ZA200801965B - Method of analyzing minute amounts of Pd, Rh and Ru, and high-frequency plasma mass spectroscope used for same - Google Patents

Method of analyzing minute amounts of Pd, Rh and Ru, and high-frequency plasma mass spectroscope used for same

Info

Publication number
ZA200801965B
ZA200801965B ZA200801965A ZA200801965A ZA200801965B ZA 200801965 B ZA200801965 B ZA 200801965B ZA 200801965 A ZA200801965 A ZA 200801965A ZA 200801965 A ZA200801965 A ZA 200801965A ZA 200801965 B ZA200801965 B ZA 200801965B
Authority
ZA
South Africa
Prior art keywords
same
frequency plasma
plasma mass
minute amounts
mass spectroscope
Prior art date
Application number
ZA200801965A
Other languages
English (en)
Inventor
Kamimura Kenichi
Kawada Satoshi
Tsuchiya Kouji
Original Assignee
Nippon Mining Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Mining Co filed Critical Nippon Mining Co
Publication of ZA200801965B publication Critical patent/ZA200801965B/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
ZA200801965A 2007-03-20 2008-02-28 Method of analyzing minute amounts of Pd, Rh and Ru, and high-frequency plasma mass spectroscope used for same ZA200801965B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007072442A JP4402128B2 (ja) 2007-03-20 2007-03-20 微量Ｐｄ、Ｒｈ及びＲｕの分析方法及び該方法に用いる高周波プラズマ質量分析装置

Publications (1)

Publication Number Publication Date
ZA200801965B true ZA200801965B (en) 2009-09-30

Family

ID=39764632

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200801965A ZA200801965B (en) 2007-03-20 2008-02-28 Method of analyzing minute amounts of Pd, Rh and Ru, and high-frequency plasma mass spectroscope used for same

Country Status (5)

Country Link
US (1) US7755033B2 (ja)
JP (1) JP4402128B2 (ja)
AU (1) AU2008200521B2 (ja)
CA (1) CA2618539C (ja)
ZA (1) ZA200801965B (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101865848B (zh) * 2010-05-21 2012-05-30 北京泰科诺科技有限公司 等离子体发射光谱法测定熏蒸罐中溴甲烷浓度的方法及装置
CN104634773A (zh) * 2013-11-15 2015-05-20 中国石油天然气股份有限公司 一种用等离子发射光谱测定三苯基磷中铑含量的方法
JP6325358B2 (ja) * 2014-06-10 2018-05-16 Ｊｘ金属株式会社 微量貴金属の分離方法及び分析方法
CN111289498B (zh) * 2020-03-26 2021-06-22 福州大学 一种负载型钌催化剂中钌含量的测定方法
CN113916868B (zh) * 2020-07-10 2024-01-09 中铝洛阳铜加工有限公司 一种铜合金熔炼炉铜灰中铜含量的测定方法
CN112557488A (zh) * 2020-12-09 2021-03-26 上海交通大学 一种一体式分子束取样接口

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09129174A (ja) * 1995-10-31 1997-05-16 Hitachi Ltd 質量分析装置
US6265717B1 (en) * 1998-07-15 2001-07-24 Agilent Technologies Inductively coupled plasma mass spectrometer and method
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method

Also Published As

Publication number Publication date
CA2618539C (en) 2011-01-25
CA2618539A1 (en) 2008-09-20
US7755033B2 (en) 2010-07-13
JP2008232808A (ja) 2008-10-02
AU2008200521A1 (en) 2008-10-09
AU2008200521B2 (en) 2010-07-29
US20080230690A1 (en) 2008-09-25
JP4402128B2 (ja) 2010-01-20

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