WO2016129546A1 - Composition for forming release layer - Google Patents

Composition for forming release layer Download PDF

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Publication number
WO2016129546A1
WO2016129546A1 PCT/JP2016/053624 JP2016053624W WO2016129546A1 WO 2016129546 A1 WO2016129546 A1 WO 2016129546A1 JP 2016053624 W JP2016053624 W JP 2016053624W WO 2016129546 A1 WO2016129546 A1 WO 2016129546A1
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WO
WIPO (PCT)
Prior art keywords
release layer
polyamic acid
tetracarboxylic dianhydride
composition
substrate
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PCT/JP2016/053624
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French (fr)
Japanese (ja)
Inventor
江原 和也
和也 進藤
Original Assignee
日産化学工業株式会社
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Application filed by 日産化学工業株式会社 filed Critical 日産化学工業株式会社
Priority to KR1020177024538A priority Critical patent/KR102528185B1/en
Priority to KR1020227020140A priority patent/KR102602473B1/en
Priority to CN201680009594.XA priority patent/CN107250277B/en
Priority to CN202110782191.1A priority patent/CN113402882B/en
Priority to JP2016574789A priority patent/JP6729403B2/en
Publication of WO2016129546A1 publication Critical patent/WO2016129546A1/en

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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • C08G73/1071Wholly aromatic polyimides containing oxygen in the form of ether bonds in the main chain
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1003Preparatory processes
    • C08G73/1007Preparatory processes from tetracarboxylic acids or derivatives and diamines
    • C08G73/1028Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous
    • C08G73/1032Preparatory processes from tetracarboxylic acids or derivatives and diamines characterised by the process itself, e.g. steps, continuous characterised by the solvent(s) used
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1039Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors comprising halogen-containing substituents
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1042Copolyimides derived from at least two different tetracarboxylic compounds or two different diamino compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1067Wholly aromatic polyimides, i.e. having both tetracarboxylic and diamino moieties aromatically bound
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/1085Polyimides with diamino moieties or tetracarboxylic segments containing heterocyclic moieties
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C08L79/08Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133305Flexible substrates, e.g. plastics, organic film
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/13338Input devices, e.g. touch panels
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • G09F9/301Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements flexible foldable or roll-able electronic displays, e.g. thin LCD, OLED

Definitions

  • the present invention relates to a release layer forming composition, and more particularly, to a release layer forming composition for forming a release layer provided on a substrate.
  • Patent Documents 1, 2, and 3 an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then a laser is irradiated from the glass surface side to accompany crystallization of amorphous silicon.
  • a method of peeling a plastic substrate from a glass substrate with generated hydrogen gas is disclosed.
  • Patent Document 4 uses a technique disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device by attaching a layer to be peeled (described as “transfer target layer” in Patent Document 4) to a plastic film. A method is disclosed.
  • JP 10-125929 A Japanese Patent Laid-Open No. 10-125931 International Publication No. 2005/050754 JP-A-10-125930
  • This invention is made
  • the inventors of the present invention include a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and a composition containing an organic solvent.
  • the aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond
  • / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond.
  • a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond.
  • a composition for forming a release layer, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42); 3.
  • composition for forming a release layer according to 1 or 2 wherein the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (B1) to (B14) , 4).
  • composition for forming a release layer wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton, 6).
  • a composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12); 7).
  • a release layer forming composition (In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H represents a natural number. Represents.) 8).
  • a method for producing a flexible electronic device comprising a resin substrate, comprising using a release layer of 8; 10.
  • a method for producing a touch panel sensor comprising a resin substrate, comprising using a release layer of 8; 11.
  • the manufacturing method according to 9 or 10 wherein the resin substrate is a substrate made of polyimide.
  • the composition for forming a release layer of the present invention By using the composition for forming a release layer of the present invention, it is possible to obtain a film having excellent adhesion to the substrate, moderate adhesion to the resin substrate, and moderate peelability with good reproducibility.
  • the composition of the present invention in the manufacturing process of the flexible electronic device, the resin substrate formed on the substrate and the circuit provided on the substrate are not damaged, and the resin substrate together with the circuit etc. Can be separated from the substrate. Therefore, the composition for forming a release layer of the present invention can contribute to simplification of the production process of a flexible electronic device including a resin substrate, improvement of its yield, and the like.
  • Example 6 is a graph showing the transmittance measured in Example 4.
  • the composition for forming a release layer of the present invention comprises a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine is an ester.
  • An aromatic diamine including at least one of a bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes an aromatic tetracarboxylic dianhydride including at least one of an ester bond and an ether bond.
  • the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose.
  • a flexible electronic made of a substrate and a resin such as polyimide is used. Provided between the resin substrate of the device to fix the resin substrate in a predetermined process, and after the electronic circuit or the like is formed on the resin substrate, the resin substrate is easily peeled off from the base. The thing provided in order to be able to do is mentioned.
  • the aromatic diamine containing at least one of an ester bond and an ether bond contains one or both of an ester bond and an ether bond in the molecule.
  • aromatic diamines examples include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds.
  • Specific examples of the aromatic ring include a benzene ring, a naphthalene ring, an anthracene ring, and a phenanthrene ring.
  • a diamine having a structure in which two or three aromatic rings are connected by an ester bond or an ether bond is preferable.
  • aromatic diamine containing at least one of an ester bond and an ether bond include the following.
  • the aromatic tetracarboxylic dianhydride containing at least one of the ester bond and the ether bond contains one or both of the ester bond and the ether bond in the molecule.
  • aromatic tetracarboxylic dianhydrides examples include tetracarboxylic dianhydrides having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds.
  • Specific examples of the aromatic ring include the same ones as described above. Among these, those having a structure in which three or four aromatic rings are connected by an ester bond or an ether bond are preferable from the viewpoint of ensuring the solubility of polyamic acid in an organic solvent.
  • aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond include the following.
  • Such a diamine may be either an aliphatic diamine or an aromatic diamine, but an aromatic diamine containing neither an ester bond nor an ether bond is preferred from the viewpoint of ensuring the strength and heat resistance of the resulting thin film.
  • 1,4-diaminobenzene p-phenylenediamine
  • 1,3-diaminobenzene m-phenylenediamine
  • 1,2-diaminobenzene o-phenylenediamine
  • 2,4-diamino 1,4-diaminobenzene (p-phenylenediamine)
  • 1,3-diaminobenzene m-phenylenediamine
  • 1,2-diaminobenzene o-phenylenediamine
  • 2,4-diamino 2,4-diaminobenzene
  • the amount of the aromatic diamine containing at least one of an ester bond and an ether bond is preferably used in all diamines. Is 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more.
  • tetracarboxylic dianhydrides can be used together with the aromatic tetracarboxylic dianhydride containing at least one of the above-mentioned ester bond and ether bond.
  • Such a tetracarboxylic dianhydride may be either an aliphatic tetracarboxylic dianhydride or an aromatic tetracarboxylic dianhydride, but from the viewpoint of ensuring the strength and heat resistance of the resulting thin film, an ester bond And an aromatic tetracarboxylic dianhydride which does not contain any ether bond.
  • pyromellitic dianhydride benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1 , 2,5,6-tetracarboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene- 2,3,5,6-tetracarboxylic dianhydride, naphthalene-2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl -2,2 ', 3,3'-tetracarboxylic dianhydride, biphenyl-2,3,3', 4'-tetracarboxylic dianhydride,
  • the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is preferably at least one selected from the group consisting of formulas (C1) to (C12) from the viewpoint of ensuring heat resistance.
  • At least one selected from the group consisting of formula (C1) and formula (C9) is more preferable.
  • an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is used together with another tetracarboxylic dianhydride
  • an aromatic tetracarboxylic acid containing at least one of an ester bond and an ether bond is used.
  • the amount of carboxylic dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more in the total tetracarboxylic dianhydride. It is. By adopting such a usage amount, it is possible to obtain a film having sufficient reproducibility with sufficient adhesion to the substrate, appropriate adhesion to the resin substrate, and appropriate peelability.
  • the polyamic acid contained in the composition for forming a release layer according to the present invention can be obtained by reacting the diamine described above with tetracarboxylic dianhydride.
  • the organic solvent used in such a reaction is not particularly limited as long as it does not adversely affect the reaction.
  • Specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, N-ethyl-2- Pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropylamide, 3- Propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethylpropylamide, 3 -Tert-butoxy-N, N-dimethylpropylamide, ⁇ -butyrolactone and the like.
  • amides represented by formula (S1), amides represented by formula (S2) and formula ( At least one selected from amides represented by S3) is preferred.
  • R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms.
  • R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms.
  • h represents a natural number, preferably 1 to 3, more preferably 1 or 2.
  • alkyl group having 1 to 10 carbon atoms examples include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n- Examples include hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like. Of these, alkyl groups having 1 to 3 carbon atoms are preferable, and alkyl groups having 1 or 2 carbon atoms are more preferable.
  • the reaction temperature may be appropriately set in the range from the melting point to the boiling point of the solvent used, and is usually about 0 to 100 ° C., but it prevents imidization in the solution of the resulting polyamic acid and contains a high content of polyamic acid units. In order to maintain the amount, it is preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and still more preferably about 0 to 50 ° C.
  • the reaction time depends on the reaction temperature and the reactivity of the raw material, and cannot be specified unconditionally, but is usually about 1 to 100 hours.
  • a target reaction solution containing polyamic acid can be obtained.
  • the weight average molecular weight of the polyamic acid is preferably 5,000 to 1,000,000, more preferably 10,000 to 500,000, and even more preferably 15,000 to 200,000 from the viewpoint of handling properties.
  • the weight average molecular weight is an average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.
  • a solution obtained by diluting or concentrating the filtrate as it is can be used as the release layer forming composition of the present invention.
  • the composition for peeling layer formation can be obtained efficiently.
  • the solvent in this case include organic solvents used in the above-described reaction.
  • the solvent used for dilution is not particularly limited, and specific examples thereof include those similar to the specific examples of the reaction solvent for the reaction.
  • the solvent used for dilution may be used singly or in combination of two or more.
  • N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl-2 are used because they dissolve polyamic acid well.
  • -Pyrrolidone and ⁇ -butyrolactone are preferred, and N-methyl-2-pyrrolidone is more preferred.
  • ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, 1-phenoxy -2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, dipropylene glycol, 2- (2-ethoxy A solvent having a low surface tension such as propoxy) propanol, methyl lactate, ethyl lactate, n-propyl lactate, n
  • the concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably It is about 1 to 20% by mass. By setting such a concentration, a release layer having a thickness of about 0.05 to 5 ⁇ m can be obtained with good reproducibility.
  • the concentration of the polyamic acid is adjusted to adjust the amount of diamine and tetracarboxylic dianhydride used as the raw material of the polyamic acid. After the reaction solution is filtered, the filtrate is diluted or concentrated. The amount can be adjusted by, for example, adjusting the amount thereof when dissolved in a solvent.
  • the viscosity of the release layer-forming composition is appropriately set in consideration of the thickness of the release layer to be produced, etc. In particular, it is desirable to obtain a film having a thickness of about 0.05 to 5 ⁇ m with good reproducibility. Is usually about 10 to 10,000 mPa ⁇ s at 25 ° C., preferably about 20 to 5,000 mPa ⁇ s.
  • the viscosity can be measured using a commercially available liquid viscosity measurement viscometer, for example, with reference to the procedure described in JIS K7117-2 at a temperature of the composition of 25 ° C. .
  • a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and preferably the composition temperature is 25 ° C. using 1 ° 34 ′ ⁇ R24 as a standard cone rotor. It can be measured under the condition of ° C.
  • An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
  • composition for forming a release layer according to the present invention may contain a component such as a crosslinking agent in addition to the polyamic acid and the organic solvent, for example, in order to improve the film strength.
  • a component such as a crosslinking agent in addition to the polyamic acid and the organic solvent, for example, in order to improve the film strength.
  • release layer-forming composition of the present invention By applying the release layer-forming composition of the present invention described above to a substrate, and heating the resulting coating to thermally imidize the polyamic acid, it has excellent adhesion to the substrate, and moderate to the resin substrate. It is possible to obtain a release layer made of a polyimide film having good adhesion and moderate peelability.
  • the release layer of the present invention When the release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the substrate or the entire surface.
  • a release layer As an aspect of forming a release layer on a part of the surface of the substrate, an embodiment in which the release layer is formed only within a predetermined range of the substrate surface, a release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate.
  • substrate means what is used for manufacture of a flexible electronic device etc. by which the composition for peeling layer formation concerning this invention is applied to the surface.
  • the substrate examples include glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene resin, etc.), metal (silicon wafer, etc.), Although wood, paper, slate, etc. are mentioned, since the peeling layer obtained from the composition for peeling layer formation which concerns on this invention has sufficient adhesiveness with respect to it, glass is preferable.
  • substrate surface may be comprised with the single material and may be comprised with two or more materials.
  • the substrate surface is constituted by two or more materials
  • a certain range of the substrate surface is constituted by a certain material
  • the other surface is constituted by another material.
  • a dot pattern is formed on the entire substrate surface.
  • a material in a pattern such as a line and space pattern is present in other materials.
  • the coating method is not particularly limited.
  • a cast coating method for example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, a die coating method, an ink jet method, a printing method (a relief plate, an intaglio plate, a planographic plate). , Screen printing, etc.).
  • the heating temperature for imidization is usually appropriately determined within the range of 50 to 550 ° C., but is preferably 200 ° C. or higher, and preferably 500 ° C. or lower. By setting the heating temperature in this way, it is possible to sufficiently advance the imidization reaction while preventing the obtained film from being weakened.
  • the heating time varies depending on the heating temperature, and cannot be generally defined, but is usually 5 minutes to 5 hours.
  • the imidization rate may be in the range of 50 to 100%.
  • the heating temperature is raised stepwise as it is, and finally from 375 ° C. to 450 ° C. for 30 minutes to 4 hours.
  • the method of heating is mentioned.
  • Examples of equipment used for heating include a hot plate and an oven.
  • the heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
  • the thickness of the release layer is usually about 0.01 to 50 ⁇ m, preferably from about 0.05 to 20 ⁇ m, more preferably about 0.05 to 5 ⁇ m from the viewpoint of productivity. To achieve the desired thickness.
