ZA793570B - Method of detecting flaws on surfaces - Google Patents

Method of detecting flaws on surfaces

Info

Publication number
ZA793570B
ZA793570B ZA00793570A ZA793570A ZA793570B ZA 793570 B ZA793570 B ZA 793570B ZA 00793570 A ZA00793570 A ZA 00793570A ZA 793570 A ZA793570 A ZA 793570A ZA 793570 B ZA793570 B ZA 793570B
Authority
ZA
South Africa
Prior art keywords
detecting flaws
flaws
detecting
Prior art date
Application number
ZA00793570A
Other languages
English (en)
Inventor
M Sarkozi
N Yaroshuk
E Vaerewyck
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of ZA793570B publication Critical patent/ZA793570B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
ZA00793570A 1978-08-09 1979-07-16 Method of detecting flaws on surfaces ZA793570B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/932,234 US4219277A (en) 1978-08-09 1978-08-09 Method of detecting flaws on surfaces

Publications (1)

Publication Number Publication Date
ZA793570B true ZA793570B (en) 1980-10-29

Family

ID=25461991

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA00793570A ZA793570B (en) 1978-08-09 1979-07-16 Method of detecting flaws on surfaces

Country Status (9)

Country Link
US (1) US4219277A (xx)
EP (1) EP0008010B1 (xx)
JP (1) JPS5524696A (xx)
CA (1) CA1127242A (xx)
DE (1) DE2964477D1 (xx)
ES (1) ES483233A1 (xx)
FR (1) FR2435709A1 (xx)
YU (1) YU43458B (xx)
ZA (1) ZA793570B (xx)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2901970C2 (de) * 1979-01-19 1981-08-20 H.F. & Ph.F. Reemtsma Gmbh & Co, 2000 Hamburg Verfahren und Vorrichtung zum Aussortieren von Fremdkörpern aus auf einem sich bewegenden Förderband o.ä. befindlichen Gut
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
US4448680A (en) * 1980-07-22 1984-05-15 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for classifying fuel pellets for nuclear reactor
US4377238A (en) * 1980-08-27 1983-03-22 The United States Of America As Represented By The United States Department Of Energy Flaw detection and evaluation
US4376583A (en) * 1981-05-12 1983-03-15 Aeronca Electronics, Inc. Surface inspection scanning system
GB8311795D0 (en) * 1983-04-29 1983-06-02 De La Rue Syst Detecting luminescent security features
DE3526923A1 (de) * 1985-07-27 1987-02-05 Man Technologie Gmbh Verfahren und einrichtung zur beruehrungslosen bestimmung von oberflaechen
JP2003004657A (ja) * 2001-06-25 2003-01-08 Hitachi Ltd 観察作業支援システム
CA3049647A1 (en) * 2017-01-10 2018-07-19 Sunspring America, Inc. Optical method for identifying defects on tube surfaces
CN110712982A (zh) * 2019-09-04 2020-01-21 成都术有云视觉科技有限公司 核燃料芯块外观表面缺陷离线检查系统

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2975293A (en) * 1955-02-18 1961-03-14 Diamond Power Speciality Optical defect detector
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam
US3804534A (en) * 1971-10-27 1974-04-16 Ferranti Ltd Detection of blemishes in a surface
US3781117A (en) * 1972-03-31 1973-12-25 United States Steel Corp Apparatus for surface inspection of moving material
US3781531A (en) * 1972-06-23 1973-12-25 Intec Corp Flaw detector system utilizing a laser scanner
JPS5213952B2 (xx) * 1972-07-31 1977-04-18
DE2245058A1 (de) * 1972-09-14 1974-03-21 Sick Optik Elektronik Erwin Photoelektrische oberflaechenabtastvorrichtung
US3984189A (en) * 1973-01-19 1976-10-05 Hitachi Electronics, Ltd. Method and apparatus for detecting defects in a surface regardless of surface finish
US3834822A (en) * 1973-03-29 1974-09-10 Gen Motors Corp Method and apparatus for surface defect detection using detection of non-symmetrical patterns of non-specularly reflected light
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system
US3920970A (en) * 1974-04-30 1975-11-18 Intec Corp Laser scanner flaw detection system using baseline follower signal processing
US4005281A (en) * 1975-05-14 1977-01-25 E. I. Du Pont De Nemours And Company Defect identification with normalizing of gain function in optical-electrical inspection
GB1526375A (en) * 1977-03-23 1978-09-27 Ciba Geigy Ag Method of identifying streaks on a web

Also Published As

Publication number Publication date
CA1127242A (en) 1982-07-06
FR2435709A1 (fr) 1980-04-04
ES483233A1 (es) 1980-10-01
US4219277A (en) 1980-08-26
DE2964477D1 (en) 1983-02-17
EP0008010A1 (en) 1980-02-20
YU43458B (en) 1989-08-31
JPS5524696A (en) 1980-02-21
EP0008010B1 (en) 1983-01-12
FR2435709B1 (xx) 1984-04-13
YU192079A (en) 1983-06-30

Similar Documents

Publication Publication Date Title
ZA815271B (en) Method of fracturation detection
DE2961682D1 (en) Method and reagent for the determination of glycerol
JPS5526896A (en) Method and reagent for determining edenosinephosphate
JPS5386012A (en) Detecting method of phatogenic microorganism
GB2005015B (en) Method of detecting flaws on the surface of metal
JPS5498268A (en) Method of inspecting position
DE2961059D1 (en) Gap measurement method
JPS5526894A (en) Method and reagent for measuring glutamatee oxaloacetateetransamynase and glutamateepirvatee transamynase
DE2964477D1 (en) Method of detecting flaws on surfaces
GB2035571B (en) Flaw detection
JPS5332081A (en) Method of inspecting hygrometer or hygrostart
JPS54128785A (en) Method of detecting flaw on surface
JPS54119353A (en) Groove detecting method
JPS5574402A (en) Method of inspecting nonnconductive products
JPS54106263A (en) Detecting apparatus of matter
JPS5383671A (en) Detecting method of surface defects
GB2013884B (en) Method and apparatus for detecting gases
JPS54133186A (en) Method of detecting flaws of hot piece
JPS54110867A (en) Thickness measuring method and apparatus
JPS52135785A (en) Method of inspecting surface flaw
JPS54150196A (en) Method of detecting gas
GB2027887B (en) Methods of non-destructive testing
JPS54107386A (en) Flaw detecting system
JPS53138389A (en) Detecting method of surface flaws
SU642606A1 (ru) Способ дефектоскопии