wherein the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (B1) to (B14) , 4).
- composition for forming a release layer wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton, 6).
- a composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12); 7).
- a release layer forming composition (In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H represents a natural number. Represents.) 8).
- a method for producing a flexible electronic device comprising a resin substrate, comprising using a release layer of 8; 10.
- a method for producing a touch panel sensor comprising a resin substrate, comprising using a release layer of 8; 11.
- the manufacturing method according to 9 or 10 wherein the resin substrate is a substrate made of polyimide.
- the composition for forming a release layer of the present invention By using the composition for forming a release layer of the present invention, it is possible to obtain a film having excellent adhesion to the substrate, moderate adhesion to the resin substrate, and moderate peelability with good reproducibility.
- the composition of the present invention in the manufacturing process of the flexible electronic device, the resin substrate formed on the substrate and the circuit provided on the substrate are not damaged, and the resin substrate together with the circuit etc. Can be separated from the substrate. Therefore, the composition for forming a release layer of the present invention can contribute to simplification of the production process of a flexible electronic device including a resin substrate, improvement of its yield, and the like.
- Example 6 is a graph showing the transmittance measured in Example 4.
- the composition for forming a release layer of the present invention comprises a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine is an ester.
- An aromatic diamine including at least one of a bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes an aromatic tetracarboxylic dianhydride including at least one of an ester bond and an ether bond.
- the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose.
- a flexible electronic made of a substrate and a resin such as polyimide is used. Provided between the resin substrate of the device to fix the resin substrate in a predetermined process, and after the electronic circuit or the like is formed on the resin substrate, the resin substrate is easily peeled off from the base. The thing provided in order to be able to do is mentioned.
- the aromatic diamine containing at least one of an ester bond and an ether bond contains one or both of an ester bond and an ether bond in the molecule.
- aromatic diamines examples include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds.
- Specific examples of the aromatic ring include a benzene ring, a naphthalene ring, an anthracene ring, and a phenanthrene ring.
- a diamine having a structure in which two or three aromatic rings are connected by an ester bond or an ether bond is preferable.
- aromatic diamine containing at least one of an ester bond and an ether bond include the following.
- the aromatic tetracarboxylic dianhydride containing at least one of the ester bond and the ether bond contains one or both of the ester bond and the ether bond in the molecule.
- aromatic tetracarboxylic dianhydrides examples include tetracarboxylic dianhydrides having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds.
- Specific examples of the aromatic ring include the same ones as described above. Among these, those having a structure in which three or four aromatic rings are connected by an ester bond or an ether bond are preferable from the viewpoint of ensuring the solubility of polyamic acid in an organic solvent.
- aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond include the following.
- Such a diamine may be either an aliphatic diamine or an aromatic diamine, but an aromatic diamine containing neither an ester bond nor an ether bond is preferred from the viewpoint of ensuring the strength and heat resistance of the resulting thin film.
- 1,4-diaminobenzene p-phenylenediamine
- 1,3-diaminobenzene m-phenylenediamine
- 1,2-diaminobenzene o-phenylenediamine
- 2,4-diamino 1,4-diaminobenzene (p-phenylenediamine)
- 1,3-diaminobenzene m-phenylenediamine
- 1,2-diaminobenzene o-phenylenediamine
- 2,4-diamino 2,4-diaminobenzene
- the amount of the aromatic diamine containing at least one of an ester bond and an ether bond is preferably used in all diamines. Is 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more.
- tetracarboxylic dianhydrides can be used together with the aromatic tetracarboxylic dianhydride containing at least one of the above-mentioned ester bond and ether bond.
- Such a tetracarboxylic dianhydride may be either an aliphatic tetracarboxylic dianhydride or an aromatic tetracarboxylic dianhydride, but from the viewpoint of ensuring the strength and heat resistance of the resulting thin film, an ester bond And an aromatic tetracarboxylic dianhydride which does not contain any ether bond.
- pyromellitic dianhydride benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1 , 2,5,6-tetracarboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene- 2,3,5,6-tetracarboxylic dianhydride, naphthalene-2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl -2,2 ', 3,3'-tetracarboxylic dianhydride, biphenyl-2,3,3', 4'-tetracarboxylic dianhydride,
- the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is preferably at least one selected from the group consisting of formulas (C1) to (C12) from the viewpoint of ensuring heat resistance.
- At least one selected from the group consisting of formula (C1) and formula (C9) is more preferable.
- an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is used together with another tetracarboxylic dianhydride
- an aromatic tetracarboxylic acid containing at least one of an ester bond and an ether bond is used.
- the amount of carboxylic dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more in the total tetracarboxylic dianhydride. It is. By adopting such a usage amount, it is possible to obtain a film having sufficient reproducibility with sufficient adhesion to the substrate, appropriate adhesion to the resin substrate, and appropriate peelability.
- the polyamic acid contained in the composition for forming a release layer according to the present invention can be obtained by reacting the diamine described above with tetracarboxylic dianhydride.
- the organic solvent used in such a reaction is not particularly limited as long as it does not adversely affect the reaction.
- Specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, N-ethyl-2- Pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropylamide, 3- Propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethylpropylamide, 3 -Tert-butoxy-N, N-dimethylpropylamide, ⁇ -butyrolactone and the like.
- amides represented by formula (S1), amides represented by formula (S2) and formula ( At least one selected from amides represented by S3) is preferred.
- R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms.
- R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms.
- h represents a natural number, preferably 1 to 3, more preferably 1 or 2.
- alkyl group having 1 to 10 carbon atoms examples include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n- Examples include hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like. Of these, alkyl groups having 1 to 3 carbon atoms are preferable, and alkyl groups having 1 or 2 carbon atoms are more preferable.
- the reaction temperature may be appropriately set in the range from the melting point to the boiling point of the solvent used, and is usually about 0 to 100 ° C., but it prevents imidization in the solution of the resulting polyamic acid and contains a high content of polyamic acid units. In order to maintain the amount, it is preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and still more preferably about 0 to 50 ° C.
- the reaction time depends on the reaction temperature and the reactivity of the raw material, and cannot be specified unconditionally, but is usually about 1 to 100 hours.
- a target reaction solution containing polyamic acid can be obtained.
- the weight average molecular weight of the polyamic acid is preferably 5,000 to 1,000,000, more preferably 10,000 to 500,000, and even more preferably 15,000 to 200,000 from the viewpoint of handling properties.
- the weight average molecular weight is an average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.