  • the release layer described above has excellent adhesion to a substrate, particularly a glass substrate, moderate adhesion to a resin substrate, and moderate release. Therefore, the release layer according to the present invention, in the manufacturing process of the flexible electronic device, without damaging the resin substrate of the device, the resin substrate together with the circuit and the like formed on the resin substrate from the substrate. It can be suitably used for peeling.
  • a release layer is formed on a glass substrate by the method described above.
  • a resin solution for forming a resin substrate is applied, and this coating film is heated to form a resin substrate fixed to the glass substrate via the release layer according to the present invention.
  • the resin substrate is formed with a larger area than the area of the release layer so as to cover the entire release layer.
  • the resin substrate examples include a resin substrate made of polyimide which is typical as a resin substrate of a flexible electronic device, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution.
  • the method for forming the resin substrate may follow a conventional method.
  • a desired circuit is formed on the resin substrate fixed to the base via the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer. Is peeled from the release layer to separate the resin substrate and the substrate. At this time, a part of the substrate may be cut together with the release layer.
  • the polymer substrate can be suitably peeled from the glass carrier using the laser lift-off method (LLO method) that has been used in the manufacture of high-brightness LEDs, three-dimensional semiconductor packages, and the like.
  • LLO method laser lift-off method
  • JP 2013-147599 A In manufacturing a flexible display, a polymer substrate made of polyimide or the like is provided on a glass carrier, and then a circuit or the like including an electrode or the like is formed on the substrate. Finally, the substrate is peeled off from the glass carrier together with the circuit or the like. There is a need.
  • the LLO method is adopted, that is, when a glass carrier is irradiated with a light beam having a wavelength of 308 nm from the surface opposite to the surface on which a circuit or the like is formed, the light beam with the wavelength passes through the glass carrier, Only the nearby polymer (polyimide) absorbs this light and evaporates (sublimates). As a result, it has been reported that peeling of the substrate from the glass carrier can be performed selectively without affecting the circuit or the like provided on the substrate, which determines the performance of the display.
  • the composition for forming a release layer of the present invention has a feature of sufficiently absorbing light having a specific wavelength (for example, 308 nm) that can be applied by the LLO method, and thus can be used as a sacrificial layer for the LLO method.
  • p-PDA p-phenylenediamine
  • m-PDA m-phenylenediamine
  • DATP 4,4 ′ ′′-diamino-p-terphenyl
  • DBA 3,5-diaminobenzoic acid
  • HAB 3,3′-dihydroxybenzidine
  • DDE 4,4'-oxydianiline
  • BAPB 4,4'-bis (4-aminophenoxy) biphenyl
  • FAPB 4,4'-bis (4-amino-2-trifluoromethylphenoxy) biphenyl
  • APAB 5-amino -2- (4-aminophenyl) -1H-benzimidazole
  • APAB-E 4-aminophenyl-4′-aminobenzoate 6FAP: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane
  • TFMB 2,2′-bis (trifluoromethyl) biphenyl-4,4′-diamine
  • the weight average molecular weight (Mw) and molecular weight distribution (Mw / Mn) of the polymer were measured using a GPC apparatus manufactured by JASCO Corporation (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko KK); : Dimethylformamide / LiBr.H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); flow rate: 1.0 mL / min; column temperature: 40 ° C .; Mw: (Standard polystyrene equivalent value) was used (same in the following examples and comparative examples).
  • Synthesis Example L13 Synthesis of polyamic acid L13 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L13. Polyamic acid L13 had Mw of 39,100 and Mw / Mn of 2.6.
  • Synthesis Example L16 Synthesis of polyamic acid L16 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.765 g (8 mmol) was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L16. Mw of polyamic acid L16 was 43,800, and Mw / Mn was 2.5.
  • composition for forming release layer [Example 1-1] BCS was added to the reaction solution obtained in Synthesis Example L1, and diluted with NMP so that the polymer concentration was 5% by mass and BCS was 20% by mass to obtain a composition for forming a release layer.
  • Examples 1-2 to 1-22 A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solution obtained in Synthesis Example L1. It was.
  • Comparative Example 1 The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.
  • Example 2-1 Formation and evaluation of release layer
  • the composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm ⁇ 100 mm glass substrate (hereinafter the same) using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
  • the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
  • the film-coated substrate was not removed from the oven but heated in the oven.
  • Example 2-1 was used except that the release layer forming composition obtained in Examples 1-2 to 1-22 was used in place of the release layer forming composition obtained in Example 1-1.
  • a release layer was formed in the same manner as described above.
  • Example 2-23 The composition for forming a release layer obtained in Example 1-12 was applied on a 100 mm ⁇ 100 mm glass substrate using a spin coater (conditions: about 30 seconds at a rotation speed of 3000 rpm).
  • the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And then heated at 250 ° C. for 60 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
  • the film-coated substrate was not removed from the oven but heated in the oven.
  • Example 2-24 The composition for forming a release layer obtained in Example 1-8 was applied on a 100 mm ⁇ 100 mm glass substrate as a glass substrate using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
  • the obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes in a nitrogen atmosphere using an oven to raise the heating temperature to 400 ° C. (10 C./min), and further heated at 400 ° C. for 60 minutes, and finally heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 ⁇ m on the glass substrate.
  • the film-coated substrate was not removed from the oven but heated in the oven.
  • Example 2-25 A resin thin film was prepared in the same manner as in Example 2-24, except that the composition obtained in Example 1-12 was used instead of the release layer-forming composition obtained in Example 1-8. Formed.
  • Comparative Example 2 A resin thin film was formed in the same manner as in Example 2-1, except that the composition obtained in Comparative Example 1 was used instead of the release layer forming composition obtained in Example 1-1. .
  • the resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following method. Using a bar coater (gap: 250 ⁇ m), either the resin substrate forming composition W or X was applied on the release layer (resin thin film) on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 210 ° C. (10 ° C./min. The same applies to the following, and the heating temperature was raised to 210 ° C. for 30 minutes, the heating temperature was raised to 300 ° C., the heating temperature was raised to 300 ° C.
  • the heating temperature was raised to 400 ° C., and the heating temperature was raised to 400 ° C. for 60 minutes.
  • a polyimide substrate having a thickness of about 20 ⁇ m was formed. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
  • the resin substrates of Examples 3-42 to 3-43 were formed by the following method. Using a bar coater (gap: 50 ⁇ m), either the resin substrate forming composition Y or Z was applied onto the release layer on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And heated at 250 ° C. for 60 minutes to form a polyimide substrate having a thickness of about 0.8 ⁇ m on the release layer. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
  • a bar coater gap: 50 ⁇ m
  • the release layers of the examples were excellent in adhesion to the glass substrate and excellent in peelability from the resin substrate.
  • the release layer of the comparative example did not peel from the resin substrate and the glass substrate, and did not function as a release layer.
  • Example 4 Evaluation of transmittance [Example 4] Using a spin coater (condition: about 30 seconds at 800 rpm), the release layer forming composition obtained in Example 2-8 was applied as a glass substrate onto a 100 mm ⁇ 100 mm glass substrate (hereinafter the same). . The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.4 ⁇ m on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
  • the transmittance of the obtained film was measured using an ultraviolet-visible spectrophotometer (SIMADSU UV-2550 model number, manufactured by Shimadzu Corporation). The results are shown in FIG.
  • the transmittance of the obtained film was 1% or less with respect to the wavelength of 308 nm, indicating a transmittance that can be used as a sacrificial layer.

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Abstract

Provided is a composition for forming a release layer, which comprises a polyamic acid produced by reacting an aromatic diamine with an aromatic tetracarboxylic dianhydride and an organic solvent, wherein the aromatic diamine comprises an aromatic diamine containing an ester bond and/or an ether bond and/or the aromatic tetracarboxylic dianhydride contains an ester bond and/or an ether bond.

Description

剥離層形成用組成物Release layer forming composition
 本発明は、剥離層形成用組成物に関し、詳述すると、基体上に設ける剥離層を形成するための剥離層形成用組成物に関する。 The present invention relates to a release layer forming composition, and more particularly, to a release layer forming composition for forming a release layer provided on a substrate.
 近年、電子デバイスには、曲げるという機能付与や薄型化及び軽量化といった性能が求められている。このことから、従来の重く脆弱で曲げることができないガラス基板にかわって、軽量なフレキシブルプラスチック基板を用いることが求められる。また、新世代ディスプレイでは、軽量なフレキシブルプラスチック基板を用いる、アクティブフルカラー(active full-color)TFTディスプレイパネルの開発が求められている。そこで、樹脂フィルムを基板とした電子デバイスの製造方法が各種検討され始めており、新世代ディスプレイでは、既存のTFT設備を転用可能なプロセスで製造検討が進められている。 In recent years, electronic devices have been required to have the functions of bending, thinning and lightening. For this reason, it is required to use a lightweight flexible plastic substrate in place of the conventional glass substrate that is fragile and cannot be bent. In the new generation display, development of an active full-color TFT display panel using a lightweight flexible plastic substrate is required. Therefore, various methods for manufacturing electronic devices using a resin film as a substrate are being studied, and in the new generation display, manufacturing studies are being carried out in a process that can divert existing TFT equipment.
 特許文献1、2及び3は、ガラス基板上にアモルファスシリコン薄膜層を形成し、その薄膜層上にプラスチック基板を形成した後に、ガラス面側からレーザーを照射して、アモルファスシリコンの結晶化に伴い発生する水素ガスによりプラスチック基板をガラス基板から剥離する方法を開示する。また、特許文献4は、特許文献1~3開示の技術を用いて被剥離層(特許文献4において「被転写層」と記載される。)をプラスチックフィルムに貼りつけて液晶表示装置を完成させる方法を開示する。 In Patent Documents 1, 2, and 3, an amorphous silicon thin film layer is formed on a glass substrate, a plastic substrate is formed on the thin film layer, and then a laser is irradiated from the glass surface side to accompany crystallization of amorphous silicon. A method of peeling a plastic substrate from a glass substrate with generated hydrogen gas is disclosed. Further, Patent Document 4 uses a technique disclosed in Patent Documents 1 to 3 to complete a liquid crystal display device by attaching a layer to be peeled (described as “transfer target layer” in Patent Document 4) to a plastic film. A method is disclosed.
 しかし、特許文献1~4に開示された方法、特に特許文献4に開示された方法は、透光性の高い基板を使用することが必須であり、基板を通過させ、更に非晶質シリコンに含まれる水素を放出させるのに十分なエネルギーを与えるため、比較的大きなレーザー光の照射が必要とされ、被剥離層に損傷を与えてしまうという問題がある。また、レーザー処理に長時間を要し、大面積を有する被剥離層を剥離するのは困難であるため、デバイス作製の生産性を挙げることが難しいという問題もある。 However, in the methods disclosed in Patent Documents 1 to 4, particularly the method disclosed in Patent Document 4, it is essential to use a highly light-transmitting substrate. In order to give sufficient energy to release the contained hydrogen, it is necessary to irradiate a relatively large laser beam, and there is a problem that the layer to be peeled is damaged. In addition, since laser treatment takes a long time and it is difficult to peel off a peeled layer having a large area, there is a problem that it is difficult to increase the productivity of device fabrication.
特開平10-125929号公報JP 10-125929 A 特開平10-125931号公報Japanese Patent Laid-Open No. 10-125931 国際公開第2005/050754号International Publication No. 2005/050754 特開平10-125930号公報JP-A-10-125930
 本発明は、前記事情に鑑みてなされたものであり、フレキシブル電子デバイスの樹脂基板に損傷を与えることなく剥離することができる剥離層形成用組成物を提供することを目的とする。 This invention is made | formed in view of the said situation, and it aims at providing the composition for peeling layer formation which can peel without damaging the resin substrate of a flexible electronic device.
 本発明者らは、前記課題を解決すべく鋭意検討を重ねた結果、芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含む組成物において、前記芳香族ジアミンがエステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物がエステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含む場合に、基体との優れた密着性、及びフレキシブル電子デバイスとして用いられる樹脂基板との適度な密着性と適度な剥離性とを有する剥離層を形成できる組成物が得られることを見出し、本発明を完成させた。 As a result of intensive studies to solve the above problems, the inventors of the present invention include a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and a composition containing an organic solvent. The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond. When an anhydride is contained, a composition capable of forming a release layer having excellent adhesion to a substrate and appropriate adhesion to a resin substrate used as a flexible electronic device and appropriate release properties can be obtained. The headline and the present invention were completed.
 すなわち、本発明は、
1. 芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含み、
 前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物、
2. 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンが、式(A1)~(A42)からなる群から選ばれる少なくとも1種である1の剥離層形成用組成物、
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000013
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000015
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
3. 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物が、式(B1)~(B14)からなる群から選ばれる少なくとも1種である1又は2の剥離層形成用組成物、
Figure JPOXMLDOC01-appb-C000018
4. 前記芳香族テトラカルボン酸二無水物が、更にエステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物を含む1~3のいずれかの剥離層形成用組成物、
5. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものである4の剥離層形成用組成物、
6. 前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)~(C12)からなる群から選ばれる少なくとも1種である5の剥離層形成用組成物、
Figure JPOXMLDOC01-appb-C000019
7. 前記有機溶媒が、式(S1)で表されるアミド類、式(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1つを含む1~6のいずれかの剥離層形成用組成物、
Figure JPOXMLDOC01-appb-C000020
(式中、R1及びR2は、互いに独立して、炭素数1~10のアルキル基を表す。R3は、水素原子、又は炭素数1~10のアルキル基を表す。hは、自然数を表す。)
8. 1~7のいずれかの剥離層形成用組成物を用いて形成される剥離層、
9. 8の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法、
10. 8の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法、
11. 前記樹脂基板が、ポリイミドからなる基板である9又は10の製造方法
を提供する。
That is, the present invention
1. A polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent,
The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond. A composition for forming a release layer, comprising an acid dianhydride,
2. 1. A composition for forming a release layer, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42);
Figure JPOXMLDOC01-appb-C000011
Figure JPOXMLDOC01-appb-C000012
Figure JPOXMLDOC01-appb-C000013
Figure JPOXMLDOC01-appb-C000014
Figure JPOXMLDOC01-appb-C000015
Figure JPOXMLDOC01-appb-C000016
Figure JPOXMLDOC01-appb-C000017
3. The composition for forming a release layer according to 1 or 2, wherein the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (B1) to (B14) ,
Figure JPOXMLDOC01-appb-C000018
4). The release layer-forming composition according to any one of 1 to 3, wherein the aromatic tetracarboxylic dianhydride further contains an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond,
5. 4. The composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton, or a biphenyl skeleton,
6). 5. A composition for forming a release layer, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12);
Figure JPOXMLDOC01-appb-C000019
7). Any of 1 to 6, wherein the organic solvent includes at least one selected from amides represented by the formula (S1), amides represented by the formula (S2), and amides represented by the formula (S3) A release layer forming composition,
Figure JPOXMLDOC01-appb-C000020
(In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H represents a natural number. Represents.)
