JPS5524696A - Detecting surface scratches - Google Patents

Detecting surface scratches

Info

Publication number
JPS5524696A
JPS5524696A JP10082579A JP10082579A JPS5524696A JP S5524696 A JPS5524696 A JP S5524696A JP 10082579 A JP10082579 A JP 10082579A JP 10082579 A JP10082579 A JP 10082579A JP S5524696 A JPS5524696 A JP S5524696A
Authority
JP
Japan
Prior art keywords
detecting surface
surface scratches
scratches
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10082579A
Other languages
English (en)
Inventor
Yaroshiyuku Nitsuku
Saakoji Mikurosu
Jieraado Baereuitsuku Yuujin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of JPS5524696A publication Critical patent/JPS5524696A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
JP10082579A 1978-08-09 1979-08-09 Detecting surface scratches Pending JPS5524696A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/932,234 US4219277A (en) 1978-08-09 1978-08-09 Method of detecting flaws on surfaces

Publications (1)

Publication Number Publication Date
JPS5524696A true JPS5524696A (en) 1980-02-21

Family

ID=25461991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10082579A Pending JPS5524696A (en) 1978-08-09 1979-08-09 Detecting surface scratches

Country Status (9)

Country Link
US (1) US4219277A (ja)
EP (1) EP0008010B1 (ja)
JP (1) JPS5524696A (ja)
CA (1) CA1127242A (ja)
DE (1) DE2964477D1 (ja)
ES (1) ES483233A1 (ja)
FR (1) FR2435709A1 (ja)
YU (1) YU43458B (ja)
ZA (1) ZA793570B (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2901970C2 (de) * 1979-01-19 1981-08-20 H.F. & Ph.F. Reemtsma Gmbh & Co, 2000 Hamburg Verfahren und Vorrichtung zum Aussortieren von Fremdkörpern aus auf einem sich bewegenden Förderband o.ä. befindlichen Gut
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
US4448680A (en) * 1980-07-22 1984-05-15 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for classifying fuel pellets for nuclear reactor
US4377238A (en) * 1980-08-27 1983-03-22 The United States Of America As Represented By The United States Department Of Energy Flaw detection and evaluation
US4376583A (en) * 1981-05-12 1983-03-15 Aeronca Electronics, Inc. Surface inspection scanning system
GB8311795D0 (en) * 1983-04-29 1983-06-02 De La Rue Syst Detecting luminescent security features
DE3526923A1 (de) * 1985-07-27 1987-02-05 Man Technologie Gmbh Verfahren und einrichtung zur beruehrungslosen bestimmung von oberflaechen
JP2003004657A (ja) * 2001-06-25 2003-01-08 Hitachi Ltd 観察作業支援システム
CA3049647A1 (en) * 2017-01-10 2018-07-19 Sunspring America, Inc. Optical method for identifying defects on tube surfaces

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2975293A (en) * 1955-02-18 1961-03-14 Diamond Power Speciality Optical defect detector
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam
US3804534A (en) * 1971-10-27 1974-04-16 Ferranti Ltd Detection of blemishes in a surface
US3781117A (en) * 1972-03-31 1973-12-25 United States Steel Corp Apparatus for surface inspection of moving material
US3781531A (en) * 1972-06-23 1973-12-25 Intec Corp Flaw detector system utilizing a laser scanner
JPS5213952B2 (ja) * 1972-07-31 1977-04-18
DE2245058A1 (de) * 1972-09-14 1974-03-21 Sick Optik Elektronik Erwin Photoelektrische oberflaechenabtastvorrichtung
US3984189A (en) * 1973-01-19 1976-10-05 Hitachi Electronics, Ltd. Method and apparatus for detecting defects in a surface regardless of surface finish
US3834822A (en) * 1973-03-29 1974-09-10 Gen Motors Corp Method and apparatus for surface defect detection using detection of non-symmetrical patterns of non-specularly reflected light
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system
US3920970A (en) * 1974-04-30 1975-11-18 Intec Corp Laser scanner flaw detection system using baseline follower signal processing
US4005281A (en) * 1975-05-14 1977-01-25 E. I. Du Pont De Nemours And Company Defect identification with normalizing of gain function in optical-electrical inspection
GB1526375A (en) * 1977-03-23 1978-09-27 Ciba Geigy Ag Method of identifying streaks on a web

Also Published As

Publication number Publication date
ZA793570B (en) 1980-10-29
EP0008010A1 (en) 1980-02-20
YU192079A (en) 1983-06-30
FR2435709B1 (ja) 1984-04-13
DE2964477D1 (en) 1983-02-17
FR2435709A1 (fr) 1980-04-04
CA1127242A (en) 1982-07-06
US4219277A (en) 1980-08-26
YU43458B (en) 1989-08-31
ES483233A1 (es) 1980-10-01
EP0008010B1 (en) 1983-01-12

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