- a solution obtained by diluting or concentrating the filtrate as it is can be used as the release layer forming composition of the present invention.
- the composition for peeling layer formation can be obtained efficiently.
- the solvent in this case include organic solvents used in the above-described reaction.
- the solvent used for dilution is not particularly limited, and specific examples thereof include those similar to the specific examples of the reaction solvent for the reaction.
- the solvent used for dilution may be used singly or in combination of two or more.
- N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl-2 are used because they dissolve polyamic acid well.
- -Pyrrolidone and ⁇ -butyrolactone are preferred, and N-methyl-2-pyrrolidone is more preferred.
- ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, 1-phenoxy -2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, dipropylene glycol, 2- (2-ethoxy A solvent having a low surface tension such as propoxy) propanol, methyl lactate, ethyl lactate, n-propyl lactate, n
- the concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably It is about 1 to 20% by mass. By setting such a concentration, a release layer having a thickness of about 0.05 to 5 ⁇ m can be obtained with good reproducibility.
- the concentration of the polyamic acid is adjusted to adjust the amount of diamine and tetracarboxylic dianhydride used as the raw material of the polyamic acid. After the reaction solution is filtered, the filtrate is diluted or concentrated. The amount can be adjusted by, for example, adjusting the amount thereof when dissolved in a solvent.
- the viscosity of the release layer-forming composition is appropriately set in consideration of the thickness of the release layer to be produced, etc. In particular, it is desirable to obtain a film having a thickness of about 0.05 to 5 ⁇ m with good reproducibility. Is usually about 10 to 10,000 mPa ⁇ s at 25 ° C., preferably about 20 to 5,000 mPa ⁇ s.
- the viscosity can be measured using a commercially available liquid viscosity measurement viscometer, for example, with reference to the procedure described in JIS K7117-2 at a temperature of the composition of 25 ° C. .
- a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and preferably the composition temperature is 25 ° C. using 1 ° 34 ′ ⁇ R24 as a standard cone rotor. It can be measured under the condition of ° C.
- An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
- composition for forming a release layer according to the present invention may contain a component such as a crosslinking agent in addition to the polyamic acid and the organic solvent, for example, in order to improve the film strength.
- a component such as a crosslinking agent in addition to the polyamic acid and the organic solvent, for example, in order to improve the film strength.
- release layer-forming composition of the present invention By applying the release layer-forming composition of the present invention described above to a substrate, and heating the resulting coating to thermally imidize the polyamic acid, it has excellent adhesion to the substrate, and moderate to the resin substrate. It is possible to obtain a release layer made of a polyimide film having good adhesion and moderate peelability.
- the release layer of the present invention When the release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the substrate or the entire surface.
- a release layer As an aspect of forming a release layer on a part of the surface of the substrate, an embodiment in which the release layer is formed only within a predetermined range of the substrate surface, a release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate.
- substrate means what is used for manufacture of a flexible electronic device etc. by which the composition for peeling layer formation concerning this invention is applied to the surface.
- the substrate examples include glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene resin, etc.), metal (silicon wafer, etc.), Although wood, paper, slate, etc. are mentioned, since the peeling layer obtained from the composition for peeling layer formation which concerns on this invention has sufficient adhesiveness with respect to it, glass is preferable.
- substrate surface may be comprised with the single material and may be comprised with two or more materials.
- the substrate surface is constituted by two or more materials
- a certain range of the substrate surface is constituted by a certain material
- the other surface is constituted by another material.
- a dot pattern is formed on the entire substrate surface.
- a material in a pattern such as a line and space pattern is present in other materials.
- the coating method is not particularly limited.
- a cast coating method for example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, a die coating method, an ink jet method, a printing method (a relief plate, an intaglio plate, a planographic plate). , Screen printing, etc.).
- the heating temperature for imidization is usually appropriately determined within the range of 50 to 550 ° C., but is preferably 200 ° C. or higher, and preferably 500 ° C. or lower. By setting the heating temperature in this way, it is possible to sufficiently advance the imidization reaction while preventing the obtained film from being weakened.
- the heating time varies depending on the heating temperature, and cannot be generally defined, but is usually 5 minutes to 5 hours.
- the imidization rate may be in the range of 50 to 100%.
- the heating temperature is raised stepwise as it is, and finally from 375 ° C. to 450 ° C. for 30 minutes to 4 hours.
- the method of heating is mentioned.
- Examples of equipment used for heating include a hot plate and an oven.
- the heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
- the thickness of the release layer is usually about 0.01 to 50 ⁇ m, preferably from about 0.05 to 20 ⁇ m, more preferably about 0.05 to 5 ⁇ m from the viewpoint of productivity. To achieve the desired thickness.
- the release layer described above has excellent adhesion to a substrate, particularly a glass substrate, moderate adhesion to a resin substrate, and moderate release. Therefore, the release layer according to the present invention, in the manufacturing process of the flexible electronic device, without damaging the resin substrate of the device, the resin substrate together with the circuit and the like formed on the resin substrate from the substrate. It can be suitably used for peeling.
- a release layer is formed on a glass substrate by the method described above.
- a resin solution for forming a resin substrate is applied, and this coating film is heated to form a resin substrate fixed to the glass substrate via the release layer according to the present invention.
- the resin substrate is formed with a larger area than the area of the release layer so as to cover the entire release layer.
- the resin substrate examples include a resin substrate made of polyimide which is typical as a resin substrate of a flexible electronic device, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution.
- the method for forming the resin substrate may follow a conventional method.
- a desired circuit is formed on the resin substrate fixed to the base via the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer. Is peeled from the release layer to separate the resin substrate and the substrate. At this time, a part of the substrate may be cut together with the release layer.
- the polymer substrate can be suitably peeled from the glass carrier using the laser lift-off method (LLO method) that has been used in the manufacture of high-brightness LEDs, three-dimensional semiconductor packages, and the like.
- LLO method laser lift-off method
- JP 2013-147599 A In manufacturing a flexible display, a polymer substrate made of polyimide or the like is provided on a glass carrier, and then a circuit or the like including an electrode or the like is formed on the substrate. Finally, the substrate is peeled off from the glass carrier together with the circuit or the like. There is a need.
- the LLO method is adopted, that is, when a glass carrier is irradiated with a light beam having a wavelength of 308 nm from the surface opposite to the surface on which a circuit or the like is formed, the light beam with the wavelength passes through the glass carrier, Only the nearby polymer (polyimide) absorbs this light and evaporates (sublimates). As a result, it has been reported that peeling of the substrate from the glass carrier can be performed selectively without affecting the circuit or the like provided on the substrate, which determines the performance of the display.