8). A release layer formed using the release layer-forming composition of any one of 1 to 7,
9. A method for producing a flexible electronic device comprising a resin substrate, comprising using a release layer of 8;
10. A method for producing a touch panel sensor comprising a resin substrate, comprising using a release layer of 8;
11. The manufacturing method according to 9 or 10, wherein the resin substrate is a substrate made of polyimide.
 本発明の剥離層形成用組成物を用いることで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有する膜を再現性よく得ることができる。本発明の組成物を用いることで、フレキシブル電子デバイスの製造プロセスにおいて、基体上に形成された樹脂基板や、更にその上に設けられる回路等に損傷を与えることなく、当該回路等とともに当該樹脂基板を当該基体から分離することが可能となる。したがって、本発明の剥離層形成用組成物は、樹脂基板を備えるフレキシブル電子デバイスの製造プロセスの簡便化やその歩留り向上等に寄与し得る。 By using the composition for forming a release layer of the present invention, it is possible to obtain a film having excellent adhesion to the substrate, moderate adhesion to the resin substrate, and moderate peelability with good reproducibility. By using the composition of the present invention, in the manufacturing process of the flexible electronic device, the resin substrate formed on the substrate and the circuit provided on the substrate are not damaged, and the resin substrate together with the circuit etc. Can be separated from the substrate. Therefore, the composition for forming a release layer of the present invention can contribute to simplification of the production process of a flexible electronic device including a resin substrate, improvement of its yield, and the like.
実施例4で測定した透過率を示すグラフである。6 is a graph showing the transmittance measured in Example 4.
 以下、本発明について、より詳細に説明する。
 本発明の剥離層形成用組成物は、芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含むものであって、前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むものである。ここで、本発明における剥離層とは、所定の目的でガラス基体直上に設けられる層であって、その典型例としては、フレキシブル電子デバイスの製造プロセスにおいて、基体と、ポリイミドといった樹脂からなるフレキシブル電子デバイスの樹脂基板との間に、当該樹脂基板を所定のプロセス中において固定するために設けられ、かつ、当該樹脂基板上に電子回路等の形成した後において当該樹脂基板が当該基体から容易に剥離できるようにするために設けられるものが挙げられる。
Hereinafter, the present invention will be described in more detail.
The composition for forming a release layer of the present invention comprises a polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent, wherein the aromatic diamine is an ester. An aromatic diamine including at least one of a bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes an aromatic tetracarboxylic dianhydride including at least one of an ester bond and an ether bond. . Here, the release layer in the present invention is a layer provided immediately above a glass substrate for a predetermined purpose. As a typical example, in a manufacturing process of a flexible electronic device, a flexible electronic made of a substrate and a resin such as polyimide is used. Provided between the resin substrate of the device to fix the resin substrate in a predetermined process, and after the electronic circuit or the like is formed on the resin substrate, the resin substrate is easily peeled off from the base The thing provided in order to be able to do is mentioned.
 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンは、その分子内にエステル結合及びエーテル結合の一方を含むか、あるいはこれらの両方を含むものである。 The aromatic diamine containing at least one of an ester bond and an ether bond contains one or both of an ester bond and an ether bond in the molecule.
 このような芳香族ジアミンとしては、複数の炭素数6~20の芳香族環がエステル結合又はエーテル結合で連結された構造を有するジアミンが挙げられる。前記芳香族環の具体例としては、ベンゼン環、ナフタレン環、アントラセン環、フェナントレン環等が挙げられる。中でも、ポリアミック酸の有機溶媒への溶解性を確保する観点から、2又は3個の芳香族環が、エステル結合又はエーテル結合で連結された構造を有するジアミンが好ましい。 Examples of such aromatic diamines include diamines having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds. Specific examples of the aromatic ring include a benzene ring, a naphthalene ring, an anthracene ring, and a phenanthrene ring. Among these, from the viewpoint of ensuring the solubility of polyamic acid in an organic solvent, a diamine having a structure in which two or three aromatic rings are connected by an ester bond or an ether bond is preferable.
 本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンの好ましい具体例としては、以下に示すものが挙げられる。 In the present invention, preferred specific examples of the aromatic diamine containing at least one of an ester bond and an ether bond include the following.
Figure JPOXMLDOC01-appb-C000021
Figure JPOXMLDOC01-appb-C000021
Figure JPOXMLDOC01-appb-C000022
Figure JPOXMLDOC01-appb-C000022
Figure JPOXMLDOC01-appb-C000023
Figure JPOXMLDOC01-appb-C000023
Figure JPOXMLDOC01-appb-C000024
Figure JPOXMLDOC01-appb-C000024
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000025
Figure JPOXMLDOC01-appb-C000026
Figure JPOXMLDOC01-appb-C000026
Figure JPOXMLDOC01-appb-C000027
Figure JPOXMLDOC01-appb-C000027
 前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物は、その分子内にエステル結合とエーテル結合の一方を含むか、あるいはこれらの両方ともを含むものである。 The aromatic tetracarboxylic dianhydride containing at least one of the ester bond and the ether bond contains one or both of the ester bond and the ether bond in the molecule.
 このような芳香族テトラカルボン酸二無水物としては、複数の炭素数6~20の芳香族環がエステル結合又はエーテル結合で連結された構造を有するテトラカルボン酸二無水物が挙げられる。前記芳香族環の具体例としては、前記と同様のものが挙げられる。中でも、ポリアミック酸の有機溶媒への溶解性を確保する観点から、3又は4個の芳香族環がエステル結合又はエーテル結合で連結された構造を有するものが好ましい。 Examples of such aromatic tetracarboxylic dianhydrides include tetracarboxylic dianhydrides having a structure in which a plurality of aromatic rings having 6 to 20 carbon atoms are connected by ester bonds or ether bonds. Specific examples of the aromatic ring include the same ones as described above. Among these, those having a structure in which three or four aromatic rings are connected by an ester bond or an ether bond are preferable from the viewpoint of ensuring the solubility of polyamic acid in an organic solvent.
 本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物の好ましい具体例としては、以下に示すものが挙げられる。 In the present invention, preferred specific examples of the aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond include the following.
Figure JPOXMLDOC01-appb-C000028
Figure JPOXMLDOC01-appb-C000028
 本発明においては、前述したエステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンとともに、それ以外のジアミンを用いることができる。 In the present invention, other diamines can be used together with the aromatic diamine containing at least one of the ester bond and the ether bond described above.
 このようなジアミンは、脂肪族ジアミン、芳香族ジアミンのいずれでもよいが、得られる薄膜の強度と耐熱性を確保する観点から、エステル結合及びエーテル結合のいずれも含まない芳香族ジアミンが好ましい。 Such a diamine may be either an aliphatic diamine or an aromatic diamine, but an aromatic diamine containing neither an ester bond nor an ether bond is preferred from the viewpoint of ensuring the strength and heat resistance of the resulting thin film.
 その具体例としては、1,4-ジアミノベンゼン(p-フェニレンジアミン)、1,3-ジアミノベンゼン(m-フェニレンジアミン)、1,2-ジアミノベンゼン(o-フェニレンジアミン)、2,4-ジアミノトルエン、2,5-ジアミノトルエン、2,6-ジアミノトルエン、4,6-ジメチル-m-フェニレンジアミン、2,5-ジメチル-p-フェニレンジアミン、2,6-ジメチル-p-フェニレンジアミン、2,4,6-トリメチル-1,3-フェニレンジアミン、2,3,5,6-テトラメチル-p-フェニレンジアミン、m-キシリレンジアミン、p-キシリレンジアミン、5-トリフルオロメチルベンゼン-1,3-ジアミン、5-トリフルオロメチルベンゼン-1,2-ジアミン、3,5-ビス(トリフルオロメチル)ベンゼン-1,2-ジアミン等のベンゼン核を1つ含むジアミン;1,2-ナフタレンジアミン、1,3-ナフタレンジアミン、1,4-ナフタレンジアミン、1,5-ナフタレンジアミン、1,6-ナフタレンジアミン、1,7-ナフタレンジアミン、1,8-ナフタレンジアミン、2,3-ナフタレンジアミン、2,6-ナフタレンジアミン、4,4'-ビフェニルジアミン、2,2'-ビス(トリフルオロメチル)-4,4'-ジアミノビフェニル、3,3'-ジメチル-4,4'-ジアミノジフェニルメタン、3,3'-ジカルボキシ-4,4'-ジアミノジフェニルメタン、3,3',5,5'-テトラメチル-4,4'-ジアミノジフェニルメタン、4,4'-ジアミノベンズアニリド、3,3'-ジクロロベンジジン、3,3'-ジメチルベンジジン、2,2'-ジメチルベンジジン、3,3'-ジアミノジフェニルメタン、3,4'-ジアミノジフェニルメタン、4,4'-ジアミノジフェニルメタン、2,2-ビス(3-アミノフェニル)プロパン、2,2-ビス(4-アミノフェニル)プロパン、2,2-ビス(3-アミノフェニル)-1,1,1,3,3,3-ヘキサフルオロプロパン、2,2-ビス(4-アミノフェニル)-1,1,1,3,3,3-ヘキサフルオロプロパン、3,3'-ジアミノジフェニルスルホキシド、3,4'-ジアミノジフェニルスルホキシド、4,4'-ジアミノジフェニルスルホキシド、3,3'-ビス(トリフルオロメチル)ビフェニル-4,4'-ジアミン、3,3',5,5'-テトラフルオロビフェニル-4,4'-ジアミン、4,4'-ジアミノオクタフルオロビフェニル等のベンゼン核を2つ含むジアミン;1,5-ジアミノアントラセン、2,6-ジアミノアントラセン、9,10-ジアミノアントラセン、1,8-ジアミノフェナントレン、2,7-ジアミノフェナントレン、3,6-ジアミノフェナントレン、9,10-ジアミノフェナントレン、1,3-ビス(3-アミノフェニル)ベンゼン、1,3-ビス(4-アミノフェニル)ベンゼン、1,4-ビス(3-アミノフェニル)ベンゼン、1,4-ビス(4-アミノフェニル)ベンゼン、1,3-ビス(3-アミノフェニルスルフィド)ベンゼン、1,3-ビス(4-アミノフェニルスルフィド)ベンゼン、1,4-ビス(4-アミノフェニルスルフィド)ベンゼン、1,3-ビス(3-アミノフェニルスルホン)ベンゼン、1,3-ビス(4-アミノフェニルスルホン)ベンゼン、1,4-ビス(4-アミノフェニルスルホン)ベンゼン、1,3-ビス[2-(4-アミノフェニル)イソプロピル]ベンゼン、1,4-ビス[2-(3-アミノフェニル)イソプロピル]ベンゼン、1,4-ビス[2-(4-アミノフェニル)イソプロピル]ベンゼン等のベンゼン核を3つ含むジアミン等が挙げられるが、これらに限定されない。これらは、1種単独でも、2種以上を組み合わせて用いることもできる。 Specific examples thereof include 1,4-diaminobenzene (p-phenylenediamine), 1,3-diaminobenzene (m-phenylenediamine), 1,2-diaminobenzene (o-phenylenediamine), and 2,4-diamino. Toluene, 2,5-diaminotoluene, 2,6-diaminotoluene, 4,6-dimethyl-m-phenylenediamine, 2,5-dimethyl-p-phenylenediamine, 2,6-dimethyl-p-phenylenediamine, 2 , 4,6-trimethyl-1,3-phenylenediamine, 2,3,5,6-tetramethyl-p-phenylenediamine, m-xylylenediamine, p-xylylenediamine, 5-trifluoromethylbenzene-1 , 3-diamine, 5-trifluoromethylbenzene-1,2-diamine, 3,5-bis (trifluoromethyl) benzene-1,2-dialysis Diamine containing one benzene nucleus such as 1,2-naphthalenediamine, 1,3-naphthalenediamine, 1,4-naphthalenediamine, 1,5-naphthalenediamine, 1,6-naphthalenediamine, 1,7-naphthalene Diamine, 1,8-naphthalenediamine, 2,3-naphthalenediamine, 2,6-naphthalenediamine, 4,4'-biphenyldiamine, 2,2'-bis (trifluoromethyl) -4,4'-diaminobiphenyl 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 3,3'-dicarboxy-4,4'-diaminodiphenylmethane, 3,3 ', 5,5'-tetramethyl-4,4'- Diaminodiphenylmethane, 4,4'-diaminobenzanilide, 3,3'-dichlorobenzidine, 3,3'-dimethylbenzidine, 2,2'-dimethylbenzidine, 3,3'-diaminodipheni Methane, 3,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylmethane, 2,2-bis (3-aminophenyl) propane, 2,2-bis (4-aminophenyl) propane, 2,2-bis ( 3-aminophenyl) -1,1,1,3,3,3-hexafluoropropane, 2,2-bis (4-aminophenyl) -1,1,1,3,3,3-hexafluoropropane, 3,3'-diaminodiphenyl sulfoxide, 3,4'-diaminodiphenyl sulfoxide, 4,4'-diaminodiphenyl sulfoxide, 3,3'-bis (trifluoromethyl) biphenyl-4,4'-diamine, 3,3 Diamines containing two benzene nuclei such as', 5,5'-tetrafluorobiphenyl-4,4'-diamine, 4,4'-diaminooctafluorobiphenyl; 1,5-diaminoanthracene, 2,6-diaminoanthracene 9,10-diaminoanthracene, 1,8-diaminophenanthrene, 2,7-diaminophenanthrene, 3,6-diaminophenanthrene, 9,10-diaminophenanthrene, 1,3-bis (3-aminophenyl) benzene, 1, 3-bis (4-aminophenyl) benzene, 1,4-bis (3-aminophenyl) benzene, 1,4-bis (4-aminophenyl) benzene, 1,3-bis (3-aminophenyl sulfide) benzene 1,3-bis (4-aminophenylsulfide) benzene, 1,4-bis (4-aminophenylsulfide) benzene, 1,3-bis (3-aminophenylsulfone) benzene, 1,3-bis (4 -Aminophenylsulfone) benzene, 1,4-bis (4-aminophenylsulfone) benzene, 1,3-bis [2- (4-aminophenyl) isopropyl] benzene Examples of the diamine include three benzene nuclei such as 1,4-bis [2- (3-aminophenyl) isopropyl] benzene and 1,4-bis [2- (4-aminophenyl) isopropyl] benzene. It is not limited to these. These may be used alone or in combination of two or more.
