JPS6276745A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6276745A
JPS6276745A JP21834185A JP21834185A JPS6276745A JP S6276745 A JPS6276745 A JP S6276745A JP 21834185 A JP21834185 A JP 21834185A JP 21834185 A JP21834185 A JP 21834185A JP S6276745 A JPS6276745 A JP S6276745A
Authority
JP
Japan
Prior art keywords
package
switching
decoder
chip
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21834185A
Other languages
Japanese (ja)
Inventor
Takashi Mihashi
隆 三橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP21834185A priority Critical patent/JPS6276745A/en
Publication of JPS6276745A publication Critical patent/JPS6276745A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5382Adaptable interconnections, e.g. for engineering changes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

Abstract

PURPOSE:To freely select the operating function in an IC by exposing a part of a circuit contained in a package to be able to be separated from an external portion. CONSTITUTION:U-shaped switching conductors 21, 22 are exposed in an air gap in a recess 2 of a package 1. They are wired at W to the bonding pad of a chip 4 similarly to lead pins 31-38. When the conductors 21, 22 are connected, the input terminals 51, 52 of a decoder 5 are ground potential, and when interrupted, they become a power source potential. Selection signals of special function circuits K1-K4 are output through the decoder 5 in this combination to achieve a desired function.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は半導体装置に係り、特に外部からの操作で機能
の切換えを行なうことのできる半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a semiconductor device, and particularly to a semiconductor device whose functions can be switched by external operation.

〔発明の技術的背景およびその問題点〕最近のしSt製
造技術の進歩により、1つのチップ上に搭載することの
できる論理ゲートの数は急速に増大しており、複雑な回
路の実現も容易となってきている。
[Technical background of the invention and its problems] With recent advances in ST manufacturing technology, the number of logic gates that can be mounted on one chip is rapidly increasing, making it easier to realize complex circuits. It is becoming.

細部の機能が異なるのみで機能的にはほとんど同一であ
るような回路の場合、製造コストの面から考えると夫々
別々にその機能通りのものを製造するよりは、両方の機
能を含む同一の回路を製造し、ユーザが必要に応じて機
能を切換えて使用するようにした方が望ましいと考えら
れる。
In the case of circuits that are almost the same functionally but differ only in detailed functions, from the viewpoint of manufacturing costs, it is better to manufacture the same circuit that includes both functions than to manufacture each circuit separately with the same function. It would be desirable to manufacture a system and allow the user to switch functions as needed.

このことはまた、既存の集積回路に新規の機能を追加し
ておき、必要に応じてユーザが選択して新旧の機能を使
用したい場合も同様であるが、モード切換え用にピンを
増加させることは、更にパターン設計を複雑化させるこ
とにもなり、実用的ではなかった。
This also applies when new functionality is added to an existing integrated circuit and the user wants to select and use the old and new functionality as needed, but increasing the number of pins for mode switching is also the case. This would further complicate the pattern design and was not practical.

〔発明の目的〕[Purpose of the invention]

本発明は、前記実情に鑑みてなされたもので、パッケー
ジの外側から機能の切換えを行なうことのできる半導体
装置を提供することを目的とする。
The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a semiconductor device whose functions can be switched from outside the package.

(発明の概要) そこで本発明では、パッケージ内に収容せしめられる回
路の1部を露呈せしめ、パッケージの外から切断可能と
なるようにしている。
(Summary of the Invention) Therefore, in the present invention, a part of the circuit housed in the package is exposed so that it can be cut from outside the package.

例えば、チップ上に形成されている集積回路パターンの
1部をプルアップ抵抗を介してパッケージに配設された
凹部内に引き出して露出させると共に他方はグランドに
接続させ、外部から切断可能なようにしておく。そして
このプルアップ抵抗と露出部との間の電位信号をデコー
ドし、集積回路内の動作機能選択信号を作成するように
している。
For example, one part of the integrated circuit pattern formed on the chip is pulled out and exposed through a pull-up resistor into a recess provided in the package, and the other part is connected to ground so that it can be disconnected from the outside. I'll keep it. The potential signal between this pull-up resistor and the exposed portion is decoded to create an operation function selection signal within the integrated circuit.