- the composition for forming a release layer of the present invention has a feature of sufficiently absorbing light having a specific wavelength (for example, 308 nm) that can be applied by the LLO method, and thus can be used as a sacrificial layer for the LLO method.
- p-PDA p-phenylenediamine
- m-PDA m-phenylenediamine
- DATP 4,4 ′ ′′-diamino-p-terphenyl
- DBA 3,5-diaminobenzoic acid
- HAB 3,3′-dihydroxybenzidine
- DDE 4,4'-oxydianiline
- BAPB 4,4'-bis (4-aminophenoxy) biphenyl
- FAPB 4,4'-bis (4-amino-2-trifluoromethylphenoxy) biphenyl
- APAB 5-amino -2- (4-aminophenyl) -1H-benzimidazole
- APAB-E 4-aminophenyl-4′-aminobenzoate 6FAP: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane
- TFMB 2,2′-bis (trifluoromethyl) biphenyl-4,4′-diamine
- the weight average molecular weight (Mw) and molecular weight distribution (Mw / Mn) of the polymer were measured using a GPC apparatus manufactured by JASCO Corporation (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko KK); : Dimethylformamide / LiBr.H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); flow rate: 1.0 mL / min; column temperature: 40 ° C .; Mw: (Standard polystyrene equivalent value) was used (same in the following examples and comparative examples).
- Synthesis Example L13 Synthesis of polyamic acid L13 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L13. Polyamic acid L13 had Mw of 39,100 and Mw / Mn of 2.6.
- Synthesis Example L16 Synthesis of polyamic acid L16 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.765 g (8 mmol) was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L16. Mw of polyamic acid L16 was 43,800, and Mw / Mn was 2.5.
- composition for forming release layer [Example 1-1] BCS was added to the reaction solution obtained in Synthesis Example L1, and diluted with NMP so that the polymer concentration was 5% by mass and BCS was 20% by mass to obtain a composition for forming a release layer.
- Examples 1-2 to 1-22 A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solution obtained in Synthesis Example L1. It was.
- Comparative Example 1 The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.
- Example 2-1 Formation and evaluation of release layer
- the composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm ⁇ 100 mm glass substrate (hereinafter the same) using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
- the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
- the film-coated substrate was not removed from the oven but heated in the oven.
- Example 2-1 was used except that the release layer forming composition obtained in Examples 1-2 to 1-22 was used in place of the release layer forming composition obtained in Example 1-1.
- a release layer was formed in the same manner as described above.
- Example 2-23 The composition for forming a release layer obtained in Example 1-12 was applied on a 100 mm ⁇ 100 mm glass substrate using a spin coater (conditions: about 30 seconds at a rotation speed of 3000 rpm).
- the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And then heated at 250 ° C. for 60 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
- the film-coated substrate was not removed from the oven but heated in the oven.
- Example 2-24 The composition for forming a release layer obtained in Example 1-8 was applied on a 100 mm ⁇ 100 mm glass substrate as a glass substrate using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
- the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes in a nitrogen atmosphere using an oven to raise the heating temperature to 400 ° C. (10 C./min), and further heated at 400 ° C. for 60 minutes, and finally heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
- the film-coated substrate was not removed from the oven but heated in the oven.
- Example 2-25 A resin thin film was prepared in the same manner as in Example 2-24, except that the composition obtained in Example 1-12 was used instead of the release layer-forming composition obtained in Example 1-8. Formed.
- Comparative Example 2 A resin thin film was formed in the same manner as in Example 2-1, except that the composition obtained in Comparative Example 1 was used instead of the release layer forming composition obtained in Example 1-1. .
- the resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following method. Using a bar coater (gap: 250 ⁇ m), either the resin substrate forming composition W or X was applied on the release layer (resin thin film) on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 210 ° C. (10 ° C./min. The same applies to the following, and the heating temperature was raised to 210 ° C. for 30 minutes, the heating temperature was raised to 300 ° C., the heating temperature was raised to 300 ° C.
- the heating temperature was raised to 400 ° C., and the heating temperature was raised to 400 ° C. for 60 minutes.
- a polyimide substrate having a thickness of about 20 ⁇ m was formed. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
- the resin substrates of Examples 3-42 to 3-43 were formed by the following method. Using a bar coater (gap: 50 ⁇ m), either the resin substrate forming composition Y or Z was applied onto the release layer on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And heated at 250 ° C. for 60 minutes to form a polyimide substrate having a thickness of about 0.8 ⁇ m on the release layer. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
- a bar coater gap: 50 ⁇ m
- the release layers of the examples were excellent in adhesion to the glass substrate and excellent in peelability from the resin substrate.
- the release layer of the comparative example did not peel from the resin substrate and the glass substrate, and did not function as a release layer.
- Example 4 Evaluation of transmittance [Example 4] Using a spin coater (condition: about 30 seconds at 800 rpm), the release layer forming composition obtained in Example 2-8 was applied as a glass substrate onto a 100 mm ⁇ 100 mm glass substrate (hereinafter the same). . The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.4 ⁇ m on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
- the transmittance of the obtained film was measured using an ultraviolet-visible spectrophotometer (SIMADSU UV-2550 model number, manufactured by Shimadzu Corporation). The results are shown in FIG.
- the transmittance of the obtained film was 1% or less with respect to the wavelength of 308 nm, indicating a transmittance that can be used as a sacrificial layer.
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Abstract
Description
1. 芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含み、
前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物、
2. 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンが、式(A1)~(A42)からなる群から選ばれる少なくとも1種である1の剥離層形成用組成物、
5. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものである4の剥離層形成用組成物、
6. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)~(C12)からなる群から選ばれる少なくとも1種である5の剥離層形成用組成物、
8. 1~7のいずれかの剥離層形成用組成物を用いて形成される剥離層、
9. 8の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法、
10. 8の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法、
11. 前記樹脂基板が、ポリイミドからなる基板である9又は10の製造方法
を提供する。 That is, the present invention
1. A polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent,
The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond. A composition for forming a release layer, comprising an acid dianhydride,
2. 1. A composition for forming a release layer, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42);
5. 4. The composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton,
6). 5. A composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12);
8). A release layer formed using the release layer-forming composition of any one of 1 to 7,
9. A method for producing a flexible electronic device comprising a resin substrate, comprising using a release layer of 8;
10. A method for producing a touch panel sensor comprising a resin substrate, comprising using a release layer of 8;
11. The manufacturing method according to 9 or 10, wherein the resin substrate is a substrate made of polyimide.
本発明の剥離層形成用組成物は、芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含むものであって、前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むものである。ここで、本発明における剥離層とは、所定の目的でガラス基体直上に設けられる層であって、その典型例としては、フレキシブル電子デバイスの製造プロセスにおいて、基体と、ポリイミドといった樹脂からなるフレキシブル電子デバイスの樹脂基板との間に、当該樹脂基板を所定のプロセス中において固定するために設けられ、かつ、当該樹脂基板上に電子回路等の形成した後において当該樹脂基板が当該基体から容易に剥離できるようにするために設けられるものが挙げられる。 Hereinafter, the present invention will be described in more detail.