 本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンとともに、それ以外のジアミンを用いる場合、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンの使用量は、全ジアミン中、好ましくは70モル%以上、より好ましくは80モル%以上、より一層好ましくは90モル%以上、更に好ましくは95モル%以上である。このような使用量を採用することで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有する膜を再現性よく得ることができる。 In the present invention, when other diamine is used together with an aromatic diamine containing at least one of an ester bond and an ether bond, the amount of the aromatic diamine containing at least one of an ester bond and an ether bond is preferably used in all diamines. Is 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more. By adopting such a use amount, it is possible to obtain a film having excellent adhesion to the substrate, moderate adhesion to the resin substrate, and moderate peelability with good reproducibility.
 本発明においては、前述したエステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物とともに、それ以外のテトラカルボン酸二無水物を用いることができる。 In the present invention, other tetracarboxylic dianhydrides can be used together with the aromatic tetracarboxylic dianhydride containing at least one of the above-mentioned ester bond and ether bond.
 このようなテトラカルボン酸二無水物は、脂肪族テトラカルボン酸二無水物、芳香族テトラカルボン酸二無水物のいずれでもよいが、得られる薄膜の強度と耐熱性を確保する観点から、エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が好ましい。 Such a tetracarboxylic dianhydride may be either an aliphatic tetracarboxylic dianhydride or an aromatic tetracarboxylic dianhydride, but from the viewpoint of ensuring the strength and heat resistance of the resulting thin film, an ester bond And an aromatic tetracarboxylic dianhydride which does not contain any ether bond.
 その具体例としては、ピロメリット酸二無水物、ベンゼン-1,2,3,4-テトラカルボン酸二無水物、ナフタレン-1,2,3,4-テトラカルボン酸二無水物、ナフタレン-1,2,5,6-テトラカルボン酸二無水物、ナフタレン-1,2,6,7-テトラカルボン酸二無水物、ナフタレン-1,2,7,8-テトラカルボン酸二無水物、ナフタレン-2,3,5,6-テトラカルボン酸二無水物、ナフタレン-2,3,6,7-テトラカルボン酸二無水物、ナフタレン-1,4,5,8-テトラカルボン酸二無水物、ビフェニル-2,2',3,3'-テトラカルボン酸二無水物、ビフェニル-2,3,3',4'-テトラカルボン酸二無水物、ビフェニル-3,3',4,4'-テトラカルボン酸二無水物、アントラセン-1,2,3,4-テトラカルボン酸二無水物、アントラセン-1,2,5,6-テトラカルボン酸二無水物、アントラセン-1,2,6,7-テトラカルボン酸二無水物、アントラセン-1,2,7,8-テトラカルボン酸二無水物、アントラセン-2,3,6,7-テトラカルボン酸二無水物、フェナントレン-1,2,3,4-テトラカルボン酸二無水物、フェナントレン-1,2,5,6-テトラカルボン酸二無水物、フェナントレン-1,2,6,7-テトラカルボン酸二無水物、フェナントレン-1,2,7,8-テトラカルボン酸二無水物、フェナントレン-1,2,9,10-テトラカルボン酸二無水物、フェナントレン-2,3,5,6-テトラカルボン酸二無水物、フェナントレン-2,3,6,7-テトラカルボン酸二無水物、フェナントレン-2,3,9,10-テトラカルボン酸二無水物、フェナントレン-3,4,5,6-テトラカルボン酸二無水物、フェナントレン-3,4,9,10-テトラカルボン酸二無水物等が挙げられるが、これらに限定されない。これらは、1種単独でも、2種以上を組み合わせて用いることもできる。 Specific examples thereof include pyromellitic dianhydride, benzene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1,2,3,4-tetracarboxylic dianhydride, naphthalene-1 , 2,5,6-tetracarboxylic dianhydride, naphthalene-1,2,6,7-tetracarboxylic dianhydride, naphthalene-1,2,7,8-tetracarboxylic dianhydride, naphthalene- 2,3,5,6-tetracarboxylic dianhydride, naphthalene-2,3,6,7-tetracarboxylic dianhydride, naphthalene-1,4,5,8-tetracarboxylic dianhydride, biphenyl -2,2 ', 3,3'-tetracarboxylic dianhydride, biphenyl-2,3,3', 4'-tetracarboxylic dianhydride, biphenyl-3,3 ', 4,4'-tetra Carboxylic dianhydride, anthracene-1,2,3,4-tetracarboxylic dianhydride, anthracene-1, 2,5,6-tetracarboxylic dianhydride, anthracene-1,2,6,7-tetracarboxylic dianhydride, anthracene-1,2,7,8-tetracarboxylic dianhydride, anthracene-2 , 3,6,7-tetracarboxylic dianhydride, phenanthrene-1,2,3,4-tetracarboxylic dianhydride, phenanthrene-1,2,5,6-tetracarboxylic dianhydride, phenanthrene- 1,2,6,7-tetracarboxylic dianhydride, phenanthrene-1,2,7,8-tetracarboxylic dianhydride, phenanthrene-1,2,9,10-tetracarboxylic dianhydride, phenanthrene -2,3,5,6-tetracarboxylic dianhydride, phenanthrene-2,3,6,7-tetracarboxylic dianhydride, phenanthrene-2,3,9,10-tetracarboxylic dianhydride, Phenanthrene-3,4,5,6-tetracar Phosphate dianhydride, although phenanthrene-3,4,9,10-tetracarboxylic dianhydride, and the like, without limitation. These may be used alone or in combination of two or more.
 特に、エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物としては、耐熱性を確保する観点から、式(C1)~(C12)からなる群から選ばれる少なくとも1種が好ましく、式(C1)及び式(C9)からなる群から選ばれる少なくとも1種がより好ましい。 In particular, the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is preferably at least one selected from the group consisting of formulas (C1) to (C12) from the viewpoint of ensuring heat resistance. , At least one selected from the group consisting of formula (C1) and formula (C9) is more preferable.
Figure JPOXMLDOC01-appb-C000029
Figure JPOXMLDOC01-appb-C000029
 本発明において、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物とともに、それ以外のテトラカルボン酸二無水物を用いる場合、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物の使用量は、全テトラカルボン酸二無水物中、好ましくは70モル%以上、より好ましくは80モル%以上、より一層好ましくは90モル%以上、更に好ましくは95モル%以上である。このような使用量を採用することで、基体との十分な密着性及び樹脂基板との適度な密着性と適度な剥離性を有する膜を再現性よく得ることができる。 In the present invention, when an aromatic tetracarboxylic dianhydride containing at least one of an ester bond and an ether bond is used together with another tetracarboxylic dianhydride, an aromatic tetracarboxylic acid containing at least one of an ester bond and an ether bond is used. The amount of carboxylic dianhydride used is preferably 70 mol% or more, more preferably 80 mol% or more, still more preferably 90 mol% or more, and still more preferably 95 mol% or more in the total tetracarboxylic dianhydride. It is. By adopting such a usage amount, it is possible to obtain a film having sufficient reproducibility with sufficient adhesion to the substrate, appropriate adhesion to the resin substrate, and appropriate peelability.
 以上説明したジアミンとテトラカルボン酸二無水物とを反応させることで、本発明に係る剥離層形成用組成物に含まれるポリアミック酸を得ることができる。 The polyamic acid contained in the composition for forming a release layer according to the present invention can be obtained by reacting the diamine described above with tetracarboxylic dianhydride.
 このような反応に用いる有機溶媒は、反応に悪影響を及ぼさない限り特に限定されないが、その具体例としては、m-クレゾール、2-ピロリドン、N-メチル-2-ピロリドン、N-エチル-2-ピロリドン、N-ビニル-2-ピロリドン、N,N-ジメチルアセトアミド、N,N-ジメチルホルムアミド、3-メトキシ-N,N-ジメチルプロピルアミド、3-エトキシ-N,N-ジメチルプロピルアミド、3-プロポキシ-N,N-ジメチルプロピルアミド、3-イソプロポキシ-N,N-ジメチルプロピルアミド、3-ブトキシ-N,N-ジメチルプロピルアミド、3-sec-ブトキシ-N,N-ジメチルプロピルアミド、3-tert-ブトキシ-N,N-ジメチルプロピルアミド、γ-ブチロラクトン等が挙げられる。なお、有機溶媒は、1種単独で又は2種以上を組み合わせて使用してもよい。 The organic solvent used in such a reaction is not particularly limited as long as it does not adversely affect the reaction. Specific examples thereof include m-cresol, 2-pyrrolidone, N-methyl-2-pyrrolidone, N-ethyl-2- Pyrrolidone, N-vinyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, 3-methoxy-N, N-dimethylpropylamide, 3-ethoxy-N, N-dimethylpropylamide, 3- Propoxy-N, N-dimethylpropylamide, 3-isopropoxy-N, N-dimethylpropylamide, 3-butoxy-N, N-dimethylpropylamide, 3-sec-butoxy-N, N-dimethylpropylamide, 3 -Tert-butoxy-N, N-dimethylpropylamide, γ-butyrolactone and the like. In addition, you may use an organic solvent individually by 1 type or in combination of 2 or more types.
 特に、反応に用いる有機溶媒は、ジアミン及びテトラカルボン酸二無水物並びにポリアミック酸をよく溶解することから、式(S1)で表されるアミド類、(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1種が好ましい。 In particular, since the organic solvent used in the reaction dissolves diamine, tetracarboxylic dianhydride and polyamic acid well, amides represented by formula (S1), amides represented by formula (S2) and formula ( At least one selected from amides represented by S3) is preferred.
Figure JPOXMLDOC01-appb-C000030
Figure JPOXMLDOC01-appb-C000030
 式中、R1及びR2は、互いに独立して、炭素数1~10のアルキル基を表す。R3は、水素原子、又は炭素数1~10のアルキル基を表す。hは、自然数を表すが、好ましくは1~3、より好ましくは1又は2である。 In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. h represents a natural number, preferably 1 to 3, more preferably 1 or 2.
 炭素数1~10のアルキル基としては、メチル基、エチル基、n-プロピル基、イソプロピル基、n-ブチル基、イソブチル基、s-ブチル基、t-ブチル基、n-ペンチル基、n-ヘキシル基、n-ヘプチル基、n-オクチル基、n-ノニル基、n-デシル基等が挙げられる。これらのうち、炭素数1~3のアルキル基が好ましく、炭素数1又は2のアルキル基がより好ましい。 Examples of the alkyl group having 1 to 10 carbon atoms include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, isobutyl group, s-butyl group, t-butyl group, n-pentyl group, n- Examples include hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like. Of these, alkyl groups having 1 to 3 carbon atoms are preferable, and alkyl groups having 1 or 2 carbon atoms are more preferable.
 反応温度は、用いる溶媒の融点から沸点までの範囲で適宜設定すればよく、通常0~100℃程度であるが、得られるポリアミック酸の溶液中でのイミド化を防いでポリアミック酸単位の高含有量を維持するためには、好ましくは0~70℃程度であり、より好ましくは0~60℃程度であり、より一層好ましくは0~50℃程度である。 The reaction temperature may be appropriately set in the range from the melting point to the boiling point of the solvent used, and is usually about 0 to 100 ° C., but it prevents imidization in the solution of the resulting polyamic acid and contains a high content of polyamic acid units. In order to maintain the amount, it is preferably about 0 to 70 ° C, more preferably about 0 to 60 ° C, and still more preferably about 0 to 50 ° C.
 反応時間は、反応温度や原料物質の反応性に依存するため一概に規定できないが、通常1~100時間程度である。 The reaction time depends on the reaction temperature and the reactivity of the raw material, and cannot be specified unconditionally, but is usually about 1 to 100 hours.
 以上説明した方法によって、目的とするポリアミック酸を含む反応溶液を得ることができる。 By the method described above, a target reaction solution containing polyamic acid can be obtained.
 前記ポリアミック酸の重量平均分子量は、5,000~1,000,000が好ましく、10,000~500,000がより好ましく、ハンドリング性の観点から15,000~200,000がより一層好ましい。なお、本発明において重量平均分子量は、ゲルパーミエーションクロマトグラフィー(GPC)分析による標準ポリスチレン換算で得られる平均分子量である。 The weight average molecular weight of the polyamic acid is preferably 5,000 to 1,000,000, more preferably 10,000 to 500,000, and even more preferably 15,000 to 200,000 from the viewpoint of handling properties. In the present invention, the weight average molecular weight is an average molecular weight obtained in terms of standard polystyrene by gel permeation chromatography (GPC) analysis.
 本発明においては、通常、前記反応溶液をろ過した後、そのろ液をそのまま、又は希釈若しくは濃縮して得られる溶液を、本発明の剥離層形成用組成物として用いることができる。このようにすることで、得られる剥離層の密着性、剥離性等の悪化の原因となり得る不純物の混入を低減できるだけでなく、効率よく剥離層形成用組成物を得ることができる。また、前記反応溶液からポリアミック酸を単離した後、再度溶媒に溶解して剥離層形成用組成物としてもよい。この場合の溶媒としては、前述した反応に用いる有機溶媒等が挙げられる。 In the present invention, usually, after filtering the reaction solution, a solution obtained by diluting or concentrating the filtrate as it is can be used as the release layer forming composition of the present invention. By doing in this way, not only can mixing of the impurity which can cause deterioration of the adhesiveness of the obtained peeling layer, peelability, etc., but the composition for peeling layer formation can be obtained efficiently. Further, after isolating the polyamic acid from the reaction solution, it may be dissolved again in a solvent to form a release layer forming composition. Examples of the solvent in this case include organic solvents used in the above-described reaction.
