ZA834585B - Radiation scanning and measuring device - Google Patents

Radiation scanning and measuring device

Info

Publication number
ZA834585B
ZA834585B ZA834585A ZA834585A ZA834585B ZA 834585 B ZA834585 B ZA 834585B ZA 834585 A ZA834585 A ZA 834585A ZA 834585 A ZA834585 A ZA 834585A ZA 834585 B ZA834585 B ZA 834585B
Authority
ZA
South Africa
Prior art keywords
shutter
halves
measuring device
shielding
radiation scanning
Prior art date
Application number
ZA834585A
Other languages
English (en)
Inventor
Edward J Tatham
Richard Kravits
John C Clymer
Carvel D Hoffman
Original Assignee
Bethlehem Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bethlehem Steel Corp filed Critical Bethlehem Steel Corp
Publication of ZA834585B publication Critical patent/ZA834585B/xx

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21FPROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F5/00Transportable or portable shielded containers
    • G21F5/02Transportable or portable shielded containers with provision for restricted exposure of a radiation source within the container
    • G21F5/04Means for controlling exposure, e.g. time, size of aperture
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00Irradiation devices
    • G21K5/10Irradiation devices with provision for relative movement of beam source and object to be irradiated

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Saccharide Compounds (AREA)
  • Separation By Low-Temperature Treatments (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
ZA834585A 1982-07-19 1983-06-23 Radiation scanning and measuring device ZA834585B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/399,501 US4511801A (en) 1982-07-19 1982-07-19 Radiation scanning and measuring device

Publications (1)

Publication Number Publication Date
ZA834585B true ZA834585B (en) 1984-03-28

Family

ID=23579757

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA834585A ZA834585B (en) 1982-07-19 1983-06-23 Radiation scanning and measuring device

Country Status (11)

Country Link
US (1) US4511801A (de)
EP (1) EP0099560B1 (de)
JP (1) JPS5932442A (de)
KR (1) KR870001909B1 (de)
AT (1) ATE22728T1 (de)
AU (1) AU556207B2 (de)
BR (1) BR8303773A (de)
CA (1) CA1214887A (de)
DE (1) DE3366735D1 (de)
FI (1) FI81215C (de)
ZA (1) ZA834585B (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2576102B1 (fr) * 1985-01-16 1987-02-06 Aerospatiale Procede et dispositif de tomodensitometrie quantitative
US4951222A (en) * 1988-06-09 1990-08-21 Bethlehem Steel Corporation Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography
US5075554A (en) * 1990-09-27 1991-12-24 Siemens Gammasonics, Inc. Scintillation camera gantry supporting a plurality of detector heads between two parallel plates
US9480440B2 (en) * 2011-09-28 2016-11-01 Qr Srl System and method for cone beam computed tomography

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2362911A (en) * 1942-10-05 1944-11-14 Int Standard Electric Corp Liquid cooling of high temperature bodies
FR1354942A (fr) * 1963-01-29 1964-03-13 Commissariat Energie Atomique Obturateur à rideaux pour la radiographie, notamment des combustibles nucléaires irradiés
DE1564235C3 (de) * 1966-07-08 1974-11-14 Kernforschungsanlage Juelich Gmbh, 5170 Juelich Strahlenverschluß
US3562531A (en) * 1967-04-27 1971-02-09 Ind Nucieonics Corp Nucleonic measuring apparatus with automatic fire safety radiation source shutter closing and locking means comprising a spring retained by a fusible barrier which melts at high temperatures
US3526798A (en) * 1968-05-20 1970-09-01 Varian Associates X-ray shield structure for liquid cooled electron beam collectors and tubes using same
US3684887A (en) * 1970-03-26 1972-08-15 Schlumberger Technology Corp Apparatus for inspecting tubular goods having an automatic shutter
US3808437A (en) * 1972-05-15 1974-04-30 Nippon Steel Corp Method of thickness measurement for long sections and apparatus therefor
US3835323A (en) * 1972-08-07 1974-09-10 J Kahil Radiation inspection apparatus with adjustable shutter for inspecting different sizes of tubular goods
FR2276667A1 (fr) * 1974-06-28 1976-01-23 Kernforschungsanlage Juelich Diaphragme a ouverture reglable de facon continue
US4200800A (en) * 1977-11-03 1980-04-29 American Science & Engineering, Inc. Reduced dose CT scanning
US4284895A (en) * 1978-02-21 1981-08-18 Ira Lon Morgan Method and apparatus for tomographic examination of an object by penetrating radiation
US4239972A (en) * 1978-04-24 1980-12-16 U.S. Philips Corporation Device for computed tomography
JPS55129781A (en) * 1979-03-30 1980-10-07 Kagaku Gijutsucho Hoshasen Igaku Sogo Kenkyusho Proton cross tomography unit

Also Published As

Publication number Publication date
FI832615A0 (fi) 1983-07-18
BR8303773A (pt) 1984-02-21
FI81215B (fi) 1990-05-31
AU556207B2 (en) 1986-10-23
JPS5932442A (ja) 1984-02-21
AU1695183A (en) 1984-01-26
DE3366735D1 (en) 1986-11-13
KR840005558A (ko) 1984-11-14
EP0099560A1 (de) 1984-02-01
ATE22728T1 (de) 1986-10-15
US4511801A (en) 1985-04-16
FI81215C (fi) 1990-09-10
FI832615L (fi) 1984-01-20
KR870001909B1 (ko) 1987-10-21
EP0099560B1 (de) 1986-10-08
CA1214887A (en) 1986-12-02

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