従って、この露出部を切断すれば電位信号は論理的には
1となる。一方接続していれば電位信号は0となる。こ
のようにして、この動作機能選択信号の組み合わせによ
って、チップ内の回路の機能がビンとは無関係に選択可
能となる。
Therefore, if this exposed portion is cut off, the potential signal becomes logically 1. If one is connected, the potential signal becomes 0. In this way, this combination of operational function selection signals allows the functions of the circuits within the chip to be selected independently of the bins.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、はとんどの機能が同じで1部のみの異
なる集積回路装置を形成するに際し、すべての機能を含
む集積回路を1チツプ上に搭載しパッケージングしてお
き、必要に応じて外部から自由に機能の選択を行なうこ
とができる。
According to the present invention, when forming an integrated circuit device that has most of the same functions but only one different part, an integrated circuit including all the functions is mounted on one chip and packaged, and as needed. You can freely select functions from the outside.

このようにすることにより、多種類のチップを製造する
ことなく単一種類のチップを製造すればよいため、製造
コストを大幅に低減することができる。
By doing so, it is sufficient to manufacture a single type of chip without having to manufacture many types of chips, so that manufacturing costs can be significantly reduced.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の実施例について図面を参照しつつ詳細に
説明する。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

第1図は、本発明実施例の半導体集積回路装置(IC)
の外形を示す図である。
FIG. 1 shows a semiconductor integrated circuit device (IC) according to an embodiment of the present invention.
FIG.

このICは、4種の特殊機能回路に1〜に4の選択が可
能なように構成されたもので、パッケージ1の上部に形
成された凹部2内にわずかの空隙が形成され、この空隙
から、切換え回路に接続された第1の切換え用導体21
.第2の切換え用導体22が露呈するようにコの字状に
曲げて取り出されており、外部から切断゛可能であるよ
うに形成されている。
This IC has four types of special function circuits that can be selected from 1 to 4. A small gap is formed in a recess 2 formed at the top of a package 1, and the , a first switching conductor 21 connected to the switching circuit
.. The second switching conductor 22 is bent into a U-shape and taken out to be exposed, and is formed so that it can be cut from the outside.

そしてこの第1の切換え用導体21および第2の切換え
用導体22は、パッケージ内の1部を第2図に示すよう
に、リードビン31〜38と同様にワイヤWによって集
積回路チップ4の周縁に形成されたポンディングパッド
に接続されている。
As shown in FIG. 2, the first switching conductor 21 and the second switching conductor 22 are connected to the periphery of the integrated circuit chip 4 by wires W, similar to the lead bins 31 to 38, as shown in FIG. connected to a formed bonding pad.

この集積回路チップ4には、主要回路の他上記4種の特
殊機能回路に1〜に4と、切換え回路とが搭載されてお
り、切換え回路は、第3図に等両回路を示す如く、第1
および第2の切換え用導体の1端にある端子21A、2
2Aに接続されたプルアップ抵抗41.42と、この端
子21A。
In addition to the main circuit, this integrated circuit chip 4 is equipped with the above-mentioned four types of special function circuits 1 to 4, and a switching circuit, as shown in FIG. 1st
and terminals 21A, 2 at one end of the second switching conductor.
A pull-up resistor 41.42 connected to 2A and this terminal 21A.

22Aに入力側端子51.52が接続されると共に4個
の前記特殊機能回路に1〜に4に夫々選択信号を出力す
るように形成されたデコーダ5とを具えており、この切
換え用導体は夫々、該プルアップ抵抗41.42を介し
て電源VDDに接続されると共に、他端21B、22B
をグランドに接続したものである。
Input side terminals 51 and 52 are connected to 22A, and a decoder 5 is formed to output a selection signal to each of the four special function circuits 1 to 4, and this switching conductor is They are connected to the power supply VDD via the pull-up resistors 41 and 42, respectively, and the other ends 21B and 22B
is connected to ground.

ところで切換え用導体21.22が夫々そのままつなが
った状態であれば、デコーダ5の入力側端子51.52
の電位はアース電位であり、切断されておれば、電源電
位にほぼ等しくなる。この入力側端子51.52の電位
がアース電位であるか電源電位であるかの組合わせによ
って、デコーダ5を介して、4種類のモードが選択され
、夫々の特殊機能回路に1〜に4の機能選択信号が出力
される。
By the way, if the switching conductors 21 and 22 are connected as they are, the input terminals 51 and 52 of the decoder 5
The potential is the ground potential, and if it is disconnected, it will be approximately equal to the power supply potential. Depending on the combination of whether the potential of the input side terminals 51 and 52 is the ground potential or the power supply potential, four types of modes are selected via the decoder 5, and 1 to 4 modes are selected for each special function circuit. A function selection signal is output.