 希釈に用いる溶媒は、特に限定されず、その具体例としては、前記反応の反応溶媒の具体例と同様のものが挙げられる。希釈に用いる溶媒は、1種単独で又は2種以上を組み合わせて使用してもよい。中でも、ポリアミック酸をよく溶解することから、N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド、N-メチル-2-ピロリドン、1,3-ジメチル-2-イミダゾリジノン、N-エチル-2-ピロリドン、γ-ブチロラクトンが好ましく、N-メチル-2-ピロリドンがより好ましい。 The solvent used for dilution is not particularly limited, and specific examples thereof include those similar to the specific examples of the reaction solvent for the reaction. The solvent used for dilution may be used singly or in combination of two or more. Among them, N, N-dimethylformamide, N, N-dimethylacetamide, N-methyl-2-pyrrolidone, 1,3-dimethyl-2-imidazolidinone, N-ethyl-2 are used because they dissolve polyamic acid well. -Pyrrolidone and γ-butyrolactone are preferred, and N-methyl-2-pyrrolidone is more preferred.
 また、単独ではポリアミック酸を溶解しない溶媒であっても、ポリアミック酸が析出しない範囲であれば、本発明の剥離層形成用組成物に混合することができる。特に、エチルセロソルブ、ブチルセロソルブ、エチルカルビトール、ブチルカルビトール、エチルカルビトールアセテート、エチレングリコール、1-メトキシ-2-プロパノール、1-エトキシ-2-プロパノール、1-ブトキシ-2-プロパノール、1-フェノキシ-2-プロパノール、プロピレングリコールモノアセテート、プロピレングリコールジアセテート、プロピレングリコール-1-モノメチルエーテル-2-アセテート、プロピレングリコール-1-モノエチルエーテル-2-アセテート、ジプロピレングリコール、2-(2-エトキシプロポキシ)プロパノール、乳酸メチル、乳酸エチル、乳酸n-プロピル、乳酸n-ブチル、乳酸イソアミル等の低表面張力を有する溶媒を適度に混在させることができる。これにより、基板への塗布時に塗膜均一性が向上することが知られており、本発明の剥離層形成用組成物においても好適に用いられる。 Further, even if the solvent alone does not dissolve the polyamic acid, it can be mixed with the release layer forming composition of the present invention as long as the polyamic acid does not precipitate. In particular, ethyl cellosolve, butyl cellosolve, ethyl carbitol, butyl carbitol, ethyl carbitol acetate, ethylene glycol, 1-methoxy-2-propanol, 1-ethoxy-2-propanol, 1-butoxy-2-propanol, 1-phenoxy -2-propanol, propylene glycol monoacetate, propylene glycol diacetate, propylene glycol-1-monomethyl ether-2-acetate, propylene glycol-1-monoethyl ether-2-acetate, dipropylene glycol, 2- (2-ethoxy A solvent having a low surface tension such as propoxy) propanol, methyl lactate, ethyl lactate, n-propyl lactate, n-butyl lactate and isoamyl lactate can be mixed appropriately. Thereby, it is known that the coating film uniformity is improved upon application to the substrate, and it is also suitably used in the composition for forming a release layer of the present invention.
 本発明の剥離層形成用組成物におけるポリアミック酸の濃度は、作製する剥離層の厚み、組成物の粘度等を勘案して適宜設定するものではあるが、通常1~30質量%程度、好ましくは1~20質量%程度である。このような濃度とすることで、0.05~5μm程度の厚さの剥離層を再現性よく得ることができる。なお、ポリアミック酸の濃度は、ポリアミック酸の原料であるジアミンとテトラカルボン酸二無水物の使用量を調整する、前記反応溶液をろ過した後そのろ液を希釈又は濃縮する、単離したポリアミック酸を溶媒に溶解させる際にその量を調整する等して調整することができる。 The concentration of the polyamic acid in the composition for forming a release layer of the present invention is appropriately set in consideration of the thickness of the release layer to be produced, the viscosity of the composition, etc., but is usually about 1 to 30% by mass, preferably It is about 1 to 20% by mass. By setting such a concentration, a release layer having a thickness of about 0.05 to 5 μm can be obtained with good reproducibility. The concentration of the polyamic acid is adjusted to adjust the amount of diamine and tetracarboxylic dianhydride used as the raw material of the polyamic acid. After the reaction solution is filtered, the filtrate is diluted or concentrated. The amount can be adjusted by, for example, adjusting the amount thereof when dissolved in a solvent.
 また、剥離層形成用組成物の粘度は、作製する剥離層の厚み等を勘案して適宜設定するものではあるが、特に0.05~5μm程度の厚さの膜を再現性よく得ること目的とする場合、通常、25℃で10~10,000mPa・s程度、好ましくは20~5,000mPa・s程度である。ここで、粘度は、市販の液体の粘度測定用粘度計を使用して、例えば、JIS K7117-2に記載の手順を参照して、組成物の温度25℃の条件にて測定することができる。好ましくは、粘度計としては、円錐平板型(コーンプレート型)回転粘度計を使用し、好ましくは同型の粘度計で標準コーンロータとして1°34’×R24を使用して、組成物の温度25℃の条件にて測定することができる。このような回転粘度計としては、例えば、東機産業(株)製TVE-25Lが挙げられる。 The viscosity of the release layer-forming composition is appropriately set in consideration of the thickness of the release layer to be produced, etc. In particular, it is desirable to obtain a film having a thickness of about 0.05 to 5 μm with good reproducibility. Is usually about 10 to 10,000 mPa · s at 25 ° C., preferably about 20 to 5,000 mPa · s. Here, the viscosity can be measured using a commercially available liquid viscosity measurement viscometer, for example, with reference to the procedure described in JIS K7117-2 at a temperature of the composition of 25 ° C. . Preferably, a conical plate type (cone plate type) rotational viscometer is used as the viscometer, and preferably the composition temperature is 25 ° C. using 1 ° 34 ′ × R24 as a standard cone rotor. It can be measured under the condition of ° C. An example of such a rotational viscometer is TVE-25L manufactured by Toki Sangyo Co., Ltd.
 なお、本発明に係る剥離層形成用組成物は、ポリアミック酸と有機溶媒のほかに、例えば膜強度を向上させるために、架橋剤等の成分を含んでもよい。 In addition, the composition for forming a release layer according to the present invention may contain a component such as a crosslinking agent in addition to the polyamic acid and the organic solvent, for example, in order to improve the film strength.
 以上説明した本発明の剥離層形成組成物を基体に塗布し、得られた塗膜を加熱してポリアミック酸を熱イミド化することで、基体との優れた密着性、及び樹脂基板との適度な密着性と適度な剥離性とを有するポリイミド膜からなる剥離層を得ることができる。 By applying the release layer-forming composition of the present invention described above to a substrate, and heating the resulting coating to thermally imidize the polyamic acid, it has excellent adhesion to the substrate, and moderate to the resin substrate. It is possible to obtain a release layer made of a polyimide film having good adhesion and moderate peelability.
 本発明の剥離層を基体上に形成する場合、剥離層は基体の一部表面に形成されていてもよいし、全面に形成されていてもよい。基体の一部表面に剥離層を形成する態様としては、基体表面のうち所定の範囲にのみ剥離層を形成する態様、基体表面全面にドットパターン、ラインアンドスペースパターン等のパターン状に剥離層を形成する態様等がある。なお、本発明において、基体とは、その表面に本発明に係る剥離層形成用組成物が塗られるものであって、フレキシブル電子デバイス等の製造に用いられるものを意味する。 When the release layer of the present invention is formed on a substrate, the release layer may be formed on a part of the substrate or the entire surface. As an aspect of forming a release layer on a part of the surface of the substrate, an embodiment in which the release layer is formed only within a predetermined range of the substrate surface, a release layer is formed in a pattern such as a dot pattern or a line and space pattern on the entire surface of the substrate. There are forms to be formed. In addition, in this invention, a base | substrate means what is used for manufacture of a flexible electronic device etc. by which the composition for peeling layer formation concerning this invention is applied to the surface.
 基体(基材)としては、例えば、ガラス、プラスチック(ポリカーボネート、ポリメタクリレート、ポリスチレン、ポリエステル、ポリオレフィン、エポキシ、メラミン、トリアセチルセルロース、ABS、AS、ノルボルネン系樹脂等)、金属(シリコンウエハ等)、木材、紙、スレート等が挙げられるが、特に、本発明に係る剥離層形成用組成物から得られる剥離層がそれに対する十分な密着性を有することから、ガラスが好ましい。なお、基体表面は、単一の材料で構成されていてもよく、2以上の材料で構成されていてもよい。2以上の材料で基体表面が構成される態様としては、基体表面のうち、ある範囲はある材料で構成され、その余の表面はその他の材料で構成されている態様、基体表面全体にドットパターン、ラインアンドスペースパターン等のパターン状にある材料がその他の材料中に存在する態様等がある。 Examples of the substrate (substrate) include glass, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine, triacetyl cellulose, ABS, AS, norbornene resin, etc.), metal (silicon wafer, etc.), Although wood, paper, slate, etc. are mentioned, since the peeling layer obtained from the composition for peeling layer formation which concerns on this invention has sufficient adhesiveness with respect to it, glass is preferable. In addition, the base | substrate surface may be comprised with the single material and may be comprised with two or more materials. As an aspect in which the substrate surface is constituted by two or more materials, a certain range of the substrate surface is constituted by a certain material, and the other surface is constituted by another material. A dot pattern is formed on the entire substrate surface. There is a mode in which a material in a pattern such as a line and space pattern is present in other materials.
 塗布する方法は、特に限定されないが、例えば、キャストコート法、スピンコート法、ブレードコート法、ディップコート法、ロールコート法、バーコート法、ダイコート法、インクジェット法、印刷法(凸版、凹版、平版、スクリーン印刷等)等が挙げられる。 The coating method is not particularly limited. For example, a cast coating method, a spin coating method, a blade coating method, a dip coating method, a roll coating method, a bar coating method, a die coating method, an ink jet method, a printing method (a relief plate, an intaglio plate, a planographic plate). , Screen printing, etc.).
 イミド化するための加熱温度は、通常50~550℃の範囲内で適宜決定されるが、好ましくは200℃以上、また、好ましくは500℃以下である。加熱温度をこのようにすることで、得られる膜の脆弱化を防ぎつつ、イミド化反応を十分に進行させることが可能となる。加熱時間は、加熱温度によって異なるため一概に規定できないが、通常5分~5時間である。また、イミド化率は、50~100%の範囲であればよい。 The heating temperature for imidization is usually appropriately determined within the range of 50 to 550 ° C., but is preferably 200 ° C. or higher, and preferably 500 ° C. or lower. By setting the heating temperature in this way, it is possible to sufficiently advance the imidization reaction while preventing the obtained film from being weakened. The heating time varies depending on the heating temperature, and cannot be generally defined, but is usually 5 minutes to 5 hours. The imidization rate may be in the range of 50 to 100%.
 本発明における加熱態様の好ましい一例としては、50~100℃で5分間~2時間加熱した後に、そのまま段階的に加熱温度を上昇させて最終的に375℃超~450℃で30分~4時間加熱する手法が挙げられる。特に、50~100℃で5分間~2時間加熱した後に、100℃超~375℃で5分間~2時間、最後に375℃超~450℃で30分~4時間加熱することが好ましい。 As a preferred example of the heating mode in the present invention, after heating at 50 to 100 ° C. for 5 minutes to 2 hours, the heating temperature is raised stepwise as it is, and finally from 375 ° C. to 450 ° C. for 30 minutes to 4 hours. The method of heating is mentioned. In particular, after heating at 50 to 100 ° C. for 5 minutes to 2 hours, it is preferable to heat at over 100 ° C. to 375 ° C. for 5 minutes to 2 hours, and finally at over 375 ° C. to 450 ° C. for 30 minutes to 4 hours.
 加熱に用いる器具としては、例えば、ホットプレート、オーブン等が挙げられる。加熱雰囲気は、空気下であっても不活性ガス下であってもよく、また、常圧下であっても減圧下であってもよい。 Examples of equipment used for heating include a hot plate and an oven. The heating atmosphere may be under air or under an inert gas, and may be under normal pressure or under reduced pressure.
 剥離層の厚さは、通常0.01~50μm程度、生産性の観点から、好ましくは0.05~20μm程度、より好ましくは0.05~5μm程度であり、加熱前の塗膜の厚さを調整して所望の厚さを実現する。 The thickness of the release layer is usually about 0.01 to 50 μm, preferably from about 0.05 to 20 μm, more preferably about 0.05 to 5 μm from the viewpoint of productivity. To achieve the desired thickness.
 以上説明した剥離層は、基体、特にガラスの基体との優れた密着性及び樹脂基板との適度な密着性と適度な剥離性を有する。それ故、本発明に係る剥離層は、フレキシブル電子デバイスの製造プロセスにおいて、当該デバイスの樹脂基板に損傷を与えることなく、当該樹脂基板を、その樹脂基板上に形成された回路等とともに、基体から剥離させるために好適に用いることができる。 The release layer described above has excellent adhesion to a substrate, particularly a glass substrate, moderate adhesion to a resin substrate, and moderate release. Therefore, the release layer according to the present invention, in the manufacturing process of the flexible electronic device, without damaging the resin substrate of the device, the resin substrate together with the circuit and the like formed on the resin substrate from the substrate. It can be suitably used for peeling.
 以下、本発明の剥離層を用いたフレキシブル電子デバイスの製造方法の一例について説明する。
 本発明に係る剥離層形成用組成物を用いて、前述の方法によって、ガラス基体上に剥離層を形成する。この剥離層の上に、樹脂基板を形成するための樹脂溶液を塗布し、この塗膜を加熱することで、本発明に係る剥離層を介して、ガラス基体に固定された樹脂基板を形成する。この際、剥離層を全て覆うようにして、剥離層の面積と比較して大きい面積で、樹脂基板を形成する。前記樹脂基板としては、フレキシブル電子デバイスの樹脂基板として代表的なポリイミドからなる樹脂基板等が挙げられ、それを形成するための樹脂溶液としては、ポリイミド溶液やポリアミック酸溶液が挙げられる。当該樹脂基板の形成方法は、常法に従えばよい。
Hereinafter, an example of the manufacturing method of the flexible electronic device using the peeling layer of this invention is demonstrated.
By using the composition for forming a release layer according to the present invention, a release layer is formed on a glass substrate by the method described above. On this release layer, a resin solution for forming a resin substrate is applied, and this coating film is heated to form a resin substrate fixed to the glass substrate via the release layer according to the present invention. . At this time, the resin substrate is formed with a larger area than the area of the release layer so as to cover the entire release layer. Examples of the resin substrate include a resin substrate made of polyimide which is typical as a resin substrate of a flexible electronic device, and examples of the resin solution for forming the resin substrate include a polyimide solution and a polyamic acid solution. The method for forming the resin substrate may follow a conventional method.