The composition for forming a release layer of the present invention comprises a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine is an ester. An aromatic diamine including at least one of a bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes an aromatic tetracarboxylic dianhydride including at least one of an ester bond and an ether bond. . Here, the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose. As a typical example, in a manufacturing process of a flexible electronic device, a flexible electronic made of a substrate and a resin such as polyimide is used. Provided between the resin substrate of the device to fix the resin substrate in a predetermined process, and after the electronic circuit or the like is formed on the resin substrate, the resin substrate is easily peeled off from the base The thing provided in order to be able to do is mentioned.
本発明に係る剥離層形成用組成物を用いて、前述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂溶液を塗布し、この塗膜を加熱することで、本発明に係る剥離層を介して、ガラス基体に固定された樹脂基板を形成する。この際、剥離層を全て覆うようにして、剥離層の面積と比較して大きい面積で、樹脂基板を形成する。前記樹脂基板としては、フレキシブル電子デバイスの樹脂基板として代表的なポリイミドからなる樹脂基板等が挙げられ、それを形成するための樹脂溶液としては、ポリイミド溶液やポリアミック酸溶液が挙げられる。当該樹脂基板の形成方法は、常法に従えばよい。 Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.
By using the composition for forming a release layer according to the present invention, a release layer is formed on a glass substrate by the method described above. On this release layer, a resin solution for forming a resin substrate is applied, and this coating film is heated to form a resin substrate fixed to the glass substrate via the release layer according to the present invention. . At this time, the resin substrate is formed with a larger area than the area of the release layer so as to cover the entire release layer. Examples of the resin substrate include a resin substrate made of polyimide which is typical as a resin substrate of a flexible electronic device, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution. The method for forming the resin substrate may follow a conventional method.
p-PDA:p-フェニレンジアミン
m-PDA:m-フェニレンジアミン
DATP:4,4'''-ジアミノ-p-ターフェニル
DBA:3,5-ジアミノ安息香酸
HAB:3,3'-ジヒドロキシベンジジン
DDE:4,4'-オキシジアニリン
BAPB:4,4'-ビス(4-アミノフェノキシ)ビフェニル
FAPB:4,4'-ビス(4-アミノ-2-トリフルオロメチルフェノキシ)ビフェニル
APAB:5-アミノ-2-(4-アミノフェニル)-1H-ベンゾイミダゾール
APAB-E:4-アミノフェニル-4'-アミノベンゾエート
6FAP:2,2-ビス(3-アミノ-4-ヒドロキシフェニル)ヘキサフルオロプロパン
TFMB:2,2'-ビス(トリフルオロメチル)ビフェニル-4,4'-ジアミン
BPDA:3,3',4,4'-ビフェニルテトラカルボン酸二無水物
TAHQ:p-フェニレンビス(トリメリット酸モノエステル酸無水物)
PMDA:ピロメリット酸二無水物
BPTME:p-ビフェニレンビス(トリメリット酸モノエステル酸無水物)
BPODA:4,4'-(ビフェニル-4,4'-ジイルビスオキシ)ビスフタル酸二無水物
CF3-BP-TMA:N,N'-[2,2'-ビス(トリフルオロメチル)ビフェニル-4,4'-ジイル]ビス(1,3-ジオキソ-1,3-ジヒドロイソベンゾフラン-5-カルボアミド)
6FDA:4,4'-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物
CBDA:1,2,3,4-シクロブタンテトラカルボン酸二無水物
IPBBT:N,N'-イソフタルビス(ベンゾオキサゾリン-2-チオン)
NMP:N-メチル-2-ピロリドン
BCS:ブチルセロソルブ <Abbreviation of compound>
p-PDA: p-phenylenediamine m-PDA: m-phenylenediamine DATP: 4,4 ′ ″-diamino-p-terphenyl DBA: 3,5-diaminobenzoic acid HAB: 3,3′-dihydroxybenzidine DDE : 4,4'-oxydianiline BAPB: 4,4'-bis (4-aminophenoxy) biphenyl FAPB: 4,4'-bis (4-amino-2-trifluoromethylphenoxy) biphenyl APAB: 5-amino -2- (4-aminophenyl) -1H-benzimidazole APAB-E: 4-aminophenyl-4′-aminobenzoate 6FAP: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane TFMB: 2,2′-bis (trifluoromethyl) biphenyl-4,4′-diamine BPDA: 2,3 ′, 4,4′-biphenyltetracarboxylic acid Anhydride TAHQ: p-phenylenebis (trimellitic acid monoester acid anhydride)
PMDA: pyromellitic dianhydride BPTME: p-biphenylenebis (trimellitic acid monoester anhydride)
BPODA: 4,4 ′-(biphenyl-4,4′-diylbisoxy) bisphthalic dianhydride CF3-BP-TMA: N, N ′-[2,2′-bis (trifluoromethyl) biphenyl-4 , 4'-diyl] bis (1,3-dioxo-1,3-dihydroisobenzofuran-5-carboxamide)
6FDA: 4,4 ′-(hexafluoroisopropylidene) diphthalic anhydride CBDA: 1,2,3,4-cyclobutanetetracarboxylic dianhydride IPBBT: N, N′-isophthalbis (benzoxazoline-2-thione) )
NMP: N-methyl-2-pyrrolidone BCS: Butyl cellosolve
ポリマーの重量平均分子量(Mw)及び分子量分布(Mw/Mn)の測定は、日本分光(株)製GPC装置(カラム:昭和電工(株)製OHpak SB803-HQ、及びOHpak SB804-HQ;溶離液:ジメチルホルムアミド/LiBr・H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1質量%);流量:1.0mL/分;カラム温度:40℃;Mw:標準ポリスチレン換算値)を用いて行った(以下の実施例及び比較例において、同じ)。 <Measurement of weight average molecular weight and molecular weight distribution>
The weight average molecular weight (Mw) and molecular weight distribution (Mw / Mn) of the polymer were measured using a GPC apparatus manufactured by JASCO Corporation (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko KK); : Dimethylformamide / LiBr.H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); flow rate: 1.0 mL / min; column temperature: 40 ° C .; Mw: (Standard polystyrene equivalent value) was used (same in the following examples and comparative examples).
