ZA831255B - Device for applying two-state logic testing signals to an input of a logic circuit - Google Patents

Device for applying two-state logic testing signals to an input of a logic circuit

Info

Publication number
ZA831255B
ZA831255B ZA831255A ZA831255A ZA831255B ZA 831255 B ZA831255 B ZA 831255B ZA 831255 A ZA831255 A ZA 831255A ZA 831255 A ZA831255 A ZA 831255A ZA 831255 B ZA831255 B ZA 831255B
Authority
ZA
South Africa
Prior art keywords
applying
input
testing signals
logic
logic circuit
Prior art date
Application number
ZA831255A
Other languages
English (en)
Inventor
Michel Collombet
Original Assignee
Framatome & Cie
Merlin Gerin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Framatome & Cie, Merlin Gerin filed Critical Framatome & Cie
Publication of ZA831255B publication Critical patent/ZA831255B/xx

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H21/00—Adaptive networks
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Tests Of Electronic Circuits (AREA)
ZA831255A 1982-03-05 1983-02-24 Device for applying two-state logic testing signals to an input of a logic circuit ZA831255B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8203711A FR2522824A1 (fr) 1982-03-05 1982-03-05 Dispositif pour appliquer des signaux logiques de test a deux etats sur une entree d'un circuit logique et application aux tests automatiques d'une pluralite de circuits logiques

Publications (1)

Publication Number Publication Date
ZA831255B true ZA831255B (en) 1983-11-30

Family

ID=9271650

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA831255A ZA831255B (en) 1982-03-05 1983-02-24 Device for applying two-state logic testing signals to an input of a logic circuit

Country Status (7)

Country Link
US (1) US4652815A (enrdf_load_stackoverflow)
EP (1) EP0088684B1 (enrdf_load_stackoverflow)
JP (1) JPS58189567A (enrdf_load_stackoverflow)
KR (1) KR910003546B1 (enrdf_load_stackoverflow)
DE (1) DE3360699D1 (enrdf_load_stackoverflow)
FR (1) FR2522824A1 (enrdf_load_stackoverflow)
ZA (1) ZA831255B (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63195772U (enrdf_load_stackoverflow) * 1987-06-05 1988-12-16
FR2738302B1 (fr) * 1995-08-30 1997-10-10 Hydroperfect Int Groupe electro-hydraulique compact
CN111289875B (zh) * 2020-02-29 2022-12-16 苏州浪潮智能科技有限公司 一种逻辑电路故障检测装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3524178A (en) * 1968-12-18 1970-08-11 Gen Electric Voltage indicator and test device
US3892954A (en) * 1972-04-04 1975-07-01 Westinghouse Electric Corp Programmable, tester for protection and safeguards logic functions
DE2438257C2 (de) * 1974-08-08 1978-05-24 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltungsanordnung zur Überwachung eines binären Signalgebers
US4045726A (en) * 1976-07-06 1977-08-30 Schweitzer Edmund O Jun Tool for manually tripping a fault indicator for high voltage electric power circuits and resetting same
DE2935108C2 (de) * 1979-08-30 1981-12-10 Kraftwerk Union AG, 4330 Mülheim Prüfeinrichtung

Also Published As

Publication number Publication date
FR2522824A1 (fr) 1983-09-09
US4652815A (en) 1987-03-24
EP0088684B1 (fr) 1985-09-04
JPS58189567A (ja) 1983-11-05
FR2522824B1 (enrdf_load_stackoverflow) 1985-05-10
KR840004334A (ko) 1984-10-10
EP0088684A1 (fr) 1983-09-14
KR910003546B1 (ko) 1991-06-04
DE3360699D1 (en) 1985-10-10
JPH0254908B2 (enrdf_load_stackoverflow) 1990-11-22

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