 次に、本発明に係る剥離層を介して基体に固定された当該樹脂基板の上に、所望の回路を形成し、その後、例えば剥離層に沿って樹脂基板をカットし、この回路とともに樹脂基板を剥離層から剥離して、樹脂基板と基体とを分離する。この際、基体の一部を剥離層とともにカットしてもよい。 Next, a desired circuit is formed on the resin substrate fixed to the base via the release layer according to the present invention, and then, for example, the resin substrate is cut along the release layer. Is peeled from the release layer to separate the resin substrate and the substrate. At this time, a part of the substrate may be cut together with the release layer.
 一方、フレキシブルディスプレイの製造において、これまで高輝度LEDや三次元半導体パッケージ等の製造において使用されてきたレーザーリフトオフ法(LLO法)を用いてガラスキャリアからポリマー基板を好適に剥離できることが報告されている(特開2013-147599号公報)。フレキシブルディスプレイの製造では、ガラスキャリア上にポリイミド等からなるポリマー基板を設け、次にその基板の上に電極等を含む回路等を形成し、最終的にこの回路等とともに基板をガラスキャリアから剥離する必要がある。この剥離工程においてLLO法を採用し、すなわち、回路等が形成された面とは反対の面から、波長308nmの光線をガラスキャリアに照射すると、当該波長の光線がガラスキャリアを透過し、ガラスキャリア近傍のポリマー(ポリイミド)のみがこの光線を吸収して蒸発(昇華)する。その結果、ディスプレイの性能を決定づけることとなる、基板上に設けられた回路等に影響を与えることなく、ガラスキャリアからの基板の剥離を選択的に実行可能であると報告されている。 On the other hand, in the manufacture of flexible displays, it has been reported that the polymer substrate can be suitably peeled from the glass carrier using the laser lift-off method (LLO method) that has been used in the manufacture of high-brightness LEDs, three-dimensional semiconductor packages, and the like. (JP 2013-147599 A). In manufacturing a flexible display, a polymer substrate made of polyimide or the like is provided on a glass carrier, and then a circuit or the like including an electrode or the like is formed on the substrate. Finally, the substrate is peeled off from the glass carrier together with the circuit or the like. There is a need. In this peeling step, the LLO method is adopted, that is, when a glass carrier is irradiated with a light beam having a wavelength of 308 nm from the surface opposite to the surface on which a circuit or the like is formed, the light beam with the wavelength passes through the glass carrier, Only the nearby polymer (polyimide) absorbs this light and evaporates (sublimates). As a result, it has been reported that peeling of the substrate from the glass carrier can be performed selectively without affecting the circuit or the like provided on the substrate, which determines the performance of the display.
 本発明に係る剥離層を介して基体に固定された当該樹脂基板の上に、所望の回路を形成し、その後、LLO法を採用すると、該剥離層のみがこの光線を吸収して蒸発(昇華)する。すなわち、該剥離層が犠牲となり(犠牲層として働く)、ガラスキャリアからの基板の剥離を選択的に実行可能となる。本発明の剥離層形成用組成物は、LLO法の適用が可能となる特定波長(例えば308nm)の光線を十分に吸収するという特徴を持つため、LLO法の犠牲層として用いることができる。 When a desired circuit is formed on the resin substrate fixed to the substrate via the release layer according to the present invention and then the LLO method is employed, only the release layer absorbs this light and evaporates (sublimates). ) That is, the peeling layer is sacrificed (acts as a sacrificial layer), and the peeling of the substrate from the glass carrier can be performed selectively. The composition for forming a release layer of the present invention has a feature of sufficiently absorbing light having a specific wavelength (for example, 308 nm) that can be applied by the LLO method, and thus can be used as a sacrificial layer for the LLO method.
 以下、合成例、比較合成例、実施例及び比較例を挙げて本発明を更に詳細に説明するが、本発明は、これら実施例に限定されない。なお、下記例で使用した化合物の略称、及び数平均分子量及び重量平均分子量の測定方法は以下のとおりである。 Hereinafter, the present invention will be described in more detail with reference to synthesis examples, comparative synthesis examples, examples, and comparative examples, but the present invention is not limited to these examples. In addition, the abbreviation of the compound used in the following example and the measuring method of a number average molecular weight and a weight average molecular weight are as follows.
<化合物の略称>
p-PDA:p-フェニレンジアミン
m-PDA:m-フェニレンジアミン
DATP:4,4'''-ジアミノ-p-ターフェニル
DBA:3,5-ジアミノ安息香酸
HAB:3,3'-ジヒドロキシベンジジン
DDE:4,4'-オキシジアニリン
BAPB:4,4'-ビス(4-アミノフェノキシ)ビフェニル
FAPB:4,4'-ビス(4-アミノ-2-トリフルオロメチルフェノキシ)ビフェニル
APAB:5-アミノ-2-(4-アミノフェニル)-1H-ベンゾイミダゾール
APAB-E:4-アミノフェニル-4'-アミノベンゾエート
6FAP:2,2-ビス(3-アミノ-4-ヒドロキシフェニル)ヘキサフルオロプロパン
TFMB:2,2'-ビス(トリフルオロメチル)ビフェニル-4,4'-ジアミン
BPDA:3,3',4,4'-ビフェニルテトラカルボン酸二無水物
TAHQ:p-フェニレンビス(トリメリット酸モノエステル酸無水物)
PMDA:ピロメリット酸二無水物
BPTME:p-ビフェニレンビス(トリメリット酸モノエステル酸無水物)
BPODA:4,4'-(ビフェニル-4,4'-ジイルビスオキシ)ビスフタル酸二無水物
CF3-BP-TMA:N,N'-[2,2'-ビス(トリフルオロメチル)ビフェニル-4,4'-ジイル]ビス(1,3-ジオキソ-1,3-ジヒドロイソベンゾフラン-5-カルボアミド)
6FDA:4,4'-(ヘキサフルオロイソプロピリデン)ジフタル酸無水物
CBDA:1,2,3,4-シクロブタンテトラカルボン酸二無水物
IPBBT:N,N'-イソフタルビス(ベンゾオキサゾリン-2-チオン)
NMP:N-メチル-2-ピロリドン
BCS:ブチルセロソルブ
<Abbreviation of compound>
p-PDA: p-phenylenediamine m-PDA: m-phenylenediamine DATP: 4,4 ′ ″-diamino-p-terphenyl DBA: 3,5-diaminobenzoic acid HAB: 3,3′-dihydroxybenzidine DDE : 4,4'-oxydianiline BAPB: 4,4'-bis (4-aminophenoxy) biphenyl FAPB: 4,4'-bis (4-amino-2-trifluoromethylphenoxy) biphenyl APAB: 5-amino -2- (4-aminophenyl) -1H-benzimidazole APAB-E: 4-aminophenyl-4′-aminobenzoate 6FAP: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane TFMB: 2,2′-bis (trifluoromethyl) biphenyl-4,4′-diamine BPDA: 2,3 ′, 4,4′-biphenyltetracarboxylic acid Anhydride TAHQ: p-phenylenebis (trimellitic acid monoester acid anhydride)
PMDA: pyromellitic dianhydride BPTME: p-biphenylenebis (trimellitic acid monoester anhydride)
BPODA: 4,4 ′-(biphenyl-4,4′-diylbisoxy) bisphthalic dianhydride CF3-BP-TMA: N, N ′-[2,2′-bis (trifluoromethyl) biphenyl-4 , 4'-diyl] bis (1,3-dioxo-1,3-dihydroisobenzofuran-5-carboxamide)
6FDA: 4,4 ′-(hexafluoroisopropylidene) diphthalic anhydride CBDA: 1,2,3,4-cyclobutanetetracarboxylic dianhydride IPBBT: N, N′-isophthalbis (benzoxazoline-2-thione) )
NMP: N-methyl-2-pyrrolidone BCS: Butyl cellosolve
<重量平均分子量及び分子量分布の測定>
 ポリマーの重量平均分子量(Mw)及び分子量分布(Mw/Mn)の測定は、日本分光(株)製GPC装置(カラム:昭和電工(株)製OHpak SB803-HQ、及びOHpak SB804-HQ;溶離液:ジメチルホルムアミド/LiBr・H2O(29.6mM)/H3PO4(29.6mM)/THF(0.1質量%);流量:1.0mL/分;カラム温度:40℃;Mw:標準ポリスチレン換算値)を用いて行った(以下の実施例及び比較例において、同じ)。
<Measurement of weight average molecular weight and molecular weight distribution>
The weight average molecular weight (Mw) and molecular weight distribution (Mw / Mn) of the polymer were measured using a GPC apparatus manufactured by JASCO Corporation (column: OHpak SB803-HQ and OHpak SB804-HQ manufactured by Showa Denko KK); : Dimethylformamide / LiBr.H 2 O (29.6 mM) / H 3 PO 4 (29.6 mM) / THF (0.1% by mass); flow rate: 1.0 mL / min; column temperature: 40 ° C .; Mw: (Standard polystyrene equivalent value) was used (same in the following examples and comparative examples).
[1]ポリマーの合成
 以下の方法によって、ポリアミック酸及びポリベンゾオキサゾール前駆体を合成した。
 なお、得られたポリマー含有反応液からポリマーを単離せず、後述のとおり、反応溶液を希釈することで、樹脂基板形成用組成物又は剥離層形成用組成物を調製した。
[1] Synthesis of polymer A polyamic acid and a polybenzoxazole precursor were synthesized by the following method.
In addition, the polymer was not isolated from the obtained polymer containing reaction liquid, but the composition for resin substrate formation or the composition for peeling layer formation was prepared by diluting a reaction solution as mentioned later.
[合成例S1]ポリアミック酸S1の合成
 p-PDA20.261g(187mmol)及びDATP12.206g(47mmol)をNMP617.4gに溶解させた。得られた溶液を15℃に冷却し、そこへPMDA50.112g(230mmol)を加え、窒素雰囲気下、50℃まで昇温し、48時間反応させ、ポリアミック酸S1を得た。ポリアミック酸S1のMwは82,100、Mw/Mnは2.7であった。
[Synthesis Example S1] Synthesis of polyamic acid S1 20.261 g (187 mmol) of p-PDA and 12.206 g (47 mmol) of DATP were dissolved in 617.4 g of NMP. The obtained solution was cooled to 15 ° C., PMDA 50.112 g (230 mmol) was added thereto, the temperature was raised to 50 ° C. in a nitrogen atmosphere, and the mixture was reacted for 48 hours to obtain polyamic acid S1. Polyamic acid S1 had Mw of 82,100 and Mw / Mn of 2.7.
[合成例S2]ポリアミック酸S2の合成
 p-PDA3.218g(30mmol)をNMP88.2gに溶解させた。得られた溶液にBPDA8.581g(29mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S2を得た。ポリアミック酸S2のMwは107,300、Mw/Mnは4.6であった。
[Synthesis Example S2] Synthesis of polyamic acid S2 3.218 g (30 mmol) of p-PDA was dissolved in 88.2 g of NMP. To the obtained solution, 8.581 g (29 mmol) of BPDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid S2. Polyamic acid S2 had Mw of 107,300 and Mw / Mn of 4.6.
[合成例S3]ポリアミック酸S3の合成
 TFMB17.8g(56mmol)、BAPB0.4g(1mmol)及びp-PDA2.5g(23mmol)をNMP430gに溶解させた。得られた溶液に、6FDA6.3g(14mmol)及びCF3-BP-TMA42.8g(64mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S3を得た。ポリアミック酸S3のMwは38,700、Mw/Mnは2.1であった。
[Synthesis Example S3] Synthesis of polyamic acid S3 17.8 g (56 mmol) of TFMB, 0.4 g (1 mmol) of BAPB and 2.5 g (23 mmol) of p-PDA were dissolved in 430 g of NMP. To the obtained solution, 6.3 g (14 mmol) of 6FDA and 42.8 g (64 mmol) of CF3-BP-TMA were added and reacted at 23 ° C. for 24 hours in a nitrogen atmosphere to obtain polyamic acid S3. Polyamic acid S3 had Mw of 38,700 and Mw / Mn of 2.1.
[合成例S4]ポリアミック酸S4の合成
 DDE30.6g(153mmol)をNMP440gに溶解させた。得られた溶液にCBDA29.4g(150mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸S4を得た。ポリアミック酸S4のMwは29,800、Mw/Mnは2.2であった。
[Synthesis Example S4] Synthesis of polyamic acid S4 30.6 g (153 mmol) of DDE was dissolved in 440 g of NMP. CBDA 29.4g (150mmol) was added to the obtained solution, and it was made to react at 23 degreeC by nitrogen atmosphere for 24 hours, and polyamic acid S4 was obtained. Polyamic acid S4 had Mw of 29,800 and Mw / Mn of 2.2.
[合成例L1]ポリアミック酸L1の合成
 p-PDA2.054g(19mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.946g(19mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L1を得た。ポリアミック酸L1のMwは57,500、Mw/Mnは3.0であった。
[Synthesis Example L1] Synthesis of polyamic acid L1 2.054 g (19 mmol) of p-PDA was dissolved in 88 g of NMP. BPTME 9.946g (19mmol) was added to the obtained solution, and it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and polyamic acid L1 was obtained. Polyamic acid L1 had Mw of 57,500 and Mw / Mn of 3.0.
[合成例L2]ポリアミック酸L2の合成
 p-PDA1.836g(17mmol)及びDBA0.287g(1.9mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.878g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L2を得た。ポリアミック酸L2のMwは65,100、Mw/Mnは3.0であった。
[Synthesis Example L2] Synthesis of polyamic acid L2 p-PDA (1.836 g, 17 mmol) and DBA (0.287 g, 1.9 mmol) were dissolved in NMP (88 g). To the obtained solution, 9.878 g (18 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L2. Mw of polyamic acid L2 was 65,100, and Mw / Mn was 3.0.