以下の方法によって、ポリアミック酸及びポリベンゾオキサゾール前駆体を合成した。
なお、得られたポリマー含有反応液からポリマーを単離せず、後述のとおり、反応溶液を希釈することで、樹脂基板形成用組成物又は剥離層形成用組成物を調製した。 [1] Synthesis of polymer A polyamic acid and a polybenzoxazole precursor were synthesized by the following method.
In addition, the polymer was not isolated from the obtained polymer containing reaction liquid, but the composition for resin substrate formation or the composition for peeling layer formation was prepared by diluting a reaction solution as mentioned later.
p-PDA20.261g(187mmol)及びDATP12.206g(47mmol)をNMP617.4gに溶解させた。得られた溶液を15℃に冷却し、そこへPMDA50.112g(230mmol)を加え、窒素雰囲気下、50℃まで昇温し、48時間反応させ、ポリアミック酸S1を得た。ポリアミック酸S1のMwは82,100、Mw/Mnは2.7であった。 [Synthesis Example S1] Synthesis of polyamic acid S1 20.261 g (187 mmol) of p-PDA and 12.206 g (47 mmol) of DATP were dissolved in 617.4 g of NMP. The obtained solution was cooled to 15 ° C., PMDA 50.112 g (230 mmol) was added thereto, the temperature was raised to 50 ° C. in a nitrogen atmosphere, and the mixture was reacted for 48 hours to obtain polyamic acid S1. Polyamic acid S1 had Mw of 82,100 and Mw / Mn of 2.7.
p-PDA3.218g(30mmol)をNMP88.2gに溶解させた。得られた溶液にBPDA8.581g(29mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S2を得た。ポリアミック酸S2のMwは107,300、Mw/Mnは4.6であった。 [Synthesis Example S2] Synthesis of polyamic acid S2 3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. To the obtained solution, 8.581 g (29 mmol) of BPDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid S2. Polyamic acid S2 had Mw of 107,300 and Mw / Mn of 4.6.
TFMB17.8g(56mmol)、BAPB0.4g(1mmol)及びp-PDA2.5g(23mmol)をNMP430gに溶解させた。得られた溶液に、6FDA6.3g(14mmol)及びCF3-BP-TMA42.8g(64mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S3を得た。ポリアミック酸S3のMwは38,700、Mw/Mnは2.1であった。 [Synthesis Example S3] Synthesis of polyamic acid S3 17.8 g (56 mmol) of TFMB, 0.4 g (1 mmol) of BAPB and 2.5 g (23 mmol) of p-PDA were dissolved in 430 g of NMP. To the obtained solution, 6.3 g (14 mmol) of 6FDA and 42.8 g (64 mmol) of CF3-BP-TMA were added and reacted at 23 ° C. for 24 hours in a nitrogen atmosphere to obtain polyamic acid S3. Polyamic acid S3 had Mw of 38,700 and Mw / Mn of 2.1.
DDE30.6g(153mmol)をNMP440gに溶解させた。得られた溶液にCBDA29.4g(150mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S4を得た。ポリアミック酸S4のMwは29,800、Mw/Mnは2.2であった。 [Synthesis Example S4] Synthesis of polyamic acid S4 30.6 g (153 mmol) of DDE was dissolved in 440 g of NMP. CBDA 29.4g (150mmol) was added to the obtained solution, and it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid S4 was obtained. Polyamic acid S4 had Mw of 29,800 and Mw / Mn of 2.2.
p-PDA2.054g(19mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.946g(19mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L1を得た。ポリアミック酸L1のMwは57,500、Mw/Mnは3.0であった。 [Synthesis Example L1] Synthesis of polyamic acid L1 2.054 g (19 mmol) of p-PDA was dissolved in 88 g of NMP. BPTME 9.946g (19mmol) was added to the obtained solution, and it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and polyamic acid L1 was obtained. Polyamic acid L1 had Mw of 57,500 and Mw / Mn of 3.0.
p-PDA1.836g(17mmol)及びDBA0.287g(1.9mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.878g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L2を得た。ポリアミック酸L2のMwは65,100、Mw/Mnは3.0であった。 [Synthesis Example L2] Synthesis of polyamic acid L2 p-PDA (1.836 g, 17 mmol) and DBA (0.287 g, 1.9 mmol) were dissolved in NMP (88 g). To the obtained solution, 9.878 g (18 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L2. Mw of polyamic acid L2 was 65,100, and Mw / Mn was 3.0.
p-PDA1.367g(13mmol)及びHAB1.172g(5.4mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.461g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L3を得た。ポリアミック酸L3のMwは43,600、Mw/Mn2.6であった。 [Synthesis Example L3] Synthesis of polyamic acid L3 1.367 g (13 mmol) of p-PDA and 1.172 g (5.4 mmol) of HAB were dissolved in 88 g of NMP. To the obtained solution, 9.461 g (18 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L3. Mw of polyamic acid L3 was 43,600 and Mw / Mn 2.6.
DATP3.984g(15mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.016g(15mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L4を得た。ポリアミック酸L4のMwは42,600、Mw/Mnは3.9であった。 [Synthesis Example L4] Synthesis of polyamic acid L4 3.984 g (15 mmol) of DATP was dissolved in 88 g of NMP. To the resulting solution, 8.016 g (15 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L4. Polyamic acid L4 had Mw of 42,600 and Mw / Mn of 3.9.
BAPB5.17g(14mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.83g(13mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L5を得た。ポリアミック酸L5のMwは52,100、Mw/Mnは2.7であった。 [Synthesis Example L5] Synthesis of polyamic acid L5 5.17 g (14 mmol) of BAPB was dissolved in 88 g of NMP. To the resulting solution, 6.83 g (13 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L5. Polyamic acid L5 had Mw of 52,100 and Mw / Mn of 2.7.