このようにして集積回路は、これらの信号に従って動作
し、所望の機能を実現する。
The integrated circuit thus operates according to these signals to achieve the desired functionality.

このICによれば、同じ半導体チップによってユーザは
必要に応じて4種類の異なる機能を発揮させることがで
きる。従って、4種類の半導体チップを夫々に作製して
いた場合に比べ、すべて、同一工程で天吊生産すること
ができるため、製造コストが大幅に低減されることにな
る。
According to this IC, the user can use the same semiconductor chip to perform four different functions as needed. Therefore, compared to the case where four types of semiconductor chips were manufactured individually, all of them can be hung in the same process and the manufacturing cost can be significantly reduced.

なお、実施例では、第1および第2の切換え用導体21
.22は、パッケージ1の凹部からコの字状に曲げて取
り出されているが、第4図に示す如く、凹部2′を深く
形成することにより、リードフレーム面を曲げることな
くそのまま使用することができ、製造が容易となる。
In addition, in the embodiment, the first and second switching conductors 21
.. 22 is bent into a U-shape and taken out from the recess of the package 1, but as shown in FIG. 4, by forming the recess 2' deeply, it is possible to use the lead frame as it is without bending the surface. This makes manufacturing easier.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明実施例の半導体集積回路装置(IC)
の外形を示す図、第2図は、同ICの内部を示す図、第
3図は、同ICの切換え回路の等価回路図、第4図は、
同ICの変形例を示す図である。 K1−に4・・・特殊機能回路、1・・・パッケージ、
2・・・凹部、21・・・第1の切換え用導体、22・
・・第2の切換え用導体、W・・・ワイヤ、31〜38
・・・リードビン、4・・・チップ、41.42・・・
プルアップ抵抗、5・・・デコーダ。 第1図 第2図
FIG. 1 shows a semiconductor integrated circuit device (IC) according to an embodiment of the present invention.
2 is a diagram showing the inside of the IC, FIG. 3 is an equivalent circuit diagram of the switching circuit of the IC, and FIG. 4 is a diagram showing the inside of the IC.
It is a figure which shows the modification of the same IC. K1- to 4...Special function circuit, 1...Package,
2... Recessed portion, 21... First switching conductor, 22.
...Second switching conductor, W...wire, 31-38
...Lead bin, 4...Chip, 41.42...
Pull-up resistor, 5...decoder. Figure 1 Figure 2

Claims (3)

【特許請求の範囲】[Claims] (1)パッケージ内の回路の1部を露出せしめ、外部か
ら切断することによって機能選択を可能とする切換え部
を具えた切換え回路を配設したことを特徴とする半導体
装置。
(1) A semiconductor device characterized in that a switching circuit is provided, which includes a switching section that enables function selection by exposing a part of the circuit inside the package and disconnecting it from the outside.
(2)前記切換え部はパッケージに形成された凹部内に
配設されるようにしたことを特徴とする特許請求の範囲
第(1)項記載の半導体装置。
(2) The semiconductor device according to claim (1), wherein the switching section is disposed within a recess formed in a package.
(3)前記切換え回路は、複数の切換え部を具備するよ
うにしたことを特徴とする特許請求の範囲第(1)項記
載の半導体装置。
(3) The semiconductor device according to claim (1), wherein the switching circuit includes a plurality of switching sections.
JP21834185A 1985-09-30 1985-09-30 Semiconductor device Pending JPS6276745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21834185A JPS6276745A (en) 1985-09-30 1985-09-30 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21834185A JPS6276745A (en) 1985-09-30 1985-09-30 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6276745A true JPS6276745A (en) 1987-04-08

Family

ID=16718347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21834185A Pending JPS6276745A (en) 1985-09-30 1985-09-30 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6276745A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007062727A (en) * 2005-08-31 2007-03-15 Magna Car Top Systems Gmbh Luggage carrier of drawout type for vehicle, in particular passenger car

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007062727A (en) * 2005-08-31 2007-03-15 Magna Car Top Systems Gmbh Luggage carrier of drawout type for vehicle, in particular passenger car

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