[合成例L3]ポリアミック酸L3の合成
 p-PDA1.367g(13mmol)及びHAB1.172g(5.4mmol)をNMP88gに溶解させた。得られた溶液にBPTME9.461g(18mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L3を得た。ポリアミック酸L3のMwは43,600、Mw/Mn2.6であった。
[Synthesis Example L3] Synthesis of polyamic acid L3 1.367 g (13 mmol) of p-PDA and 1.172 g (5.4 mmol) of HAB were dissolved in 88 g of NMP. To the obtained solution, 9.461 g (18 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L3. Mw of polyamic acid L3 was 43,600 and Mw / Mn 2.6.
[合成例L4]ポリアミック酸L4の合成
 DATP3.984g(15mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.016g(15mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L4を得た。ポリアミック酸L4のMwは42,600、Mw/Mnは3.9であった。
[Synthesis Example L4] Synthesis of polyamic acid L4 3.984 g (15 mmol) of DATP was dissolved in 88 g of NMP. To the resulting solution, 8.016 g (15 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L4. Polyamic acid L4 had Mw of 42,600 and Mw / Mn of 3.9.
[合成例L5]ポリアミック酸L5の合成
 BAPB5.17g(14mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.83g(13mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L5を得た。ポリアミック酸L5のMwは52,100、Mw/Mnは2.7であった。
[Synthesis Example L5] Synthesis of polyamic acid L5 5.17 g (14 mmol) of BAPB was dissolved in 88 g of NMP. To the resulting solution, 6.83 g (13 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L5. Polyamic acid L5 had Mw of 52,100 and Mw / Mn of 2.7.
[合成例L6]ポリアミック酸L6の合成
 FAPB5.89g(12mmol)をNMP88gに溶解させた。得られた溶液にBPTME6.11g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L6を得た。ポリアミック酸L6のMwは87,700、Mw/Mnは3.3であった。
[Synthesis Example L6] Synthesis of polyamic acid L6 5.89 g (12 mmol) of FAPB was dissolved in 88 g of NMP. To the resulting solution, 6.11 g (11 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L6. Polyamic acid L6 had Mw of 87,700 and Mw / Mn of 3.3.
[合成例L7]ポリアミック酸L7の合成
 APAB3.60g(16mmol)をNMP88gに溶解させた。得られた溶液にBPTME8.40g(16mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L7を得た。ポリアミック酸L7のMwは58,300、Mw/Mnは2.8であった。
[Synthesis Example L7] Synthesis of Polyamic Acid L7 3.60 g (16 mmol) of APAB was dissolved in 88 g of NMP. To the resulting solution, 8.40 g (16 mmol) of BPTME was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L7. Polyamic acid L7 had Mw of 58,300 and Mw / Mn of 2.8.
[合成例L8]ポリアミック酸L8の合成
 DDE2.322g(12mmol)をNMP35.2gに溶解させた。得られた溶液にPMDA2.478g(11mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L8を得た。ポリアミック酸L8のMwは22,600、Mw/Mnは2.1であった。
[Synthesis Example L8] Synthesis of polyamic acid L8 2.322 g (12 mmol) of DDE was dissolved in 35.2 g of NMP. To the obtained solution, 2.478 g (11 mmol) of PMDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L8. Mw of polyamic acid L8 was 22,600, and Mw / Mn was 2.1.
[合成例L9]ポリアミック酸L9の合成
 DATP1.762g(7mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.038g(7mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L9を得た。ポリアミック酸L9のMwは61,300、Mw/Mnは3.3であった。
[Synthesis Example L9] Synthesis of polyamic acid L9 1.762 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. To the obtained solution, 3.038 g (7 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L9. Mw of polyamic acid L9 was 61,300, and Mw / Mn was 3.3.
[合成例L10]ポリアミック酸L10の合成
 p-PDA0.899g(8mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.900g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L10を得た。ポリアミック酸L10のMwは17,300、Mw/Mnは2.4であった。
[Synthesis Example L10] Synthesis of polyamic acid L10 0.899 g (8 mmol) of p-PDA was dissolved in 35.2 g of NMP. BPODA 3.900g (8mmol) was added to the obtained solution, and it was made to react at 23 degreeC under nitrogen atmosphere for 24 hours, and polyamic acid L10 was obtained. Mw of polyamic acid L10 was 17,300, and Mw / Mn was 2.4.
[合成例L11]ポリアミック酸L11の合成
 DATP1.713g(7mmol)をNMP35.2gに溶解させた。得られた溶液にBPODA3.086g(6mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L11を得た。ポリアミック酸L11のMwは27,000、Mw/Mnは2.4であった。
[Synthesis Example L11] Synthesis of polyamic acid L11 1.713 g (7 mmol) of DATP was dissolved in 35.2 g of NMP. To the obtained solution, 3.086 g (6 mmol) of BPODA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L11. Polyamic acid L11 had Mw of 27,000 and Mw / Mn of 2.4.
[合成例L12]ポリアミック酸L12の合成
 p-PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L12を得た。ポリアミック酸L12のMwは45,000、Mw/Mnは2.7であった。
[Synthesis Example L12] Synthesis of polyamic acid L12 0.931 g (9 mmol) of p-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L12. Polyamic acid L12 had Mw of 45,000 and Mw / Mn of 2.7.
[合成例L13]ポリアミック酸L13の合成
 p-PDA0.839g(8mmol)とm-PDA0.093g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L13を得た。ポリアミック酸L13のMwは39,100、Mw/Mnは2.6であった。
Synthesis Example L13 Synthesis of polyamic acid L13 0.839 g (8 mmol) of p-PDA and 0.093 g (1 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L13. Polyamic acid L13 had Mw of 39,100 and Mw / Mn of 2.6.
[合成例L14]ポリアミック酸L14の合成
 p-PDA0.652g(6mmol)とm-PDA0.280g(3mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L14を得た。ポリアミック酸L14のMwは42,700、Mw/Mnは2.6であった。
[Synthesis Example L14] Synthesis of polyamic acid L14 0.652 g (6 mmol) of p-PDA and 0.280 g (3 mmol) of m-PDA were dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L14. Polyamic acid L14 had Mw of 42,700 and Mw / Mn of 2.6.
[合成例L15]ポリアミック酸L15の合成
 m-PDA0.931g(9mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.868g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L15を得た。ポリアミック酸L15のMwは36,100、Mw/Mnは2.5であった。
[Synthesis Example L15] Synthesis of polyamic acid L15 0.931 g (9 mmol) of m-PDA was dissolved in 35.2 g of NMP. 3.868 g (8 mmol) of TAHQ was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L15. Mw of polyamic acid L15 was 36,100, and Mw / Mn was 2.5.
<合成例L16]ポリアミック酸L16の合成
 p-PDA0.816g(8mmol)とDATP0.218g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.765g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L16を得た。ポリアミック酸L16のMwは43,800、Mw/Mnは2.5であった。
Synthesis Example L16 Synthesis of polyamic acid L16 0.816 g (8 mmol) of p-PDA and 0.218 g (1 mmol) of DATP were dissolved in 35.2 g of NMP. TAHQ 3.765 g (8 mmol) was added to the obtained solution, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L16. Mw of polyamic acid L16 was 43,800, and Mw / Mn was 2.5.
[合成例L17]ポリアミック酸L17の合成
 p-PDA0.603g(6mmol)及びDATP0.622g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.575g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L17を得た。ポリアミック酸L17のMwは46,000、Mw/Mnは2.6であった。
[Synthesis Example L17] Synthesis of polyamic acid L17 0.603 g (6 mmol) of p-PDA and 0.622 g (2 mmol) of DATP were dissolved in 35.2 g of NMP. To the obtained solution was added 3.575 g (8 mmol) of TAHQ, and the mixture was reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L17. Polyamic acid L17 had Mw of 46,000 and Mw / Mn of 2.6.
[合成例L18]ポリアミック酸L18の合成
 p-PDA0.832g(8mmol)及びDBA0.130g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.838g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L18を得た。ポリアミック酸L18のMwは57,000、Mw/Mnは3.0であった。
[Synthesis Example L18] Synthesis of polyamic acid L18 0.832 g (8 mmol) of p-PDA and 0.130 g (1 mmol) of DBA were dissolved in 35.2 g of NMP. To the obtained solution, 3.838 g (8 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L18. Polyamic acid L18 had Mw of 57,000 and Mw / Mn of 3.0.
[合成例L19]ポリアミック酸L19の合成
 p-PDA0.822g(8mmol)及びHAB0.183g(1mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.794g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L19を得た。ポリアミック酸L19のMwは54,200、Mw/Mnは2.7であった。
[Synthesis Example L19] Synthesis of polyamic acid L19 0.822 g (8 mmol) of p-PDA and 0.183 g (1 mmol) of HAB were dissolved in 35.2 g of NMP. TAHQ 3.794 g (8 mmol) was added to the obtained solution and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L19. Polyamic acid L19 had Mw of 54,200 and Mw / Mn of 2.7.
[合成例L20]ポリアミック酸L20の合成
 p-PDA0.616g(6mmol)及びHAB0.528g(2mmol)をNMP35.2gに溶解させた。得られた溶液にTAHQ3.655g(8mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L20を得た。ポリアミック酸L20のMwは55,900、Mw/Mnは2.6であった。
[Synthesis Example L20] Synthesis of polyamic acid L20 0.616 g (6 mmol) of p-PDA and 0.5528 g (2 mmol) of HAB were dissolved in 35.2 g of NMP. To the obtained solution, 3.655 g (8 mmol) of TAHQ was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L20. Polyamic acid L20 had Mw of 55,900 and Mw / Mn of 2.6.
[合成例L21]ポリアミック酸L21の合成
 APAB-E1.239g(5mmol)をNMP17.6gに溶解させた。得られた溶液にPMDA1.160g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L21を得た。ポリアミック酸L21のMwは20,900、Mw/Mnは2.1であった。
[Synthesis Example L21] Synthesis of polyamic acid L21 1.239 g (5 mmol) of APAB-E was dissolved in 17.6 g of NMP. To the resulting solution, 1.160 g (5 mmol) of PMDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L21. Polyamic acid L21 had Mw of 20,900 and Mw / Mn of 2.1.
[合成例L22]ポリアミック酸L22の合成
 APAB-E1.060g(5mmol)をNMP17.6gに溶解させた。得られた溶液にBPDA1.339g(5mmol)を加え、窒素雰囲気下、23℃で24時間反応させ、ポリアミック酸L22を得た。ポリアミック酸L22のMwは26,600、Mw/Mnは2.3であった。
[Synthesis Example L22] Synthesis of polyamic acid L22 APAB-E (1.060 g, 5 mmol) was dissolved in 17.6 g of NMP. To the obtained solution, 1.339 g (5 mmol) of BPDA was added and reacted at 23 ° C. for 24 hours under a nitrogen atmosphere to obtain polyamic acid L22. Polyamic acid L22 had Mw of 26,600 and Mw / Mn of 2.3.
[比較合成例1]ポリベンゾオキサゾール前駆体B1の合成
 6FAP5.49g(0.015mol)をNMP27gに溶解させた。得られた溶液にIPBBT6.48g(0.015mol)を加え、窒素雰囲気下、23℃で3時間反応させた。その後、この溶液を純水300gへ投入し、24時間撹拌後、析出物を濾過した。その後、減圧乾燥し、ポリベンゾオキサゾール前駆体B1を得た。ポリベンゾオキサゾール前駆体B1のMwは2,1000、Mw/Mnは3.9であった。
[Comparative Synthesis Example 1] Synthesis of polybenzoxazole precursor B1 6.49 g (0.015 mol) of 6FAP was dissolved in 27 g of NMP. 6.48 g (0.015 mol) of IPBBT was added to the resulting solution, and the mixture was reacted at 23 ° C. for 3 hours under a nitrogen atmosphere. Thereafter, this solution was poured into 300 g of pure water, and after stirring for 24 hours, the precipitate was filtered. Then, it dried under reduced pressure and obtained polybenzoxazole precursor B1. Mw of the polybenzoxazole precursor B1 was 2,1000, and Mw / Mn was 3.9.
[2]樹脂基板形成用組成物の調製
 合成例S1~S4で得られた反応液を、それぞれ、そのまま樹脂基板形成用組成物W、X、Y及びZとして用いた。
[2] Preparation of Resin Substrate Forming Composition The reaction solutions obtained in Synthesis Examples S1 to S4 were used as resin substrate forming compositions W, X, Y, and Z, respectively.
[3]剥離層形成用組成物の調製
[実施例1-1]
 合成例L1で得られた反応液に、BCSを加え、ポリマー濃度が5質量%、BCSが20質量%となるようにNMPで希釈し、剥離層形成用組成物を得た。
[3] Preparation of composition for forming release layer [Example 1-1]
BCS was added to the reaction solution obtained in Synthesis Example L1, and diluted with NMP so that the polymer concentration was 5% by mass and BCS was 20% by mass to obtain a composition for forming a release layer.
[実施例1-2~1-22]
 合成例L1で得られた反応液のかわりに、それぞれ合成例L2~L22で得られた反応液を用いた以外は、実施例1-1と同様の方法で、剥離層形成用組成物を得た。
[Examples 1-2 to 1-22]
A composition for forming a release layer was obtained in the same manner as in Example 1-1 except that the reaction solutions obtained in Synthesis Examples L2 to L22 were used instead of the reaction solution obtained in Synthesis Example L1. It was.
[比較例1]
 比較合成例1で得られた反応液を、ポリマー濃度が5質量%となるようにNMPで希釈して、組成物を得た。
[Comparative Example 1]
The reaction solution obtained in Comparative Synthesis Example 1 was diluted with NMP so that the polymer concentration was 5% by mass to obtain a composition.
[4]剥離層の形成及びその評価
[実施例2-1]
 スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-1で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
 そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[4] Formation and evaluation of release layer [Example 2-1]
The composition for forming a release layer obtained in Example 1-1 was applied as a glass substrate onto a 100 mm × 100 mm glass substrate (hereinafter the same) using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm). .
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
[実施例2-2~2-22]
 実施例1-1で得られた剥離層形成用組成物のかわりに、それぞれ実施例1-2~1-22で得られた剥離層形成用組成物を用いた以外は、実施例2-1と同様の方法で、剥離層を形成した。
[Examples 2-2 to 2-22]
Example 2-1 was used except that the release layer forming composition obtained in Examples 1-2 to 1-22 was used in place of the release layer forming composition obtained in Example 1-1. A release layer was formed in the same manner as described above.