FAPB5.89g(12mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.11g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L6を得た。ポリアミック酸L6のMwは87,700、Mw/Mnは3.3であった。 [Synthesis Example L6] Synthesis of polyamic acid L6 5.89 g (12 mmol) of FAPB was dissolved in 88 g of NMP. To the resulting solution, 6.11 g (11 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L6. Polyamic acid L6 had Mw of 87,700 and Mw / Mn of 3.3.
APAB3.60g(16mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.40g(16mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L7を得た。ポリアミック酸L7のMwは58,300、Mw/Mnは2.8であった。 [Synthesis Example L7] Synthesis of Polyamic Acid L7 3.60 g (16 mmol) of APAB was dissolved in 88 g of NMP. To the resulting solution, 8.40 g (16 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L7. Polyamic acid L7 had Mw of 58,300 and Mw / Mn of 2.8.
DDE2.322g(12mmol)をNMP35.2gに溶解させた。得られた溶液にPMDA2.478g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L8を得た。ポリアミック酸L8のMwは22,600、Mw/Mnは2.1であった。 [Synthesis Example L8] Synthesis of polyamic acid L8 2.322 g (12 mmol) of DDE was dissolved in 35.2 g of NMP. To the obtained solution, 2.478 g (11 mmol) of PMDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L8. Mw of polyamic acid L8 was 22,600, and Mw / Mn was 2.1.
DATP1.762g(7mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.038g(7mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L9を得た。ポリアミック酸L9のMwは61,300、Mw/Mnは3.3であった。 [Synthesis Example L9] Synthesis of polyamic acid L9 1.762 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. To the obtained solution, 3.038 g (7 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L9. Mw of polyamic acid L9 was 61,300, and Mw / Mn was 3.3.
p-PDA0.899g(8mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.900g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L10を得た。ポリアミック酸L10のMwは17,300、Mw/Mnは2.4であった。 [Synthesis Example L10] Synthesis of polyamic acid L10 0.899 g (8 mmol) of p-PDA was dissolved in 35.2 g of NMP. BPODA 3.900g (8mmol) was added to the obtained solution, and it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and polyamic acid L10 was obtained. Mw of polyamic acid L10 was 17,300, and Mw / Mn was 2.4.
DATP1.713g(7mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.086g(6mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L11を得た。ポリアミック酸L11のMwは27,000、Mw/Mnは2.4であった。 [Synthesis Example L11] Synthesis of polyamic acid L11 1.713 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. To the obtained solution, 3.086 g (6 mmol) of BPODA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L11. Polyamic acid L11 had Mw of 27,000 and Mw / Mn of 2.4.
p-PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L12を得た。ポリアミック酸L12のMwは45,000、Mw/Mnは2.7であった。 [Synthesis Example L12] Synthesis of polyamic acid L12 0.931 g (9 mmol) of p-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L12. Polyamic acid L12 had Mw of 45,000 and Mw / Mn of 2.7.
p-PDA0.839g(8mmol)とm-PDA0.093g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L13を得た。ポリアミック酸L13のMwは39,100、Mw/Mnは2.6であった。 Synthesis Example L13 Synthesis of polyamic acid L13 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L13. Polyamic acid L13 had Mw of 39,100 and Mw / Mn of 2.6.
p-PDA0.652g(6mmol)とm-PDA0.280g(3mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L14を得た。ポリアミック酸L14のMwは42,700、Mw/Mnは2.6であった。 [Synthesis Example L14] Synthesis of polyamic acid L14 0.652 g (6 mmol) of p-PDA and 0.280 g (3 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L14. Polyamic acid L14 had Mw of 42,700 and Mw / Mn of 2.6.
m-PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L15を得た。ポリアミック酸L15のMwは36,100、Mw/Mnは2.5であった。 [Synthesis Example L15] Synthesis of polyamic acid L15 0.931 g (9 mmol) of m-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L15. Mw of polyamic acid L15 was 36,100, and Mw / Mn was 2.5.
p-PDA0.816g(8mmol)とDATP0.218g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.765g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L16を得た。ポリアミック酸L16のMwは43,800、Mw/Mnは2.5であった。 Synthesis Example L16 Synthesis of polyamic acid L16 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.765 g (8 mmol) was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L16. Mw of polyamic acid L16 was 43,800, and Mw / Mn was 2.5.
p-PDA0.603g(6mmol)及びDATP0.622g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.575g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L17を得た。ポリアミック酸L17のMwは46,000、Mw/Mnは2.6であった。 [Synthesis Example L17] Synthesis of polyamic acid L17 0.603 g (6 mmol) of p-PDA and 0.622 g (2 mmol) of DATP were dissolved in 35.2 g of NMP. To the obtained solution was added 3.575 g (8 mmol) of TAHQ, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L17. Polyamic acid L17 had Mw of 46,000 and Mw / Mn of 2.6.
p-PDA0.832g(8mmol)及びDBA0.130g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.838g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L18を得た。ポリアミック酸L18のMwは57,000、Mw/Mnは3.0であった。 [Synthesis Example L18] Synthesis of polyamic acid L18 0.832 g (8 mmol) of p-PDA and 0.130 g (1 mmol) of DBA were dissolved in 35.2 g of NMP. To the obtained solution, 3.838 g (8 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L18. Polyamic acid L18 had Mw of 57,000 and Mw / Mn of 3.0.
p-PDA0.822g(8mmol)及びHAB0.183g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.794g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L19を得た。ポリアミック酸L19のMwは54,200、Mw/Mnは2.7であった。 [Synthesis Example L19] Synthesis of polyamic acid L19 0.822 g (8 mmol) of p-PDA and 0.183 g (1 mmol) of HAB were dissolved in 35.2 g of NMP. TAHQ 3.794 g (8 mmol) was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L19. Polyamic acid L19 had Mw of 54,200 and Mw / Mn of 2.7.
p-PDA0.616g(6mmol)及びHAB0.528g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.655g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L20を得た。ポリアミック酸L20のMwは55,900、Mw/Mnは2.6であった。 [Synthesis Example L20] Synthesis of polyamic acid L20 0.616 g (6 mmol) of p-PDA and 0.5528 g (2 mmol) of HAB were dissolved in 35.2 g of NMP. To the obtained solution, 3.655 g (8 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L20. Polyamic acid L20 had Mw of 55,900 and Mw / Mn of 2.6.
APAB-E1.239g(5mmol)をNMP17.6gに溶解させた。得られた溶液にPMDA1.160g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L21を得た。ポリアミック酸L21のMwは20,900、Mw/Mnは2.1であった。 [Synthesis Example L21] Synthesis of polyamic acid L21 1.239 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. To the resulting solution, 1.160 g (5 mmol) of PMDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L21. Polyamic acid L21 had Mw of 20,900 and Mw / Mn of 2.1.
