ZA894271B - Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography - Google Patents

Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography

Info

Publication number
ZA894271B
ZA894271B ZA894271A ZA894271A ZA894271B ZA 894271 B ZA894271 B ZA 894271B ZA 894271 A ZA894271 A ZA 894271A ZA 894271 A ZA894271 A ZA 894271A ZA 894271 B ZA894271 B ZA 894271B
Authority
ZA
South Africa
Prior art keywords
articles
dimensional
manufacture
computerized tomography
weight measurements
Prior art date
Application number
ZA894271A
Other languages
English (en)
Inventor
Carvel D Hoffman
D Hoffman Carvel
R Creighton Booth
Creighton Booth R
John C Clymer
C Clymer John
Richard J Casler
J Casler Richard
Original Assignee
Bethlehem Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bethlehem Steel Corp filed Critical Bethlehem Steel Corp
Publication of ZA894271B publication Critical patent/ZA894271B/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/48—Analogue computers for specific processes, systems or devices, e.g. simulators
    • G06G7/68—Analogue computers for specific processes, systems or devices, e.g. simulators for civil engineering structures, e.g. beam, strut, girder, elasticity computation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B2261/00—Product parameters
    • B21B2261/02—Transverse dimensions
    • B21B2261/04—Thickness, gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Computer Hardware Design (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Architecture (AREA)
  • Mathematical Physics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Fluidized-Bed Combustion And Resonant Combustion (AREA)
ZA894271A 1988-06-09 1989-06-06 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography ZA894271B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/204,588 US4951222A (en) 1988-06-09 1988-06-09 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography

Publications (1)

Publication Number Publication Date
ZA894271B true ZA894271B (en) 1990-04-25

Family

ID=22758551

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA894271A ZA894271B (en) 1988-06-09 1989-06-06 Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography

Country Status (5)

Country Link
US (2) US4951222A (xx)
KR (1) KR950005139B1 (xx)
AU (1) AU3776889A (xx)
WO (1) WO1989012281A1 (xx)
ZA (1) ZA894271B (xx)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5379237A (en) * 1990-05-31 1995-01-03 Integrated Diagnostic Measurement Corporation Automated system for controlling the quality of regularly-shaped products during their manufacture
US5414648A (en) * 1990-05-31 1995-05-09 Integrated Diagnostic Measurement Corporation Nondestructively determining the dimensional changes of an object as a function of temperature
US5204889A (en) * 1992-07-14 1993-04-20 Loral Fairchild Corp. Apparatus for measuring thickness of metals on a rolling mill
US5351203A (en) * 1992-08-03 1994-09-27 Bethlehem Steel Corporation Online tomographic gauging of sheet metal
US5585603A (en) * 1993-12-23 1996-12-17 Design Systems, Inc. Method and system for weighing objects using X-rays
KR100332072B1 (ko) * 1999-02-18 2002-04-10 박종원 단층촬영 영상으로부터의 장기 추출 및 체적산출방법
US6264365B1 (en) * 1999-10-25 2001-07-24 General Electric Company Background monitoring of CT data for existence and location of a bad detector
NZ538649A (en) 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
US20070280415A1 (en) * 2006-05-31 2007-12-06 Keith Waterson Method of and apparatus for measuring the thickness of moving metal sheet articles
US7595893B2 (en) * 2006-09-20 2009-09-29 Mitutoyo Corporation Shape measurement method and shape measurement apparatus
DE102010023841A1 (de) 2010-06-09 2011-12-15 Pfisterer Kontaktsysteme Gmbh Elektrisches Steckverbindungselement
US20130105679A1 (en) * 2011-10-28 2013-05-02 Ge Energy Oilfield Technology, Inc. Dual gamma ray and neutron detector in a multi-sensor apparatus and related methods
CN102818810B (zh) * 2012-05-08 2015-11-25 西安筑波科技有限公司 X射线无损探伤设备
JP6309868B2 (ja) * 2014-09-26 2018-04-11 株式会社神戸製鋼所 形状測定装置および形状測定方法
CN112964738B (zh) * 2021-01-29 2022-11-22 山东大学 一种工业ct快速扫描系统及方法
CN117881960A (zh) * 2021-08-23 2024-04-12 万睿视影像有限公司 具有宽x射线光束和周向布置的检测机构的成像系统
WO2023193933A1 (en) * 2022-04-08 2023-10-12 Das-Nano Tech, S.L. Contactless determining a physical feature of a target item

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3808437A (en) * 1972-05-15 1974-04-30 Nippon Steel Corp Method of thickness measurement for long sections and apparatus therefor
DE2442809A1 (de) * 1974-09-06 1976-03-18 Philips Patentverwaltung Anordnung zur ermittlung der absorption in einem koerper
DE2650237C2 (de) * 1976-11-02 1985-05-02 Siemens AG, 1000 Berlin und 8000 München Röntgendiagnostikgerät zur Herstellung von Transversalschichtbildern
US4220863A (en) * 1977-04-01 1980-09-02 Ohio Nuclear, Inc. Data channel multiplexing system for CT scanner with rotating source
US4187425A (en) * 1978-04-14 1980-02-05 Ndt Systems, Inc. Pipe inspection systems
US4196352A (en) * 1978-04-28 1980-04-01 General Electric Company Multiple purpose high speed tomographic x-ray scanner
DE2840819A1 (de) * 1978-09-20 1980-04-03 Philips Patentverwaltung Verfahren zum ermitteln des innenmasses von langgestreckten hohlkoerpern, insbesondere von rohren
JPS5619470A (en) * 1979-07-26 1981-02-24 Shimadzu Corp Radiation detector
LU83083A1 (fr) * 1981-01-23 1982-09-10 Arbed Installation de mesure par gammametrie
US4495635A (en) * 1981-04-03 1985-01-22 Analogic Corporation Method and apparatus for profiling structural sections
JPS58133237A (ja) * 1982-02-01 1983-08-08 株式会社東芝 診断用ｘ線ｃｔ装置
US4511801A (en) * 1982-07-19 1985-04-16 Bethlehem Steel Corporation Radiation scanning and measuring device
JPS60236632A (ja) * 1984-05-10 1985-11-25 株式会社東芝 第４世代ｃｔ装置
US4725963A (en) * 1985-05-09 1988-02-16 Scientific Measurement Systems I, Ltd. Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects

Also Published As

Publication number Publication date
US4951222A (en) 1990-08-21
KR900702474A (ko) 1990-12-07
WO1989012281A1 (en) 1989-12-14
KR950005139B1 (ko) 1995-05-18
US5091862A (en) 1992-02-25
AU3776889A (en) 1990-01-05

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