[実施例2-23]
 スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-12で得られた剥離層形成用組成物を、100mm×100mmガラス基板上に塗布した。
 そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、更に250℃で60分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[Example 2-23]
The composition for forming a release layer obtained in Example 1-12 was applied on a 100 mm × 100 mm glass substrate using a spin coater (conditions: about 30 seconds at a rotation speed of 3000 rpm).
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And then heated at 250 ° C. for 60 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
[実施例2-24]
 スピンコータ(条件:回転数3000rpmで約30秒)を用いて、実施例1-8で得られた剥離層形成用組成物を、ガラス基体としての100mm×100mmガラス基板の上に塗布した。
 そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて窒素雰囲気下、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で60分間加熱し、最終的に500℃で10分間加熱し、ガラス基板上に厚さ約0.1μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
[Example 2-24]
The composition for forming a release layer obtained in Example 1-8 was applied on a 100 mm × 100 mm glass substrate as a glass substrate using a spin coater (condition: about 30 seconds at a rotation speed of 3000 rpm).
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes in a nitrogen atmosphere using an oven to raise the heating temperature to 400 ° C. (10 C./min), and further heated at 400 ° C. for 60 minutes, and finally heated at 500 ° C. for 10 minutes to form a release layer having a thickness of about 0.1 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
[実施例2-25]
 実施例1-8で得られた剥離層形成用組成物のかわりに、実施例1-12で得られた組成物を用いた以外は、実施例2-24と同様の方法で、樹脂薄膜を形成した。
[Example 2-25]
A resin thin film was prepared in the same manner as in Example 2-24, except that the composition obtained in Example 1-12 was used instead of the release layer-forming composition obtained in Example 1-8. Formed.
[比較例2]
 実施例1-1で得られた剥離層形成用組成物のかわりに、比較例1で得られた組成物を用いた以外は、実施例2-1と同様の方法で、樹脂薄膜を形成した。
[Comparative Example 2]
A resin thin film was formed in the same manner as in Example 2-1, except that the composition obtained in Comparative Example 1 was used instead of the release layer forming composition obtained in Example 1-1. .
[5]剥離性の評価
[実施例3-1~3-47、比較例3]
 実施例2-1~2-25で得られた剥離層とガラス基板の剥離性及び当該剥離層(樹脂薄膜)と樹脂基板の剥離性を確認した。なお、樹脂基板としては、ポリイミドからなる樹脂基板を用いた。
 まず、実施例2-1~2-25で得られた剥離層付きガラス基板上の剥離層のクロスカット(縦横1mm間隔、以下同様)、並びに、樹脂基板・剥離層付きガラス基板上の樹脂基板・剥離層のクロスカットを行うことにより、100マスカットを行った。すなわち、このクロスカットにより、1mm四方のマス目を100個形成した。
 そして、この100マスカット部分に粘着テープを張り付けて、そのテープを剥がし、以下の基準(5B~0B、B、A、AA)に基づき、剥離の程度を評価した(実施例3-1~3-47)。また、前記手法に準じて、比較例2で得られた樹脂薄膜付きガラス基板を用いて、同様の試験を行った(比較例3)。結果を表1に示す。なお、表1中の剥離性の評価基準は、以下のとおりである。
[5] Evaluation of peelability [Examples 3-1 to 3-47, Comparative Example 3]
The peelability of the release layer and the glass substrate obtained in Examples 2-1 to 2-25 and the peelability of the release layer (resin thin film) and the resin substrate were confirmed. As the resin substrate, a resin substrate made of polyimide was used.
First, the release layer cross-cut (length and width 1 mm spacing, hereinafter the same) on the glass substrate with release layer obtained in Examples 2-1 to 2-25, and the resin substrate on the glass substrate with release substrate and release layer -A 100 muscut was made by cross-cutting the release layer. That is, 100 crosses of 1 mm square were formed by this cross cut.
Then, an adhesive tape was applied to the 100 muscat portion, the tape was peeled off, and the degree of peeling was evaluated based on the following criteria (5B to 0B, B, A, AA) (Examples 3-1 to 3- 47). Moreover, according to the said method, the same test was done using the glass substrate with a resin thin film obtained by the comparative example 2 (comparative example 3). The results are shown in Table 1. In addition, the evaluation criteria of peelability in Table 1 are as follows.
  5B:0%剥離(剥離なし)
  4B:5%未満の剥離
  3B:5~15%の剥離
  2B:15~35%未満の剥離
  1B:35~65%未満の剥離
  0B:65%~80%未満の剥離
   B:80%~95%未満の剥離
   A:95%~100%未満の剥離
  AA:100%剥離(すべて剥離)
5B: 0% peeling (no peeling)
4B: Less than 5% peeling 3B: 5-15% peeling 2B: 15-35% peeling 1B: 35-65% peeling 0B: 65% -80% peeling B: 80% -95% Less than peeling A: 95% to less than 100% peeling AA: 100% peeling (all peeling)
 実施例3-1~3-41、3-44~3-47及び比較例3の樹脂基板は、以下の方法で形成した。
 バーコーター(ギャップ:250μm)を用いて、ガラス基板上の剥離層(樹脂薄膜)の上に樹脂基板形成用組成物W又はXのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を210℃まで昇温(10℃/分、以下同様)し、210℃で30分間、加熱温度を300℃まで昇温し、300℃で30分間、加熱温度を400℃まで昇温し、400℃で60分間加熱し、剥離層上に厚さ約20μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
The resin substrates of Examples 3-1 to 3-41, 3-44 to 3-47 and Comparative Example 3 were formed by the following method.
Using a bar coater (gap: 250 μm), either the resin substrate forming composition W or X was applied on the release layer (resin thin film) on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 210 ° C. (10 ° C./min. The same applies to the following, and the heating temperature was raised to 210 ° C. for 30 minutes, the heating temperature was raised to 300 ° C., the heating temperature was raised to 300 ° C. for 30 minutes, the heating temperature was raised to 400 ° C., and the heating temperature was raised to 400 ° C. for 60 minutes. A polyimide substrate having a thickness of about 20 μm was formed. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
 実施例3-42~3-43の樹脂基板は、以下の方法で形成した。
 バーコーター(ギャップ:50μm)を用いて、ガラス基板上の剥離層の上に樹脂基板形成用組成物Y又はZのいずれかを塗布した。そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、140℃で30分間加熱し、加熱温度を250℃まで昇温(2℃/分)し、250℃で60分間加熱し、剥離層上に厚さ約0.8μmのポリイミド基板を形成した。昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。
The resin substrates of Examples 3-42 to 3-43 were formed by the following method.
Using a bar coater (gap: 50 μm), either the resin substrate forming composition Y or Z was applied onto the release layer on the glass substrate. The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 140 ° C. for 30 minutes using an oven, and the heating temperature was raised to 250 ° C. (2 ° C./min. And heated at 250 ° C. for 60 minutes to form a polyimide substrate having a thickness of about 0.8 μm on the release layer. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven.
Figure JPOXMLDOC01-appb-T000031
Figure JPOXMLDOC01-appb-T000031
Figure JPOXMLDOC01-appb-T000032
Figure JPOXMLDOC01-appb-T000032
 表1及び2に示したように、実施例の剥離層は、ガラス基板との密着性に優れ、かつ、樹脂基板との剥離性に優れていることがわかった。一方、比較例の剥離層は、樹脂基板とガラス基板から剥離せず、剥離層として機能しなかった。 As shown in Tables 1 and 2, it was found that the release layers of the examples were excellent in adhesion to the glass substrate and excellent in peelability from the resin substrate. On the other hand, the release layer of the comparative example did not peel from the resin substrate and the glass substrate, and did not function as a release layer.
[6]透過率の評価
[実施例4]
 スピンコータ(条件:回転数800rpmで約30秒)を用いて、実施例2-8で得られた剥離層形成用組成物を、ガラス基体として100mm×100mmガラス基板(以下同様)の上に塗布した。
 そして、得られた塗膜を、ホットプレートを用いて80℃で10分間加熱し、その後、オーブンを用いて、300℃で30分間加熱し、加熱温度を400℃まで昇温(10℃/分)し、更に400℃で30分間加熱し、ガラス基板上に厚さ約0.4μmの剥離層を形成した。なお、昇温の間、膜付き基板をオーブンから取り出すことはせず、オーブン内で加熱した。得られたフィルムを紫外線可視分光光度計((株)島津製作所製SIMADSU UV-2550型番)を用いて透過率を測定した。
 結果を図1に示す。得られたフィルムの透過率は、波長308nmに対し1%以下であり、犠牲層として使用可能な透過率を示した。
[6] Evaluation of transmittance [Example 4]
Using a spin coater (condition: about 30 seconds at 800 rpm), the release layer forming composition obtained in Example 2-8 was applied as a glass substrate onto a 100 mm × 100 mm glass substrate (hereinafter the same). .
The obtained coating film was heated at 80 ° C. for 10 minutes using a hot plate, and then heated at 300 ° C. for 30 minutes using an oven, and the heating temperature was raised to 400 ° C. (10 ° C./min. And then heated at 400 ° C. for 30 minutes to form a release layer having a thickness of about 0.4 μm on the glass substrate. During the temperature increase, the film-coated substrate was not removed from the oven but heated in the oven. The transmittance of the obtained film was measured using an ultraviolet-visible spectrophotometer (SIMADSU UV-2550 model number, manufactured by Shimadzu Corporation).
The results are shown in FIG. The transmittance of the obtained film was 1% or less with respect to the wavelength of 308 nm, indicating a transmittance that can be used as a sacrificial layer.

Claims (11)

  1.  芳香族ジアミンと芳香族テトラカルボン酸二無水物とを反応させて得られるポリアミック酸、及び有機溶媒を含み、
     前記芳香族ジアミンが、エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンを含み、及び/又は前記芳香族テトラカルボン酸二無水物が、エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物を含むことを特徴とする剥離層形成用組成物。
    A polyamic acid obtained by reacting an aromatic diamine and an aromatic tetracarboxylic dianhydride, and an organic solvent,
    The aromatic diamine includes an aromatic diamine containing at least one of an ester bond and an ether bond, and / or the aromatic tetracarboxylic dianhydride includes at least one of an ester bond and an ether bond. A release layer-forming composition comprising an acid dianhydride.
  2.  前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族ジアミンが、式(A1)~(A42)からなる群から選ばれる少なくとも1種である請求項1に記載の剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000001
    Figure JPOXMLDOC01-appb-C000002
    Figure JPOXMLDOC01-appb-C000003
    Figure JPOXMLDOC01-appb-C000004
    Figure JPOXMLDOC01-appb-C000005
    Figure JPOXMLDOC01-appb-C000006
    Figure JPOXMLDOC01-appb-C000007
    The release layer forming composition according to claim 1, wherein the aromatic diamine containing at least one of an ester bond and an ether bond is at least one selected from the group consisting of formulas (A1) to (A42).
    Figure JPOXMLDOC01-appb-C000001
    Figure JPOXMLDOC01-appb-C000002
    Figure JPOXMLDOC01-appb-C000003
    Figure JPOXMLDOC01-appb-C000004
    Figure JPOXMLDOC01-appb-C000005
    Figure JPOXMLDOC01-appb-C000006
    Figure JPOXMLDOC01-appb-C000007
  3.  前記エステル結合及びエーテル結合の少なくとも一方を含む芳香族テトラカルボン酸二無水物が、式(B1)~(B14)からなる群から選ばれる少なくとも1種である請求項1又は2に記載の剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000008
    The release layer according to claim 1 or 2, wherein the aromatic tetracarboxylic dianhydride containing at least one of the ester bond and the ether bond is at least one selected from the group consisting of formulas (B1) to (B14). Forming composition.
    Figure JPOXMLDOC01-appb-C000008
  4.  前記芳香族テトラカルボン酸二無水物が、更にエステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物を含む請求項1~3のいずれか1項に記載の剥離層形成用組成物。 The composition for forming a release layer according to any one of claims 1 to 3, wherein the aromatic tetracarboxylic dianhydride further includes an aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond. object.
  5.  前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、ベンゼン骨格、ナフチル骨格又はビフェニル骨格を含むものである請求項4に記載の剥離層形成用組成物。 The composition for forming a release layer according to claim 4, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond contains a benzene skeleton, a naphthyl skeleton or a biphenyl skeleton.
  6.  前記エステル結合及びエーテル結合のいずれも含まない芳香族テトラカルボン酸二無水物が、式(C1)~(C12)からなる群から選ばれる少なくとも1種である請求項5に記載の剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000009
    6. The release layer forming layer according to claim 5, wherein the aromatic tetracarboxylic dianhydride containing neither an ester bond nor an ether bond is at least one selected from the group consisting of formulas (C1) to (C12). Composition.
    Figure JPOXMLDOC01-appb-C000009
  7.  前記有機溶媒が、式(S1)で表されるアミド類、式(S2)で表されるアミド類及び式(S3)で表されるアミド類から選ばれる少なくとも1つを含む請求項1~6のいずれか1項に記載の剥離層形成用組成物。
    Figure JPOXMLDOC01-appb-C000010
    (式中、R1及びR2は、互いに独立して、炭素数1~10のアルキル基を表す。R3は、水素原子、又は炭素数1~10のアルキル基を表す。hは、自然数を表す。)
    The organic solvent contains at least one selected from amides represented by the formula (S1), amides represented by the formula (S2), and amides represented by the formula (S3). The composition for forming a release layer according to any one of the above.
    Figure JPOXMLDOC01-appb-C000010
    (In the formula, R 1 and R 2 each independently represent an alkyl group having 1 to 10 carbon atoms. R 3 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms. H represents a natural number. Represents.)
  8.  請求項1~7のいずれか1項に記載の剥離層形成用組成物を用いて形成される剥離層。 A release layer formed using the release layer forming composition according to any one of claims 1 to 7.
  9.  請求項8に記載の剥離層を用いることを特徴とする、樹脂基板を備えるフレキシブル電子デバイスの製造方法。 A method for producing a flexible electronic device comprising a resin substrate, wherein the release layer according to claim 8 is used.
  10.  請求項8に記載の剥離層を用いることを特徴とする、樹脂基板を備えるタッチパネルセンサーの製造方法。 A method for manufacturing a touch panel sensor comprising a resin substrate, wherein the release layer according to claim 8 is used.
  11.  前記樹脂基板が、ポリイミドからなる基板である請求項9又は10に記載の製造方法。 The manufacturing method according to claim 9 or 10, wherein the resin substrate is a substrate made of polyimide.
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