APAB-E1.060g(5mmol)をNMP17.6gに溶解させた。得られた溶液にBPDA1.339g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L22を得た。ポリアミック酸L22のMwは26,600、Mw/Mnは2.3であった。 [Synthesis Example L22] Synthesis of polyamic acid L22 APAB-E (1.060 g, 5 mmol) was dissolved in 17.6 g of NMP. To the obtained solution, 1.339 g (5 mmol) of BPDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L22. Polyamic acid L22 had Mw of 26,600 and Mw / Mn of 2.3.
6FAP5.49g(0.015mol)をNMP27gに溶解させた。得られた溶液にIPBBT6.48g(0.015mol)を加え、窒素雰囲気下、23℃で3時間反応させた。その後、この溶液を純水300gへ投入し、24時間撹拌後、析出物を濾過した。その後、減圧乾燥し、ポリベンゾオキサゾール前駆体B1を得た。ポリベンゾオキサゾール前駆体B1のMwは2,1000、Mw/Mnは3.9であった。 [Comparative Synthesis Example 1] Synthesis of polybenzoxazole precursor B1 6.49 g (0.015 mol) of 6FAP was dissolved in 27 g of NMP. 6.48 g (0.015 mol) of IPBBT was added to the resulting solution, and the mixture was reacted at 23 ° C. for 3 hours under a nitrogen atmosphere. Thereafter, this solution was poured into 300 g of pure water, and after stirring for 24 hours, the precipitate was filtered. Then, it dried under reduced pressure and obtained polybenzoxazole precursor B1. Mw of the polybenzoxazole precursor B1 was 2,1000, and Mw / Mn was 3.9.
合成例S1~S4で得られた反応液を、それぞれ、そのまま樹脂基板形成用組成物W、X、Y及びZとして用いた。 [2] Preparation of Resin Substrate Forming Composition The reaction solutions obtained in Synthesis Examples S1 to S4 were used as resin substrate forming compositions W, X, Y, and Z, respectively.
[実施例1-1]
合成例L1で得られた反応液に、BCSを加え、ポリマー濃度が5質量%、BCSが20質量%となるようにNMPで希釈し、剥離層形成用組成物を得た。 [3] Preparation of composition for forming release layer [Example 1-1]
BCS was added to the reaction solution obtained in Synthesis Example L1, and diluted with NMP so that the polymer concentration was 5% by mass and BCS was 20% by mass to obtain a composition for forming a release layer.
合成例L1で得られた反応液のかわりに、それぞれ合成例L2~L22で得られた反応液を用いた以外は、実施例1-1と同様の方法で、剥離層形成用組成物を得た。 [Examples 1-2 to 1-22]
A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solution obtained in Synthesis Example L1. It was.
比較合成例1で得られた反応液を、ポリマー濃度が5質量%となるようにNMPで希釈して、組成物を得た。 [Comparative Example 1]
The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.
[実施例2-1]
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-1で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 [4] Formation and evaluation of release layer [Example 2-1]
The composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm × 100 mm glass substrate (hereinafter the same) using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm). .
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
実施例1-1で得られた剥離層形成用組成物のかわりに、それぞれ実施例1-2~1-22で得られた剥離層形成用組成物を用いた以外は、実施例2-1と同様の方法で、剥離層を形成した。 [Examples 2-2 to 2-22]
Example 2-1 was used except that the release layer forming composition obtained in Examples 1-2 to 1-22 was used in place of the release layer forming composition obtained in Example 1-1. A release layer was formed in the same manner as described above.
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-12で得られた剥離層形成用組成物を、100mm×100mmガラス基板上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、更に250℃で60分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 [Example 2-23]
The composition for forming a release layer obtained in Example 1-12 was applied on a 100 mm × 100 mm glass substrate using a spin coater (conditions: about 30 seconds at a rotation speed of 3000 rpm).
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And then heated at 250 ° C. for 60 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-8で得られた剥離層形成用組成物を、ガラス基体としての100mm×100mmガラス基板の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて窒素雰囲気下、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で60分間加熱し、最終的に500℃で10分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 [Example 2-24]
The composition for forming a release layer obtained in Example 1-8 was applied on a 100 mm × 100 mm glass substrate as a glass substrate using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes in a nitrogen atmosphere using an oven to raise the heating temperature to 400 ° C. (10 C./min), and further heated at 400 ° C. for 60 minutes, and finally heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
実施例1-8で得られた剥離層形成用組成物のかわりに、実施例1-12で得られた組成物を用いた以外は、実施例2-24と同様の方法で、樹脂薄膜を形成した。 [Example 2-25]
A resin thin film was prepared in the same manner as in Example 2-24, except that the composition obtained in Example 1-12 was used instead of the release layer-forming composition obtained in Example 1-8. Formed.
実施例1-1で得られた剥離層形成用組成物のかわりに、比較例1で得られた組成物を用いた以外は、実施例2-1と同様の方法で、樹脂薄膜を形成した。 [Comparative Example 2]
A resin thin film was formed in the same manner as in Example 2-1, except that the composition obtained in Comparative Example 1 was used instead of the release layer forming composition obtained in Example 1-1. .
[実施例3-1~3-47、比較例3]
実施例2-1~2-25で得られた剥離層とガラス基板の剥離性及び当該剥離層(樹脂薄膜)と樹脂基板の剥離性を確認した。なお、樹脂基板としては、ポリイミドからなる樹脂基板を用いた。
まず、実施例2-1~2-25で得られた剥離層付きガラス基板上の剥離層のクロスカット(縦横1mm間隔、以下同様)、並びに、樹脂基板・剥離層付きガラス基板上の樹脂基板・剥離層のクロスカットを行うことにより、100マスカットを行った。すなわち、このクロスカットにより、1mm四方のマス目を100個形成した。
そして、この100マスカット部分に粘着テープを張り付けて、そのテープを剥がし、以下の基準(5B~0B、B、A、AA)に基づき、剥離の程度を評価した(実施例3-1~3-47)。また、前記手法に準じて、比較例2で得られた樹脂薄膜付きガラス基板を用いて、同様の試験を行った(比較例3)。結果を表1に示す。なお、表1中の剥離性の評価基準は、以下のとおりである。 [5] Evaluation of peelability [Examples 3-1 to 3-47, Comparative Example 3]
The peelability of the release layer and the glass substrate obtained in Examples 2-1 to 2-25 and the peelability of the release layer (resin thin film) and the resin substrate were confirmed. As the resin substrate, a resin substrate made of polyimide was used.
First, the release layer cross-cut (length and width 1 mm spacing, hereinafter the same) on the glass substrate with release layer obtained in Examples 2-1 to 2-25, and the resin substrate on the glass substrate with release substrate and release layer -
Then, an adhesive tape was applied to the 100 muscat portion, the tape was peeled off, and the degree of peeling was evaluated based on the following criteria (5B to 0B, B, A, AA) (Examples 3-1 to 3- 47). Moreover, according to the said method, the same test was done using the glass substrate with a resin thin film obtained by the comparative example 2 (comparative example 3). The results are shown in Table 1. In addition, the evaluation criteria of peelability in Table 1 are as follows.
4B:5%未満の剥離
3B:5~15%の剥離
2B:15~35%未満の剥離
1B:35~65%未満の剥離
0B:65%~80%未満の剥離
B:80%~95%未満の剥離
A:95%~100%未満の剥離
AA:100%剥離(すべて剥離) 5B: 0% peeling (no peeling)
4B: Less than 5% peeling 3B: 5-15% peeling 2B: 15-35% peeling 1B: 35-65% peeling 0B: 65% -80% peeling B: 80% -95% Less than peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)
バーコーター(ギャップ:250μm)を用いて、ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物W又はXのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を210℃まで昇温(10℃/分、以下同様)し、210℃で30分間、加熱温度を300℃まで昇温し、300℃で30分間、加熱温度を400℃まで昇温し、400℃で60分間加熱し、剥離層上に厚さ約20μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 The resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following method.
Using a bar coater (gap: 250 μm), either the resin substrate forming composition W or X was applied on the release layer (resin thin film) on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 210 ° C. (10 ° C./min. The same applies to the following, and the heating temperature was raised to 210 ° C. for 30 minutes, the heating temperature was raised to 300 ° C., the heating temperature was raised to 300 ° C. for 30 minutes, the heating temperature was raised to 400 ° C., and the heating temperature was raised to 400 ° C. for 60 minutes. A polyimide substrate having a thickness of about 20 μm was formed. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
バーコーター(ギャップ:50μm)を用いて、ガラス基板上の剥離層の上に樹脂基板形成用組成物Y又はZのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、250℃で60分間加熱し、剥離層上に厚さ約0.8μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。 The resin substrates of Examples 3-42 to 3-43 were formed by the following method.
Using a bar coater (gap: 50 μm), either the resin substrate forming composition Y or Z was applied onto the release layer on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And heated at 250 ° C. for 60 minutes to form a polyimide substrate having a thickness of about 0.8 μm on the release layer. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
[実施例4]
スピンコータ(条件:回転数800rpmで約30秒)を用いて、実施例2-8で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.4μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。得られたフィルムを紫外線可視分光光度計((株)島津製作所製SIMADSU UV-2550型番)を用いて透過率を測定した。
結果を図1に示す。得られたフィルムの透過率は、波長308nmに対し1%以下であり、犠牲層として使用可能な透過率を示した。 [6] Evaluation of transmittance [Example 4]
Using a spin coater (condition: about 30 seconds at 800 rpm), the release layer forming composition obtained in Example 2-8 was applied as a glass substrate onto a 100 mm × 100 mm glass substrate (hereinafter the same). .
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.4 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven. The transmittance of the obtained film was measured using an ultraviolet-visible spectrophotometer (SIMADSU UV-2550 model number, manufactured by Shimadzu Corporation).
The results are shown in FIG. The transmittance of the obtained film was 1% or less with respect to the wavelength of 308 nm, indicating a transmittance that can be used as a sacrificial layer.
Claims (11)
- 芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含み、
前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物。 A polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent,
The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond. A release layer-forming composition comprising an acid dianhydride. - 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンが、式(A1)~(A42)からなる群から選ばれる少なくとも1種である請求項1に記載の剥離層形成用組成物。
- 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物が、式(B1)~(B14)からなる群から選ばれる少なくとも1種である請求項1又は2に記載の剥離層形成用組成物。
- 前記芳香族テトラカルボン酸二無水物が、更にエステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物を含む請求項1~3のいずれか1項に記載の剥離層形成用組成物。 The composition for forming a release layer according to any one of claims 1 to 3, wherein the aromatic tetracarboxylic dianhydride further includes an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond. object.
- 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものである請求項4に記載の剥離層形成用組成物。 The composition for forming a release layer according to claim 4, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton.
- 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)~(C12)からなる群から選ばれる少なくとも1種である請求項5に記載の剥離層形成用組成物。
- 前記有機溶媒が、式(S1)で表されるアミド類、式(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1つを含む請求項1~6のいずれか1項に記載の剥離層形成用組成物。
- 請求項1~7のいずれか1項に記載の剥離層形成用組成物を用いて形成される剥離層。 A release layer formed using the release layer forming composition according to any one of claims 1 to 7.
- 請求項8に記載の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法。 A method for producing a flexible electronic device comprising a resin substrate, wherein the release layer according to claim 8 is used.
- 請求項8に記載の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法。 A method for manufacturing a touch panel sensor comprising a resin substrate, wherein the release layer according to claim 8 is used.
- 前記樹脂基板が、ポリイミドからなる基板である請求項9又は10に記載の製造方法。 The manufacturing method according to claim 9 or 10, wherein the resin substrate is a substrate made of polyimide.
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TWI720965B (en) | 2021-03-11 |
JP6729403B2 (en) | 2020-07-22 |
CN111234217A (en) | 2020-06-05 |
JP2021119243A (en) | 2021-08-12 |
JP2020019960A (en) | 2020-02-06 |
TW201943767A (en) | 2019-11-16 |
KR102602473B1 (en) | 2023-11-16 |
JP6939862B2 (en) | 2021-09-22 |
CN107250277B (en) | 2021-07-30 |
TW201700540A (en) | 2017-01-01 |
KR20220091609A (en) | 2022-06-30 |
CN113402882B (en) | 2024-02-06 |
TWI768234B (en) | 2022-06-21 |
CN113402882A (en) | 2021-09-17 |
JP7131651B2 (en) | 2022-09-06 |
KR20170116065A (en) | 2017-10-18 |
KR102528185B1 (en) | 2023-05-03 |
CN107250277A (en) | 2017-10-13 |
JPWO2016129546A1 (en) | 2017-12-14 |
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